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CH522877A - Method and device for continuous monitoring of the thickness of the applied layer of a coated material with the aid of fluorescent rays and application of this method - Google Patents

Method and device for continuous monitoring of the thickness of the applied layer of a coated material with the aid of fluorescent rays and application of this method

Info

Publication number
CH522877A
CH522877A CH1597970A CH1597970A CH522877A CH 522877 A CH522877 A CH 522877A CH 1597970 A CH1597970 A CH 1597970A CH 1597970 A CH1597970 A CH 1597970A CH 522877 A CH522877 A CH 522877A
Authority
CH
Switzerland
Prior art keywords
aid
thickness
application
continuous monitoring
coated material
Prior art date
Application number
CH1597970A
Other languages
German (de)
Inventor
Gruber Ulf
Original Assignee
Landis & Gyr Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Landis & Gyr Ag filed Critical Landis & Gyr Ag
Priority to CH1597970A priority Critical patent/CH522877A/en
Priority to GB4950771A priority patent/GB1331160A/en
Priority to FR7138581A priority patent/FR2113310A5/fr
Publication of CH522877A publication Critical patent/CH522877A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CH1597970A 1970-10-29 1970-10-29 Method and device for continuous monitoring of the thickness of the applied layer of a coated material with the aid of fluorescent rays and application of this method CH522877A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
CH1597970A CH522877A (en) 1970-10-29 1970-10-29 Method and device for continuous monitoring of the thickness of the applied layer of a coated material with the aid of fluorescent rays and application of this method
GB4950771A GB1331160A (en) 1970-10-29 1971-10-25 Determination of the thickness of a coating
FR7138581A FR2113310A5 (en) 1970-10-29 1971-10-27

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH1597970A CH522877A (en) 1970-10-29 1970-10-29 Method and device for continuous monitoring of the thickness of the applied layer of a coated material with the aid of fluorescent rays and application of this method

Publications (1)

Publication Number Publication Date
CH522877A true CH522877A (en) 1972-05-15

Family

ID=4413518

Family Applications (1)

Application Number Title Priority Date Filing Date
CH1597970A CH522877A (en) 1970-10-29 1970-10-29 Method and device for continuous monitoring of the thickness of the applied layer of a coated material with the aid of fluorescent rays and application of this method

Country Status (3)

Country Link
CH (1) CH522877A (en)
FR (1) FR2113310A5 (en)
GB (1) GB1331160A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0380226A1 (en) * 1989-01-19 1990-08-01 Tava Corporation Method for measuring coating thickness

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4656357A (en) * 1985-04-16 1987-04-07 Twin City International, Inc. Apparatus for measuring coating thickness
FR2895792B1 (en) * 2005-12-29 2008-02-22 Commissariat Energie Atomique MEASUREMENT OF THICKNESS OF FILM (S) PRESENT (S) IN THIN LAYER ON A SAMPLE SUBSTRATE
AU2020210650B2 (en) * 2019-01-25 2021-03-18 Allied Bioscience, Inc. Analysis of antimicrobial coatings using XRF
CN110926399A (en) * 2019-12-10 2020-03-27 中国电子科技集团公司第四十六研究所 Method for testing thickness of metal filament ultrathin metal coating

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0380226A1 (en) * 1989-01-19 1990-08-01 Tava Corporation Method for measuring coating thickness

Also Published As

Publication number Publication date
GB1331160A (en) 1973-09-26
FR2113310A5 (en) 1972-06-23

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Legal Events

Date Code Title Description
PL Patent ceased