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BRPI0400231A - Medidor de parâmetros ópticos e método de caracterização de parâmetros ópticos de dispositivo ópticos multi-portas - Google Patents

Medidor de parâmetros ópticos e método de caracterização de parâmetros ópticos de dispositivo ópticos multi-portas

Info

Publication number
BRPI0400231A
BRPI0400231A BR0400231-8A BRPI0400231A BRPI0400231A BR PI0400231 A BRPI0400231 A BR PI0400231A BR PI0400231 A BRPI0400231 A BR PI0400231A BR PI0400231 A BRPI0400231 A BR PI0400231A
Authority
BR
Brazil
Prior art keywords
optical
port
signals
matrix
parameter
Prior art date
Application number
BR0400231-8A
Other languages
English (en)
Inventor
Elso Luiz Rigon
Nelson Kiyoshi Sasaki
Rafael Faraone Rando
Sergio Barcelos
Original Assignee
Fiberwork Comunicacoees Optica
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fiberwork Comunicacoees Optica filed Critical Fiberwork Comunicacoees Optica
Priority to BR0400231-8A priority Critical patent/BRPI0400231A/pt
Priority to EP05700226A priority patent/EP1709415A1/en
Priority to CA002552915A priority patent/CA2552915A1/en
Priority to JP2006548045A priority patent/JP2007518980A/ja
Priority to PCT/BR2005/000004 priority patent/WO2005068965A1/en
Priority to US10/596,101 priority patent/US20070146721A1/en
Publication of BRPI0400231A publication Critical patent/BRPI0400231A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/337—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by measuring polarization dependent loss [PDL]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3109—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
    • G01M11/3136—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR for testing of multiple fibers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/331—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by using interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/333—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face using modulated input signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/335—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face using two or more input wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/338—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by measuring dispersion other than PMD, e.g. chromatic dispersion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/39—Testing of optical devices, constituted by fibre optics or optical waveguides in which light is projected from both sides of the fiber or waveguide end-face

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Dispersion Chemistry (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
  • Optical Communication System (AREA)

Abstract

"MEDIDOR DE PARâMETROS óPTICOS E MéTODO DE CARACTERIZAçãO DE PARâMETROS óPTICOS DE DISPOSITIVOS óPTICOS MULTI-PORTAS". Compreendendo meios de controle do processo de caracterização, uma ou mais fontes de sinal óptico de teste (fonte de laser sintonizável), circuitaria óptica contendo fibras ópticas e diversos outros componentes ópticos de modo a constituir um arranjo óptico interferométrico, conectores ópticos, interfaces optoeletrónicas, fotodetectores, circuitaria eletrónica analógica, circuitaria eletrónica digital para processamento digital de sinais e circuitaria eletrónica de aquisição de dados, no qual os sinais ópticos de teste e os sinais ópticos de referência percorrem percursos de comprimentos quaisquer, comprimentos estes que podem ser idênticos ou distintos, sendo os sinais ópticos dos braços do interferómetro modulados na fase e/ou na freq³ência. O invento é dotado de recursos que o tornam imune às vibrações e às variações de temperatura. O invento descreve a transferência de sinais ópticos entre as diversas portas do dispositivo sob teste (DUT) através de Parâmetros 'S' ópticos, onde cada parâmetro 'S~ xy~' é representado utilizando formalismos de Jones (matriz de Jones) e/ou de M³ller (matriz de M³ller). A partir da matriz de parâmetros 'S' são derivadas todas as características ópticas do DUT, tais como: largura de banda passante, fase, tempo de atraso, dispersão cromática, dispersão de 2a ordem, refletância, coeficiente de reflexão, transmitância da porta 'y' para a porta 'x' e vice-versa, coeficiente de transmissão da porta 'y' para a porta 'x' e vice-versa, perda de inserção, perda dependente de polarização, dispersão do modo de polarização (DGD/PMD), DGD de 2a ordem, etc..
BR0400231-8A 2004-01-13 2004-01-13 Medidor de parâmetros ópticos e método de caracterização de parâmetros ópticos de dispositivo ópticos multi-portas BRPI0400231A (pt)

Priority Applications (6)

Application Number Priority Date Filing Date Title
BR0400231-8A BRPI0400231A (pt) 2004-01-13 2004-01-13 Medidor de parâmetros ópticos e método de caracterização de parâmetros ópticos de dispositivo ópticos multi-portas
EP05700226A EP1709415A1 (en) 2004-01-13 2005-01-13 System and method for measurement of optical parameters and characterization of multiport optical devices
CA002552915A CA2552915A1 (en) 2004-01-13 2005-01-13 System and method for measurement of optical parameters and characterization of multiport optical devices
JP2006548045A JP2007518980A (ja) 2004-01-13 2005-01-13 光学”ｓ”パラメーターの概念を用いたオプティカルパラメーター測定器及びマルチポート光学装置特性把握法
PCT/BR2005/000004 WO2005068965A1 (en) 2004-01-13 2005-01-13 System and method for measurement of optical parameters and characterization of multiport optical devices
US10/596,101 US20070146721A1 (en) 2004-01-13 2005-01-13 System and method for measurement of optical parameters and characterization of multiport optical devices

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
BR0400231-8A BRPI0400231A (pt) 2004-01-13 2004-01-13 Medidor de parâmetros ópticos e método de caracterização de parâmetros ópticos de dispositivo ópticos multi-portas

Publications (1)

Publication Number Publication Date
BRPI0400231A true BRPI0400231A (pt) 2005-09-13

Family

ID=36955050

Family Applications (1)

Application Number Title Priority Date Filing Date
BR0400231-8A BRPI0400231A (pt) 2004-01-13 2004-01-13 Medidor de parâmetros ópticos e método de caracterização de parâmetros ópticos de dispositivo ópticos multi-portas

Country Status (6)

Country Link
US (1) US20070146721A1 (pt)
EP (1) EP1709415A1 (pt)
JP (1) JP2007518980A (pt)
BR (1) BRPI0400231A (pt)
CA (1) CA2552915A1 (pt)
WO (1) WO2005068965A1 (pt)

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US7667830B2 (en) 2004-05-13 2010-02-23 The Boeing Company Mixer-based time domain reflectometer and method
US8045143B2 (en) * 2006-10-23 2011-10-25 The Boeing Company Optical phase domain reflectometer
US8369442B2 (en) * 2007-01-12 2013-02-05 Fujitsu Limited Communicating a signal according to ASK modulation and PSK modulation
FR2930048B1 (fr) * 2008-04-15 2010-05-28 Commissariat Energie Atomique Test non destructif d'un coupleur optique integre dans un circuit optique integre.
KR20100065540A (ko) * 2008-12-08 2010-06-17 한국전자통신연구원 파장 가변 광 인터리버
US8913636B2 (en) * 2009-04-29 2014-12-16 Montana State University Precise broadband frequency modulated laser
US8614795B2 (en) 2011-07-21 2013-12-24 Baker Hughes Incorporated System and method of distributed fiber optic sensing including integrated reference path
CN102694593B (zh) * 2012-05-30 2015-04-15 武汉邮电科学研究院 一种光无源器件的谱特性的测试方法
WO2014153325A1 (en) * 2013-03-19 2014-09-25 Intuitive Surgical Operations Inc. Methods and apparatus for simultaneous optical parameter measurements
US9817046B2 (en) 2014-10-09 2017-11-14 Keysight Technologies, Inc. System and method for measurement of S-parameters and dispersion and providing a blended solution of both
US10352685B2 (en) * 2014-12-17 2019-07-16 Geospace Technologies Corporation Pressure insensitive interferometer
WO2016099923A1 (en) 2014-12-17 2016-06-23 Pgs Geophysical As Optical filter
US9673900B2 (en) 2015-06-03 2017-06-06 Keysight Technologies, Inc. Optically synthesized tracking signal source and network analyzer using same
WO2017061247A1 (ja) * 2015-10-09 2017-04-13 ソニー株式会社 バスシステムおよび通信装置
CN113777073B (zh) * 2021-08-12 2024-05-14 香港理工大学深圳研究院 一种基于光学相位放大的气体检测方法和系统
CN114942228B (zh) * 2022-07-21 2022-10-21 中国人民解放军国防科技大学 材料瞬态特性的精准测量装置及方法
CN116094599B (zh) * 2022-12-22 2025-08-12 中国电子科技集团公司第三十四研究所 一种基于激光器移频的光纤稳相传输设备
FR3147391B1 (fr) * 2023-03-30 2025-12-05 Univ Bourgogne Caracterisation du comportement non-lineaire d’un guide d’onde
CN116938327B (zh) * 2023-09-18 2024-01-26 青岛诺克通信技术有限公司 一种ftth光纤链路测试方法及系统

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* Cited by examiner, † Cited by third party
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US6376830B1 (en) * 1999-09-14 2002-04-23 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration System and method for measuring the transfer function of a guided wave device
AUPQ641500A0 (en) * 2000-03-23 2000-04-15 Defence Science And Technology Organisation Method and apparatus for estimating chromatic dispersion in fibre bragg gratings
WO2002082038A1 (en) * 2001-04-02 2002-10-17 Advantest Corporation Optical network analyzer
EP1202038A1 (en) * 2001-07-27 2002-05-02 Agilent Technologies, Inc. (a Delaware corporation) Determination of optical properties of a device under test in transmission and in reflection
US6914681B2 (en) * 2001-08-22 2005-07-05 Agilent Technologies, Inc. Interferometric optical component analyzer based on orthogonal filters
US6825934B2 (en) * 2002-03-14 2004-11-30 Agilent Technologies, Inc. Vibration noise mitigation in an interferometric system
EP1520162B1 (en) * 2002-06-29 2009-04-22 Agilent Technologies, Inc. Polarization diversity detection using a polarization multiplexed local oscillator
US7075659B2 (en) * 2004-02-05 2006-07-11 Agilent Technologies, Inc. Heterodyne optical network analysis that utilizes signal modulation

Also Published As

Publication number Publication date
JP2007518980A (ja) 2007-07-12
EP1709415A1 (en) 2006-10-11
WO2005068965A1 (en) 2005-07-28
US20070146721A1 (en) 2007-06-28
CA2552915A1 (en) 2005-07-28

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Legal Events

Date Code Title Description
B03A Publication of a patent application or of a certificate of addition of invention [chapter 3.1 patent gazette]
B25D Requested change of name of applicant approved

Owner name: FIBERWORK COMUNICACOES OPTICAS LTDA. (BR/SP)

Free format text: ALTERADO DE: FIBERWORK COMUNICACOES OPTICAS LTDA. ME

B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE A 11A ANUIDADE

B08G Application fees: restoration [chapter 8.7 patent gazette]
B15K Others concerning applications: alteration of classification

Free format text: A CLASSIFICACAO ANTERIOR ERA: H04B 10/08

Ipc: H04B 10/07 (2013.01), G01M 11/02 (2006.01)

B07A Application suspended after technical examination (opinion) [chapter 7.1 patent gazette]
B08H Application fees: decision cancelled [chapter 8.8 patent gazette]

Free format text: REFERENTE AO DESPACHO 8.8 PUBLICADO NA RPI 2373 DE 28/06/2016.

B06G Technical and formal requirements: other requirements [chapter 6.7 patent gazette]

Free format text: COM BASE NO ART. 220 DA LPI, PARA QUE SEJA ACEITO O PROTOCOLO DE RESTAURACAO 870160028357 DE 15/06/2016 O DEPOSITANTE DEVERA COMPLEMENTAR A RETRIBUICAO REFERENTE A TAXA DE RESTAURACAO DA 11A ANUIDADE (GUIA DE RECOLHIMENTO NO 22160419101-0).

B08J Incorrect entry in the gazette republished [chapter 8.10 patent gazette]

Free format text: REPUBLICADO O TEXTO DO DESPACHO 8.8 DA RPI 2385 DE 20/09/2016 CUJO TEOR PASSA A SER: "REFERENTE AO DESPACHO 8.7 PUBLICADO NA RPI 2373 DE 28/06/2016".

B08G Application fees: restoration [chapter 8.7 patent gazette]
B09B Patent application refused [chapter 9.2 patent gazette]
B09B Patent application refused [chapter 9.2 patent gazette]

Free format text: MANTIDO O INDEFERIMENTO UMA VEZ QUE NAO FOI APRESENTADO RECURSO DENTRO DO PRAZO LEGAL.