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CN1042856C - Method for mfg. special standard particle templet for laser granulometer - Google Patents

Method for mfg. special standard particle templet for laser granulometer Download PDF

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CN1042856C
CN1042856C CN 94114047 CN94114047A CN1042856C CN 1042856 C CN1042856 C CN 1042856C CN 94114047 CN94114047 CN 94114047 CN 94114047 A CN94114047 A CN 94114047A CN 1042856 C CN1042856 C CN 1042856C
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standard particle
particle
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CN1121998A (en
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应萱同
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Fudan University
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Abstract

本发明是一种新颖的激光粒度仪专用标准粒子版制备方法,光路设计独特,用高分辨率激光束直接扫描照相底版,采用计算机控制整个系统,既有效地利用激光的高单色、高亮度特性,消除成象色差,缩短曝光时间;又克服激光散斑效应和普通扫描成象光路中的色差、象差、畸变,可高保真地摄制大量随机分布微小物体。本发明成象精度好,自动化程度高,制作工艺简单,生产周期短,投资少,可广泛应用于各种高精度微象摄影制版领域。

The present invention is a novel method for preparing standard particle plates for laser particle size analyzers. The optical path is uniquely designed. The high-resolution laser beam is used to directly scan the photographic plate, and the entire system is controlled by a computer, which effectively utilizes the high monochromatic and high brightness of the laser. Features, eliminating imaging chromatic aberration, shortening exposure time; and overcoming laser speckle effect and chromatic aberration, aberration, and distortion in ordinary scanning imaging optical path, and can capture a large number of randomly distributed tiny objects with high fidelity. The invention has good imaging precision, high degree of automation, simple manufacturing process, short production cycle and low investment, and can be widely used in various high-precision micro-image photographic plate-making fields.

Description

激光粒度仪专用标准粒子样板制备方法Preparation method of standard particle sample for laser particle size analyzer

本发明属激光微粒尺寸测量技术领域,是一种激光粒度仪专用的标准粒子样板制备方法。The invention belongs to the technical field of laser particle size measurement, and relates to a method for preparing a standard particle template specially used for a laser particle size analyzer.

用激光Fraunhofer衍射原理测量微小粒子群体尺寸分布是国际上近年来迅速发展起来的一门新技术。使用该方法可以快速,精确地对大量微粒群体的尺寸分布(从几微米到几百微米)进行实时,非接触测量。该技术已在航空、航海、化工、医药、轻工、建材等国民经济很多领域获得广泛应用。相应于该测量方法的激光粒度仪市场上已有出售,如英国的MALVERNINSTRUMENTS PARTICLE SIZER。激光粒度仪在使用前必须定标,这是由于该仪器集光学、电子技术、计算机等高精技术为一体,其中任何一个环节调节不当均可引入一定测量误差。目前,国际上通用的定标方法是用激光粒度仪专用高精度标准粒子样板进行定标。例如美国的E.D.HIRLMAN教授(ARIZONA STATE UNIVERSITY)于1982年用计算机控制大型绘图仪制版,再结合大规模集成电路中光学掩膜技术研制成功一种标准粒子样板,用于激光粒度仪的定标测试。此方法需要计算机控制精密绘图仪和大规模集成电路中光刻掩膜和光学精缩等大型设备,投资昂贵,而且,制作样板周期长,工序繁琐,易引入误差,因而会影响标准粒子板的精度和应用范围。Using the laser Fraunhofer diffraction principle to measure the population size distribution of tiny particles is a new technology developed rapidly in the world in recent years. Using this method, real-time, non-contact measurements of the size distribution (from a few micrometers to hundreds of micrometers) of a large population of microparticles can be performed quickly and accurately. This technology has been widely used in many fields of national economy such as aviation, navigation, chemical industry, medicine, light industry and building materials. Laser particle size analyzers corresponding to this measurement method are already on the market, such as MALVERNINSTRUMENTS PARTICLE SIZER in the UK. The laser particle size analyzer must be calibrated before use. This is because the instrument integrates high-precision technologies such as optics, electronic technology, and computer. Improper adjustment of any link can introduce certain measurement errors. At present, the commonly used calibration method in the world is to use a high-precision standard particle template dedicated to the laser particle size analyzer for calibration. For example, Professor E.D. HIRLMAN (ARIZONA STATE UNIVERSITY) in the United States used a computer to control a large-scale plotter to make a plate in 1982, and combined with the optical mask technology in large-scale integrated circuits, he successfully developed a standard particle model for calibration testing of laser particle size analyzers. . This method requires computer-controlled precision plotters and large-scale equipment such as photolithography masks and optical shrinkage in large-scale integrated circuits. accuracy and range of application.

本发明的目的在于提供一种工艺操作简便、设备投资少、制作周期短、产品精度高的制备激光粒度仪定标专用的标准粒子样板的方法。The purpose of the present invention is to provide a method for preparing a standard particle template specially used for calibration of laser particle size analyzers, which is simple in process operation, low in equipment investment, short in production cycle and high in product precision.

本发明提出的制备激光粒度仪定标专用的标准粒子样板的方法,革新了原有方法的设计思想,使用了激光扫描,物孔成像等工艺,采用了新的光路设计,具体操作由微机控制,其方法的主要特点为:The method of preparing the standard particle template for laser particle size analyzer calibration proposed by the present invention innovates the design idea of the original method, uses laser scanning, object hole imaging and other processes, adopts a new optical path design, and the specific operation is controlled by a microcomputer , the main characteristics of its method are:

1.用高分辩率激光直接扫描照相底版;1. Direct scanning of photographic plates with high-resolution lasers;

2.在系统光路中设置了消激光相干性装置;2. A laser coherence elimination device is set in the system optical path;

3.照相底版根据粒子分布的要求,在微机的控制下作二维移动,同时保持激光成像光束始终处于系统光路的中心,以实现激光对底版的二维扫描。3. According to the requirements of particle distribution, the photographic plate moves two-dimensionally under the control of the microcomputer, while keeping the laser imaging beam always at the center of the optical path of the system, so as to realize the two-dimensional scanning of the plate by the laser.

本发明涉及的系统光路如图1所示。该系统依次包括激光器1,声光控制快门2,消激光相干装置3,小孔滤波器4,物孔屏5,物镜6,成像透镜7,照相底版8,快门开启电路9,物孔屏驱动电路10和照相底版驱动电路11。其中,激光器1采用功率为100mw以下的Be-Ne激光器,消相干装置是厚度为0.5~5.0mm以下的光学玻璃制作而成的毛玻璃,物孔屏5设有1~100个标准物孔,由小到大依次分行排列,便于换孔控制,物镜6的焦距f1为500~2000mm,成像透镜7的焦距f2为35~100mm,中央控制机采用AST/286微机12。The optical path of the system involved in the present invention is shown in FIG. 1 . The system includes laser 1, acousto-optic control shutter 2, laser coherence elimination device 3, pinhole filter 4, object hole screen 5, objective lens 6, imaging lens 7, photographic plate 8, shutter opening circuit 9, object hole screen drive Circuit 10 and photoplate drive circuit 11. Among them, the laser 1 adopts a Be-Ne laser with a power of less than 100mw, the decoherence device is ground glass made of optical glass with a thickness of 0.5-5.0mm or less, and the object-hole screen 5 is provided with 1-100 standard object holes. Arranged in rows from small to large, it is convenient to change hole control. The focal length f1 of the objective lens 6 is 500-2000 mm, and the focal length f2 of the imaging lens 7 is 35-100 mm. The central control machine adopts AST/286 microcomputer 12.

本发明的动作步骤如下:打开激光器1,由微机通过快门开启电路控制声光快门2,以获得成象光束的准确曝光。激光束经过消相干装置3,消相干装置3以50~3000转/分的速度旋转,控制光束的相干性,然后激光束经过小孔滤波器4,扩束成φ5~50mm的均匀照明高斯光束,照明物孔屏5的某一个标准孔,经过物镜6和成像透镜7,将物孔缩小10~100倍,最后成像于照相底版8上,底版由照相底版二维扫描驱动电路11驱动,由微机按随机地址(Xj,Yj)进行二维扫描。对应物孔屏上某一个直径的标准孔,曝光Ni次,这里i为不同直径粒子的排列序号,Ni为第i种粒子尺寸的粒子数,∑Ni=N为粒子板上获得的粒子总数。Ni的数字由预先选定的粒子分布形式决定。物孔屏上的某一个尺寸的标准孔对应于标准粒子板上某一种尺寸的粒子,变换物孔屏的位置,即换为另一个标准尺寸物孔,上述动作过程由微机作中央控制,按分时制分别送出下列有关指令:(对应于物孔屏上第i个标准孔):The action steps of the present invention are as follows: the laser device 1 is turned on, and the microcomputer controls the acousto-optic shutter 2 through the shutter opening circuit to obtain accurate exposure of the imaging beam. The laser beam passes through the decoherence device 3, and the decoherence device 3 rotates at a speed of 50-3000 rpm to control the coherence of the beam, and then the laser beam passes through the pinhole filter 4, and the beam is expanded into a uniformly illuminated Gaussian beam of φ5-50mm , to illuminate a certain standard hole of the object hole screen 5, through the objective lens 6 and the imaging lens 7, the object hole is reduced by 10 to 100 times, and finally imaged on the photographic master plate 8, which is driven by the photographic master plate two-dimensional scanning drive circuit 11, by The microcomputer performs two-dimensional scanning according to random addresses (X j , Y j ). Corresponding to a standard hole of a certain diameter on the object hole screen, exposure Ni times, where i is the sequence number of particles with different diameters, Ni is the number of particles of the i-th particle size, ∑Ni=N is the total number of particles obtained on the particle plate. The number of Ni is determined by the preselected particle distribution pattern. A standard hole of a certain size on the object hole screen corresponds to a certain size of particles on the standard particle plate, and changing the position of the object hole screen means changing to another standard size hole. The above-mentioned action process is centrally controlled by a microcomputer. Send the following relevant instructions respectively according to the time-sharing system: (corresponding to the i-th standard hole on the object hole screen):

(1)曝光数据指令,以1μs~5ms时间间隔打开声光开关,以获得成象光束的准确曝光并控制曝光次数Ni:(1) Exposure data command, turn on the acousto-optic switch at intervals of 1 μs to 5 ms to obtain accurate exposure of the imaging beam and control the number of exposures Ni:

(2)消相干参数设定指令,控制该装置转速在50~3000转/分范围之内,控制照明光的相干性:(2) Decoherence parameter setting command, control the speed of the device within the range of 50 to 3000 rpm, and control the coherence of the illumination light:

(3)照相底版随机地址二维扫描指令,控制小孔成象在照相底版上位置:(3) The two-dimensional scan instruction of the random address of the photographic plate controls the position of the pinhole image on the photographic plate:

(4)换物孔指令,即当上个孔曝光Ni次后,移动物孔屏,使下一个标准孔位于照明光路中。(4) Change object hole command, that is, after the previous hole is exposed Ni times, move the object hole screen so that the next standard hole is located in the illumination light path.

计算机控制程序根据选取粒子板上粒子分布函数的要求在确定各种参数后,可以方便地计算对应于各种尺寸微粒的粒子数及它们的随机地址,并按分时制自动控制整个系统完成标准粒子样板的二维扫描曝光的制版过程。程序框图如图2所示。The computer control program can easily calculate the number of particles corresponding to particles of various sizes and their random addresses after determining various parameters according to the requirements of the particle distribution function on the selected particle board, and automatically control the entire system to complete the standard particle size according to the time-sharing system. The plate making process of two-dimensional scanning exposure of the template. The program block diagram is shown in Figure 2.

如此重复上述步骤,直至各种尺寸的粒子全部成象于照相底版中。然后按全息底板标准冲洗工序进行显影,定影,水洗,即制得标准粒子样板的母板。The above steps are repeated in this way until all the particles of various sizes are imaged in the photographic negative plate. Then develop, fix, and wash according to the standard rinsing process of the holographic bottom plate, and then the master plate of the standard particle model is obtained.

标准粒子样板上的粒子分布根据设计要求选定。一般可以选择群体微粒最常见的一种尺寸分布,即Rosin-Rammler(简记为(R-R)分布函数):The particle distribution on the standard particle template is selected according to the design requirements. Generally, one of the most common size distributions of population particles can be selected, that is, Rosin-Rammler (abbreviated as (R-R) distribution function):

                 F=exp(-d/x)N F=exp(-d/x) N

式中F为直径大于d的粒子所占的体积比d为微粒直径,X为微粒的平均直径。N为R-R分布的指数,它代表了群体微粒尺寸分布弥散的程度,N愈大,尺寸分布愈集中。X和N是R-R分布的两个参数,因此具有X和N两个参数的R-R分布标准粒子样板可记为R-R-X-N。此外,也可以是单一尺寸分布,甚至可以是随机尺寸分布。In the formula, F is the volume ratio of particles with a diameter greater than d, d is the diameter of the particle, and X is the average diameter of the particle. N is the index of the R-R distribution, which represents the degree of dispersion of the particle size distribution of the population. The larger the N, the more concentrated the size distribution. X and N are two parameters of R-R distribution, so the standard particle template of R-R distribution with two parameters of X and N can be written as R-R-X-N. In addition, a single size distribution, or even a random size distribution is possible.

由本发明制得的标准粒子板可达到如下技术指标:The standard particle board made by the present invention can reach the following technical indicators:

粒子尺寸精度:≤3%;Particle size accuracy: ≤3%;

粒子位置精度:≤1%;Particle position accuracy: ≤1%;

粒子分布范围:φ3-50mm;粒子分布可以是R-R分布,可以是带上限的对数正态分布,或独立分布,或其它分布。由于本发明用高分辨率激光直接扫描底版,可成倍缩短制作标准粒子板的周期,一般只要2-4小时即可,而且可以省去计算机控制绘图仪及光学精缩设备,大大降低设备投资;由于在系统光路中设计了消激光相干装置,既可有效地利用激光高单色性,高亮度,消除成象色差,缩短曝光时间,又可使相干成象系统转化为非相干系统,消除了激光成象固有的散斑效应;由于扫描光路设计为照相底版计算机控制二维扫描形式,使成象光束始终处于系统光路中心,因而,从根本上消除了离轴光束的象差与畸变,可高保真地摄制大量随机分布的微小物粒(线度1~1000μ)。Particle distribution range: φ3-50mm; particle distribution can be R-R distribution, log-normal distribution with upper limit, or independent distribution, or other distributions. Because the present invention directly scans the plate with high-resolution laser, the cycle of making standard particle boards can be doubled, generally only 2-4 hours, and computer-controlled plotters and optical shrinking equipment can be saved, greatly reducing equipment investment ;Because the laser coherence elimination device is designed in the system optical path, it can not only effectively use the high monochromaticity and high brightness of the laser, eliminate the imaging chromatic aberration, shorten the exposure time, but also convert the coherent imaging system into an incoherent system, eliminating The inherent speckle effect of laser imaging is eliminated; because the scanning optical path is designed as a two-dimensional scanning form controlled by a photographic plate computer, the imaging beam is always in the center of the optical path of the system, thus fundamentally eliminating the aberration and distortion of the off-axis beam. It can capture a large number of randomly distributed tiny particles (line size 1-1000μ) with high fidelity.

由本发明制备的激光粒度仪专用定标标准粒子样板(记为A),在Malvern激光粒度仪上进行测试,与英国的Malvern标准粒子样板(记为B)测试数据对比如下:(粒子分布采用R-R-50-3.0)  参数   设计值              A板              B板     实测值     误差     实测值     误差   X     50μ     51.22μ     2.4%     53.27μ     6.5%   N     3.0     3.05     1.7%     3.07     3.07% 可见由本发明制备的样板性能已超过英国的Malvern标准粒子样板。The laser particle size analyzer special calibration standard particle sample plate (marked as A) prepared by the present invention is tested on the Malvern laser particle size analyzer, and compared with the Malvern standard particle sample plate (marked as B) test data of Britain as follows: (particle distribution adopts RR -50-3.0) parameter design value A board B board measured value error measured value error x 50μ 51.22μ 2.4% 53.27μ 6.5% N 3.0 3.05 1.7% 3.07 3.07% It can be seen that the performance of the template prepared by the present invention has surpassed the British Malvern standard particle template.

图1为本发明的计算机程序框图,图2为本发明系统光路图。Fig. 1 is a computer program block diagram of the present invention, and Fig. 2 is a system optical path diagram of the present invention.

Claims (4)

1, a kind of method for preparing the standard particle model of laser particle analyzer special use has been used laser scanning, thing hole imaging technique, and by the system controlled by computer operating process, it is characterized in that:
(1) with the direct scanography negative of high-resolution laser;
(2) in system light path, be provided with the laser coherence device that disappears;
(3) photographic film is done two-dimentional moving according to the requirement of distribution of particles under scan controller drives, and makes the laser imaging light beam be in the system light path center all the time, to realize the two-dimensional scan of laser beam to photographic film.
2, the method for preparation standard particle templet according to claim 1, it is characterized in that the system light path design is followed successively by laser instrument 1, acousto-optic control shutter 2, the laser coherence device 3 that disappears, small filter 4, thing hole screen 5, object lens 6, imaging len 7, photographic film 8, shutter opening circuit 9, thing hole screen driving circuit 10 and photographic film driving circuit 11.
3, the method for preparation standard particle templet according to claim 2 is characterized in that the eliminating coherence device is that a kind of thickness is the optics frosted glass of 0.5~5.0mm, and during work, rotating speed is controlled at 50~3000 rev/mins.
4, the method for preparation standard particle templet according to claim 2 is characterized in that the gauge orifice on the screen of thing hole is that 1~100 ascending branch arranges.
CN 94114047 1994-12-15 1994-12-15 Method for mfg. special standard particle templet for laser granulometer Expired - Fee Related CN1042856C (en)

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CN115629021A (en) * 2022-12-20 2023-01-20 合肥金星智控科技股份有限公司 Laser particle analyzer system, method of calibrating the same, medium, and computer apparatus

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