[go: up one dir, main page]

BRPI0917910A2 - método para detectar amostra de aspereza e aparelho para o método - Google Patents

método para detectar amostra de aspereza e aparelho para o método

Info

Publication number
BRPI0917910A2
BRPI0917910A2 BRPI0917910A BRPI0917910A BRPI0917910A2 BR PI0917910 A2 BRPI0917910 A2 BR PI0917910A2 BR PI0917910 A BRPI0917910 A BR PI0917910A BR PI0917910 A BRPI0917910 A BR PI0917910A BR PI0917910 A2 BRPI0917910 A2 BR PI0917910A2
Authority
BR
Brazil
Prior art keywords
roughness sample
detecting roughness
detecting
sample
roughness
Prior art date
Application number
BRPI0917910A
Other languages
English (en)
Inventor
Toshikatsu Sekiguchi
Original Assignee
Bridgestone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bridgestone Corp filed Critical Bridgestone Corp
Publication of BRPI0917910A2 publication Critical patent/BRPI0917910A2/pt
Publication of BRPI0917910B1 publication Critical patent/BRPI0917910B1/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M17/00—Testing of vehicles
    • G01M17/007—Wheeled or endless-tracked vehicles
    • G01M17/02—Tyres
    • G01M17/027—Tyres using light, e.g. infrared, ultraviolet or holographic techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
BRPI0917910-0A 2008-08-26 2009-08-25 Método e aparelho para detectar desigualdade de superfície de um objeto sob inspeção BRPI0917910B1 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2008217117 2008-08-26
JP2008-217117 2008-08-26
PCT/JP2009/064795 WO2010024254A1 (ja) 2008-08-26 2009-08-25 被検体の凹凸検出方法とその装置

Publications (2)

Publication Number Publication Date
BRPI0917910A2 true BRPI0917910A2 (pt) 2016-07-26
BRPI0917910B1 BRPI0917910B1 (pt) 2019-08-20

Family

ID=41721421

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0917910-0A BRPI0917910B1 (pt) 2008-08-26 2009-08-25 Método e aparelho para detectar desigualdade de superfície de um objeto sob inspeção

Country Status (6)

Country Link
US (1) US8948491B2 (pt)
EP (1) EP2322899B1 (pt)
JP (1) JP5436431B2 (pt)
BR (1) BRPI0917910B1 (pt)
MX (1) MX2011002160A (pt)
WO (1) WO2010024254A1 (pt)

Families Citing this family (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2729640B2 (ja) 1988-11-21 1998-03-18 江東電気株式会社 メタルハライド放電灯
FR2957417B1 (fr) * 2010-03-15 2013-01-04 Michelin Soc Tech Dispositif de maintien destine a l'inspection visuelle d'un pneumatique
JP5837283B2 (ja) * 2010-03-18 2015-12-24 株式会社ブリヂストン タイヤの外観検査方法および外観検査装置
JP2011227006A (ja) * 2010-04-23 2011-11-10 Nidec Tosok Corp 刻印検査装置
JP5570890B2 (ja) * 2010-07-05 2014-08-13 株式会社ブリヂストン タイヤの外観検査方法および外観検査装置
JP2012038692A (ja) * 2010-08-12 2012-02-23 Alpha- Design Kk コネクタ不具合検査装置
JP5503470B2 (ja) * 2010-09-07 2014-05-28 株式会社ブリヂストン マーク打点方法及びマーク打点装置
US8824878B2 (en) * 2010-11-25 2014-09-02 Toyo Tire & Rubber Co., Ltd. Illumination device and inspection device of tire
JP5562278B2 (ja) * 2011-03-15 2014-07-30 株式会社神戸製鋼所 タイヤ形状検査装置、及びタイヤ形状検査方法
JP5827028B2 (ja) * 2011-04-07 2015-12-02 ユニバーサル製缶株式会社 ボトル缶の口金部検査装置
US8538128B2 (en) * 2011-04-11 2013-09-17 The Procter & Gamble Company Method for determining the location of an additive in an article
JP5443435B2 (ja) * 2011-05-17 2014-03-19 シャープ株式会社 タイヤの欠陥検出方法
EP2735433B1 (en) * 2011-07-20 2018-02-07 Bridgestone Corporation Bead filler testing device, program for bead filler testing, and bead filler testing method
JP5882730B2 (ja) 2011-12-28 2016-03-09 株式会社ブリヂストン 外観検査装置及び外観検査方法
JP6317892B2 (ja) * 2013-06-06 2018-04-25 株式会社ブリヂストン 外観検査装置及び外観検査方法
US10063837B2 (en) * 2013-07-25 2018-08-28 TIREAUDIT.COM, Inc. System and method for analysis of surface features
JP5775132B2 (ja) * 2013-11-01 2015-09-09 株式会社ブリヂストン タイヤの検査装置
CN105705940B (zh) * 2013-11-06 2019-08-09 不二精工株式会社 填胶的连接部检查方法
KR102534392B1 (ko) * 2014-12-22 2023-05-19 피렐리 타이어 소시에떼 퍼 아찌오니 생산라인에서 타이어를 제어하기 위한 기기
KR102596252B1 (ko) * 2014-12-22 2023-10-31 피렐리 타이어 소시에떼 퍼 아찌오니 생산라인에서 타이어를 검사하기 위한 방법 및 기기
JP6475027B2 (ja) * 2015-01-27 2019-02-27 国立研究開発法人産業技術総合研究所 表面検査装置および表面検査方法、ならびにそのためのプログラムおよびそのプログラムの記録媒体
CN104677314A (zh) * 2015-03-02 2015-06-03 合肥京东方光电科技有限公司 检测显示面板表面平坦度的装置及方法
EP3179205B1 (en) * 2015-05-29 2018-09-05 Nippon Steel & Sumitomo Metal Corporation Metal body shape inspection apparatus and metal body shape inspection method
CN108369159B (zh) 2015-12-16 2021-05-25 倍耐力轮胎股份公司 用于分析轮胎的装置和方法
EP3391011B1 (en) 2015-12-16 2020-02-19 Pirelli Tyre S.p.A. Method and apparatus for checking tyres
MX380029B (es) * 2015-12-16 2025-03-11 Pirelli Metodo y dispositivo para verificar neumaticos.
RU2722779C2 (ru) * 2015-12-28 2020-06-03 Пирелли Тайр С.П.А. Устройство для контроля шин
JP6732027B2 (ja) 2015-12-28 2020-07-29 ピレリ・タイヤ・ソチエタ・ペル・アツィオーニ タイヤを検査するための装置および方法
BR112018012635B1 (pt) 2015-12-28 2022-11-08 Pirelli Tyre S.P.A Aparelho para verificação de pneus
US10145981B2 (en) * 2016-02-12 2018-12-04 Garadget Inc. System, device, and method for monitoring and controlling the position of a remote object
US10789773B2 (en) 2016-03-04 2020-09-29 TIREAUDIT.COM, Inc. Mesh registration system and method for diagnosing tread wear
US11472234B2 (en) 2016-03-04 2022-10-18 TIREAUDIT.COM, Inc. Mesh registration system and method for diagnosing tread wear
IT201700016046A1 (it) * 2017-02-14 2018-08-14 Tekna Automazione E Controllo S R L Apparato per il rilevamento e la verifica di difetti superficiali di un pneumatico al termine di un processo di produzione
JP7087533B2 (ja) * 2018-03-26 2022-06-21 住友電気工業株式会社 表面状態検査装置及び表面状態検査方法
JP7251559B2 (ja) * 2019-02-15 2023-04-04 日本電気株式会社 情報処理装置
WO2020174596A1 (ja) * 2019-02-26 2020-09-03 日本電気株式会社 画像撮影装置
DE112019007030T5 (de) * 2019-03-15 2021-12-02 Yamaha Hatsudoki Kabushiki Kaisha Messvorrichtung und Oberflächenmontgeeinrichtung
CN110038822A (zh) * 2019-04-20 2019-07-23 东莞中科蓝海智能视觉科技有限公司 反光圆环件的视觉检测方法
CN117739875B (zh) * 2024-02-19 2024-04-23 湖南沃尔博精密工具有限公司 一种基于光电效应的刀具涂层均匀性检测系统及方法

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5892904A (ja) 1981-11-30 1983-06-02 Hitachi Ltd 面方向の検出方法及び同装置
JPH071164B2 (ja) * 1985-02-28 1995-01-11 ソニー株式会社 三次元形状の認識装置
JP2864993B2 (ja) 1994-07-06 1999-03-08 信越半導体株式会社 表面形状測定装置
JP3312849B2 (ja) * 1996-06-25 2002-08-12 松下電工株式会社 物体表面の欠陥検出方法
JP3686182B2 (ja) * 1996-09-13 2005-08-24 Ｊｆｅスチール株式会社 表面形状測定方法及び装置
US5987978A (en) * 1997-04-02 1999-11-23 Assembly Technology & Test Ltd. Apparatus for testing tire tread depth
JP3949796B2 (ja) 1997-11-06 2007-07-25 株式会社ブリヂストン タイヤ形状判定装置
AT406528B (de) * 1998-05-05 2000-06-26 Oesterr Forsch Seibersdorf Verfahren und einrichtung zur feststellung, insbesondere zur visualisierung, von fehlern auf der oberfläche von gegenständen
US6269689B1 (en) * 1998-07-22 2001-08-07 Oliver Rubber Company Tire inspection equipment and method
SE511985C2 (sv) * 1999-01-28 2000-01-10 Skogsind Tekn Foskningsinst Topografisk bestämning av en av infallande ljus belyst yta
US6327374B1 (en) * 1999-02-18 2001-12-04 Thermo Radiometrie Oy Arrangement and method for inspection of surface quality
JP4514007B2 (ja) * 1999-12-28 2010-07-28 株式会社ブリヂストン 被検体の外観形状検査方法及び装置
JP2002228417A (ja) 2001-02-01 2002-08-14 Shinei Denshi Keisokki Kk クラック測定装置
KR100406843B1 (ko) * 2001-04-06 2003-11-21 (주) 인텍플러스 색정보를 이용한 실시간 3차원 표면형상 측정방법 및 장치
JP2003139714A (ja) 2001-11-06 2003-05-14 Ube Ind Ltd 物体表面状態の評価方法
JP2003202214A (ja) * 2002-01-04 2003-07-18 Mitsubishi Electric Corp 形状計測装置および形状計測方法
JP2003240521A (ja) 2002-02-21 2003-08-27 Bridgestone Corp 被検体の外観・形状検査方法とその装置、及び、被検体の外観・形状検出装置
JP2005148010A (ja) 2003-11-19 2005-06-09 Bridgestone Corp 被検体の形状及び明暗の検出方法とその装置
DE102005058873A1 (de) * 2005-12-09 2007-06-14 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung und Verfahren zur Vermessung der Oberfläche eines Körpers
US7471381B2 (en) * 2006-05-23 2008-12-30 Agency For Science, Technology And Research Method and apparatus for bump inspection
JP5019849B2 (ja) * 2006-11-02 2012-09-05 株式会社ブリヂストン タイヤの表面検査方法および装置

Also Published As

Publication number Publication date
US8948491B2 (en) 2015-02-03
BRPI0917910B1 (pt) 2019-08-20
WO2010024254A1 (ja) 2010-03-04
EP2322899A4 (en) 2015-10-28
EP2322899B1 (en) 2022-03-16
US20110188731A1 (en) 2011-08-04
JPWO2010024254A1 (ja) 2012-01-26
MX2011002160A (es) 2011-04-05
EP2322899A1 (en) 2011-05-18
JP5436431B2 (ja) 2014-03-05

Similar Documents

Publication Publication Date Title
BRPI0917910A2 (pt) método para detectar amostra de aspereza e aparelho para o método
BRPI0916492A2 (pt) dispositivo e método para detectar depósitos
FI20080182A0 (fi) Mittausmenetelmä ja -laite
BRPI0921173A2 (pt) metodo e dispositivo para medicao de distancia
BRPI0917288A2 (pt) sensor de biomems e aparelhos e métodos para o mesmo
BRPI0918357A2 (pt) sistema e método para processamento de amostras
BR112012005568A2 (pt) aparelho e métodos para medir processos biológicos
BRPI0909361A2 (pt) subconjunto sensor de analito e métodos e aparelhos para inserir um sensor de analito associado com o mesmo
BRPI0923566A2 (pt) método e sistema para detecção de uma expressão vocal relevante
BRPI0918588A2 (pt) método e aparelho para detecção de defeitos
BRPI1010670A2 (pt) método e aparelho para sensoriamento ótico
BRPI0910587A2 (pt) método e aparelho para eletrogalvanização
BRPI0912934A2 (pt) aparelho e método
BRPI1008835A2 (pt) sensor de analito e aparelho para inserção do sensor
BRPI0822972A2 (pt) "método e aparelho para redução de atrito"
BRPI0918358A2 (pt) sistema e método para a concentração de amostras
BRPI0910713A2 (pt) método e aparelhos
EP2264446A4 (en) Periodic defect detecting device and method for the same
BRPI0910885A2 (pt) método e aparelho para determinação de posição com dados de órbita sps híbridos
BRPI0914120A2 (pt) método e aparelho para determinação estrutural
BRPI0906907A2 (pt) Carreador para a detecção óptica em uma amostra em uma câmara de amostra adjacente e aparelho para a detecção óptica em uma amostra em uma câmara de amostra.
FI20085665A0 (fi) Menetelmä ja laite etäisyyden mittaamiseen
BRPI1015922A2 (pt) sistemas e métodos para testar analitos
BRPI0912722A2 (pt) método de ensaio magnético e aparelhagem de ensaio magnético
BRPI0820721A2 (pt) Reagentes e métodos para detectar analitos

Legal Events

Date Code Title Description
B15K Others concerning applications: alteration of classification

Free format text: AS CLASSIFICACOES ANTERIORES ERAM: G01B 11/30 , G01N 21/88

Ipc: G01B 11/30 (1968.09), G01N 21/88 (1980.01), G01N 2

B06F Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette]
B06T Formal requirements before examination [chapter 6.20 patent gazette]
B09A Decision: intention to grant [chapter 9.1 patent gazette]
B16A Patent or certificate of addition of invention granted [chapter 16.1 patent gazette]

Free format text: PRAZO DE VALIDADE: 20 (VINTE) ANOS CONTADOS A PARTIR DE 25/08/2009, OBSERVADAS AS CONDICOES LEGAIS. (CO) 20 (VINTE) ANOS CONTADOS A PARTIR DE 25/08/2009, OBSERVADAS AS CONDICOES LEGAIS

B21F Lapse acc. art. 78, item iv - on non-payment of the annual fees in time

Free format text: REFERENTE A 13A ANUIDADE.

B24J Lapse because of non-payment of annual fees (definitively: art 78 iv lpi, resolution 113/2013 art. 12)

Free format text: EM VIRTUDE DA EXTINCAO PUBLICADA NA RPI 2685 DE 21-06-2022 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDA A EXTINCAO DA PATENTE E SEUS CERTIFICADOS, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.