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BR8105987A - Sistema de analise de defeito - Google Patents

Sistema de analise de defeito

Info

Publication number
BR8105987A
BR8105987A BR8105987A BR8105987A BR8105987A BR 8105987 A BR8105987 A BR 8105987A BR 8105987 A BR8105987 A BR 8105987A BR 8105987 A BR8105987 A BR 8105987A BR 8105987 A BR8105987 A BR 8105987A
Authority
BR
Brazil
Prior art keywords
analysis system
defect analysis
defect
analysis
Prior art date
Application number
BR8105987A
Other languages
English (en)
Inventor
W Cornyn Jr
J Barrett
D Brabston Jr
P Mcaferty
S Nelson
S Schy
Original Assignee
Trw Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Trw Inc filed Critical Trw Inc
Publication of BR8105987A publication Critical patent/BR8105987A/pt

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/0006Industrial image inspection using a design-rule based approach
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/10Segmentation; Edge detection
    • G06T7/136Segmentation; Edge detection involving thresholding
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/10Segmentation; Edge detection
    • G06T7/187Segmentation; Edge detection involving region growing; involving region merging; involving connected component labelling
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N21/6456Spatial resolved fluorescence measurements; Imaging
    • G01N2021/646Detecting fluorescent inhomogeneities at a position, e.g. for detecting defects
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10016Video; Image sequence
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/20Special algorithmic details
    • G06T2207/20076Probabilistic image processing
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30164Workpiece; Machine component

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Textile Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Quality & Reliability (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
BR8105987A 1980-09-19 1981-09-18 Sistema de analise de defeito BR8105987A (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US18865180A 1980-09-19 1980-09-19

Publications (1)

Publication Number Publication Date
BR8105987A true BR8105987A (pt) 1982-06-08

Family

ID=22694021

Family Applications (1)

Application Number Title Priority Date Filing Date
BR8105987A BR8105987A (pt) 1980-09-19 1981-09-18 Sistema de analise de defeito

Country Status (8)

Country Link
EP (1) EP0048568A3 (pt)
JP (1) JPS57118145A (pt)
AU (1) AU7517681A (pt)
BR (1) BR8105987A (pt)
CA (1) CA1175555A (pt)
ES (1) ES8302911A1 (pt)
IL (1) IL63781A (pt)
MX (1) MX151484A (pt)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4519041A (en) * 1982-05-03 1985-05-21 Honeywell Inc. Real time automated inspection
US4542527A (en) * 1982-05-17 1985-09-17 Tokyo Shibaura Denki Kabushiki Kaisha Image processing device for continuously extracting features of small regions of an image
FR2571519B1 (fr) * 1984-10-04 1986-12-26 Mounet Jean Francois Systeme de traitement de donnees
JPH0772718B2 (ja) * 1985-02-15 1995-08-02 株式会社日立製作所 外観検査装置
IL79098A0 (en) * 1985-07-15 1986-09-30 Visionetics Corp Fine flaw detector for printed circuit boards
US4918739A (en) * 1988-08-12 1990-04-17 Maraven, S.A. Process and system for digital analysis of images applied to stratigraphic data
GB2222879A (en) * 1988-09-15 1990-03-21 Gkn Technology Ltd Crack detecting apparatus
GB9008632D0 (en) * 1990-04-17 1990-06-13 Leicester Polytechnic Inspecting garments
JPH0820380B2 (ja) * 1990-07-30 1996-03-04 参天製薬株式会社 樹脂成形品の検査装置
IT1246047B (it) * 1990-12-21 1994-11-07 Pirelli Prod Diversificati Procedimento ed apparecchiatura per individuare difettosita' supeficiali su strati e/o manicotti in materiale elastomerico
US5147047A (en) * 1991-01-14 1992-09-15 Westinghouse Electric Corp. Pellet inspection system
JPH0678895B2 (ja) * 1991-01-24 1994-10-05 肇産業株式会社 欠陥判別方法
GB9105358D0 (en) * 1991-03-13 1991-04-24 Secr Defence Anomaly detector
EP0572336B1 (en) * 1992-05-29 2001-03-14 Eastman Kodak Company Coating density analyzer and method using image processing
US5304519A (en) * 1992-10-28 1994-04-19 Praxair S.T. Technology, Inc. Powder feed composition for forming a refraction oxide coating, process used and article so produced
FI100366B (fi) * 1994-09-01 1997-11-14 Spectra Physics Visiontech Oy Menetelmä poikkeamien tunnistamiseksi tarkastettavasta pinnasta
EP1016862A1 (de) * 1998-12-28 2000-07-05 Siemens Aktiengesellschaft Verfahren sowie Vorrichtung zur Qualitätsüberprüfung einer Beschichtung
US8775436B1 (en) * 2004-03-19 2014-07-08 Google Inc. Image selection for news search
US8208711B2 (en) * 2007-09-07 2012-06-26 General Electric Company Method for automatic identification of defects in turbine engine blades
CN102384839A (zh) * 2010-09-06 2012-03-21 信义超薄玻璃(东莞)有限公司 获取玻璃光学性能的装置
CN103175848B (zh) * 2013-02-05 2015-01-14 厦门大学 一种rcf型铣刀刃部崩缺在线检测方法
CN103473781B (zh) * 2013-09-22 2016-03-23 长安大学 一种公路岩体边坡图像中节理裂纹的分割方法
CN119147543A (zh) * 2024-09-13 2024-12-17 珠海格力电器股份有限公司 空调器翅片的缺陷检测方法及装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3694658A (en) * 1970-10-22 1972-09-26 Morvue Inc Veneer inspection system
US3729619A (en) * 1971-03-04 1973-04-24 Steel Corp Apparatus for surface inspection of moving material with defect type recognition
US4183013A (en) * 1976-11-29 1980-01-08 Coulter Electronics, Inc. System for extracting shape features from an image
US4237539A (en) * 1977-11-21 1980-12-02 E. I. Du Pont De Nemours And Company On-line web inspection system
FR2461944A1 (fr) * 1979-07-20 1981-02-06 Hitachi Ltd Procede et appareil pour examiner l'aspect exterieur d'un objet cylindrique plein
JPS5677704A (en) * 1979-11-30 1981-06-26 Hitachi Ltd Inspection system for surface defect of substance

Also Published As

Publication number Publication date
ES505606A0 (es) 1982-12-01
AU7517681A (en) 1982-03-25
EP0048568A3 (en) 1983-09-21
JPS57118145A (en) 1982-07-22
IL63781A (en) 1985-03-31
MX151484A (es) 1984-12-03
ES8302911A1 (es) 1982-12-01
CA1175555A (en) 1984-10-02
EP0048568A2 (en) 1982-03-31

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