BR9101444A - Sistema e metodo para melhorar a profundidade de campo em litografia fotomecanica - Google Patents
Sistema e metodo para melhorar a profundidade de campo em litografia fotomecanicaInfo
- Publication number
- BR9101444A BR9101444A BR919101444A BR9101444A BR9101444A BR 9101444 A BR9101444 A BR 9101444A BR 919101444 A BR919101444 A BR 919101444A BR 9101444 A BR9101444 A BR 9101444A BR 9101444 A BR9101444 A BR 9101444A
- Authority
- BR
- Brazil
- Prior art keywords
- litography
- photomechanical
- depth
- improving
- field
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/703—Non-planar pattern areas or non-planar masks, e.g. curved masks or substrates
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/70—Adapting basic layout or design of masks to lithographic process requirements, e.g., second iteration correction of mask patterns for imaging
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US51090690A | 1990-04-18 | 1990-04-18 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| BR9101444A true BR9101444A (pt) | 1991-11-26 |
Family
ID=24032670
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BR919101444A BR9101444A (pt) | 1990-04-18 | 1991-04-10 | Sistema e metodo para melhorar a profundidade de campo em litografia fotomecanica |
Country Status (5)
| Country | Link |
|---|---|
| EP (1) | EP0453753A3 (pt) |
| JP (1) | JPH04226013A (pt) |
| KR (1) | KR910019132A (pt) |
| BR (1) | BR9101444A (pt) |
| CA (1) | CA2037705A1 (pt) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4232844A1 (de) * | 1992-09-30 | 1994-03-31 | Siemens Ag | Belichtungsverfahren und Maske für die optische Projektionslithographie |
| KR100263900B1 (ko) * | 1993-03-04 | 2000-09-01 | 윤종용 | 마스크 및 그 제조방법 |
| US5438204A (en) * | 1993-12-30 | 1995-08-01 | The Board Of Trustees Of The Leland Stanford, Jr. University | Twin-mask, and method and system for using same to pattern microelectronic substrates |
| GB2291216B (en) * | 1994-06-30 | 1998-01-07 | Matsushita Electric Works Ltd | Method of manufacturing a printed circuit board |
| KR100290588B1 (ko) * | 1998-07-03 | 2001-06-01 | 윤종용 | 반도체장치의 도전막 패턴 형성방법 |
| US7255978B2 (en) | 2000-05-09 | 2007-08-14 | Shipley Company, L.L.C. | Multi-level optical structure and method of manufacture |
| US6756185B2 (en) | 2000-05-09 | 2004-06-29 | Shipley Company, L.L.C. | Method for making integrated optical waveguides and micromachined features |
| US20030229875A1 (en) | 2002-06-07 | 2003-12-11 | Smith Taber H. | Use of models in integrated circuit fabrication |
| US7853904B2 (en) | 2002-06-07 | 2010-12-14 | Cadence Design Systems, Inc. | Method and system for handling process related variations for integrated circuits based upon reflections |
| US7774726B2 (en) | 2002-06-07 | 2010-08-10 | Cadence Design Systems, Inc. | Dummy fill for integrated circuits |
| US7363099B2 (en) | 2002-06-07 | 2008-04-22 | Cadence Design Systems, Inc. | Integrated circuit metrology |
| US7393755B2 (en) | 2002-06-07 | 2008-07-01 | Cadence Design Systems, Inc. | Dummy fill for integrated circuits |
| WO2003104921A2 (en) | 2002-06-07 | 2003-12-18 | Praesagus, Inc. | Characterization adn reduction of variation for integrated circuits |
| US7712056B2 (en) | 2002-06-07 | 2010-05-04 | Cadence Design Systems, Inc. | Characterization and verification for integrated circuit designs |
| US7124386B2 (en) | 2002-06-07 | 2006-10-17 | Praesagus, Inc. | Dummy fill for integrated circuits |
| US7152215B2 (en) | 2002-06-07 | 2006-12-19 | Praesagus, Inc. | Dummy fill for integrated circuits |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5934101B2 (ja) * | 1978-12-27 | 1984-08-20 | 株式会社クボタ | 排ワラ処理装置 |
| JPS5678122A (en) * | 1979-11-30 | 1981-06-26 | Fujitsu Ltd | Formation of pattern |
| JPS60223121A (ja) * | 1984-04-19 | 1985-11-07 | Matsushita Electric Ind Co Ltd | パタ−ン形成方法 |
| JP2644741B2 (ja) * | 1987-01-14 | 1997-08-25 | 株式会社日立製作所 | プロキシミティ露光方法およびその装置 |
-
1991
- 1991-03-07 CA CA002037705A patent/CA2037705A1/en not_active Abandoned
- 1991-03-15 EP EP19910103988 patent/EP0453753A3/en not_active Withdrawn
- 1991-03-18 KR KR1019910004217A patent/KR910019132A/ko not_active Ceased
- 1991-04-02 JP JP3094891A patent/JPH04226013A/ja active Pending
- 1991-04-10 BR BR919101444A patent/BR9101444A/pt unknown
Also Published As
| Publication number | Publication date |
|---|---|
| EP0453753A2 (en) | 1991-10-30 |
| KR910019132A (ko) | 1991-11-30 |
| JPH04226013A (ja) | 1992-08-14 |
| CA2037705A1 (en) | 1991-10-19 |
| EP0453753A3 (en) | 1992-05-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| KF | Request for proof of payment of annual fee | ||
| FD5 | Application fees: dismissal - article 86 of industrial property law |