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CN104102008A - Light receiving device capable of increasing light receiving quantity and angle - Google Patents

Light receiving device capable of increasing light receiving quantity and angle Download PDF

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Publication number
CN104102008A
CN104102008A CN201410047276.5A CN201410047276A CN104102008A CN 104102008 A CN104102008 A CN 104102008A CN 201410047276 A CN201410047276 A CN 201410047276A CN 104102008 A CN104102008 A CN 104102008A
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light
integrating sphere
receiving
hole
glass plate
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陈正泰
李志宏
陈志伟
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HAUMAN TECHNOLOGIES CORP
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HAUMAN TECHNOLOGIES CORP
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Abstract

本发明涉及一种能增加收光量及角度的收光装置,包括一积分球及一支撑治具,其中该积分球为一中空的圆形球体,其内壁面均匀形成有一反射面,其外壁则设有一收光柱及至少一出光柱,该收光柱及该出光柱上分别开设有一收光孔及一出光孔,以与该积分球内之空间相连通;该支撑治具则包括一定位环及一透光玻板,该定位环能套接至该收光柱,该透光玻板则固设于该定位环的顶侧,以供支撑及放置一待测发光元件,使该待测发光元件产生的光线进入该积分球后,能投射至一光检测装置进行检测,如此,由于该待测发光元件能透过该透光玻板,定位于紧邻该收光孔的位置,故能有效增加该收光孔接收该待测发光元件产生的光线的收光量及收光角度,提升检测上的精确度。

The invention relates to a light-collecting device that can increase the amount and angle of light-collecting. It includes an integrating sphere and a supporting fixture. The integrating sphere is a hollow circular sphere, and its inner wall surface is uniformly formed with a reflective surface, and its outer wall is There is a light-collecting column and at least one light-emitting column. A light-collecting hole and a light-emitting hole are respectively provided on the light-collecting column and the light-emitting column to communicate with the space in the integrating sphere; the support fixture includes a positioning ring and a light-emitting hole. A light-transmitting glass plate, the positioning ring can be connected to the light-collecting column, and the light-transmitting glass plate is fixed on the top side of the positioning ring for supporting and placing a light-emitting element to be tested, so that the light-emitting element to be tested After the generated light enters the integrating sphere, it can be projected to a light detection device for detection. In this way, since the light-emitting element to be tested can pass through the light-transmitting glass plate and be positioned close to the light-collecting hole, it can effectively increase the number of The light-collecting hole receives the light-collecting amount and light-collecting angle of the light generated by the light-emitting element to be tested, thereby improving detection accuracy.

Description

能增加收光量及角度的收光装置Light receiving device that can increase the amount and angle of light received

技术领域technical field

本发明涉及一种能增加收光量及角度的收光装置,尤指在一积分球的收光柱上装设一支撑治具,令一待测发光元件能被定位于邻近该收光柱的位置,以增加该积分球收光量及角度的收光装置。The invention relates to a light-receiving device capable of increasing the amount and angle of light-receiving, especially a support jig is installed on the light-receiving column of an integrating sphere, so that a light-emitting element to be tested can be positioned adjacent to the light-receiving column, so as to A light-collecting device that increases the amount and angle of light received by the integrating sphere.

背景技术Background technique

发光二极管(Light-Emitting Diode,LED)是一种于通电后能产生光亮的半导体电子元件,相较于传统的照明用具,发光二极管具有效率高、成本低、反应速度快且使用寿命长的优点,故近年来开始被大量应用在交通号志、照明器具、显示面板甚至光通讯等领域上,成为经济发展及科技研发上极具影响力的关键技术之一。Light-emitting diode (Light-Emitting Diode, LED) is a semiconductor electronic component that can produce light after being powered on. Compared with traditional lighting appliances, light-emitting diodes have the advantages of high efficiency, low cost, fast response and long service life. Therefore, in recent years, it has been widely used in the fields of traffic signals, lighting equipment, display panels and even optical communications, and has become one of the most influential key technologies in economic development and technology research and development.

发光二极管中主要发光的元件为晶粒(crystal grain),由于晶粒的发光亮度、波长、色温及操作电压等特性会因加工条件上的些微差异而有所不同,且即便是由同一片晶圆(wafer)切割而成的晶粒,其发光特性亦并不完全相同,因此,在业者将晶圆切割成多个晶粒后,切割下来的晶粒尚须经过一检测程序,以根据晶粒的主波长、发光强度、光通亮、色温、工作电压、反向击穿电压等特性参数进行分级后,再将不同等级的晶粒应用于适合的领域中。The main light-emitting element in the light-emitting diode is the crystal grain. Because the characteristics of the grain, such as luminous brightness, wavelength, color temperature and operating voltage, will vary due to slight differences in processing conditions, and even if it is made of the same crystal grain The luminescent characteristics of the crystal grains cut from a wafer are not exactly the same. Therefore, after the industry cuts the wafer into multiple crystal grains, the cut crystal grains still have to go through a testing procedure to determine the After grading the main wavelength, luminous intensity, luminous flux, color temperature, operating voltage, reverse breakdown voltage and other characteristic parameters of the grains, the grains of different grades are applied to suitable fields.

一般而言,现今业者在进行检测程序时,多使用积分球(Integrating Sphere),积分球一种理想的光学扩散器,其构形为一中空球体,且内部涂布有高稳定度、高反射率的一反射层(如:硫酸钡),以在其内部形成一无光害的空间,确保光线投射至该积分球内后,不会受到其他光源的光害影响,进而降低因光线形状、发散角度及不同检测位置的响应度所造成的检测误差,使得检测结果更为可靠。请参阅图1所示,为一种公知检测装置1的结构,该检测装置1包括一积分球11及一点测探针12,该积分球11上设有一收光柱111及二出光柱112,该收光柱111及出光柱112分别开设有开孔,以连通至该积分球11内的空间,该出光柱112分别与一光纤13及一光检测器14相连接;该点测探针12经由一点测装置(图中未示)定位于对应该收光柱111的位置,且该点测探针12下方呈放有一发光二极管的晶粒10。在进行检测时,该点测探针12能朝下位移,以分别电气连接至该晶粒10的接脚,令该晶粒10投射出光线,使该发光二极管的晶粒10发出的光线投射至该积分球11内部后,再通过该光纤13与光检测器14,检测该发光二极管的晶粒10的特性参数。Generally speaking, today's industry uses integrating spheres (Integrating Sphere) when performing inspection procedures. Integrating spheres are an ideal optical diffuser. Its configuration is a hollow sphere, and the interior is coated with high stability and high reflection. A high-efficiency reflective layer (such as barium sulfate) to form a light-pollution-free space inside to ensure that the light will not be affected by light pollution from other light sources after it is projected into the integrating sphere, thereby reducing the light pollution due to light shape, The detection error caused by the divergence angle and the responsivity of different detection positions makes the detection result more reliable. See also shown in Fig. 1, be a kind of structure of known detection device 1, this detection device 1 comprises an integrating sphere 11 and a point measuring probe 12, this integrating sphere 11 is provided with a light-receiving column 111 and two light-emitting columns 112, the The light-receiving column 111 and the light-emitting column 112 are respectively provided with openings to communicate with the space in the integrating sphere 11. The light-emitting column 112 is respectively connected with an optical fiber 13 and a photodetector 14; The measuring device (not shown in the figure) is positioned at the position corresponding to the light-receiving column 111, and the die 10 with a light-emitting diode is placed under the spot measuring probe 12. When testing, the spot probe 12 can be displaced downwards to be electrically connected to the pins of the die 10 respectively, so that the die 10 can project light, and the light emitted by the die 10 of the light-emitting diode can be projected. After reaching the inside of the integrating sphere 11 , the characteristic parameters of the crystal grain 10 of the LED are detected through the optical fiber 13 and the photodetector 14 .

该晶粒10投射出的光线能在该积分球11中反射、漫射,而形成极为均匀地光束,被该光纤13及该光检测器14接收,有效地避免了各种可能造成误差的干扰因素。然而,实际上在进行检测程序时,通过该检测装置1所检测出的光线数据,仍无法理想地完全反应出该晶粒10的真正特性,现分别详述其理由及该检测装置1的缺陷如下:The light projected by the crystal grain 10 can be reflected and diffused in the integrating sphere 11 to form a very uniform light beam, which is received by the optical fiber 13 and the photodetector 14, effectively avoiding various interferences that may cause errors factor. However, in practice, the light data detected by the detection device 1 cannot fully reflect the real characteristics of the crystal grain 10 ideally during the detection process. The reasons and the defects of the detection device 1 are now described in detail. as follows:

(1)晶粒10与收光柱111间的距离:由于该晶粒10必须经由该点测探针12来通电驱动,故该晶粒10与该收光柱111间必然存在着一间隔距离D1,因此,该晶粒10投射出的光线并无法在不受外界干扰的情况下,理想地投射至该积分球11中,且该晶粒10在投射出光线时,尚具有一预定的投射角度A,若该投射角度A较大或该间隔距离D1过长,则该光线在经过该间隔距离D1后,必然会有部分的光线无法顺利被该收光柱111收集,而影响在测量上的精准度。(1) The distance between the crystal grain 10 and the light receiving column 111: since the crystal grain 10 must be energized and driven through the spot measuring probe 12, there must be a distance D1 between the crystal grain 10 and the light receiving column 111, Therefore, the light projected by the crystal grain 10 cannot be ideally projected into the integrating sphere 11 without external interference, and the crystal grain 10 still has a predetermined projection angle A when projecting light. , if the projection angle A is large or the distance D1 is too long, after the light passes through the distance D1, part of the light cannot be collected by the light-receiving column 111, which will affect the accuracy of measurement .

(2)收光柱111上开孔的孔径大小:如前所述,由于该收光柱111与该晶粒10间具有该间隔距离D1,故在进行检测时,该收光柱111上的开孔必然需设计成远较该晶粒10为大,如此,才能尽可能地避免光线经该投射角度A扩散后,无法全部进入该积分球11的问题,然而,在该收光柱111的开孔与该晶粒10并不匹配的情况下,该晶粒10投射出的光线于该积分球11内反射与漫射后,尚可能会由该收光柱111射出,造成该积分球内原应完全密闭的检测环境被破坏,进而影响到检测上的精准性。(2) Aperture size of the opening on the light receiving column 111: As mentioned above, since the distance D1 exists between the light receiving column 111 and the crystal grain 10, the opening on the light receiving column 111 must be It needs to be designed to be far larger than the crystal grain 10, so as to avoid the problem that the light cannot all enter the integrating sphere 11 after being diffused through the projection angle A. However, the opening of the light receiving column 111 and the When the crystal grains 10 do not match, the light projected by the crystal grains 10 may be emitted by the light receiving column 111 after being reflected and diffused in the integrating sphere 11, resulting in a completely airtight detection system in the integrating sphere. The environment is destroyed, which affects the accuracy of detection.

因此,如何对公知的检测装置进行改良,以解决过去在进行检测程序时,晶粒10产生的光线无法完全地进入该积分球11,且该积分球11中经反射及漫射后的光线,尚可能由该收光柱111散漏至外界的问题,即成为本发明在此亟欲解决的重要问题。Therefore, how to improve the known detection device to solve the problem that the light generated by the crystal grain 10 cannot completely enter the integrating sphere 11 during the detection process in the past, and the reflected and diffused light in the integrating sphere 11, The problem that the light receiving column 111 may leak to the outside becomes an important problem that the present invention wants to solve here.

发明内容Contents of the invention

有鉴于公知检测装置在进行检测程序时,积分球的收光量受限于晶粒的收光角度影响的问题,发明人凭借着多年的实务经验,在不断地研究、测试及改良后,终于设计出一种能增加收光量及角度的收光装置,期能解决公知检测装置的诸多问题。In view of the problem that the amount of light received by the integrating sphere is limited by the angle of light received by the crystal grains when performing the detection procedure of the known detection device, the inventor finally designed the A light-receiving device capable of increasing the amount and angle of light-receiving is proposed, which is expected to solve many problems of the known detection device.

本发明的目的,是提供一种能增加收光量及角度的收光装置,所述收光装置包括一积分球及一支撑治具,其中所述积分球为一中空的圆形球体,所述积分球的内壁表面均匀涂布或形成有一反射面,所述积分球的外壁开设有一收光孔及至少一出光孔,所述收光孔及出光孔分别与所述积分球内的空间相连通;所述支撑治具包括一定位环及一透光玻板,其中所述定位环能固设至所述积分球上对应于所述收光孔的位置,并与所述积分球结合成一体,所述透光玻板固设在所述定位环的顶侧,以在所述定位环与所述积分球结合成一体时,所述透光玻板能对应于所述收光孔。如此,由于所述待测发光元件直接被置放在所述透光玻板上紧邻该收光孔的位置,故能有效缩减所述积分球与待测发光元件的间隔距离,避免所述待测发光元件产生的光线经一发光角度扩散后,无法完全进入所述积分球的问题,以确保所述待测发光元件在发光角度范围内所产生的所有光线,均能经由反射面均匀反射及漫射,再经由所述出光孔射出,有效改善所述光检测装置对所述待测发光元件的量测准确度。The object of the present invention is to provide a light-receiving device capable of increasing the light-receiving amount and angle, the light-receiving device includes an integrating sphere and a supporting jig, wherein the integrating sphere is a hollow circular sphere, the The surface of the inner wall of the integrating sphere is evenly coated or formed with a reflective surface, and the outer wall of the integrating sphere is provided with a light receiving hole and at least one light outlet hole, and the light receiving hole and the light outlet hole are respectively connected with the space in the integrating sphere ; The supporting fixture includes a positioning ring and a light-transmitting glass plate, wherein the positioning ring can be fixed to the position corresponding to the light receiving hole on the integrating sphere, and integrated with the integrating sphere , the light-transmitting glass plate is fixed on the top side of the positioning ring, so that when the positioning ring and the integrating sphere are integrated, the light-transmitting glass plate can correspond to the light receiving hole. In this way, since the light-emitting element to be tested is directly placed on the light-transmitting glass plate adjacent to the light-receiving hole, the distance between the integrating sphere and the light-emitting element to be tested can be effectively reduced, and the light-emitting element to be tested can be avoided. The problem that the light generated by the light-emitting element under test cannot completely enter the integrating sphere after being diffused through a light-emitting angle, so as to ensure that all the light generated by the light-emitting element to be tested within the range of the light-emitting angle can be uniformly reflected by the reflective surface and Diffused, and then emitted through the light exit hole, effectively improving the measurement accuracy of the light detection device for the light-emitting element to be tested.

在优选的实施方式中,所述透光玻板面对所述收光孔的一侧表面上,除中央对应于供支撑及放置所述待测发光元件的部位形成有一透光检测区外,其余部位均涂布有一反光层,以形成一不透光反射区,所述透光检测区的构形对应于所述待测发光元件的大小。In a preferred embodiment, on the surface of the light-transmitting glass plate facing the light-receiving hole, a light-transmitting detection area is formed in the center corresponding to the position for supporting and placing the light-emitting element to be tested. The rest of the parts are coated with a light-reflecting layer to form an opaque reflection area, and the configuration of the light-transmitting detection area corresponds to the size of the light-emitting element to be tested.

如此,由于所述透光检测区的构形对应于所述待测发光元件的大小,故在一点测探针对所述待测发光元件施加电流,进行点测时,所述待测发光元件所产生的光线,除了会在所述积分球内被所述反射面均匀地反射及漫射外,尚会因所述不透光反射区的辅助,被反射回所述积分球内,直到形成均匀光强,经由所述出光孔,射出所述积分球外为止,以降低反射及漫射光由所述收光孔散失的程度。In this way, since the configuration of the light-transmitting detection area corresponds to the size of the light-emitting element to be tested, the light-emitting element to be tested will be The generated light, in addition to being uniformly reflected and diffused by the reflective surface in the integrating sphere, will also be reflected back into the integrating sphere with the assistance of the opaque reflection area until forming Uniform light intensity passes through the light exit hole until it exits the integrating sphere, so as to reduce the degree of reflection and diffuse light lost from the light collection hole.

附图说明Description of drawings

图1是公知的检测装置示意图;Fig. 1 is a schematic diagram of a known detection device;

图2是本发明的收光装置的立体示意图;Fig. 2 is a schematic perspective view of the light receiving device of the present invention;

图3A是本发明的收光装置的作动示意图;及3A is a schematic diagram of the operation of the light receiving device of the present invention; and

图3B是本发明的收光装置的作动示意图。FIG. 3B is a schematic diagram of the operation of the light receiving device of the present invention.

主要元件标号说明Description of main components

收光装置      ………       2Light receiving device ……… 2

积分球        ………       21Integrating sphere ……… 21

反射面        ………       210Reflective surface ......... 210

收光柱        ………       211Receiving Pillar ……… 211

收光孔        ………       211aLight receiving hole ......... 211a

出光柱        ………       212Light Pillar ......... 212

出光孔        ………       212aLight exit hole ......... 212a

支撑治具      ………       22Support fixtures ……… 22

定位环        ………       221Locating ring ......... 221

定位空间      ………       221aPositioning space ......... 221a

嵌合元件      ………       221bFitting elements ......... 221b

透光玻板      ………       222Translucent glass plate ……… 222

点测探针      ………       30Point probe ......... 30

待测发光元件  ………       LLight-emitting element to be tested ……… L

透光检测区    ………       F1Translucent detection area ………… F1

不透光反射区  ………       F2Opaque reflection area ……… F2

发光角度      ………       θBeaming Angle                                

密封元件      ………       MSealing element ……… M

厚度          ………       D2Thickness ......... D2

具体实施方式Detailed ways

为了对本发明的技术特征、目的和效果有更加清楚的理解,现结合附图进一步说明本发明的具体实施方式。In order to have a clearer understanding of the technical features, purposes and effects of the present invention, the specific implementation manners of the present invention will be further described in conjunction with the accompanying drawings.

本发明是一种能增加收光量及角度的收光装置,请参阅图2及图3A所示,为本发明的第一较佳实施例,该收光装置2包括一积分球21及一支撑治具22,该积分球21的构形为一中空的球状体,其内壁面上均匀涂布或形成有一反射面210,其外壁上则凸设有一收光柱211及至少一出光柱212(该出光柱212的数量可依业者实际的检测方式调整),该收光柱211的中央开设有一收光孔211a,各出光柱212的中央则分别开设有一出光孔212a,且该收光孔211a及出光孔212a与该积分球21内部的空间相连通。The present invention is a light-receiving device that can increase the light-receiving amount and angle. Please refer to Fig. 2 and Fig. 3A, which is the first preferred embodiment of the present invention. The light-receiving device 2 includes an integrating sphere 21 and a support Fixture 22, the configuration of the integrating sphere 21 is a hollow spherical body, its inner wall surface is evenly coated or formed with a reflective surface 210, and its outer wall is protruded with a light-receiving column 211 and at least one light-emitting column 212 (the The number of light-emitting columns 212 can be adjusted according to the actual detection method of the industry), the center of the light-receiving column 211 is provided with a light-receiving hole 211a, and the center of each light-emitting column 212 is respectively provided with a light-emitting hole 212a, and the light-receiving hole 211a and the light-emitting The hole 212a communicates with the space inside the integrating sphere 21 .

该支撑治具22包括一定位环221及一透光玻板222,该定位环221面向该积分球21的底侧内缘开设有一定位空间221a,该定位空间221a的构形与该收光柱211的构形相匹配,以能套接于该收光柱211上,且该定位环221上尚活动地设有多个嵌合元件221b,令使用者能透过转动各嵌合元件221b的一端,使该嵌合元件221b的另一端迫紧至该收光柱211的周缘,让该定位环221与该收光柱211结合成一体;该透光玻板222固设于该定位环221远离该收光柱211的顶侧,以能透过该定位环221,定位至对应于该收光孔211a的位置,使外界的光线能依序通过该透光玻板222及该收光孔211a,进入该积分球21中。The support fixture 22 includes a positioning ring 221 and a light-transmitting glass plate 222. The positioning ring 221 faces the inner edge of the bottom side of the integrating sphere 21 to provide a positioning space 221a. The configuration of the positioning space 221a is similar to that of the light receiving column 211 The configuration of the ring 221 is matched with the shape of the light receiving column 211, and the positioning ring 221 is movably provided with a plurality of fitting elements 221b, so that the user can turn one end of each fitting element 221b to make the The other end of the fitting element 221b is pressed to the periphery of the light-receiving column 211, so that the positioning ring 221 and the light-receiving column 211 are integrated; to pass through the positioning ring 221 and be positioned at the position corresponding to the light receiving hole 211a, so that the light from the outside can pass through the light-transmitting glass plate 222 and the light receiving hole 211a in sequence and enter the integrating sphere 21 in.

发明人根据多年来的实务经验,发现公知的检测装置之所以具有过大的检测误差,其主要原因在于过去在执行检测程序时,发光二极管的晶粒必须先置放于一检测平台上,再透过一点测装置逐一驱动发光二极管的晶粒发亮,由此可知,该点测装置所占据的空间,即为检测误差的主要来源,因此,请参阅图3A所示,本发明的收光装置2的一设计重点,即利用该透光玻板222,作为可直接承载一待测发光元件L(如:发光二极管的晶粒)的支撑面,令该待测发光元件L能透过该透光玻板222,紧贴于该收光柱211上,据此,即可确保该待测发光元件L的光线能完全投射于该积分球21中。在进行检测程序时,业者能在各出光柱212上分别连接装设一光检测器(图中未示);或在各该出光柱212上装设一密封元件M(如:密封盖或反射板),由于光检测器的结构并非本发明的保护重点,故在图3A及3B中,仅绘制二密封元件M装设于该积分球21的态样,以期能清楚呈现出该积分球21的内部构形,在此一并说明。Based on many years of practical experience, the inventor has found that the reason why the known detection device has too large detection error is that the main reason is that in the past, when performing the detection procedure, the crystal grains of the light-emitting diode must first be placed on a detection platform, and then The crystal grains of the light-emitting diodes are driven to light up one by one through the point measuring device. It can be seen that the space occupied by the point measuring device is the main source of detection errors. Therefore, please refer to FIG. A key point of the design of the device 2 is to use the light-transmitting glass plate 222 as a supporting surface that can directly carry a light-emitting element L (such as: a crystal grain of a light-emitting diode) to be tested, so that the light-emitting element L to be tested can pass through the light-emitting element L. The light-transmitting glass plate 222 is closely attached to the light-receiving column 211 , thereby ensuring that the light of the light-emitting element L to be tested can be completely projected into the integrating sphere 21 . When carrying out the detection procedure, the industry can connect and install a photodetector (not shown) on each light-emitting column 212 respectively; ), since the structure of the photodetector is not the focus of protection of the present invention, in Figures 3A and 3B, only the appearance of the two sealing elements M installed on the integrating sphere 21 is drawn, in order to clearly show the shape of the integrating sphere 21 The internal configuration is explained together here.

请参阅图2至图3B所示,在本实施例中,该收光装置2配合一点测装置(图中未示),对该待测发光元件L进行检测,该点测装置的一点测探针30定位于该收光装置2的上方,且能活动地进行上下位移,由于该点测探针30设于该支撑治具22远离该积分球21的方向,故该点测探针30的占用空间并不会影响该收光装置2于检测上的精确度。在该点测探针30分别电气连接至该待测发光元件L的接脚时,该待测发光元件L将能被通电驱动,并产生出光线,且该光线能经由该收光孔211a,射入该积分球21内,随后,光线会在该积分球21内被该反射面均匀地反射及漫射,以在该积分球21内形成均匀的光强分布,再经由该出光孔212a,射出该积分球21外,使该光检测装置能由该出光孔212a,检测到非常均匀的漫射光束,并据以对该待测发光元件L进行检测。Please refer to Fig. 2 to Fig. 3B, in this embodiment, the light receiving device 2 cooperates with a point measuring device (not shown in the figure) to detect the light-emitting element L to be tested, and the point detecting device of the point measuring device The needle 30 is positioned above the light receiving device 2, and can move up and down. Since the spot measuring probe 30 is arranged in the direction away from the integrating sphere 21 of the support jig 22, the point measuring probe 30 The occupied space will not affect the detection accuracy of the light receiving device 2 . When the measuring probes 30 are respectively electrically connected to the pins of the light-emitting element L to be tested, the light-emitting element L to be tested will be powered and driven to generate light, and the light can pass through the light receiving hole 211a, Into the integrating sphere 21, then the light will be evenly reflected and diffused by the reflective surface in the integrating sphere 21 to form a uniform light intensity distribution in the integrating sphere 21, and then pass through the light exit hole 212a, Out of the integrating sphere 21, the light detection device can detect a very uniform diffused light beam through the light exit hole 212a, and detect the light-emitting element L to be tested accordingly.

承上,在本发明的第一较佳实施例中,该透光玻板222面对该收光孔211a的表面上,除中央对应于该待测发光元件L的部位形成有一透光检测区F1外,其余部位均涂布有一反光层,以形成一不透光反射区F2,且该透光检测区F1的构形对应于该待测发光元件L的大小。如此,在该点测探针30当对该待测发光元件L施加电流,进行点测时,该待测发光元件L所产生的光线,在依序通过该透光玻板222及该收光孔211a,射入该积分球21后,除了会在该积分球21内被该反射面均匀地反射及漫射外,尚会因该不透光反射区F2的辅助,被反射回该积分球21内,继续被该反射面反射及漫射,直到形成均匀光强,经由该出光孔212a,射出该积分球21外为止,故能大幅降低反射及漫射光由该收光孔211a散失的程度。As mentioned above, in the first preferred embodiment of the present invention, on the surface of the light-transmitting glass plate 222 facing the light-receiving hole 211a, a light-transmitting detection area is formed except for the central portion corresponding to the light-emitting element L to be tested. Except for F1, the remaining parts are coated with a reflective layer to form an opaque reflection area F2, and the configuration of the light-transmitting detection area F1 corresponds to the size of the light-emitting element L to be tested. In this way, when the spot measuring probe 30 applies current to the light-emitting element L to be tested for point measurement, the light generated by the light-emitting element L to be tested passes through the transparent glass plate 222 and the light-receiving element in sequence. After the hole 211a is injected into the integrating sphere 21, in addition to being uniformly reflected and diffused by the reflecting surface in the integrating sphere 21, it will also be reflected back to the integrating sphere with the aid of the opaque reflection area F2 21, continue to be reflected and diffused by the reflective surface until a uniform light intensity is formed, and then exit the integrating sphere 21 through the light exit hole 212a, so the degree of reflection and diffused light being lost by the light receiving hole 211a can be greatly reduced .

请参阅图1、2、3B所示,比较公知检测装置1与本发明的收光装置2后可明显看出,利用该收光装置2进行检测时,该待测发光元件L与该积分球21间的距离仅为该透光玻板222的厚度D2,该厚度D2不仅远较图1中的间隔距离D1为短,且由于该透光玻板222贴设于该收光柱211上,故该待测发光元件L产生的光线并无需先穿过外界空气,再进入该积分球21,据此,即能确保光线不会受到外界的干扰,并提升检测上的精准度,此外,该待测发光元件L产生的光线虽具有一发光角度θ,然而,由于该透光玻板222紧邻该收光孔211a及该透光检测区F1,故该待测发光元件L产生的光线在进入积分球21后,会随着该发光角度θ扩散,意即,本发明的收光装置2能确保该待测发光元件L产生的光线完全地投射至该积分球21中,令该积分球21的收光量比公知检测装置大,同时,还能完善地解决收光角度的问题。1, 2, and 3B, after comparing the known detection device 1 with the light-receiving device 2 of the present invention, it can be clearly seen that when the light-receiving device 2 is used for detection, the light-emitting element L to be tested and the integrating sphere The distance between 21 is only the thickness D2 of the light-transmitting glass plate 222, which is not only far shorter than the distance D1 in FIG. The light generated by the light-emitting element L to be tested does not need to pass through the outside air before entering the integrating sphere 21. Accordingly, it can ensure that the light will not be disturbed by the outside world and improve the accuracy of detection. In addition, the to-be-tested Although the light generated by the light-emitting element L under test has a light-emitting angle θ, however, since the light-transmitting glass plate 222 is adjacent to the light-receiving hole 211a and the light-transmitting detection area F1, the light generated by the light-emitting element L to be tested enters the integral After the sphere 21, it will diffuse with the luminous angle θ, that is, the light receiving device 2 of the present invention can ensure that the light generated by the light-emitting element L to be tested is completely projected into the integrating sphere 21, so that the light of the integrating sphere 21 The amount of received light is larger than that of the known detection device, and at the same time, the problem of the received light angle can be perfectly solved.

在此要特别一提的是,图2中所绘制的积分球21,其收光孔211a开设于该收光柱211上,但是,在实际施作上,该收光孔211a亦能直接开设于该积分球21的外壁上,而无须透过该收光柱211。业者仅需将该定位环221的底侧设计成与该积分球21上对应于该收光孔211a的部位相匹配(如:一弧状凹面,以贴合至该积分球21上,或使该定位环221能嵌设于该积分球21上的一嵌卡槽中),则也能密闭地固设于该积分球21上对应于该收光孔211a的位置。此外,在本发明的第一较佳实施例中,该定位环221透过该等嵌合元件221b,迫紧于该出光柱212的外缘,且该透光玻板222直接固设(如:以粘胶固定)于该定位环221的顶面,但是,在本发明的其他较佳实施例中,该定位环221及该透光玻板222的定位方式并不以前述的方法为限,该定位环221尚可使用嵌卡、螺合等方式,与该收光柱211结合成一体,且该透光玻板222也能以套合或嵌卡的方式,固设于该定位环221上。It should be particularly mentioned here that the light receiving hole 211a of the integrating sphere 21 drawn in FIG. on the outer wall of the integrating sphere 21 without passing through the light-receiving rod 211 . The operator only needs to design the bottom side of the positioning ring 221 to match the position corresponding to the light receiving hole 211a on the integrating sphere 21 (such as: an arc-shaped concave surface to be attached to the integrating sphere 21, or to make the integrating sphere 21 The positioning ring 221 can be embedded in an inserting groove on the integrating sphere 21 ), and can also be airtightly fixed on the integrating sphere 21 at a position corresponding to the light receiving hole 211a. In addition, in the first preferred embodiment of the present invention, the positioning ring 221 is pressed against the outer edge of the light emitting column 212 through the fitting elements 221b, and the transparent glass plate 222 is directly fixed (such as : fixed with glue) on the top surface of the positioning ring 221, however, in other preferred embodiments of the present invention, the positioning method of the positioning ring 221 and the light-transmitting glass plate 222 is not limited to the aforementioned method The positioning ring 221 can still be integrated with the light-receiving column 211 by inserting, screwing, etc., and the light-transmitting glass plate 222 can also be fixed on the positioning ring 221 by fitting or inserting. superior.

此外,在前述实施例中,该透光玻板222通过反射层,区分为透光检测区F1及不透光反射区F2,但是,业者亦能直接使用不同材料制作该透光玻板222,意即,业者能使用透光材料制成该透光玻板222上透光检测区F1,并使用整块的不透光反射材料制作该不透光反射区F2,如此,也能达成相同的效果。此外,在前述实施例中,该反射层的材质与该积分球21中反射面210的材质相同,以达成较佳的检测效果,但是,实际施作上,该反射层的材质仍可依业者的需求进行调整。In addition, in the aforementioned embodiments, the transparent glass plate 222 is divided into the light-transmitting detection area F1 and the opaque reflection area F2 through the reflective layer. However, the industry can also directly use different materials to make the light-transmitting glass plate 222. That is, the industry can use a light-transmitting material to make the light-transmitting detection area F1 on the light-transmitting glass plate 222, and use a whole piece of light-impermeable reflective material to make the light-impermeable reflective area F2. In this way, the same effect can also be achieved. Effect. In addition, in the aforementioned embodiments, the material of the reflective layer is the same as that of the reflective surface 210 in the integrating sphere 21 to achieve a better detection effect. However, in practice, the material of the reflective layer can still be determined by the industry. needs to be adjusted.

以上所述仅为本发明的若干较佳实施例,但是,本发明的技术方案并不局限于此,凡相关技术领域的人士,在参酌本发明的技术内容后所能轻易思及的等效变化,均应不脱离本发明的保护范畴。The above descriptions are only some preferred embodiments of the present invention, but the technical solutions of the present invention are not limited thereto. Those in the relevant technical field can easily think of equivalents after considering the technical contents of the present invention. Changes should not depart from the scope of protection of the present invention.

Claims (4)

1.一种能增加收光量及角度的收光装置,其特征在于,所述能增加收光量及角度的收光装置包括:1. A light-receiving device that can increase the light-receiving amount and angle, is characterized in that, the light-receiving device that can increase the light-receiving amount and angle includes: 一积分球,为一中空的圆形球体,其内壁表面形成有一反射面,所述积分球的外壁上开设有一收光孔及至少一出光孔,所述收光孔及出光孔分别与所述积分球内的空间相连通;及An integrating sphere is a hollow circular sphere with a reflective surface formed on its inner wall surface, a light receiving hole and at least one light outlet hole are provided on the outer wall of the integrating sphere, and the light receiving hole and the light outlet hole are respectively connected to the The spaces within the integrating sphere are connected; and 一支撑治具,包括一定位环及一透光玻板,其中所述定位环的底侧构形与所述积分球上对应于所述收光孔的部位的构形相匹配,以使所述定位环能固设于所述积分球上对应于所述收光孔的位置,并与所述积分球结合成一体,所述透光玻板固设于所述定位环的顶侧,使所述透光玻板能对应于所述收光孔,在一待测发光元件定位于所述透光玻板的背对所述收光孔的一侧表面,且一光检测装置定位于所述出光孔的情况下,所述待测发光元件产生的光线能依序通过所述透光玻板及收光孔,投射至所述积分球内,并在所述积分球内被所述反射面均匀地反射及漫射后,再由所述出光孔,投射至所述光检测装置。A support fixture, including a positioning ring and a light-transmitting glass plate, wherein the configuration of the bottom side of the positioning ring matches the configuration of the part corresponding to the light receiving hole on the integrating sphere, so that the The positioning ring can be fixed on the integrating sphere at a position corresponding to the light receiving hole, and is integrated with the integrating sphere, and the light-transmitting glass plate is fixed on the top side of the positioning ring, so that the The light-transmitting glass plate can correspond to the light-receiving hole, and a light-emitting element to be measured is positioned on the side surface of the light-transmitting glass plate facing away from the light-receiving hole, and a light detection device is positioned on the light-receiving hole. In the case of a light exit hole, the light generated by the light-emitting element to be tested can pass through the light-transmitting glass plate and the light-receiving hole in sequence, and be projected into the integrating sphere, and be reflected by the reflecting surface in the integrating sphere. After being uniformly reflected and diffused, it is projected from the light exit hole to the light detection device. 2.如权利要求1所述的收光装置,其特征在于,所述透光玻板面对所述收光孔的另一侧表面上,除中央对应于所述待测发光元件的部位形成有一透光检测区外,其余部位均涂布有一反光层,以形成一不透光反射区,且所述透光反射区的构形对应于所述待测发光元件的大小。2. The light-receiving device according to claim 1, characterized in that, on the surface of the other side of the light-transmitting glass plate facing the light-receiving hole, except for the central part corresponding to the light-emitting element to be tested, a Outside a light-transmitting detection area, the remaining parts are coated with a light-reflecting layer to form an opaque reflection area, and the configuration of the light-transmitting reflection area corresponds to the size of the light-emitting element to be tested. 3.如权利要求2所述的收光装置,其特征在于,所述收光孔开设于所述积分球上的一收光柱的中央部位,所述收光柱的构形与所述定位环的底侧开设的一定位空间相匹配,且所述定位环的外缘尚活动地嵌设有多个嵌合元件,以在所述定位环的底侧套接至所述收光柱上的情况下,各所述嵌合元件的一端能被转动,使其另一端迫紧至所述收光柱的周缘,令所述定位环能紧密地与所述收光柱结合成一体。3. The light-receiving device according to claim 2, wherein the light-receiving hole is set at the central part of a light-receiving column on the integrating sphere, and the configuration of the light-receiving column is consistent with that of the positioning ring. A positioning space opened on the bottom side matches, and the outer edge of the positioning ring is still movably embedded with a plurality of fitting elements, so that when the bottom side of the positioning ring is sleeved on the light-receiving column One end of each fitting element can be rotated so that the other end is pressed against the periphery of the light-receiving column, so that the positioning ring can be tightly integrated with the light-receiving column. 4.如权利要求3所述的收光装置,其特征在于,所述透光玻板上反光层的材质与所述积分球内壁上的反射面的材质相同。4. The light collecting device according to claim 3, wherein the material of the reflective layer on the transparent glass plate is the same as that of the reflective surface on the inner wall of the integrating sphere.
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