CN1044745C - Method for testing content of X-ray fluorescence gold and thickness of gold plated and clad - Google Patents
Method for testing content of X-ray fluorescence gold and thickness of gold plated and clad Download PDFInfo
- Publication number
- CN1044745C CN1044745C CN 96106707 CN96106707A CN1044745C CN 1044745 C CN1044745 C CN 1044745C CN 96106707 CN96106707 CN 96106707 CN 96106707 A CN96106707 A CN 96106707A CN 1044745 C CN1044745 C CN 1044745C
- Authority
- CN
- China
- Prior art keywords
- gold
- plating
- value
- covered
- silver
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 title claims abstract description 90
- 229910052737 gold Inorganic materials 0.000 title claims abstract description 48
- 239000010931 gold Substances 0.000 title claims abstract description 48
- 238000012360 testing method Methods 0.000 title claims description 24
- 238000000034 method Methods 0.000 title abstract description 4
- 238000004876 x-ray fluorescence Methods 0.000 title description 3
- 238000007747 plating Methods 0.000 claims abstract description 52
- 239000010949 copper Substances 0.000 claims abstract description 48
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 35
- 229910052802 copper Inorganic materials 0.000 claims abstract description 35
- 229910052709 silver Inorganic materials 0.000 claims abstract description 27
- 239000004332 silver Substances 0.000 claims abstract description 27
- 238000005259 measurement Methods 0.000 claims abstract description 7
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims abstract description 5
- 239000000758 substrate Substances 0.000 claims description 29
- 239000010944 silver (metal) Substances 0.000 claims description 11
- 230000005855 radiation Effects 0.000 claims description 8
- 230000002285 radioactive effect Effects 0.000 claims description 8
- 238000010606 normalization Methods 0.000 claims description 7
- -1 plating Substances 0.000 claims description 5
- 239000010946 fine silver Substances 0.000 claims description 3
- 238000005253 cladding Methods 0.000 abstract description 11
- 238000004458 analytical method Methods 0.000 abstract description 5
- 238000001131 gamma-ray scattering spectroscopy Methods 0.000 abstract 1
- 238000011282 treatment Methods 0.000 abstract 1
- 238000001228 spectrum Methods 0.000 description 11
- 230000000875 corresponding effect Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 238000010521 absorption reaction Methods 0.000 description 3
- 238000002083 X-ray spectrum Methods 0.000 description 1
- GSJVCJPEZMDJIW-UHFFFAOYSA-N copper;silver Chemical compound [Cu+2].[Ag+] GSJVCJPEZMDJIW-UHFFFAOYSA-N 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 239000002932 luster Substances 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Abstract
A method for measuring the content of X-ray fluorescent gold and the thickness of plated or clad gold features that the X-ray fluorescent analysis and low-energy gamma-ray scattering analysis are used to measure the X-ray intensities of gold, silver and copper elements, their compton scattering intensities and Rayleigh scattering intensities, and a series of numerical value treatments are used to compare them, so accurately discriminating the gold product from the pseudo-plated or clad gold product and measuring the thickness of plated or clad gold layer. The method is mainly used for measuring the gold content of the gold product, plating, discrimination of gold-coated counterfeit products and thickness measurement. The thickness measuring range of the plating layer and the cladding layer is less than 200 mu m, and the thickness measuring precision is better than 10 percent.
Description
The present invention relates to a kind of content, thickness testing method, specifically a kind of XRF gold content and plating, thickness testing method covered with gold leaf.
On market, the element that golden goods (gold, silver, copper) and plating, fakement covered with gold leaf relate generally to is three kinds of gold, silver, copper; Silver, copper are that golden goods are regulated color and luster and the most frequently used element of quality, also are as plating, the most frequently used substrate of fakement covered with gold leaf.Radioactive source
241Am excites, and the characteristic X-ray energy that golden material produces is 9.71kev and 11.44kev; The X ray energy of Ag is 22.1kev; The X ray energy of Cu is 8.04kev, existing " x-ray fluorescence analysis percentage of gold instrument ", because its technical foundation is each element to be excited characteristic X-radiation spectrum carry out " closed loop method " and handle, is to differentiate golden goods and is the plating of substrate, fakement covered with gold leaf with copper, silver.Although added some insecure human interventions, when plating, thickness covered with gold leaf just can't be measured greater than the fakement (for example copper substrate is plated the thick proof gold of 10 μ) of certain value.
The objective of the invention is to utilize the different X-ray energy spectrum of material and Compton, Rayleigh scattering to compose, provide a kind of and can accurately screen golden goods and be the plating of substrate, fakement covered with gold leaf, and measure the XRF gold content of plating, the plating of goods covered with gold leaf, thickness covered with gold leaf and plating, thickness testing method covered with gold leaf with copper, silver.
The objective of the invention is to realize by following means.A kind of XRF gold content and plating, thickness testing method covered with gold leaf, its principle is as follows: to radioactive source
241Am, gold, silver, three kinds of elements of copper not only can produce different characteristic X-radiation ray energy spectrums, and the low-energy of the 59.5kev of source outgoing had quality Compton absorption coefficient μ C, the quality Rayleigh absorption coefficient μ R of marked difference, and μ C, μ R the share μ C/ μ, the μ R/ μ that in the gross mass absorption coefficient, account for.Feature thus can be measured the X feature power spectrum of gold, silver in the material, copper and Compton scattering spectrum, Rayleigh scattering spectrum, carries out a series of spectrum peak again and handles, and deducibility goes out the component and the content of measured matter.According to ray and matter interaction theory; To a sample based on gold element, the maximum ga(u)ge that the characteristic X-radiation of its copper, gold produces effect is that " effectively layer " thickness is 5-10 μ m, and silver is about 30 μ m; And the Compton scattering that the 59.5kev low-energy produces and " net thickness " of Rayleigh scattering reach 200 μ m or bigger.Because concerning golden goods, each element is mixed uniformly in the sample, with " effectively layer " of the corresponding different-thickness of different-energy spectral line in, the component of element is identical.But to being that the plating of substrate, sample covered with gold leaf are just different with copper, silver, when plating, cladding thickness during less than its corresponding " net thickness ", just the element components in " effectively layer " is not that it is comprising the hierarchy of plating, covering element and end liner element uniformly.Therefore, in theory in 200 μ m thickness ranges, correlated characteristic between characteristic X-ray spectrum by measuring gold, silver, copper and Compton, the Rayleigh scattering spectrum is used to that golden goods plate with plating, fakement covered with gold leaf and mensuration, the main foundation of cladding thickness as screening.Its method of testing be
241Am or
109Under the irradiation of Cd radioactive source, go out the X radiation intensity (S that is excited feature of silver, the copper of fine silver, fine copper sample by detector measurement
AgO, S
CuO) and the strength S of a Compton scattering and Rayleigh scattering
CO (Ag), S
RO (Ag), S
CO (Cu), S
RO (Cu), and the gold, silver of plating, sample covered with gold leaf, copper be excited the characteristic X-radiation strength S
Au, S
Ag, S
CuStrength S with a Compton scattering and Rayleigh scattering
C, S
R, at normalization gold content share [a
u] value and plating, sample covered with gold leaf gold be excited characteristic X-radiation intensity (S
Au) and residue Rayleigh intensity (S
R ') ratio R
2(R
2=S
Au/ S
R ') coordinate on, instrument is set up the [a of golden goods
u]-R
2The zone of value, wherein S
R '=S
R-S
RO (Ag)S
Ag/ S
AgO-S
RO (Cu)S
Cu/ S
CuOAt normalization gold content share [a
u] value and plating, sample covered with gold leaf gold be excited characteristic X-radiation intensity and residue Compton scattering intensity (S
C ') ratio R
1(R
1=S
Au/ S
C ') coordinate on, instrument is set up the [a of golden goods
u]-R
1The zone of value, wherein S
C '=S
C-S
CO (Ag)S
Ag/ S
AgO-S
CO (Cu)S
Cu/ S
CuOTo the different substrates of instrument system, the series of samples of different platings, thickness covered with gold leaf is carried out scale, and respectively the scale point value is carried out the function match, obtains the mathematic(al) representation of curve: copper substrate d=f
1([a
u]); D=f
2(R
2), silver-colored substrate d=f
3([a
u]); D=f
4(R
2).
241Am or
109Under the irradiation of Cd radioactive source, (testing sample refer to golden goods or be the plating of substrate, covered with gold leaf ornaments with copper, silver) that goes out testing sample by detector measurement is excited the X radiation intensity (S of feature
Au, S
Ag, S
CuO) and the strength S of a Compton scattering and Rayleigh scattering
C, S
R, calculate its R
1, R
2[a
u] value, at identical [a
u] be worth down, compare the R of testing sample
2R with golden goods
20The value size, R
2Not significantly greater than R
20Value then is golden goods, R
2Significantly greater than R
20Value then is plating, fakement covered with gold leaf; At identical [a
u] be worth down, compare the R of testing sample
1R with golden goods zone
10The value size, R
1Significantly greater than R
10, then substrate is for silver or based on silver; R
1Significantly less than R
10, then end liner is a copper or based on copper, R
1Neither significantly greater than R
10, also not significantly less than R
10, then substrate has the potpourri of suitable content for silver, copper.If [a of sample
u] smaller or equal to 0.95, R
1Less than R
10And, then use d=f greater than zero
1([a
u]) calculating is plated, cladding thickness; If [a
u] greater than 0.95, R
1Less than R
10And, then use d=f greater than zero
2(R
2) calculating is plated, cladding thickness; If [a
u] smaller or equal to 0.95, R
1Greater than R
10Or R
1Less than zero, then use d=f
3([a
u]) calculating is plated, cladding thickness; If [a
u] greater than 0.95, and R
1Greater than R
10Or R
1Less than zero, then use d=f
4(R
2) calculating is plated, cladding thickness.
The invention provides a kind of x ray fluorescence gold content and plating, thickness testing method covered with gold leaf, owing to adopt xrf analysis in conjunction with low-energy scattering analysis technology, measure the X feature power spectrum of material and their Compton scattering spectrum, Rayleigh scattering spectrum, can accurately screen, analyze the thickness of plating, fakement covered with gold leaf.Be mainly used in the examination and the thickness measurement of the gold content measurement of golden goods and plating, fakement covered with gold leaf.Plating, covering thickness measuring scope are below 200 μ m, and the thickness measuring precision is better than 10%.
The present invention is described in more detail below by embodiment.
Embodiment.
A kind of XRF gold content and plating, thickness testing method covered with gold leaf are 1 30m Curie's
241Under the irradiation of Am radioactive source,, measure the X-radiation strength S of fine silver, fine copper by the plane germanium detector of 1 φ 40 * 10m
AgO, S
CuOStrength S with a Compton scattering and Rayleigh scattering
CO (Ag), S
RO (Ag), S
CO (Cu), S
RO (Cu)And the gold, silver of plating, sample covered with gold leaf, copper be excited the characteristic X-radiation strength S
Au, S
Ag, S
CuStrength S with a Compton scattering and Rayleigh scattering
C, S
R, S
C ', S
R 'Be residue Compton scattering intensity, residue Rayleigh intensity, and S
C '=S
C-S
CO (Ag)S
Ag/ S
AgO-S
CO (Cu)S
Cu/ S
CuOS
R '=S
R-S
RO (Ag)S
Ag/ S
AgO-S
RO (Cu)S
Cu/ S
CuO, and introduce parameter R
1=S
Au/ S
C 'R
2=S
Au/ S
R ', at different normalization gold content share [a
u] be worth down, have corresponding different R
1, R
2Value.At [a
u]-R
2On the coordinate, instrument is set up the [a of golden goods
u]-R
2The zone of value; At [a
u]-R
1On the coordinate, instrument is set up the [a of golden goods
u]-R
1The zone; And instrument system is carried out scale with the series standardized sample of different substrates, different plating, thickness covered with gold leaf, and respectively the scale point value is carried out the function match, obtain the mathematic(al) representation of curve: copper substrate d=f
1([a
u]); D=f
2(R
2), silver-colored substrate d=f
3([a
u]); D=f
4(R
2).Measure the X radiation intensity S of testing sample (testing sample refer to gold ornaments or be the plating of substrate, covered with gold leaf ornaments with copper, silver)
Au, S
Ag, S
CuStrength S with a Compton scattering and Rayleigh scattering
C, S
R, can obtain remaining the Compton scattering strength S equally
C, residue Rayleigh intensity S
RAnd corresponding R
1, R
2Value and normalization gold content share [a
u] value.At identical [a
u] be worth down [a that is setting up
u]-R
2On the coordinate, compare the R of testing sample
2R with golden goods zone
20Value, R
2Whether significantly greater than R
20Value is not golden goods, is to be plating, fakement covered with gold leaf.At identical [a
u] be worth down [a that is setting up
u]-R
1On the coordinate, compare the R of testing sample
1R with golden goods zone
10Value, R
1Whether significantly greater than R
10, be, then substrate for silver or silver-colored main body; , do not differentiate R again
1Whether significantly less than R
10, be, then end liner is Cu or based on Cu, not, then substrate has the potpourri of suitable content for silver, copper.[a of sample
u]≤0.95, and 0＜R
1＜R
10, use d=f
1([a
u]), measure plating, cladding thickness; If [a
u]＞0.95 and 0＜R
1＜R
10, use d=f
2(R
2), measure plating, cladding thickness; If [a
u]≤0.95 and R
1＞R
10Or R
1＜0, select d=f for use
3([a
u]), measure plating, cladding thickness; If [a
u]＞0.95, and R
1＞R
10Or R
1＜0, select d=f for use
4(R
2), measure plating, cladding thickness.
Claims (2)
1. XRF gold content and plating, thickness testing method covered with gold leaf is characterized in that
241Am or
109Under the irradiation of Cd radioactive source, measure gold ornaments or be the intensity of being excited characteristic X-radiation intensity and a Compton scattering and Rayleigh scattering of the testing sample of the plating of substrate, ornaments covered with gold leaf with copper, silver by detector, at identical normalization gold content share value [a
u] under, compare the X radiation intensity of testing sample and the ratio R of residue Rayleigh intensity
2[a of the golden goods of having set up
u]-R
2The X radiation intensity on the value coordinates regional and the ratio R of Rayleigh intensity
20Size, screen plating, fakement covered with gold leaf; At identical normalized gold content share value [a
u] under, the ratio R of the X radiation intensity of plating, sample covered with gold leaf and residue Compton scattering intensity relatively
1[a of the golden goods of having set up
u]-R
1X radiation intensity on the value coordinates regional and the ratio R that remains Compton scattering intensity
10Size, judge substrate; Compare [a
u] value, R
1With R
10Relation between the null value by the plating of fixed copper, silver-colored substrate, the computing formula of thickness covered with gold leaf, is measured the thickness of plating, layer covered with gold leaf.
2. XRF gold content as claimed in claim 1 and plating, thickness testing method covered with gold leaf is characterized in that:
(1) exists
241Am or
109Under the irradiation of Cd radioactive source, go out the X radiation intensity (S that is excited feature of silver, the copper of fine silver, fine copper sample by detector measurement
AgO, S
CuO) and the strength S of a Compton scattering and Rayleigh scattering
CO (Ag), S
RO (Ag), S
CO (Cu), S
RO (Cu) and plate sample covered with gold leaf gold, silver, copper be excited the characteristic X-radiation strength S
Au, S
Ag, S
CuWith a Compton scattering and Rayleigh intensity S
C, S
R, at normalization gold content share [a
u] ratio R of being excited characteristic X-radiation intensity and residue Rayleigh intensity of gold of value and plating, sample covered with gold leaf
2Coordinate on, instrument is set up the [a of golden goods
u] R
2The zone of value; At normalization gold content share [a
u] ratio R of being excited characteristic X-radiation intensity and residue Compton scattering intensity of gold of value and plating, sample covered with gold leaf
1Coordinate on, instrument is set up [the au]-R of golden goods
1The zone of value; Instrument system is carried out scale with the series of samples of different substrates, different plating, thickness covered with gold leaf, and respectively the scale point value is carried out the function match, obtain the computing formula of four kinds of curves of the plating of copper, silver-colored substrate, layer thickness covered with gold leaf,
(2) exist
241Am or
109Under the irradiation of Cd radioactive source, be excited the characteristic X-radiation strength S by what detector measurement went out testing sample
Am, S
Ag, S
Cu, the strength S of Compton scattering and Rayleigh scattering
C, S
R, calculate its R
1, R
2[a
u] value, at identical [a
u] be worth down, compare the R of testing sample
2R with golden goods
20The value size, R
2Near R
20Value then is golden goods, R
2Significantly greater than R
20Value then is plating, fakement covered with gold leaf; At identical [a
u] be worth down, compare the R of testing sample
1R with golden goods zone
10The value size, R
1Significantly greater than R
10Then substrate is silver or silver-colored main body, R
1Significantly less than R
10Then substrate is a copper or based on copper, R1 is near R
10Value, then substrate has the potpourri of suitable content for silver, copper; [a of testing sample
u] be worth smaller or equal to 0.95 R
1Less than R
10And greater than zero, then be substrate with copper, plating, layer thickness d=f1 ([a covered with gold leaf
u]) calculate [a
u] value greater than 0.95, R
1Less than R
10And greater than zero, then be substrate with copper, plating, layer thickness d=f covered with gold leaf
2(R
2) calculate [a
u] value smaller or equal to 0.95, R
1Greater than R
10Or R
1Less than zero, then be substrate with silver, plating, layer thickness d=f covered with gold leaf
3([a
u]) calculate [a
u] value greater than 0.95, R
1Greater than R
10Or R
1Less than zero, be substrate with silver, plating, layer thickness d=f covered with gold leaf
4(R
2) calculate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 96106707 CN1044745C (en) | 1996-06-25 | 1996-06-25 | Method for testing content of X-ray fluorescence gold and thickness of gold plated and clad |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 96106707 CN1044745C (en) | 1996-06-25 | 1996-06-25 | Method for testing content of X-ray fluorescence gold and thickness of gold plated and clad |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1157920A CN1157920A (en) | 1997-08-27 |
| CN1044745C true CN1044745C (en) | 1999-08-18 |
Family
ID=5119323
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 96106707 Expired - Fee Related CN1044745C (en) | 1996-06-25 | 1996-06-25 | Method for testing content of X-ray fluorescence gold and thickness of gold plated and clad |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1044745C (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100409002C (en) * | 2001-08-07 | 2008-08-06 | 精工电子纳米科技术有限公司 | X-ray Coating Thickness Gauge |
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|---|---|---|---|---|
| CN100454008C (en) * | 2005-06-22 | 2009-01-21 | 重庆大学 | A Method for Measuring the Concentration of a Single Solute Solution by Compton Scattering |
| US20130202083A1 (en) * | 2012-02-03 | 2013-08-08 | Stanislaw Piorek | System and method for identification of counterfeit gold jewelry using xrf |
| JP6683111B2 (en) * | 2016-11-28 | 2020-04-15 | 株式会社島津製作所 | Sample analysis system |
| CN107218971A (en) * | 2017-05-24 | 2017-09-29 | 深圳市金质金银珠宝检验研究中心有限公司 | A kind of detection method of golden paper certificate gold content, quality and layer gold thickness |
| CN114324432B (en) * | 2021-12-16 | 2023-09-01 | 山东电力工业锅炉压力容器检验中心有限公司 | Method for detecting copper content of transformer bushing wiring terminal with plating layer |
-
1996
- 1996-06-25 CN CN 96106707 patent/CN1044745C/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100409002C (en) * | 2001-08-07 | 2008-08-06 | 精工电子纳米科技术有限公司 | X-ray Coating Thickness Gauge |
Also Published As
| Publication number | Publication date |
|---|---|
| CN1157920A (en) | 1997-08-27 |
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