BRPI0815425A2 - dispositivo de medição para medir um feixe laser concentrado - Google Patents

dispositivo de medição para medir um feixe laser concentrado

Info

Publication number: BRPI0815425A2
Authority: BR; Brazil
Prior art keywords: measuring; laser beam; concentrated laser; measuring device; concentrated
Prior art date: 2007-09-13

Application number

BRPI0815425A

Other languages

English (en)

Inventor

Kittleman Olaf

Zerl Bernd

Original Assignee

Wavelight Ag

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2007-09-13

Filing date

2008-09-12

Publication date

2016-08-09

2008-09-12 Application filed by Wavelight Ag filed Critical Wavelight Ag

2016-08-09 Publication of BRPI0815425A2 publication Critical patent/BRPI0815425A2/pt

2019-04-09 Publication of BRPI0815425B1 publication Critical patent/BRPI0815425B1/pt

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0448—Adjustable, e.g. focussing

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Spectroscopy & Molecular Physics (AREA)
Optics & Photonics (AREA)
Lens Barrels (AREA)
Length Measuring Devices By Optical Means (AREA)
Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Testing Of Optical Devices Or Fibers (AREA)

BRPI0815425-2A 2007-09-13 2008-09-12 Dispositivo de medição para medir um feixe laser concentrado BRPI0815425B1 (pt)

Applications Claiming Priority (3)

Application Number	Priority Date	Filing Date	Title
EP07017968.4		2007-09-13
EP07017968A EP2037238B1 (de)	2007-09-13	2007-09-13	Messgerät zur Vermessung eines Laserstrahls
PCT/EP2008/007575 WO2009036932A1 (de)	2007-09-13	2008-09-12	Messgerät zur vermessung eines fokussierten laserstrahls

Publications (2)

Publication Number	Publication Date
BRPI0815425A2 true BRPI0815425A2 (pt)	2016-08-09
BRPI0815425B1 BRPI0815425B1 (pt)	2019-04-09

Family

ID=39059375

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
BRPI0815425-2A BRPI0815425B1 (pt)	2007-09-13	2008-09-12	Dispositivo de medição para medir um feixe laser concentrado

Country Status (14)

Country	Link
US (1)	US8351028B2 (pt)
EP (1)	EP2037238B1 (pt)
JP (1)	JP5554710B2 (pt)
KR (1)	KR101255796B1 (pt)
CN (1)	CN101821595B (pt)
BR (1)	BRPI0815425B1 (pt)
CA (1)	CA2699629C (pt)
DE (1)	DE502007001924D1 (pt)
ES (1)	ES2333369T3 (pt)
IN (1)	IN2010KN00855A (pt)
MX (1)	MX2010002894A (pt)
RU (1)	RU2474795C2 (pt)
TW (1)	TW200920334A (pt)
WO (1)	WO2009036932A1 (pt)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE102010029089B4 (de) *	2010-05-18	2019-08-29	Carl Zeiss Ag	Optisches System zur Kalibrierung einer Lichtquelle
CN102384782A (zh) *	2010-09-06	2012-03-21	杭州法珀激光科技有限公司	手持式激光光束分析仪
FR2974176B1 (fr)	2011-04-14	2014-01-17	Centre Nat Rech Scient	Analyseur spatial de faisceau laser a reglage automatique
CN105606213B (zh) *	2015-12-05	2018-02-13	中国航空工业集团公司洛阳电光设备研究所	一种激光微脉冲峰值功率测试装置
DE102016009475B4 (de) *	2016-08-05	2019-06-19	Primes GmbH Meßtechnik für die Produktion mit Laserstrahlung	Strahlleistungsmessung mit Aufweitung
KR102680056B1 (ko) *	2017-06-23	2024-06-28	예놉틱 옵틱컬 시스템즈 게엠베하	빔 확장기 조정 지원 방법, 조정 지원 장치 및 빔 확장기
WO2020009787A1 (en) *	2018-07-05	2020-01-09	Applied Materials, Inc.	Photomask pellicle glue residue removal
US11243114B2 (en) *	2018-09-17	2022-02-08	Trumpf Lasersystems For Semiconductor Manufacturing Gmbh	Method for determining at least one beam propagation parameter of a laser beam
TWI729403B (zh) *	2019-05-31	2021-06-01	致茂電子股份有限公司	光電元件特性測量裝置
CN116907369B (zh) *	2023-09-06	2023-12-12	太原科技大学	一种螺旋焊管管径激光检测系统及其使用方法

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JPH071201B2 (ja) *	1989-01-17	1995-01-11	株式会社オプトアート	光ビーム測定装置
US5194993A (en) *	1991-09-24	1993-03-16	Eastman Kodak Company	Adjustable mount for cylindrical lens
FR2698182B1 (fr) *	1992-11-13	1994-12-16	Commissariat Energie Atomique	Dispositif de contrôle du centrage d'un faisceau lumineux, application à l'introduction de ce faisceau dans une fibre optique.
JPH071201A (ja)	1993-02-28	1995-01-06	Sanshin Kogyo Kk	円筒部材の加工方法
CN2293794Y (zh) *	1997-04-28	1998-10-07	中国科学技术大学	可调式半导体激光准直头
JP2000234916A (ja) *	1999-02-15	2000-08-29	Konica Corp	光ビーム形状計測装置及びアライメント測定装置
JP2001004491A (ja) *	1999-06-25	2001-01-12	Sankyo Seiki Mfg Co Ltd	光ビームの検査装置
US6922232B2 (en)	2002-09-24	2005-07-26	Infineon Technologies North America Corp.	Test system for laser diode far-field pattern measurement
RU40103U1 (ru) *	2004-01-08	2004-08-27	Федеральное государственное унитарное предприятие "Производственное объединение "Уральский оптико-механический завод"	Устройство для определения углового рассогласования пучков лазерного излучения
TW200608475A (en)	2004-08-26	2006-03-01	Adv Lcd Tech Dev Ct Co Ltd	Method of picking up sectional image of laser light
JP3935168B2 (ja) *	2004-08-26	2007-06-20	シャープ株式会社	レンズ鏡筒装置
US20060254115A1 (en) *	2004-11-22	2006-11-16	Thomas Mark A	Optical sight with side focus adjustment
WO2006078349A2 (en) *	2004-11-22	2006-07-27	Meade Instruments Corporation	Scope for a firearm
JP4524403B2 (ja) *	2005-05-31	2010-08-18	三菱電機株式会社	フーリエ変換光学装置及び光制御型フェーズドアレイアンテナ装置
JP4049171B2 (ja) *	2005-07-08	2008-02-20	コニカミノルタオプト株式会社	鏡胴ユニット並びに撮像装置
US7463342B2 (en) *	2007-05-02	2008-12-09	Angstrom, Inc.	Optical tracking device using micromirror array lenses

2007
- 2007-09-13 EP EP07017968A patent/EP2037238B1/de active Active
- 2007-09-13 DE DE502007001924T patent/DE502007001924D1/de active Active
- 2007-09-13 ES ES07017968T patent/ES2333369T3/es active Active
2008
- 2008-09-12 IN IN855KON2010 patent/IN2010KN00855A/en unknown
- 2008-09-12 BR BRPI0815425-2A patent/BRPI0815425B1/pt not_active IP Right Cessation
- 2008-09-12 RU RU2010113570/28A patent/RU2474795C2/ru not_active IP Right Cessation
- 2008-09-12 KR KR1020107008066A patent/KR101255796B1/ko not_active Expired - Fee Related
- 2008-09-12 WO PCT/EP2008/007575 patent/WO2009036932A1/de not_active Ceased
- 2008-09-12 JP JP2010524407A patent/JP5554710B2/ja active Active
- 2008-09-12 TW TW097135025A patent/TW200920334A/zh unknown
- 2008-09-12 CN CN200880106717.7A patent/CN101821595B/zh active Active
- 2008-09-12 CA CA2699629A patent/CA2699629C/en active Active
- 2008-09-12 MX MX2010002894A patent/MX2010002894A/es active IP Right Grant
- 2008-09-12 US US12/677,776 patent/US8351028B2/en active Active

Also Published As

Publication number	Publication date
TW200920334A (en)	2009-05-16
KR101255796B1 (ko)	2013-04-17
BRPI0815425B1 (pt)	2019-04-09
MX2010002894A (es)	2010-04-01
JP2010539459A (ja)	2010-12-16
KR20100063118A (ko)	2010-06-10
RU2474795C2 (ru)	2013-02-10
JP5554710B2 (ja)	2014-07-23
ES2333369T3 (es)	2010-02-19
EP2037238A1 (de)	2009-03-18
EP2037238B1 (de)	2009-11-04
CA2699629C (en)	2016-04-19
CN101821595A (zh)	2010-09-01
DE502007001924D1 (de)	2009-12-17
WO2009036932A1 (de)	2009-03-26
IN2010KN00855A (pt)	2015-08-28
CA2699629A1 (en)	2009-03-26
US8351028B2 (en)	2013-01-08
US20100253937A1 (en)	2010-10-07
CN101821595B (zh)	2014-11-26
RU2010113570A (ru)	2011-10-20

Publication	Publication Date	Title
BRPI0815425A2 (pt)	2016-08-09	dispositivo de medição para medir um feixe laser concentrado
BRPI0914476A2 (pt)	2015-10-27	dispositivo cirúrgico portátil de mão a laser
BRPI0918716A2 (pt)	2015-12-01	dispositivos de diodo emissor de luz para a geracao de feixe largo offset
DE602007003107D1 (de)	2009-12-24	Faserlaserstrahlbearbeitungsgerät
BR112013018970A2 (pt)	2017-03-28	dispositivo de marcação a laser.
BRPI0917549A2 (pt)	2017-07-04	dispositivo para a liberação de um medicamento
FR2938659B3 (fr)	2011-04-01	Dispositif de mesure de distance par laser
BRPI0815507A2 (pt)	2015-02-10	Espectrômetro para fundo do furo por arranjo de diodo laser
BRPI1014310A2 (pt)	2016-04-05	imagem a laser
BRPI0919682A2 (pt)	2015-12-01	mecanismo de fixação para um dispensador
BRPI0921668A2 (pt)	2018-06-26	direcionamento de feixe ótico
PL2237731T3 (pl)	2018-02-28	Urządzenie do zabiegu dermatologicznego wykorzystujące wiązkę laserową
BRPI0919872A2 (pt)	2015-12-15	dispositivo para a fixação de imãs
EP2185913A4 (en)	2015-04-01	PHOTOACOUSTIC JOULEMETER USING BEAM DEFLECTION TECHNIQUE
FR2911693B3 (fr)	2009-08-07	Telemetre laser
DE112008001852A5 (de)	2010-04-22	Abstimmbarer Laser
BRPI0812805A2 (pt)	2014-12-09	Formas de dosagem marcadas a laser
BRPI0811075A2 (pt)	2014-12-09	Mecanismo de ajuste para um guincho
BRPI0921666A2 (pt)	2019-09-24	direção de feixe ótico
IT1391351B1 (it)	2011-12-13	Unità di marcatura laser di pacchetti.
DK2381543T3 (da)	2019-10-07	Fiberlaserapparat
BRPI0818898A2 (pt)	2015-05-05	Pacote para um dispositivo de distribuição.
EP2106628A4 (en)	2015-07-01	FIBER LASER
BRPI0821997A2 (pt)	2016-08-02	sistema para controlar um feixe laser
FR2911692B3 (fr)	2009-08-07	Telemetre laser

Legal Events

Date	Code	Title	Description
2018-07-31	B06T	Formal requirements before examination [chapter 6.20 patent gazette]
2019-01-02	B06A	Patent application procedure suspended [chapter 6.1 patent gazette]
2019-03-19	B09A	Decision: intention to grant [chapter 9.1 patent gazette]
2019-04-09	B16A	Patent or certificate of addition of invention granted [chapter 16.1 patent gazette]	Free format text: PRAZO DE VALIDADE: 10 (DEZ) ANOS CONTADOS A PARTIR DE 09/04/2019, OBSERVADAS AS CONDICOES LEGAIS. (CO) 10 (DEZ) ANOS CONTADOS A PARTIR DE 09/04/2019, OBSERVADAS AS CONDICOES LEGAIS
2020-03-17	B25D	Requested change of name of applicant approved	Owner name: WAVELIGHT GMBH (DE)
2020-04-07	B25A	Requested transfer of rights approved	Owner name: ALCON INC. (CH)
2021-08-10	B21F	Lapse acc. art. 78, item iv - on non-payment of the annual fees in time	Free format text: REFERENTE A 13A ANUIDADE.
2021-11-30	B24J	Lapse because of non-payment of annual fees (definitively: art 78 iv lpi, resolution 113/2013 art. 12)	Free format text: EM VIRTUDE DA EXTINCAO PUBLICADA NA RPI 2640 DE 10-08-2021 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDA A EXTINCAO DA PATENTE E SEUS CERTIFICADOS, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.