AU7746000A - Atmospheric process and system for controlled and rapid removal of polymers fromhigh depth to width aspect ratio holes - Google Patents
Atmospheric process and system for controlled and rapid removal of polymers fromhigh depth to width aspect ratio holesInfo
- Publication number
- AU7746000A AU7746000A AU77460/00A AU7746000A AU7746000A AU 7746000 A AU7746000 A AU 7746000A AU 77460/00 A AU77460/00 A AU 77460/00A AU 7746000 A AU7746000 A AU 7746000A AU 7746000 A AU7746000 A AU 7746000A
- Authority
- AU
- Australia
- Prior art keywords
- fromhigh
- polymers
- depth
- controlled
- aspect ratio
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K10/00—Welding or cutting by means of a plasma
- B23K10/003—Scarfing, desurfacing or deburring
-
- H10P50/287—
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
- B23K2101/40—Semiconductor devices
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Drying Of Semiconductors (AREA)
- Arc Welding In General (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US15640799P | 1999-09-28 | 1999-09-28 | |
| US60156407 | 1999-09-28 | ||
| PCT/US2000/027113 WO2001023130A1 (en) | 1999-09-28 | 2000-09-28 | Atmospheric process and system for controlled and rapid removal of polymers from high depth to width aspect ratio holes |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| AU7746000A true AU7746000A (en) | 2001-04-30 |
Family
ID=22559445
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU77460/00A Abandoned AU7746000A (en) | 1999-09-28 | 2000-09-28 | Atmospheric process and system for controlled and rapid removal of polymers fromhigh depth to width aspect ratio holes |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP1246710A4 (en) |
| JP (2) | JP2003510824A (en) |
| AU (1) | AU7746000A (en) |
| WO (1) | WO2001023130A1 (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2001023130A1 (en) * | 1999-09-28 | 2001-04-05 | Jetek, Inc. | Atmospheric process and system for controlled and rapid removal of polymers from high depth to width aspect ratio holes |
| US6955991B2 (en) * | 1999-11-01 | 2005-10-18 | Jetek, Inc. | Atmospheric process and system for controlled and rapid removal of polymers from high depth to width aspect ratio holes |
| FR2913972B1 (en) * | 2007-03-21 | 2011-11-18 | Saint Gobain | METHOD FOR MANUFACTURING A MASK FOR CARRYING OUT A GRID |
| CN114864482A (en) * | 2021-02-04 | 2022-08-05 | 中国科学院微电子研究所 | Method for manufacturing semiconductor structure |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6159834A (en) * | 1984-08-31 | 1986-03-27 | Hitachi Ltd | Detecting method of end point of etching |
| US4783695A (en) * | 1986-09-26 | 1988-11-08 | General Electric Company | Multichip integrated circuit packaging configuration and method |
| US4891303A (en) * | 1988-05-26 | 1990-01-02 | Texas Instruments Incorporated | Trilayer microlithographic process using a silicon-based resist as the middle layer |
| US5173442A (en) * | 1990-07-23 | 1992-12-22 | Microelectronics And Computer Technology Corporation | Methods of forming channels and vias in insulating layers |
| US5314709A (en) * | 1991-03-20 | 1994-05-24 | International Business Machines Corporation | Unzippable polymer mask for screening operations |
| CA2097388A1 (en) * | 1992-07-16 | 1994-01-17 | Susan Nord Bohlke | Topographical selective patterns |
| JP2787646B2 (en) * | 1992-11-27 | 1998-08-20 | 三菱電機株式会社 | Method for manufacturing semiconductor device |
| US5302547A (en) * | 1993-02-08 | 1994-04-12 | General Electric Company | Systems for patterning dielectrics by laser ablation |
| JP3147137B2 (en) * | 1993-05-14 | 2001-03-19 | セイコーエプソン株式会社 | Surface treatment method and device, semiconductor device manufacturing method and device, and liquid crystal display manufacturing method |
| JPH09246252A (en) * | 1996-03-01 | 1997-09-19 | Sony Corp | Semiconductor manufacturing apparatus and semiconductor manufacturing method |
| KR20000016136A (en) * | 1996-05-31 | 2000-03-25 | 피터 무몰라 | Method for treating articles with a plasma jet |
| WO1997046056A1 (en) * | 1996-05-31 | 1997-12-04 | Ipec Precision, Inc. | Apparatus for generating and deflecting a plasma jet |
| US5968283A (en) * | 1996-10-25 | 1999-10-19 | Lucent Technologies Inc. | Method for heat stripping optical fibers |
| WO2001023130A1 (en) * | 1999-09-28 | 2001-04-05 | Jetek, Inc. | Atmospheric process and system for controlled and rapid removal of polymers from high depth to width aspect ratio holes |
-
2000
- 2000-09-28 WO PCT/US2000/027113 patent/WO2001023130A1/en not_active Ceased
- 2000-09-28 EP EP00967233A patent/EP1246710A4/en not_active Withdrawn
- 2000-09-28 AU AU77460/00A patent/AU7746000A/en not_active Abandoned
- 2000-09-28 JP JP2001526324A patent/JP2003510824A/en active Pending
-
2007
- 2007-02-26 JP JP2007045525A patent/JP2007235138A/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| JP2007235138A (en) | 2007-09-13 |
| WO2001023130A1 (en) | 2001-04-05 |
| JP2003510824A (en) | 2003-03-18 |
| EP1246710A1 (en) | 2002-10-09 |
| EP1246710A4 (en) | 2007-07-04 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |