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CN104166254A - Method for measuring box thickness and pre-tilt angle of liquid crystal layers - Google Patents

Method for measuring box thickness and pre-tilt angle of liquid crystal layers Download PDF

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Publication number
CN104166254A
CN104166254A CN201410415863.5A CN201410415863A CN104166254A CN 104166254 A CN104166254 A CN 104166254A CN 201410415863 A CN201410415863 A CN 201410415863A CN 104166254 A CN104166254 A CN 104166254A
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CN
China
Prior art keywords
liquid crystal
tilt angle
effective display
crystal layer
display area
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201410415863.5A
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Chinese (zh)
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CN104166254B (en
Inventor
谢克成
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TCL China Star Optoelectronics Technology Co Ltd
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Shenzhen China Star Optoelectronics Technology Co Ltd
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Application filed by Shenzhen China Star Optoelectronics Technology Co Ltd filed Critical Shenzhen China Star Optoelectronics Technology Co Ltd
Priority to CN201410415863.5A priority Critical patent/CN104166254B/en
Priority claimed from CN201410415863.5A external-priority patent/CN104166254B/en
Priority to PCT/CN2014/086586 priority patent/WO2016026187A1/en
Publication of CN104166254A publication Critical patent/CN104166254A/en
Application granted granted Critical
Publication of CN104166254B publication Critical patent/CN104166254B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Liquid Crystal (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)

Abstract

The invention provides a method for measuring the box thickness and the pre-tilt angle of liquid crystal layers. The method comprises the following steps that (1), effective display areas (5) and a plurality of measuring areas (7) on the peripheries of the effective display areas (5) are correspondingly defined on an array substrate (1) and a color film substrate (3) respectively, and consistent patterns are manufactured on the effective display areas (5) and the measuring areas (7) respectively; (2), the array substrate (1) and the color film substrate (3) are respectively coated with a glue frame corresponding to the effective display areas (5) and the measuring areas (7), and liquid crystal is respectively dropped into the array substrate (1) and the color film substrate (3) corresponding to the effective display areas (5) and the measuring areas (7); (3), assembling, baking and the orientation manufacturing process of the array substrate (1) and the color film substrate (3) are completed; (4) the box thickness and the pre-tilt angle of the liquid crystal layers of the effective display areas (5) and the measuring areas (7) are measured, and measuring data are processed. According to the method, the box thickness and the pre-tilt angle of the liquid crystal layers can b accurately measured, the box thickness and the pre-tilt angle are effectively monitored, and product quality is guaranteed.

Description

Measure the thick method with tilt angle of liquid crystal layer box
Technical field
The present invention relates to technical field of liquid crystal display, relate in particular to a kind of thick method with tilt angle of liquid crystal layer box of measuring.
Background technology
Liquid crystal indicator (LCD, Liquid Crystal Display) has that fuselage is thin, power saving, the many merits such as radiationless, is widely used.As: LCD TV, mobile phone, personal digital assistant (PDA), digital camera, computer screen or notebook computer screen etc.
Conventionally liquid crystal indicator comprises housing, is located at the display panels in housing and is located at the backlight module (Backlight module) in housing.Wherein, display panels is mainly by a thin-film transistor array base-plate (Thin Film Transistor Array Substrate, TFT Array Substrate), a color membrane substrates (Color Filter, CF) and a liquid crystal layer (Liquid Crystal Layer) being disposed between two substrates form, its principle of work is to control the rotation of the liquid crystal molecule of liquid crystal layer by apply driving voltage on two sheet glass substrates, and the light refraction of backlight module is out produced to picture.
Box thick (Cell gap) is two important parameters that affect display panels performance with tilt angle (Pre angle).
The thick thickness that is disposed at the liquid crystal layer between array base palte and color membrane substrates of box, the reaction time of box thick transmittance and the liquid crystal that can affect display panels.In order to obtain high-contrast, high brightness, the display effect of high response speed, necessary strict control enclosure is thick, needs to ensure that box is thick evenly simultaneously, avoids liquid crystal display background color to change, and causes irregular colour.
In order to make Liquid Crystal Molecules Alignment more regular, be respectively arranged with at array base palte and color membrane substrates the polyimide (Polyimide crossing through friction treatment near a side of liquid crystal layer, PI) oriented film, acting force between branched group and liquid crystal molecule in PI oriented film is more intense, liquid crystal molecule is had to grappling effect, make liquid crystal molecule orientations on a certain polar angle with respect to PI oriented film surface tilt, this polar angle is exactly the tilt angle of liquid crystal layer.Tilt angle can be controlled the orientation of liquid crystal molecule, prevents the appearance on the anti-farmland of inclining in liquid crystal layer, also can affect to a certain extent the transmittance-voltage curve of liquid crystal layer, and suitable tilt angle can make threshold voltage reduce, and liquid crystal response speed is accelerated.
In display panels production run, need to measure with tilt angle box is thick.Conventionally display panels processing procedure need first be made motherboard of liquid crystal display: applying paste frame, injection liquid crystal on array base palte or color membrane substrates, pair array substrate and color membrane substrates carry out processing procedures such as group, baking, orientations again, complete the making of motherboard of liquid crystal display, finally motherboard of liquid crystal display is cut into the single display panels of multiple specific dimensions.Different from the thickness of each rete at color membrane substrates diverse location place owing to being positioned at array base palte in motherboard of liquid crystal display manufacturing process, cause Liquid crystal pour amount difference, easily cause the box of motherboard of liquid crystal display diverse location thick inconsistent with tilt angle, do not reach designing requirement.Traditional measuring box is thick only to be measured for the territory, effective display area of certain single display panels in motherboard of liquid crystal display with method tilt angle, but the film thickness uniformity of motherboard of liquid crystal display entirety is not good, easily generating box thick with tilt angle measure less than phenomenon, do not have effective supervisory function bit.Along with the requirement of the fineness to liquid crystal display product and show uniformity is more and more higher, use traditional measuring method can not meet Production requirement, and be unfavorable for the optimum permanent exploitation of liquid crystal display product.
Summary of the invention
The object of the present invention is to provide a kind of thick method with tilt angle of liquid crystal layer box of measuring, can measure more accurately the thick and tilt angle of the box of motherboard of liquid crystal display, carry out effective monitoring to box is thick with tilt angle, ensure product quality, be conducive to fast Development and the process control of product.
For achieving the above object, the invention provides a kind of thick method with tilt angle of liquid crystal layer box of measuring, comprise the following steps:
Step 1, on array base palte and color membrane substrates territory, corresponding definition effective display area and be positioned at the overseas several measured zone of enclosing in effective display area respectively, make respectively consistent pattern in territory, effective display area with measured zone;
Step 2, be coated with respectively gluing frame and splash into liquid crystal forming array territory, effective display area corresponding to color membrane substrates and the measured zone of pattern;
Step 3, by scribble glue frame and drip have the array of liquid crystal and color membrane substrates to complete group, baking, alignment manufacture process;
Step 4, territory, effective display area and measured zone are carried out respectively to the thick measurement with tilt angle of liquid crystal layer box, and measurement data is processed.
Space, territory, described effective display area arranges, and the area of described measured zone is less than the area in territory, effective display area.
Described measured zone be shaped as rectangle.
Described several measured zone is arranged at respectively between the surrounding and territory, adjacent two effective display area of array, color membrane substrates.
The edge that described step 2 is included in territory, described effective display area is coated with the first glue frame, and splashes into liquid crystal in this first glue frame; And be coated with the second glue frame in the edge of described several measured zone, and splash into liquid crystal in this second glue frame.
Be the liquid crystal of standard droplet size to the liquid crystal splashing in the second glue frame.
Described the first glue frame is coated on color membrane substrates or coats on array base palte; Described the second glue frame is coated on color membrane substrates or coats on array base palte.
Described step 4 is carried out the thick measurement with tilt angle of liquid crystal layer box by software set by measuring measured zone described in alignment lens.
In described step 1, thick to each tunic in the each processing procedure of array, live width, line-spacing and electric characteristics are measured.
Beneficial effect of the present invention: a kind of thick method with tilt angle of liquid crystal layer box of measuring of the present invention, by in effective display area overseas enclosing put several measured zone, and make respectively consistent pattern in territory, effective display area with measured zone, described measured zone is measured, can measure more accurately the thick and tilt angle of the box of liquid crystal layer, carry out effective monitoring to box is thick with tilt angle, ensure product quality, be conducive to fast Development and the process control of product.
In order further to understand feature of the present invention and technology contents, refer to following about detailed description of the present invention and accompanying drawing, but accompanying drawing only provide with reference to and explanation use, be not used for the present invention to be limited.
Brief description of the drawings
Below in conjunction with accompanying drawing, by the specific embodiment of the present invention is described in detail, will make technical scheme of the present invention and other beneficial effect apparent.
In accompanying drawing,
Fig. 1 is the process flow diagram that the present invention measures the thick method with tilt angle of liquid crystal layer box;
Fig. 2 is the schematic diagram that the present invention measures the step 3 of the thick method with tilt angle of liquid crystal layer box;
Fig. 3 is the schematic diagram that the present invention measures the step 4 of the thick method with tilt angle of liquid crystal layer box.
Embodiment
Technological means and the effect thereof taked for further setting forth the present invention, be described in detail below in conjunction with the preferred embodiments of the present invention and accompanying drawing thereof.
Refer to Fig. 1 to Fig. 3, the invention provides a kind of thick method with tilt angle of liquid crystal layer box of measuring, comprise the steps:
Step 1, on array base palte 1 and color membrane substrates 3 territory, corresponding definition effective display area 5 and be positioned at several measured zone 7 of 5 peripheries, territory, effective display area respectively, make respectively consistent pattern in territory, effective display area 5 with measured zone 7.
5 spaces, territory, described effective display area arrange, described several measured zone 7 is positioned at the periphery in territory, effective display area 5, under the prerequisite of display panels typesetting utilization factor maximization principle that does not affect final formation, the quantity of described several measured zone 7 is not limit, its setting position can be selected arbitrarily in the periphery in territory, effective display area 5, preferably, described several measured zone 7 is arranged at respectively between the surrounding and territory, adjacent two effective display area 5 of array, color membrane substrates 1,3.
The shape of described measured zone 7 is identical with the shape in territory, effective display area 5, is rectangle, but the area of described measured zone 7 is less than the area in territory, effective display area 5.
It is worth mentioning that, the territory, effective display area 5 that is set forth in make respectively consistent pattern with measured zone 7, refer to that the pattern that is positioned at described measured zone 7 is identical with the each rete structure of pattern that is positioned at territory, described effective display area 5, as described in being positioned at, the pattern of measured zone 7 comprises the retes such as grid, gate insulator, source/drain electrode, PI oriented film in array base palte 1 one sides; The pattern that is positioned at described measured zone 7 comprises the retes such as black matrix" (BM), optical filter (CF), PI oriented film in color membrane substrates 3 one sides, in other words, described measured zone 7 is equivalent to a miniature territory, effective display area 5, can apply described measured zone 7 thickness to each rete, live width, line-spacing, characteristic such as electrical in the each processing procedure of array and measure, be conducive to the character surveillance of processing procedure process.
Step 2, array and color membrane substrates 1,3 territories, corresponding effective display area 5 and the measured zone 7 that form pattern are coated with respectively to gluing frame and splash into liquid crystal.
Concrete, the edge that this step 2 is included in territory, described effective display area 5 is coated with the first glue frame 51, and splashes into liquid crystal in this first glue frame 51; And be coated with the second glue frame 71 in the edge of described measured zone 7, and splash into liquid crystal in this second glue frame 71.
Especially, it should be noted that, be the liquid crystal of standard droplet size to the liquid crystal splashing in the second glue frame 71, i.e. standard model liquid crystal.
Described the first glue frame 51 can be coated on color membrane substrates 3, also can coat on array base palte 1; Described the second glue frame is coated with 71 and can coats on color membrane substrates 3, also can coat on array base palte 1.
Step 3, by scribble glue frame and drip have the array of liquid crystal and color membrane substrates 1,3 to complete group, baking, alignment manufacture process.
Complete after this step 3, corresponding to territory, described effective display area, 6 places form effective display unit, are formed for measuring the thick measuring unit with tilt angle of liquid crystal layer box corresponding to described measured zone 7 places.
Step 4, territory, effective display area 5 and measured zone 7 are carried out respectively to the thick measurement with tilt angle of liquid crystal layer box, and measurement data is processed.
Concrete, this step 4 is carried out the thick measurement with tilt angle of liquid crystal layer box by software set by measuring measured zone 7 described in the measurement alignment lens of board.
Due to splash in measured zone 7 standard model liquid crystal can not there is not the thick phenomenon with tilt angle skew of liquid crystal layer box because of amount under each layer of membrane thickness unevenness of array and color membrane substrates 1,3, liquid crystal drop and liquid crystal diffusion uniformity problem, it is thick to liquid crystal layer box more accurate with measurement tilt angle to make, and can carry out effective monitoring with tilt angle to box is thick.
In sum, a kind of thick method with tilt angle of liquid crystal layer box of measuring of the present invention, by in effective display area overseas enclosing put several measured zone, and make respectively consistent pattern in territory, effective display area with measured zone, described measured zone is measured, can be measured more accurately the thick and tilt angle of the box of liquid crystal layer, carry out effective monitoring to box is thick with tilt angle, ensure product quality, be conducive to fast Development and the process control of product.
The above, for the person of ordinary skill of the art, can make other various corresponding changes and distortion according to technical scheme of the present invention and technical conceive, and all these changes and distortion all should belong to the protection domain of the claims in the present invention.

Claims (9)

1. measure the thick method with tilt angle of liquid crystal layer box, it is characterized in that, comprise the following steps:
Step 1, at array base palte (1) and color membrane substrates (3) upper territory, corresponding definition effective display area (5) respectively and be positioned at the peripheral several measured zone (7) in territory, effective display area (5), make respectively consistent pattern in territory, effective display area (5) with measured zone (7);
Step 2, the array and color membrane substrates (1, the 3) territories, corresponding effective display area (5) that form pattern are coated with respectively to gluing frame and splash into liquid crystal with measured zone (7);
Step 3, by scribble glue frame and drip have the array of liquid crystal and color membrane substrates (1,3) to complete group, baking, alignment manufacture process;
Step 4, territory, effective display area (5) and measured zone (7) are carried out respectively to the thick measurement with tilt angle of liquid crystal layer box, and measurement data is processed.
2. the thick method with tilt angle of measurement liquid crystal layer box as claimed in claim 1, it is characterized in that, space, territory, described effective display area (5) arranges, and the area of described measured zone (7) is less than the area of territory, effective display area (5).
3. the thick method with tilt angle of measurement liquid crystal layer box as claimed in claim 1, is characterized in that, described measured zone (7) be shaped as rectangle.
4. the thick method with tilt angle of measurement liquid crystal layer box as claimed in claim 1, it is characterized in that, described several measured zone (7) are arranged at respectively between the surrounding and territory, adjacent two effective display area (5) of array, color membrane substrates (1,3).
5. the thick method with tilt angle of measurement liquid crystal layer box as claimed in claim 1, it is characterized in that, the edge that described step 2 is included in territory, described effective display area (5) is coated with the first glue frame (51), and splashes into liquid crystal to (51) in this first glue frame; And be coated with the second glue frame (71) in the edge of described several measured zone (7), and splash into liquid crystal in this second glue frame (71).
6. the thick method with tilt angle of measurement liquid crystal layer box as claimed in claim 5, is characterized in that, is the liquid crystal of standard droplet size to the liquid crystal splashing in the second glue frame (71).
7. the thick method with tilt angle of measurement liquid crystal layer box as claimed in claim 5, is characterized in that, it is upper or coat on array base palte (1) that described the first glue frame (51) is coated color membrane substrates (3); Described the second glue frame (71) is coated color membrane substrates (3) above or is coated on array base palte (1).
8. the thick method with tilt angle of measurement liquid crystal layer box as claimed in claim 1, is characterized in that, described step 4 will be measured measured zone (7) described in alignment lens by software set and carry out the measurement of the thick and tilt angle of liquid crystal layer box.
9. the thick method with tilt angle of measurement liquid crystal layer box as claimed in claim 1, is characterized in that, in described step 1, thick to each tunic in the each processing procedure of array, live width, line-spacing and electric characteristics are measured.
CN201410415863.5A 2014-08-20 2014-08-20 Measure the thick method with tilt angle of liquid crystal layer box Expired - Fee Related CN104166254B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN201410415863.5A CN104166254B (en) 2014-08-20 Measure the thick method with tilt angle of liquid crystal layer box
PCT/CN2014/086586 WO2016026187A1 (en) 2014-08-20 2014-09-16 Method for measuring box thickness and pre-tilt angle of liquid crystal layer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410415863.5A CN104166254B (en) 2014-08-20 Measure the thick method with tilt angle of liquid crystal layer box

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CN104166254A true CN104166254A (en) 2014-11-26
CN104166254B CN104166254B (en) 2016-11-30

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Publication number Priority date Publication date Assignee Title
CN105445995A (en) * 2015-07-30 2016-03-30 友达光电股份有限公司 Liquid crystal display panel and method for manufacturing the same
CN106054442A (en) * 2016-08-18 2016-10-26 京东方科技集团股份有限公司 Display panel and cell gap test method thereof and display device
CN106200050A (en) * 2016-08-31 2016-12-07 深圳市华星光电技术有限公司 Liquid crystal display liquid crystal pretilt angle method for measurement and device
CN107065275A (en) * 2017-06-19 2017-08-18 深圳市华星光电技术有限公司 The preparation method of PSVA liquid crystal panels
CN108628021A (en) * 2018-06-22 2018-10-09 深圳市华星光电半导体显示技术有限公司 Manufacturing method, liquid crystal display panel and the liquid crystal display of liquid crystal display panel
CN109164614A (en) * 2018-10-25 2019-01-08 深圳市华星光电半导体显示技术有限公司 LCD alignment method and LCD alignment monitoring device
CN109828392A (en) * 2019-03-06 2019-05-31 深圳市华星光电技术有限公司 A kind of test method of liquid crystal display panel and its liquid crystal anchoring energy
CN110044277A (en) * 2019-04-04 2019-07-23 深圳市华星光电技术有限公司 Frame glue detection device and frame glue detection method
WO2020024404A1 (en) * 2018-08-01 2020-02-06 深圳市华星光电半导体显示技术有限公司 Mask plate, and manufacturing method for flexible liquid crystal display panel

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CN105445995B (en) * 2015-07-30 2019-04-02 友达光电股份有限公司 Liquid crystal display panel and method for manufacturing the same
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CN106054442B (en) * 2016-08-18 2019-04-09 京东方科技集团股份有限公司 Display panel and cell thickness test method thereof, and display device
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CN106200050B (en) * 2016-08-31 2019-07-23 深圳市华星光电技术有限公司 Liquid crystal display liquid crystal pretilt angle method for measurement and device
CN107065275A (en) * 2017-06-19 2017-08-18 深圳市华星光电技术有限公司 The preparation method of PSVA liquid crystal panels
CN108628021A (en) * 2018-06-22 2018-10-09 深圳市华星光电半导体显示技术有限公司 Manufacturing method, liquid crystal display panel and the liquid crystal display of liquid crystal display panel
CN108628021B (en) * 2018-06-22 2020-07-03 深圳市华星光电半导体显示技术有限公司 Manufacturing method of liquid crystal panel, liquid crystal panel and liquid crystal display
WO2020024404A1 (en) * 2018-08-01 2020-02-06 深圳市华星光电半导体显示技术有限公司 Mask plate, and manufacturing method for flexible liquid crystal display panel
CN109164614A (en) * 2018-10-25 2019-01-08 深圳市华星光电半导体显示技术有限公司 LCD alignment method and LCD alignment monitoring device
CN109164614B (en) * 2018-10-25 2021-10-15 深圳市华星光电半导体显示技术有限公司 Liquid crystal alignment method and liquid crystal alignment monitoring equipment
CN109828392A (en) * 2019-03-06 2019-05-31 深圳市华星光电技术有限公司 A kind of test method of liquid crystal display panel and its liquid crystal anchoring energy
CN110044277A (en) * 2019-04-04 2019-07-23 深圳市华星光电技术有限公司 Frame glue detection device and frame glue detection method

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