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BR8105277A - Comutador semicondutor de alta voltagem - Google Patents

Comutador semicondutor de alta voltagem

Info

Publication number
BR8105277A
BR8105277A BR8105277A BR8105277A BR8105277A BR 8105277 A BR8105277 A BR 8105277A BR 8105277 A BR8105277 A BR 8105277A BR 8105277 A BR8105277 A BR 8105277A BR 8105277 A BR8105277 A BR 8105277A
Authority
BR
Brazil
Prior art keywords
high voltage
semiconductor switch
voltage semiconductor
switch
voltage
Prior art date
Application number
BR8105277A
Other languages
English (en)
Inventor
J Pernyeszi
Original Assignee
Int Standard Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Int Standard Electric Corp filed Critical Int Standard Electric Corp
Publication of BR8105277A publication Critical patent/BR8105277A/pt

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/40Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00 with at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of IGFETs with BJTs
    • H10D84/401Combinations of FETs or IGBTs with BJTs
    • H10D84/403Combinations of FETs or IGBTs with BJTs and with one or more of diodes, resistors or capacitors
    • H10D84/409Combinations of FETs or IGBTs with lateral BJTs and with one or more of diodes, resistors or capacitors
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/567Circuits characterised by the use of more than one type of semiconductor device, e.g. BIMOS, composite devices such as IGBT
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D12/00Bipolar devices controlled by the field effect, e.g. insulated-gate bipolar transistors [IGBT]
    • H10D12/411Insulated-gate bipolar transistors [IGBT]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D12/00Bipolar devices controlled by the field effect, e.g. insulated-gate bipolar transistors [IGBT]
    • H10D12/411Insulated-gate bipolar transistors [IGBT]
    • H10D12/441Vertical IGBTs
    • H10D12/461Vertical IGBTs having non-planar surfaces, e.g. having trenches, recesses or pillars in the surfaces of the emitter, base or collector regions
    • H10D12/481Vertical IGBTs having non-planar surfaces, e.g. having trenches, recesses or pillars in the surfaces of the emitter, base or collector regions having gate structures on slanted surfaces, on vertical surfaces, or in grooves, e.g. trench gate IGBTs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/40Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00 with at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of IGFETs with BJTs
    • H10D84/401Combinations of FETs or IGBTs with BJTs
    • H10D84/403Combinations of FETs or IGBTs with BJTs and with one or more of diodes, resistors or capacitors
    • H10D84/406Combinations of FETs or IGBTs with vertical BJTs and with one or more of diodes, resistors or capacitors
BR8105277A 1980-08-25 1981-08-18 Comutador semicondutor de alta voltagem BR8105277A (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US18129080A 1980-08-25 1980-08-25

Publications (1)

Publication Number Publication Date
BR8105277A true BR8105277A (pt) 1982-04-27

Family

ID=22663651

Family Applications (1)

Application Number Title Priority Date Filing Date
BR8105277A BR8105277A (pt) 1980-08-25 1981-08-18 Comutador semicondutor de alta voltagem

Country Status (7)

Country Link
EP (1) EP0047392B1 (pt)
JP (1) JPS5772365A (pt)
AU (1) AU547356B2 (pt)
BR (1) BR8105277A (pt)
DE (1) DE3175641D1 (pt)
ES (1) ES504914A0 (pt)
NZ (1) NZ198035A (pt)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3369431D1 (en) * 1982-02-09 1987-02-26 Western Electric Co Field-effect controlled bi-directional lateral thyristor
EP0111803B1 (en) * 1982-12-13 1989-03-01 General Electric Company Lateral insulated-gate rectifier structures
DE3470632D1 (en) * 1983-02-03 1988-05-26 Fairchild Camera Instr Co High voltage mos/bipolar power transistor apparatus
NL8302092A (nl) * 1983-06-13 1985-01-02 Philips Nv Halfgeleiderinrichting bevattende een veldeffekttransistor.
EP0166390B1 (en) * 1984-06-22 1991-08-28 Hitachi, Ltd. Semiconductor switch circuit
JP2590863B2 (ja) * 1987-03-12 1997-03-12 日本電装株式会社 導電変調型mosfet
JPS6459868A (en) * 1987-08-29 1989-03-07 Fuji Electric Co Ltd Semiconductor device having insulating gate
JPH01198076A (ja) * 1988-02-02 1989-08-09 Mitsubishi Electric Corp 半導体装置
DE3838355A1 (de) * 1988-11-11 1990-05-17 Fraunhofer Ges Forschung Vertikaltransistoranordnung
JPH0716009B2 (ja) * 1988-12-02 1995-02-22 株式会社日立製作所 横型絶縁ゲートバイポーラトランジスタ
JPH02156678A (ja) * 1988-12-09 1990-06-15 Meidensha Corp 電界効果トランジスタ及びその製造方法
US5072266A (en) 1988-12-27 1991-12-10 Siliconix Incorporated Trench DMOS power transistor with field-shaping body profile and three-dimensional geometry
EP1291924A1 (en) 2001-09-10 2003-03-12 STMicroelectronics S.r.l. MOS semiconductor device having a body region
JP2005057028A (ja) * 2003-08-04 2005-03-03 Sanken Electric Co Ltd 絶縁ゲート型バイポーラトランジスタ

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2422258A1 (fr) * 1978-01-19 1979-11-02 Radiotechnique Compelec Dispositif semiconducteur monolithique a transistors de types mos et bipolaire

Also Published As

Publication number Publication date
JPS5772365A (en) 1982-05-06
ES8301391A1 (es) 1982-12-01
ES504914A0 (es) 1982-12-01
NZ198035A (en) 1986-04-11
EP0047392A3 (en) 1983-07-20
DE3175641D1 (en) 1987-01-08
AU7432081A (en) 1982-03-04
AU547356B2 (en) 1985-10-17
EP0047392A2 (de) 1982-03-17
EP0047392B1 (de) 1986-11-20

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