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BR8107845A - Aparelho de teste especifico com modulos automatico e portatil - Google Patents

Aparelho de teste especifico com modulos automatico e portatil

Info

Publication number
BR8107845A
BR8107845A BR8107845A BR8107845A BR8107845A BR 8107845 A BR8107845 A BR 8107845A BR 8107845 A BR8107845 A BR 8107845A BR 8107845 A BR8107845 A BR 8107845A BR 8107845 A BR8107845 A BR 8107845A
Authority
BR
Brazil
Prior art keywords
automatic
testing equipment
specific testing
portable modules
modules
Prior art date
Application number
BR8107845A
Other languages
English (en)
Inventor
Rene Lazare
Original Assignee
Rene Lazare
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rene Lazare filed Critical Rene Lazare
Publication of BR8107845A publication Critical patent/BR8107845A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31912—Tester/user interface
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31915—In-circuit Testers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Human Computer Interaction (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Purses, Travelling Bags, Baskets, Or Suitcases (AREA)
BR8107845A 1980-12-03 1981-12-02 Aparelho de teste especifico com modulos automatico e portatil BR8107845A (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8025619A FR2495350A1 (fr) 1980-12-03 1980-12-03 Testeur specifique a modules, automatise et portable

Publications (1)

Publication Number Publication Date
BR8107845A true BR8107845A (pt) 1982-09-08

Family

ID=9248601

Family Applications (1)

Application Number Title Priority Date Filing Date
BR8107845A BR8107845A (pt) 1980-12-03 1981-12-02 Aparelho de teste especifico com modulos automatico e portatil

Country Status (4)

Country Link
EP (1) EP0053561A3 (pt)
JP (1) JPS57119268A (pt)
BR (1) BR8107845A (pt)
FR (1) FR2495350A1 (pt)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2531230A1 (fr) * 1982-07-27 1984-02-03 Rank Xerox Sa Ensemble destine au test automatique centralise de circuits imprimes et procede de test de circuits a microprocesseur faisant application de cet ensemble
FR2547140B1 (fr) * 1983-06-06 1989-03-31 Electro Acoustique Lab Appareil analyseur de transmission pour la mesure et les essais de lignes de telecommunication
FR2549256B1 (fr) * 1983-06-22 1985-11-29 Philips Ind Commerciale Procede et machine automatiques pour tester simultanement des systemes informatiques
DK557884A (da) * 1983-11-25 1985-05-26 Mars Inc Automatisk testudstyr
EP0157028B1 (en) * 1984-04-05 1989-10-25 Grumman Aerospace Corporation Programmable tester
BE902855A (fr) * 1985-07-11 1986-01-13 Acec Equipement de test automatique
GB2210184A (en) * 1987-09-24 1989-06-01 Rodime Plc Portable testing apparatus for computer peripherals
JPH0752142B2 (ja) * 1987-12-21 1995-06-05 富士重工業株式会社 車輌診断装置
US5960405A (en) 1997-02-05 1999-09-28 Fox Enterprises, Inc. Worldwide marketing logistics network including strategically located centers for frequency programming crystal oscillators to customer specification
US5952890A (en) 1997-02-05 1999-09-14 Fox Enterprises, Inc. Crystal oscillator programmable with frequency-defining parameters
US6064721A (en) 1997-10-22 2000-05-16 Telecommunications Techniques Corporation Modular test instrument
US6891803B1 (en) 1998-12-18 2005-05-10 Sunrise Telecom, Inc. Telecommunications transmission test set
FR2810123A1 (fr) * 2000-06-08 2001-12-14 Daniel Alfred Rouillere Procede et dispositif de test d'organes de commande de systemes pilotes sur un module operationnel et/ou module espion
CN109753050A (zh) * 2019-01-28 2019-05-14 西安爱生技术集团公司 一种便携式无人机操纵控制器测试系统及测试方法
CN115616331B (zh) * 2022-12-19 2023-12-01 深圳市高麦电子有限公司 一种精密四线式测试机

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3854125A (en) * 1971-06-15 1974-12-10 Instrumentation Engineering Automated diagnostic testing system
US4108358A (en) * 1977-03-22 1978-08-22 The Bendix Corporation Portable circuit tester
US4168527A (en) * 1978-02-17 1979-09-18 Winkler Dean A Analog and digital circuit tester
US4194113A (en) * 1978-04-13 1980-03-18 Ncr Corporation Method and apparatus for isolating faults in a logic circuit
GB2086103B (en) * 1980-10-27 1985-01-30 Hal Computers Ltd Computer peripheral test equipment

Also Published As

Publication number Publication date
EP0053561A2 (fr) 1982-06-09
FR2495350A1 (fr) 1982-06-04
EP0053561A3 (fr) 1984-07-18
JPS57119268A (en) 1982-07-24

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