CN104076224A

CN104076224A - Testing method for verifying reliability of electricity utilization information collecting device

Info

Publication number: CN104076224A
Application number: CN201410332093.8A
Authority: CN
Inventors: 刘岩; 董俐君; 刘喆; 唐悦; 章宏伟; 闫梓桐
Original assignee: China Electric Power Research Institute Co Ltd CEPRI; State Grid Corp of China SGCC
Current assignee: China Electric Power Research Institute Co Ltd CEPRI; Electric Power Research Institute of State Grid Jiangsu Electric Power Co Ltd; State Grid Corp of China SGCC
Priority date: 2014-07-11
Filing date: 2014-07-11
Publication date: 2014-10-01
Anticipated expiration: 2034-07-11
Also published as: CN104076224B

Abstract

The invention provides a test method for reliability verification of power consumption information collection equipment, which includes the following steps: establishing a reliability model of power consumption information collection equipment, determining failure modes, failure criteria and failure statistics principles; Humidity constant stress accelerated life test, and failure statistics; analyze the test data obtained from the accelerated life test, and obtain the cumulative failure probability and reliability. The test method for the reliability verification of the electricity information collection equipment provided by the present invention is to establish the reliability model of the electricity information collection equipment, guide the development of the temperature and humidity constant stress accelerated life test of the electricity information collection equipment, and start from the accelerated life test under the accelerated condition The estimated value of the reliability characteristic quantity under normal use conditions is deduced from the failure data to verify whether the reliability of the power consumption information collection equipment meets the requirements.

Description

A test method for reliability verification of power consumption information collection equipment

技术领域technical field

本发明涉及一种试验方法，具体讲涉及一种用电信息采集设备可靠性验证的试验方法。The invention relates to a test method, in particular to a test method for reliability verification of electricity information collection equipment.

背景技术Background technique

在用电信息采集系统建设中，由于系统规模大，采集设备类型多，运行环境多样，连续运行时间长，通信介质和通信协议复杂，采集设备的可靠性问题越来越突出，从而制约了采集系统的推广和应用。In the construction of the electricity consumption information collection system, due to the large scale of the system, many types of collection equipment, various operating environments, long continuous operation time, complex communication media and communication protocols, the reliability of the collection equipment is becoming more and more prominent, which restricts the collection System promotion and application.

为了实现用电信息采集系统全覆盖和全采集的目标，要求采集设备能在各种运行环境(包括电磁环境、气候环境等)下，长期可靠地运行。同时，用电信息采集系统实现的功能涉及企业的切身利益，为了确保电能数据的安全和完整，要求采集设备具有很高的可靠性。In order to achieve the goal of full coverage and full collection of the electricity information collection system, it is required that the collection equipment can operate reliably for a long time in various operating environments (including electromagnetic environment, climate environment, etc.). At the same time, the functions realized by the power consumption information collection system involve the vital interests of the enterprise. In order to ensure the safety and integrity of the power data, the collection equipment is required to have high reliability.

用电信息采集设备用于对各信息采集点的用电信息进行采集，可以实现电能表数据的采集、数据管理、数据双向传输以及转发或执行控制命令。按应用场所分为专变采集终端、集中抄表终端(包括集中器、采集器)、分布式能源监控终端等类型。用电信息采集设备的可靠性技术研究及应用仍处于起步阶段，大部分采集设备生产厂家在设计、元器件选择和生产工艺上缺乏对可靠性的保障，也没有有效的方法对设备的可靠性进行验证。The power consumption information collection equipment is used to collect the power consumption information of each information collection point, and can realize the data collection, data management, two-way data transmission of the electric energy meter, and the forwarding or execution of control commands. According to the application site, it is divided into special variable collection terminals, centralized meter reading terminals (including concentrators and collectors), distributed energy monitoring terminals and other types. The reliability technology research and application of electricity information collection equipment is still in its infancy. Most collection equipment manufacturers lack reliability guarantees in terms of design, component selection and production processes, and there is no effective method to ensure the reliability of equipment. authenticating.

用电信息采集设备在正常使用条件下进行寿命试验，很难在短时间内获得失效数据。为缩短试验时间、减少试验样本数和试验费用，采用加速寿命试验。实际中，采集设备通常受到多种应力的影响，如温度、湿度等，并且具有多种失效模式，如通信失效、电能表数据抄收失败、模拟量测量误差超差等，采集设备的加速寿命试验具有多应力和多失效模式的特点。It is difficult to obtain failure data in a short period of time when the power consumption information collection equipment is subjected to life tests under normal operating conditions. In order to shorten the test time, reduce the number of test samples and test costs, the accelerated life test is adopted. In practice, acquisition equipment is usually affected by various stresses, such as temperature, humidity, etc., and has various failure modes, such as communication failure, energy meter data copy failure, analog measurement error out-of-tolerance, etc. Accelerated life test of acquisition equipment It has the characteristics of multiple stress and multiple failure modes.

发明内容Contents of the invention

为了克服上述现有技术的不足，本发明提供一种用电信息采集设备可靠性验证的试验方法，以建立用电信息采集设备的可靠性模型，指导用电信息采集设备温湿度恒定应力加速寿命试验的开展，并从加速条件下的失效数据推导出正常使用条件下可靠性特征量的估计值，验证用电信息采集设备的可靠性是否满足要求。In order to overcome the deficiencies of the above-mentioned prior art, the present invention provides a test method for reliability verification of power consumption information collection equipment to establish a reliability model of power consumption information collection equipment and guide the accelerated life of power consumption information collection equipment with constant temperature and humidity stress The test is carried out, and the estimated value of the reliability characteristic quantity under normal use conditions is deduced from the failure data under accelerated conditions to verify whether the reliability of the power consumption information collection equipment meets the requirements.

为了实现上述发明目的，本发明采取如下技术方案：In order to realize the above-mentioned purpose of the invention, the present invention takes the following technical solutions:

本发明提供一种用电信息采集设备可靠性验证的试验方法，所述方法包括以下步骤：The invention provides a test method for reliability verification of electricity information collection equipment, the method comprising the following steps:

步骤1：建立用电信息采集设备可靠性模型，确定失效模式、失效判据及失效统计原则；Step 1: Establish the reliability model of the power consumption information collection equipment, determine the failure mode, failure criterion and failure statistics principle;

步骤2：进行用电信息采集设备温湿度恒定应力加速寿命试验，并进行失效统计；Step 2: Carry out the temperature and humidity constant stress accelerated life test of the power consumption information collection equipment, and carry out failure statistics;

步骤3：对加速寿命试验得到的试验数据进行分析，并得到累积失效概率和可靠度。Step 3: Analyze the test data obtained from the accelerated life test, and obtain the cumulative failure probability and reliability.

所述步骤1包括以下步骤：Described step 1 comprises the following steps:

步骤1-1：建立用电信息采集设备可靠性模型；Step 1-1: Establish reliability model of power consumption information collection equipment;

步骤1-2：确定用电信息采集设备可靠性验证要求；Step 1-2: Determine the reliability verification requirements for power consumption information collection equipment;

步骤1-3：确定失效判据、失效模式及失效统计原则。Steps 1-3: Determine failure criteria, failure modes and failure statistics principles.

所述步骤1-1中，用电信息采集设备包括电源模块、主控模块、接口模块、交流采样模块、显示模块、通信模块和安全模块；用电信息采集设备可靠性模型为串联模型，用电信息采集设备中任一模块失效，用电信息采集设备就出现失效，试验中发生失效的试验样品不进行维修。In the step 1-1, the power consumption information collection device includes a power supply module, a main control module, an interface module, an AC sampling module, a display module, a communication module and a security module; the reliability model of the power consumption information collection device is a series model, using If any module in the electrical information collection equipment fails, the electrical information collection equipment will fail, and the test samples that fail during the test will not be repaired.

所述步骤1-2中，用电信息采集设备可靠性验证指标具体为：Y年时用电信息采集设备失效率小于等于F％，置信度50％；其中Y≥0，0≤F≤100。In the step 1-2, the reliability verification index of the electricity consumption information collection equipment is specifically: the failure rate of the electricity consumption information collection equipment in Y years is less than or equal to F%, and the confidence level is 50%; wherein Y≥0, 0≤F≤100 .

所述步骤1-3中，所述失效模式为状态量采集、电能表数据采集、通信、模拟量测量误差和电源电压变化下的失效；In the steps 1-3, the failure mode is failure under state quantity collection, electric energy meter data collection, communication, analog quantity measurement error and power supply voltage change;

(1)改变所有输入状态，测试5次；若测试主机显示的状态量与输入状态5次均不符合，判为状态量采集失效；(1) Change all input states and test 5 times; if the state quantity displayed by the test host does not match the input state for 5 times, it is judged that the state quantity collection is invalid;

(2)测试主机通过用电信息采集设备抄收电能表数据，若抄收失败或测试主机显示的电能表数据与电能表数据不一致，判为电能表数据采集失效；(2) The test host reads the energy meter data through the electricity information collection equipment. If the copy fails or the energy meter data displayed by the test host is inconsistent with the energy meter data, it is judged that the energy meter data acquisition is invalid;

(3)通信次数应大于10次，功能测试中出现与测试主机10次均通信失败，判为通信失效；(3) The number of communication should be greater than 10 times, and the communication with the test host fails for 10 times during the function test, and it is judged as communication failure;

(4)测试5次取平均值，测量电压基本误差超标准规定的最大误差值，判为模拟量测量误差失效；(4) Take the average value of 5 tests, and the basic error of the measured voltage exceeds the maximum error value specified in the standard, and it is judged that the measurement error of the analog quantity is invalid;

(5)在电源电压分别为U_n+20％和U_n-20％时，判断状态量采集、电能表数据采集、通信和模拟量测量误差中若有其一失效，判为电源电压变化失效；其中U_n为电源额定电压。(5) When the power supply voltage is U _n +20% and U _n -20% respectively, if one of the state quantity collection, electric energy meter data collection, communication and analog quantity measurement error fails, it is judged as the power supply voltage change failure ; Where U _n is the rated voltage of the power supply.

所述失效统计原则包括：The principles of failure statistics include:

(1)因外部试验设备影响或人为因素引起的失效，不计入失效；(1) Failures caused by external test equipment or human factors are not counted as failures;

(2)用电信息采集设备的试验样品在同一测试周期中出现多次相同项目的失效，只记录第一次失效，并在以后的测试周期不再对此试验样品进行该项目测试；(2) If the test sample of the power consumption information collection equipment has multiple failures of the same item in the same test cycle, only the first failure shall be recorded, and the test sample shall not be tested for this item in the subsequent test cycle;

(3)试验样品在单个测试周期中出现不能自启动或自恢复，分析原因，试验样品重新人工启动后进行测试；如该项目测试没有失效，相应的失效模式记录为悬置项，该项目测试发生失效，则该项记为失效项；(3) The test sample cannot start or recover itself in a single test cycle, analyze the reason, and test the test sample after restarting manually; if the test of the item does not fail, the corresponding failure mode is recorded as a suspended item, and the test of the item If a failure occurs, the item is recorded as a failure item;

(4)试验样品在单个测试周期中该项目测试没有失效，但出现测试项目外的失效，分析原因；若应力试验结束时该试验样品的该项目仍没有失效，则相应的失效模式记录为悬置项。(4) The test sample does not fail in the test of the item in a single test cycle, but the failure occurs outside the test item, and the reason is analyzed; if the item of the test sample still does not fail at the end of the stress test, the corresponding failure mode is recorded as Suspended Set items.

所述步骤2包括以下步骤：Described step 2 comprises the following steps:

步骤2-1：确定试验应力和试验样品；Step 2-1: Determine the test stress and test sample;

步骤2-2：建立加速寿命模型；Step 2-2: Establish accelerated life model;

步骤2-3：确定应力水平下的最小试验时间和试验终止时间；Step 2-3: Determine the minimum test time and test termination time under the stress level;

步骤2-4：进行温湿度恒定应力加速寿命试验，并进行失效统计。Step 2-4: Carry out accelerated life test with constant stress of temperature and humidity, and carry out failure statistics.

所述步骤2-1具体包括以下步骤：The step 2-1 specifically includes the following steps:

步骤2-1-1：温度和湿度是对用电信息采集设备可靠性影响较大的环境应力，选取以下四级应力水平进行试验；Step 2-1-1: Temperature and humidity are environmental stresses that have a greater impact on the reliability of power consumption information collection equipment, and the following four stress levels are selected for testing;

(1)温度为75℃，且湿度为95％时，确定为第一级应力水平；(1) When the temperature is 75°C and the humidity is 95%, it is determined as the first-level stress level;

(2)温度为75℃，且湿度为85％时，确定为第二级应力水平；(2) When the temperature is 75°C and the humidity is 85%, it is determined as the second-level stress level;

(3)温度为75℃，且湿度为75％时，确定为第三级应力水平；(3) When the temperature is 75°C and the humidity is 75%, it is determined as the third level of stress;

(4)温度为65℃，且湿度为95％时，确定为第四级应力水平；(4) When the temperature is 65°C and the humidity is 95%, it is determined as the fourth-level stress level;

步骤2-1-2：所述试样品从批量生产的经过出厂检验合格的同批次用电信息采集设备中随机抽取，每个组合应力试验的样品数不少于10个。Step 2-1-2: The test samples are randomly selected from the batch-produced electricity information collection equipment that has passed the factory inspection, and the number of samples for each combined stress test is not less than 10.

所述步骤2-2中的加速寿命模型采用Peck模型，用来描述温度和湿度综合应力与寿命的关系；Peck模型的加速系数AF表示为：The accelerated life model in the step 2-2 adopts the Peck model, which is used to describe the relationship between temperature and humidity comprehensive stress and life; the acceleration factor AF of the Peck model is expressed as:

$AF AF = = {((\frac{{RH RH}_{u u}}{{RH RH}_{s the s}}))}^{- - n no} {e e}^{\frac{{E E.}_{a a}}{k k} ((\frac{11}{{T T}_{u u}} - - \frac{11}{{T T}_{s the s}}))} - - - - - - ((11))$

其中，RH_u为正常使用条件下的百分比相对湿度，RH_s为应力水平下的百分比相对湿度；T_u为正常使用条件下以k表示的温度，T_s为应力水平下以k表示的温度，k为玻尔兹曼常数，取8.617×10^-5eV/K；E_a为以电子伏表示的活化能，取值范围为0.3～1.5；n为加速系数参数，取值范围为1～12。Among them, RH _u is the percentage relative humidity under normal use conditions, RH _s is the percentage relative humidity under the stress level; T _u is the temperature expressed in k under normal use conditions, T _s is the temperature expressed in k under the stress level, k is the Boltzmann constant, which is 8.617×10 ^-5 eV/K; E _a is the activation energy expressed in electron volts, and the value range is 0.3-1.5; n is the acceleration coefficient parameter, and the value range is 1-12 .

所述步骤2-3中，使E_a取典型值0.9，且n取典型值3，由式(1)得到的AF带入式(2)即可得到每级应力水平下的最小试验时间D_min，表示为：In the step 2-3, let E _a take a typical value of 0.9, and n take a typical value of 3, and AF obtained by formula (1) can be brought into formula (2) to obtain the minimum test time D under each stress level _min , expressed as:

${D D.}_{min min} = = MAX MAX ((\frac{Y Y}{AF AF} {[[\frac{ln ln ((11 - - {UCL UCL}_{11}))}{ln ln ((11 - - \frac{cF f}{10001000}))}]]}^{22},, \frac{Y Y}{AF AF} {[[\frac{ln ln ((11 - - {UCL UCL}_{11}))}{ln ln ((11 - - \frac{cF f}{10001000}))}]]}^{\frac{11}{55}})) - - - - - - ((22))$

其中，UCL₁为50％置信度下出现第1次失效的失效概率估计值，通过查IEC62059-31-1附录D得到，c为附加失效因子，取值15；Among them, UCL ₁ is the estimated value of the failure probability of the first failure under the 50% confidence level, which is obtained by checking Appendix D of IEC62059-31-1, and c is the additional failure factor, which takes a value of 15;

每级应力水平下采用定时截尾试验，在以下情况下试验终止：A timed censored test is adopted at each stress level, and the test is terminated under the following conditions:

(1)未达到最小试验时间，但已经出现全部试验样品失效；(1) The minimum test time has not been reached, but all test samples have failed;

(2)已达到最小试验时间，并且每个独立的失效模式已经出现至少5个试验样品失效；(2) The minimum test time has been reached, and at least five test specimens have failed for each independent failure mode;

(3)若达到最小试验时间，试验样品的失效数小于5，则继续试验直至某个独立失效模式出现至少5个试验样本失效或试验时间已经达到2倍最小试验时间。(3) If the minimum test time is reached and the failure number of test samples is less than 5, continue the test until at least 5 test samples fail in an independent failure mode or the test time has reached twice the minimum test time.

所述步骤2-4中，进行温湿度恒定应力加速寿命试验过程如下：In the steps 2-4, the accelerated life test process of constant temperature and humidity stress is as follows:

在每级应力水平的试验过程中，试验样品始终处于工作状态；对试验样品施加温度、湿度组合应力的同时，交流模拟量输入端施加额定电压U_n，状态量输入端连接外部模拟器，测试主机通过通信线与试验样品连接，但不进行通信；试验样品在加速寿命试验开始前，在正常试验室环境下失效模式进行测试，其功能和基本性能应符合要求；若试验样品不符合要求则给予替换，保证试验前所有试验样品都是合格品；During the test of each level of stress level, the test sample is always in the working state; when the combined stress of temperature and humidity is applied to the test sample, the rated voltage U _n is applied to the input terminal of the AC analog quantity, and the input terminal of the state quantity is connected to an external simulator. The host computer is connected to the test sample through the communication line, but does not communicate; the test sample is tested in the failure mode under the normal laboratory environment before the accelerated life test, and its function and basic performance should meet the requirements; if the test sample does not meet the requirements, then Replacement is given to ensure that all test samples before the test are qualified products;

每组恒定应力加速寿命试验均采用定时截尾试验，最小试验时间根据每组加速应力水平的加速系数和终端可靠性要求确定，在最小试验时间结束时失效样品数r≥5，试验即可终止，否则应延长试验时间；且每组应力水平试验时，应进行失效数据统计。Each group of constant stress accelerated life tests adopts a timed censored test. The minimum test time is determined according to the acceleration coefficient of each group of accelerated stress levels and terminal reliability requirements. When the minimum test time ends, the number of failed samples r≥5, the test can be terminated , otherwise the test time should be extended; and failure data statistics should be carried out for each stress level test.

所述步骤3包括以下步骤：Described step 3 comprises the following steps:

步骤3-1：对试验数据排序，并计算失效序号和中位秩失效概率估计值；Step 3-1: Sort the test data, and calculate the failure sequence number and median rank failure probability estimate;

步骤3-2：计算各类失效模式在各级应力水平下的威布尔分布参数；Step 3-2: Calculate the Weibull distribution parameters of various failure modes at all stress levels;

步骤3-3：各类失效模式的加速系数；Step 3-3: Acceleration coefficients of various failure modes;

步骤3-4：计算各类失效模式在各级应力水平下的加速系数；Step 3-4: Calculate the acceleration coefficients of various failure modes at all stress levels;

步骤3-5：推算各类失效模式在正常使用条件下的威布尔分布参数；Step 3-5: Estimate the Weibull distribution parameters of various failure modes under normal service conditions;

步骤3-6：计算各类失效模式在正常使用条件下的累积失效概率和累积可靠度。Step 3-6: Calculate the cumulative failure probability and cumulative reliability of various failure modes under normal service conditions.

所述步骤3-1中，将悬置项与失效项按失效累积时间从小到大排序，失效序号和中位秩失效概率估计值分别通过式(3)和(4)计算，有：In the step 3-1, the suspension items and the failure items are sorted according to the cumulative failure time from small to large, and the failure sequence number and median rank failure probability estimate are calculated by formulas (3) and (4) respectively, as follows:

${r r}_{j j} = = \frac{{r r}_{r r} \times \times {r r}_{j j - - 11} + + ((N N + + 11))}{{r r}_{r r} + + 11} - - - - - - ((33))$

${F f}_{r r}_{j j} = = \frac{(({r r}_{j j} - - 0.3 0.3))}{((N N + + 0.4 0.4))} % % - - - - - - ((44))$

其中，r_j为第j个已经调整的失效序号，r_j-1为上一个已经调整的失效序号，N为该失效模式的失效项和悬置项总数，即试验样品总数；为中位秩失效概率估计值。Among them, r _j is the jth adjusted failure sequence number, r _j-1 is the last adjusted failure sequence number, N is the total number of failure items and suspension items of this failure mode, that is, the total number of test samples; is the median-rank failure probability estimate.

所述步骤3-2中，威布尔分布参数包括形状参数β和尺度参数η，基于最小二乘法计算各类失效模式在各级应力水平下的形状参数β和尺度参数η过程如下：In the step 3-2, the Weibull distribution parameters include a shape parameter β and a scale parameter η, and the process of calculating the shape parameter β and the scale parameter η of various failure modes at all stress levels based on the least square method is as follows:

用电信息采集设备的寿命分布服从威布尔分布，累积失效概率用F(t)表示，有：The life distribution of electricity information collection equipment obeys the Weibull distribution, and the cumulative failure probability is represented by F(t), which is:

$F f ((t t)) = = 11 - - {e e}^{{- - ((t t / / η η))}^{β β}} - - - - - - ((55))$

将式(5)两边取自然对数，有：Taking the natural logarithm on both sides of formula (5), we have:

$- - ln ln ((11 - - F f ((t t)))) = = {((\frac{t t}{η η}))}^{β β} - - - - - - ((66))$

再取第二次自然对数，有：Taking the second natural logarithm again, we have:

$ln ln ((- - ln ln ((11 - - F f ((t t)))))) = = β β ln ln ((\frac{t t}{η η})) = = - - β β ln ln ((η η)) + + β β ln ln ((t t)) - - - - - - ((77))$

设y＝ln(-ln(1-F(t)))，A＝-βln(η)，B＝β，x＝ln(t)；则有：Let y=ln(-ln(1-F(t))), A=-βln(η), B=β, x=ln(t); then:

y＝A+Bx (8)y=A+Bx (8)

$B B = = \frac{{Σ Σ}_{i i = = 11}^{p p} {x x}_{i i} {y the y}_{i i} - - \frac{{Σ Σ}_{i i = = 11}^{p p} {x x}_{i i} {Σ Σ}_{i i = = 11}^{p p} {y the y}_{i i}}{p p}}{{Σ Σ}_{i i = = 11}^{p p} {x x}_{i i}^{22} - - \frac{{(({Σ Σ}_{i i = = 11}^{p p} {x x}_{i i}))}^{22}}{p p}} - - - - - - ((99))$

$A A = = \frac{{Σ Σ}_{i i = = 11}^{p p} {y the y}_{i i}}{p p} - - B B \frac{{Σ Σ}_{i i = = 11}^{p p} {x x}_{i i}}{p p} - - - - - - ((1010))$

其中，x_i＝ln(TTF_i)，TTF_i为第i个试验样品失效的累积失效时间；y_i＝ln(-ln(1-F(TTF_i)))，F(TTF_i)为对应于第i个试验样品失效的失效概率，p为观察到的失效数；Among them, x _i =ln(TTF _i ), TTF _i is the cumulative failure time of the ith test sample failure; y _i =ln(-ln(1-F(TTF _i ))), F(TTF _i ) is the corresponding is the failure probability of the failure of the i-th test sample, p is the number of observed failures;

由A和B可得形状参数β和尺度参数η，有：From A and B, the shape parameter β and scale parameter η can be obtained:

β＝B (11)β=B (11)

$η η = = {e e}^{- - \frac{A A}{B B}} - - - - - - ((1212)) . .$

所述步骤3-3中，各类失效模式的加速系数包括各类失效模式下以电子伏表示的活化能E_a′和加速系数参数n′；计算过程如下：In said step 3-3, the acceleration coefficients of various failure modes include activation energy E _a ' and acceleration coefficient parameter n ' expressed in electron volts under various failure modes; the calculation process is as follows:

对式(1)两边求对数，得到：Calculate the logarithm on both sides of formula (1), and get:

$ln ln ((AF AF)) = = - - n no ln ln ((\frac{{RH RH}_{u u}}{{RH RH}_{s the s}})) + + \frac{{E E.}_{a a}}{k k} ((\frac{11}{{T T}_{u u}} - - \frac{11}{{T T}_{s the s}})) - - - - - - ((1313))$

满足时，为最大应力水平下的加速系数，且AF_i为第i级应力水平下的加速系数，为最大应力水平下的尺度参数，且η_i为第i级应力水平下的尺度参数；有：satisfy hour, is the acceleration coefficient at the maximum stress level, and AF _i is the acceleration factor at the i-th stress level, is the scale parameter at the maximum stress level, and η _i is the scale parameter under the i-th stress level; there are:

$ln ln ((\frac{{η η}_{i i}}{{η η}_{11}})) = = - - n no ln ln ((\frac{{RH RH}_{i i}}{{RH RH}_{max max}})) + + \frac{{E E.}_{a a}}{k k} ((\frac{11}{{T T}_{i i}} - - \frac{11}{{T T}_{max max}})) - - - - - - ((1414))$

其中，RH_i为第i级应力水平下的湿度，RH_max为应力水平的最高湿度，且有RH_max＝RH₁＝RH₄；T_i为第i级应力水平下的温度，T_max为应力水平的最高温度，且有T_max＝T₁＝T₂＝T₃；Among them, RH _i is the humidity at the i-th stress level, RH _max is the highest humidity at the stress level, and RH _max = RH ₁ = RH ₄ ; T _i is the temperature at the i-th stress level, and T _max is the stress The maximum temperature of the level, and there is T _max =T ₁ =T ₂ =T ₃ ;

设定方程Z_i＝nX_i+E_aY_i，方程系数X_i、Y_i和Z_i表示为：Set the equation Z _i =nX _i +E _a Y _i , the equation coefficients X _i , Y _i and Z _i are expressed as:

(1)第一级应力水平下，X₁＝Y₁＝Z₁＝0；(1) At the first stress level, X ₁ =Y ₁ =Z ₁ =0;

(2)第二级应力水平下， $X_{2} = - \ln (\frac{85}{{RH}_{\max}}), Y_{2} = 0, Z_{2} = \ln (\frac{η_{2}}{η_{1}});$ (2) Under the second stress level, $x_{2} = - \ln (\frac{85}{{RH}_{\max}}), Y_{2} = 0, Z_{2} = \ln (\frac{η_{2}}{η_{1}});$

(3)第三级应力水平下， $X_{3} = - \ln (\frac{75}{{RH}_{\max}}), Y_{3} = 0, Z_{3} = \ln (\frac{η_{3}}{η_{1}});$ (3) Under the third stress level, $x_{3} = - \ln (\frac{75}{{RH}_{\max}}), Y_{3} = 0, Z_{3} = \ln (\frac{η_{3}}{η_{1}});$

(4)第四级应力水平下， $X_{4} = 0, Y_{4} = \frac{1}{k} (\frac{1}{273 + 65} - \frac{1}{273 + T_{\max}}), Z_{4} = \ln (\frac{η_{4}}{η_{1}});$ (4) Under the fourth stress level, $x_{4} = 0, Y_{4} = \frac{1}{k} (\frac{1}{273 + 65} - \frac{1}{273 + T_{\max}}), Z_{4} = \ln (\frac{η_{4}}{η_{1}});$

其中，η₁、η₂、η₃和η₄分别为第一至第四级应力水平下的尺度参数；Among them, η ₁ , η ₂ , η ₃ and η ₄ are scale parameters under the first to fourth stress levels respectively;

于是各类失效模式下以电子伏表示的活化能E_a′和加速系数参数n′表示为：Therefore, the activation energy E _a ′ expressed in electron volts and the acceleration coefficient parameter n ′ under various failure modes are expressed as:

${E E.}_{a a}^{' '} \frac{{Σ Σ}_{i i = = 11}^{44} {Y Y}_{i i} {Z Z}_{i i} {Σ Σ}_{i i = = 11}^{44} {X x}_{i i}^{22} - - {Σ Σ}_{i i = = 11}^{44} {X x}_{i i} {Z Z}_{i i} {Σ Σ}_{i i = = 11}^{44} {X x}_{i i} {Y Y}_{i i}}{{(({Σ Σ}_{i i = = 11}^{44} {X x}_{i i} {Y Y}_{i i}))}^{22} - - {Σ Σ}_{i i = = 11}^{44} {X x}_{i i}^{22} {Σ Σ}_{i i = = 11}^{44} {Y Y}_{i i}^{22}} - - - - - - ((1515))$

${n no}^{' '} = = \frac{{Σ Σ}_{i i = = 11}^{44} {X x}_{i i} {Z Z}_{i i} - - {E E.}_{a a}^{' '} {Σ Σ}_{i i = = 11}^{44} {X x}_{i i} {Y Y}_{i i}}{{Σ Σ}_{i i = = 11}^{44} {X x}_{i i}^{22}} - - - - - - ((1616)) . .$

所述步骤3-4中，根据正常使用条件下的百分比相对湿度RH_u和正常使用条件下以k表示的温度T_u，以及计算出的E_a′和n′计算各类失效模式在各级应力水平下的加速系数AF′，有：In said step 3-4, according to the percentage relative humidity RH _u under normal use conditions and the temperature T _u represented by k under normal use conditions, and the calculated E _a ' and n', the various failure modes are calculated at all levels The acceleration factor AF′ under the stress level is:

${AF AF}^{' '} = = {((\frac{{RH RH}_{u u}}{{RH RH}_{s the s}}))}^{{- - n no}^{' '}} {e e}^{\frac{{E E.}_{a a}^{' '}}{k k} ((\frac{11}{{T T}_{u u}} - - \frac{11}{{T T}_{s the s}}))} - - - - - - ((1717)) . .$

所述步骤3-5中，各类失效模式在正常使用条件下的威布尔分布参数包括形状参数β′和尺度参数η′，计算过程如下：In the steps 3-5, the Weibull distribution parameters of various failure modes under normal service conditions include shape parameter β′ and scale parameter η′, and the calculation process is as follows:

用电信息采集设备的寿命分布服从威布尔分布，各类失效模式在正常使用条件下用电信息采集设备的累积失效概率用F(t′)表示，有：The life distribution of electricity information collection equipment obeys the Weibull distribution, and the cumulative failure probability of various failure modes under normal use conditions is represented by F(t′), which is:

$F f (({t t}^{' '})) = = 11 - - {e e}^{{- - (({t t}^{' '} / / {η η}^{' '}))}^{{β β}^{' '}}} - - - - - - ((1818))$

将式(18)两边取自然对数，有：Taking the natural logarithm on both sides of formula (18), we have:

$- - ln ln ((11 - - F f (({t t}^{' '})))) = = {((\frac{{t t}^{' '}}{{η η}^{' '}}))}^{{β β}^{' '}} - - - - - - ((1919))$

$ln ln ((- - ln ln ((11 - - F f (({t t}^{' '})))))) = = {β β}^{' '} ln ln ((\frac{{t t}^{' '}}{{η η}^{' '}})) = = - - {β β}^{' '} ln ln (({η η}^{' '})) + + β β ln ln (({t t}^{' '})) - - - - - - ((2020))$

设y′＝ln(-ln(1-F(t′)))，A′＝-β′ln(η′)，B′＝β′，x′＝ln(t′)；则有：Suppose y'=ln(-ln(1-F(t'))), A'=-β'ln(η'), B'=β', x'=ln(t'); then:

y′＝A′+B′x′ (21)y'=A'+B'x' (21)

$\begin{matrix} {B B}^{' '} = = \frac{{Σ Σ}_{i i = = 11}^{p p} {x x}_{i i}^{' '} {y the y}_{i i}^{' '} - - \frac{{Σ Σ}_{i i = = 11}^{p p} {x x}_{i i}^{' '} {Σ Σ}_{i i = = 11}^{p p} {y the y}_{i i}^{' '}}{p p}}{{Σ Σ}_{i i = = 11}^{p p} {x x}_{i i}^{' ' 22} - - \frac{{(({Σ Σ}_{i i = = 11}^{p p} {x x}_{i i}^{' '}))}^{22}}{p p}} - - - - - - ((22 twenty two)) \end{matrix}$

${A A}^{' '} = = \frac{{Σ Σ}_{i i = = 11}^{p p} {y the y}_{i i}^{' '}}{p p} - - {B B}^{' '} \frac{{Σ Σ}_{i i = = 11}^{p p} {x x}_{i i}^{' '}}{p p} - - - - - - ((23 twenty three))$

其中，x_i′＝ln(TTF_i′)，TTF_i′为正常使用条件下第i个试验样品失效的累积失效时间；Among them, x _i ′=ln(TTF _i ′), TTF _i ′ is the cumulative failure time of the i-th test sample failure under normal service conditions;

y_i′＝ln(-ln(1-F(TTF_i′)))，F(TTF_i′)为对应于正常使用条件下第i个试验样品失效的失效概率，p为观察到的失效数；y _i ′=ln(-ln(1-F(TTF _i ′))), F(TTF _i ′) is the failure probability corresponding to the failure of the i-th test sample under normal service conditions, p is the number of observed failures ;

由A′和B′可得形状参数β′和尺度参数η′，有：From A' and B', the shape parameter β' and scale parameter η' can be obtained:

β′＝B′ (24)β′＝B′ (24)

${η η}^{' '} = = {e e}^{- - \frac{{A A}^{' '}}{{B B}^{' '}}} - - - - - - ((2525)) . .$

所述步骤3-6中，将各类失效模式在正常使用条件下的形状参数β′和尺度参数η′分别代入式(5)中，得到各类失效模式在正常使用条件下的累积失效概率F₁(t)、F₂(t)、F₃(t)、F₄(t)和F₅(t)；各类失效模式在正常使用条件下的累积可靠度表示为In the above steps 3-6, the shape parameter β′ and scale parameter η′ of various failure modes under normal service conditions are respectively substituted into formula (5), and the cumulative failure probability of various failure modes under normal service conditions is obtained F ₁ (t), F ₂ (t), F ₃ (t), F ₄ (t) and F ₅ (t); the cumulative reliability of various failure modes under normal service conditions is expressed as

R(t)＝(1-F₁(t))(1-F₂(t))(1-F₃(t))(1-F₄(t))(1-F₅(t)) (26)R(t)＝(1-F ₁ (t))(1-F ₂ (t))(1-F ₃ (t))(1-F ₄ (t))(1-F ₅ (t)) (26)

其中，R(t)为各类失效模式在正常使用条件下的累积可靠度。Among them, R(t) is the cumulative reliability of various failure modes under normal service conditions.

与现有技术相比，本发明的有益效果在于：Compared with prior art, the beneficial effect of the present invention is:

1.本发明以建立用电信息采集设备的可靠性模型，指导用电信息采集设备温湿度恒定应力加速寿命试验的开展，并从加速条件下的失效数据推导出正常使用条件下可靠性特征量的估计值，验证用电信息采集设备的可靠性是否满足要求；1. The present invention establishes the reliability model of the power consumption information collection equipment, guides the development of the temperature and humidity constant stress accelerated life test of the power consumption information collection equipment, and deduces the reliability characteristic quantity under the normal use condition from the failure data under the accelerated condition to verify whether the reliability of the power consumption information collection equipment meets the requirements;

2.用电信息采集设备可靠性验证试验方法不仅能验证用电信息采集设备指定寿命点的可靠度，而且能获得其全周期寿命曲线，为用电信息采集设备的使用和维护提供依据；2. The reliability verification test method of power consumption information collection equipment can not only verify the reliability of the specified life point of power consumption information collection equipment, but also obtain its full-cycle life curve, which provides a basis for the use and maintenance of power consumption information collection equipment;

3.实现了用电信息采集设备的可靠性验证，为检测人员提供了直观、有效的检测分析手段，有利于发现用电信息采集设备方案设计、元器件选择和制造工艺控制上的缺陷，促进质量改进；3. Realized the reliability verification of power consumption information collection equipment, provided inspectors with intuitive and effective detection and analysis methods, and was conducive to discovering defects in power consumption information collection equipment scheme design, component selection and manufacturing process control, and promoted quality improvement;

4.为开展用电信息采集设备供应商评价提供技术依据，促进供应商提高可靠性设计，从而降低用电信息采集设备运行故障率，延长运行寿命；4. To provide a technical basis for the evaluation of suppliers of power consumption information collection equipment, and to promote suppliers to improve reliability design, thereby reducing the failure rate of power consumption information collection equipment and prolonging the operating life;

5.进一步提高了用电信息采集设备的稳定性和可靠性，为加快推进用电信息采集设备和智能电网建设提供了技术支撑。5. Further improved the stability and reliability of the electricity consumption information collection equipment, and provided technical support for accelerating the construction of electricity consumption information collection equipment and smart grid.

附图说明Description of drawings

图1是用电信息采集设备可靠性验证的试验方法流程图。Figure 1 is a flow chart of the test method for reliability verification of electricity information collection equipment.

具体实施方式Detailed ways

下面结合附图对本发明作进一步详细说明。The present invention will be described in further detail below in conjunction with the accompanying drawings.

如图1，本发明提供一种用电信息采集设备可靠性验证的试验方法，所述方法包括以下步骤：As shown in Fig. 1, the present invention provides a kind of test method of reliability verification of electricity information collection equipment, and described method comprises the following steps:

所述失效统计原则包括：The principles of failure statistics include:

(1)因外部试验设备(主要包括高低温交变湿热箱)影响或人为因素引起的失效，不计入失效；(1) Failures caused by external test equipment (mainly including high and low temperature alternating humidity chambers) or human factors are not counted as failures;

(4)试验样品在单个测试周期中该项目测试没有失效，但出现测试项目外的失效，分析原因；若应力试验结束时该试验样品的该项目仍没有失效，则相应的失效模式记录为悬置项。(4) The test sample does not fail in the test of the item in a single test cycle, but the failure occurs outside the test item, and the reason is analyzed; if the item of the test sample still does not fail at the end of the stress test, the corresponding failure mode is recorded as Suspended Set item.

(5)温度为65℃，且湿度为95％时，确定为第四级应力水平；(5) When the temperature is 65°C and the humidity is 95%, it is determined as the fourth stress level;

所述步骤3-1中，将悬置项与失效项按失效累积时间从小到大排序，失效序号和中位秩失效概率估计值分别通过式(3)和(4)计算，有：In the step 3-1, the suspension items and failure items are sorted according to the cumulative failure time from small to large, and the failure serial number and median rank failure probability estimate are calculated by formulas (3) and (4) respectively, as follows:

y＝A+Bx (8)y=A+Bx (8)

β＝B (11)β=B (11)

$η η = = {e e}^{- - \frac{A A}{B B}} - - - - - - ((1212)) . .$

${E E.}_{a a}^{' '} = = \frac{{Σ Σ}_{i i = = 11}^{44} {Y Y}_{i i} {Z Z}_{i i} {Σ Σ}_{i i = = 11}^{44} {X x}_{i i}^{22} - - {Σ Σ}_{i i = = 11}^{44} {X x}_{i i} {Z Z}_{i i} {Σ Σ}_{i i = = 11}^{44} {X x}_{i i} {Y Y}_{i i}}{{(({Σ Σ}_{i i = = 11}^{44} {X x}_{i i} {Y Y}_{i i}))}^{22} - - {Σ Σ}_{i i = = 11}^{44} {X x}_{i i}^{22} {Σ Σ}_{i i = = 11}^{44} {Y Y}_{i i}^{22}} - - - - - - ((1515))$

y′＝A′+B′x′ (21)y'=A'+B'x' (21)

β′＝B′ (24)β′＝B′ (24)

最后应当说明的是：以上实施例仅用以说明本发明的技术方案而非对其限制，所属领域的普通技术人员参照上述实施例依然可以对本发明的具体实施方式进行修改或者等同替换，这些未脱离本发明精神和范围的任何修改或者等同替换，均在申请待批的本发明的权利要求保护范围之内。Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit them. Those of ordinary skill in the art can still modify or equivalently replace the specific implementation methods of the present invention with reference to the above embodiments. Any modifications or equivalent replacements departing from the spirit and scope of the present invention are within the protection scope of the claims of the pending application of the present invention.

Claims

1. a test method for power information collecting device reliability demonstration, is characterized in that: said method comprising the steps of:

Step 1: set up power information collecting device reliability model, determine failure mode, failure criteria and inefficacy Statistical Principles;

Step 2: carry out power information collecting device humiture stress accelerated life test, and the statistics that lost efficacy;

Step 3: the test figure that accelerated life test is obtained is analyzed, and obtain cumulative failure probability and fiduciary level.

2. the test method of power information collecting device according to claim 1 reliability demonstration, is characterized in that: described step 1 comprises the following steps:

Step 1-1: set up power information collecting device reliability model;

Step 1-2: determine power information collecting device reliability demonstration requirement;

Step 1-3: determine failure criteria, failure mode and inefficacy Statistical Principles.

3. the test method of power information collecting device according to claim 2 reliability demonstration, it is characterized in that: in described step 1-1, power information collecting device comprises power module, main control module, interface module, AC sampling module, display module, communication module and security module; Power information collecting device reliability model is series connection model, and in power information collecting device, arbitrary module lost efficacy, and losing efficacy just appears in power information collecting device, and the test specimen that occurs in test to lose efficacy does not keep in repair.

4. the test method of power information collecting device according to claim 2 reliability demonstration, it is characterized in that: in described step 1-2, power information collecting device reliability demonstration index is specially: when Y, power information collecting device crash rate is less than or equal to F%, degree of confidence 50%; Wherein Y >=0,0≤F≤100.

5. the test method of power information collecting device according to claim 2 reliability demonstration, it is characterized in that: in described step 1-3, described failure mode is the inefficacy under quantity of state collection, electric energy meter data acquisition, communication, analog measurement error and mains voltage variations;

(1) change all input states, test 5 times; If quantity of state and input state that Test Host shows all do not meet for 5 times, be judged to quantity of state collection and lost efficacy;

(2) Test Host is copied and accepted electric energy meter data by power information collecting device, if it is inconsistent to copy and accept electric energy meter data and the electric energy meter data of failure or Test Host demonstration, is judged to electric energy meter data acquisition and loses efficacy;

(3) number of communications should be greater than 10 times, in functional test, occurs and 10 equal communication failures of Test Host, is judged to communication failure;

(4) test is averaged for 5 times, and the maximum error value of the overproof regulation of measuring voltage fundamental error is judged to analog measurement error and lost efficacy;

(5) be respectively U at supply voltage _n+ 20% and U _n-20% time, there is one to lose efficacy if judge in quantity of state collection, electric energy meter data acquisition, communication and analog measurement error, be judged to mains voltage variations and lost efficacy; Wherein U _nfor power supply rated voltage.

6. the test method of power information collecting device according to claim 2 reliability demonstration, is characterized in that: described inefficacy Statistical Principles comprises:

(1) because of the inefficacy that External Test Equipment affects or human factor causes, be not counted in inefficacy;

(2) there is repeatedly the inefficacy of identical items in the test specimen of power information collecting device in same test period, and only record lost efficacy for the first time, and test period afterwards is no longer carried out this project testing to this test specimen;

(3) in single test period, occur can not self-starting or certainly recover for test specimen, analyzes reason, and test specimen is tested after again manually starting; As this project testing did not lose efficacy, corresponding failure mode is recorded as the item that suspends, and this project testing lost efficacy, and this is designated as expired entry;

(4) test specimen this project testing in single test period did not lose efficacy, but occurred the inefficacy outside test event, analyzed reason; If this project of this test specimen did not still lose efficacy when stress test finishes, corresponding failure mode is recorded as the item that suspends.

7. the test method of power information collecting device according to claim 1 reliability demonstration, is characterized in that: described step 2 comprises the following steps:

Step 2-1: determine proof stress and test specimen;

Step 2-2: set up accelerated life model;

Step 2-3: determine minimum test period and test termination time under stress level;

Step 2-4: carry out humiture stress accelerated life test, and the statistics that lost efficacy.

8. the test method of power information collecting device according to claim 7 reliability demonstration, is characterized in that: described step 2-1 specifically comprises the following steps:

Step 2-1-1: temperature and humidity is to the larger environmental stress of power information collecting device reliability effect, chooses following level Four stress level and tests;

(1) temperature is 75 DEG C, and humidity is while being 95%, is defined as first order stress level;

(2) temperature is 75 DEG C, and humidity is while being 85%, is defined as second level stress level;

(3) temperature is 75 DEG C, and humidity is while being 75%, is defined as third level stress level;

(4) temperature is 65 DEG C, and humidity is while being 95%, is defined as fourth stage stress level;

Step 2-1-2: described test agent is randomly drawed from same batch of qualified power information collecting device of the process factory inspection of batch production, and the sample number of each combined stress test is no less than 10.

9. the test method of power information collecting device according to claim 7 reliability demonstration, is characterized in that: the accelerated life model in described step 2-2 adopts Peck model, is used for describing the relation in temperature and humidity combined stress and life-span; The accelerator coefficient AF of Peck model is expressed as:

AF = {(\frac{{RH}_{u}}{{RH}_{s}})}^{- n} e^{\frac{E_{a}}{k} (\frac{1}{T_{u}} - \frac{1}{T_{s}})} - - - (1)

Wherein, RH _ufor the number percent relative humidity under regular service condition, RH _sfor the number percent relative humidity under stress level; T _ufor the temperature representing with k under regular service condition, T _sfor the temperature representing with k under stress level, k is Boltzmann constant, gets 8.617 × 10 ^-5eV/K; E _afor the energy of activation representing with electron volts, span is 0.3～1.5; N is accelerator coefficient parameter, and span is 1～12.

10. the test method of power information collecting device according to claim 9 reliability demonstration, is characterized in that: in described step 2-3, make E _aget representative value 0.9, and n gets representative value 3, the AF being obtained by formula (1) brings formula (2) into can obtain the minimum test period D under every grade of stress level _min, be expressed as:

D_{\min} = MAX (\frac{Y}{AF} {[\frac{\ln (1 - {UCL}_{1})}{\ln (1 - \frac{cF}{1000})}]}^{2}, \frac{Y}{AF} {[\frac{\ln (1 - {UCL}_{1})}{\ln (1 - \frac{cF}{1000})}]}^{\frac{1}{5}}) - - - (2)

Wherein, UCL ₁be the failure probability estimated value that occurs the 1st inefficacy under 50% degree of confidence, obtain by looking into IEC62059-31-1 Appendix D, c is the additional inefficacy factor, value 15;

Under every grade of stress level, adopt fixed time test, in following situation, test stops:

(1) do not reach minimum test period, but occurred total Test sample fails;

(2) reached minimum test period, and each independently failure mode has occurred that at least 5 test specimens lost efficacy;

(3) if reach minimum test period, the failure number of test specimen is less than 5, continues test until certain Independence Failure Modes occurs that at least 5 test samples lost efficacy or test period has reached 2 times of minimum test periods.

The test method of 11. power information collecting device according to claim 7 reliability demonstrations, is characterized in that: in described step 2-4, carry out humiture stress accelerated life test process as follows:

In the process of the test of every grade of stress level, test specimen is in running order all the time; When test specimen is applied to temperature, humidity combined stress, ac analog input end applies rated voltage U _n, quantity of state input end connects external analog device, and Test Host is connected with test specimen by order wire, but does not communicate; Test specimen is before accelerated life test starts, and under normal testing laboratory environment, failure mode is tested, and its function and key property should meet the requirements; Replace if test specimen is undesirable, before warranty test, all test specimens are all certified products;

Every group of stress accelerated life test all adopts fixed time test, minimum test period requires to determine according to every group of accelerator coefficient and terminal reliability of accelerating stress level, sample number r >=5 of losing efficacy in the time that minimum test period finishes, test can stop, otherwise should extend test period; And in the time of every group of stress level test, should carry out fail data statistics.

The test method of 12. power information collecting device according to claim 9 reliability demonstrations, is characterized in that: described step 3 comprises the following steps:

Step 3-1: to test figure sequence, and calculate inefficacy sequence number and meta order failure probability estimated value;

Step 3-2: calculate the Weibull distribution parameters of all kinds of failure modes under stress levels at different levels;

Step 3-3: the accelerator coefficient of all kinds of failure modes;

Step 3-4: calculate the accelerator coefficient of all kinds of failure modes under stress levels at different levels;

Step 3-5: calculate the Weibull distribution parameters of all kinds of failure modes under regular service condition;

Step 3-6: calculate cumulative failure probability and the accumulation fiduciary level of all kinds of failure modes under regular service condition.

The test method of 13. power information collecting device according to claim 12 reliability demonstrations, it is characterized in that: in described step 3-1, the item that will suspend sorts by inefficacy accumulated time from small to large with expired entry, inefficacy sequence number and meta order failure probability estimated value respectively through type (3) and (4) are calculated, and have:

r_{j} = \frac{r_{r} \times r_{j - 1} + (N + 1)}{r_{r} + 1} - - - (3)

{F_{r}}_{j} = \frac{(r_{j} - 0.3)}{(N + 0.4)} % - - - (4)

Wherein, r _jbe j the inefficacy sequence number of having adjusted, r _j-1for upper one the inefficacy sequence number of having adjusted, the expired entry that N is this failure mode and a sum that suspends, i.e. test specimen sum; for meta order failure probability estimated value.

The test method of 14. power information collecting device according to claim 12 reliability demonstrations, it is characterized in that: in described step 3-2, Weibull distribution parameters comprises form parameter β and scale parameter η, calculates form parameter β and the scale parameter η process of all kinds of failure modes under stress levels at different levels as follows based on least square method:

The life-span of power information collecting device distributes obeys Weibull distribution, and F for cumulative failure probability (t) represents, has:

F (t) = 1 - e^{{- (t / η)}^{β}} - - - (5)

Natural logarithm is got in formula (5) both sides, has:

- \ln (1 - F (t)) = {(\frac{t}{η})}^{β} - - - (6)

Get again natural logarithm for the second time, have:

\ln (- \ln (1 - F (t))) = β \ln (\frac{t}{η}) = - β \ln (η) + β \ln (t) - - - (7)

If y=ln (ln (1-F (t))), A=-β ln (η), B=β, x=ln (t); Have:

y＝A+Bx (8)

B = \frac{Σ_{i = 1}^{p} x_{i} y_{i} - \frac{Σ_{i = 1}^{p} x_{i} Σ_{i = 1}^{p} y_{i}}{p}}{Σ_{i = 1}^{p} {x_{i}}^{2} - \frac{{(Σ_{i = 1}^{p} x_{i})}^{2}}{p}} - - - (9)

A = \frac{Σ_{i = 1}^{p} y_{i}}{p} - B \frac{Σ_{i = 1}^{p} x_{i}}{p} - - - (10)

Wherein, x _i=ln (TTF _i), TTF _iit is the cumulative failure time that i test specimen lost efficacy; y _i=ln (ln (1-F (TTF _i))), F (TTF _i) be the failure probability losing efficacy corresponding to i test specimen, p is the failure number of observing;

Can obtain form parameter β and scale parameter η by A and B, have:

β＝B (11)

η = e^{- \frac{A}{B}} - - - (12) .

The test method of 15. power information collecting device according to claim 12 reliability demonstrations, is characterized in that: in described step 3-3, the accelerator coefficient of all kinds of failure modes comprises the activation energy representing with electron volts under all kinds of failure modes _a' and accelerator coefficient parameter n '; Computation process is as follows:

Logarithm is asked in formula (1) both sides, obtains:

\ln (AF) = - n \ln (\frac{{RH}_{u}}{{RH}_{s}}) + \frac{E_{a}}{k} (\frac{1}{T_{u}} - \frac{1}{T_{s}}) - - - (13)

Meet time, for the accelerator coefficient under maximum stress level, and aF _ibe the accelerator coefficient under i level stress level, for the scale parameter under maximum stress level, and η _iit is the scale parameter under i level stress level; Have:

\ln (\frac{η_{i}}{η_{1}}) = - n \ln (\frac{{RH}_{i}}{{RH}_{\max}}) + \frac{E_{a}}{k} (\frac{1}{T_{i}} - \frac{1}{T_{\max}}) - - - (14)

Wherein, RH _ibe the humidity under i level stress level, RH _maxfor the high humility of stress level, and there is RH _max=RH ₁=RH ₄; T _ibe the temperature under i level stress level, T _maxfor the maximum temperature of stress level, and there is T _max=T ₁=T ₂=T ₃;

Set equation Z _i=nX _i+ E _ay _i, equation coefficient X _i, Y _iand Z _ibe expressed as:

(1) under first order stress level, X ₁=Y ₁=Z ₁=0;

(2) under the stress level of the second level,

X_{2} = - \ln (\frac{85}{{RH}_{\max}}), Y_{2} = 0, Z_{2} = \ln (\frac{η_{2}}{η_{1}});

(3) under third level stress level,

X_{3} = - \ln (\frac{75}{{RH}_{\max}}), Y_{3} = 0, Z_{3} = \ln (\frac{η_{3}}{η_{1}});

(4) under fourth stage stress level,

X_{4} = 0, Y_{4} = \frac{1}{k} (\frac{1}{273 + 65} - \frac{1}{273 + T_{\max}}), Z_{4} = \ln (\frac{η_{4}}{η_{1}});

Wherein, η ₁, η ₂, η ₃and η ₄be respectively first to fourth grade of scale parameter under stress level;

So activation energy representing with electron volts under all kinds of failure modes _a' be expressed as with accelerator coefficient parameter n ':

E_{a}^{'} = \frac{Σ_{i = 1}^{4} Y_{i} Z_{i} Σ_{i = 1}^{4} X_{i}^{2} - Σ_{i = 1}^{4} X_{i} Z_{i} Σ_{i = 1}^{4} X_{i} Y_{i}}{{(Σ_{i = 1}^{4} X_{i} Y_{i})}^{2} - Σ_{i = 1}^{4} X_{i}^{2} Σ_{i = 1}^{4} Y_{i}^{2}} - - - (15)

n^{'} = \frac{Σ_{i = 1}^{4} X_{i} Z_{i} - E_{a}^{'} Σ_{i = 1}^{4} X_{i} Y_{i}}{Σ_{i = 1}^{4} X_{i}^{2}} - - - (16) .

The test method of 16. power information collecting device according to claim 15 reliability demonstrations, is characterized in that: in described step 3-4, according to the number percent relative humidity RH under regular service condition _uwith the temperature T representing with k under regular service condition _u, and the E calculating _a' and n ' calculate the accelerator coefficient AF ' of all kinds of failure modes under stress levels at different levels, have:

{AF}^{'} = {(\frac{{RH}_{u}}{{RH}_{s}})}^{{- n}^{'}} e^{\frac{E_{a}^{'}}{k} (\frac{1}{T_{u}} - \frac{1}{T_{s}})} - - - (17) .

The test method of 17. power information collecting device according to claim 14 reliability demonstrations, it is characterized in that: in described step 3-5, the Weibull distribution parameters of all kinds of failure modes under regular service condition comprises form parameter β ' and scale parameter η ', and computation process is as follows:

The life-span of power information collecting device distributes obeys Weibull distribution, and the F for cumulative failure probability (t ') of all kinds of failure modes power information collecting device under regular service condition represents, has:

F (t^{'}) = 1 - e^{{- (t^{'} / η^{'})}^{β^{'}}} - - - (18)

Natural logarithm is got in formula (18) both sides, has:

- \ln (1 - F (t^{'})) = {(\frac{t^{'}}{η^{'}})}^{β^{'}} - - - (19)

Get again natural logarithm for the second time, have:

\ln (- \ln (1 - F (t^{'}))) = β^{'} \ln (\frac{t^{'}}{η^{'}}) = - β^{'} \ln (η^{'}) + β \ln (t^{'}) - - - (20)

If y '=ln (ln (1-F (t '))), A '=-β ' ln (η '), B '=β ', x '=ln (t '); Have:

y′＝A′+B′x′ (21)

\begin{matrix} B^{'} = \frac{Σ_{i = 1}^{p} x_{i}^{'} y_{i}^{'} - \frac{Σ_{i = 1}^{p} x_{i}^{'} Σ_{i = 1}^{p} y_{i}^{'}}{p}}{Σ_{i = 1}^{p} x_{i}^{' 2} - \frac{{(Σ_{i = 1}^{p} x_{i}^{'})}^{2}}{p}} - - - (22) \end{matrix}

A^{'} = \frac{Σ_{i = 1}^{p} y_{i}^{'}}{p} - B^{'} \frac{Σ_{i = 1}^{p} x_{i}^{'}}{p} - - - (23)

Wherein, x _i'=ln (TTF _i'), TTF _i' be i the cumulative failure time that test specimen lost efficacy under regular service condition;

Y _i'=ln (ln (1-F (TTF _i'))), F (TTF _i') be that p is the failure number of observing corresponding to i the failure probability that test specimen lost efficacy under regular service condition;

Can obtain form parameter β ' and scale parameter η ' by A ' and B ', have:

β′＝B′ (24)

η^{'} = e^{- \frac{A^{'}}{B^{'}}} - - - (25) .

The test method of 18. power information collecting device according to claim 17 reliability demonstrations, it is characterized in that: in described step 3-6, in form parameter β ' by all kinds of failure modes under regular service condition and scale parameter η ' difference substitution formula (5), obtain the cumulative failure probability F of all kinds of failure modes under regular service condition ₁(t), F ₂(t), F ₃(t), F ₄and F (t) ₅(t); The accumulation fiduciary level of all kinds of failure modes under regular service condition is expressed as

R(t)＝(1-F ₁(t))(1-F ₂(t))(1-F ₃(t))(1-F ₄(t))(1-F ₅(t)) (26)

Wherein, R (t) is the accumulation fiduciary levels of all kinds of failure modes under regular service condition.