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AU5540590A - Process and device for large-scale profilometric measurement and their application to the measurement of the condition of surfaces irrespective of shape - Google Patents

Process and device for large-scale profilometric measurement and their application to the measurement of the condition of surfaces irrespective of shape

Info

Publication number
AU5540590A
AU5540590A AU55405/90A AU5540590A AU5540590A AU 5540590 A AU5540590 A AU 5540590A AU 55405/90 A AU55405/90 A AU 55405/90A AU 5540590 A AU5540590 A AU 5540590A AU 5540590 A AU5540590 A AU 5540590A
Authority
AU
Australia
Prior art keywords
measurement
scale
condition
shape
application
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU55405/90A
Inventor
Jacques Bielle
Jean Mignot
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
INSTITUT SUPERIEUR D'ETAT DE SURFACE (ISES)
Original Assignee
INST SUPERIEUR ETAT SURFACE
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by INST SUPERIEUR ETAT SURFACE filed Critical INST SUPERIEUR ETAT SURFACE
Publication of AU5540590A publication Critical patent/AU5540590A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/28—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/34—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
AU55405/90A 1989-04-11 1990-04-05 Process and device for large-scale profilometric measurement and their application to the measurement of the condition of surfaces irrespective of shape Abandoned AU5540590A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8904711 1989-04-11
FR8904711A FR2645638A1 (en) 1989-04-11 1989-04-11 METHOD AND DEVICE FOR LARGE-SCALE PROFILOMETRIC MEASUREMENT AND THEIR APPLICATIONS TO THE MEASUREMENT OF THE SURFACE CONDITION OF ANY TYPE OF FORM

Publications (1)

Publication Number Publication Date
AU5540590A true AU5540590A (en) 1990-11-05

Family

ID=9380561

Family Applications (1)

Application Number Title Priority Date Filing Date
AU55405/90A Abandoned AU5540590A (en) 1989-04-11 1990-04-05 Process and device for large-scale profilometric measurement and their application to the measurement of the condition of surfaces irrespective of shape

Country Status (3)

Country Link
AU (1) AU5540590A (en)
FR (1) FR2645638A1 (en)
WO (1) WO1990012277A1 (en)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3199141B2 (en) * 1993-07-07 2001-08-13 ソニー株式会社 Drum lead measuring device and measuring method
US6745616B1 (en) * 1999-10-21 2004-06-08 Mitutoyo Corporation Surface texture measuring machine, leveling device for surface texture measuring machine and orientation-adjusting method of workpiece of surface texture measuring machine
TW550375B (en) * 2001-09-07 2003-09-01 Olympus Optical Co Apparatus for measuring a surface profile
CN101614515B (en) * 2008-06-26 2011-11-30 鸿富锦精密工业（深圳）有限公司 Height-measuring tool
CN102435127A (en) * 2011-11-28 2012-05-02 苏州工业园区隆盛电器成套设备制造有限公司 Verification method of evenness of transformer for rail vehicle
CN103196386B (en) * 2013-03-12 2015-11-18 浙江大学宁波理工学院 Non-contact type rotation part shape error accuracy detecting device and method
CN103196367B (en) * 2013-03-12 2015-05-06 浙江大学宁波理工学院 Shaft sleeve type part form-position error measuring device and method based on image field
CN107328331B (en) * 2017-08-25 2023-05-23 郑州市质量技术监督检验测试中心 Distributed steel ruler calibrating device and method based on vision
CN108278979B (en) * 2018-01-03 2019-10-08 华中科技大学 A kind of blade in situ contact formula three-dimensional measuring apparatus and method
CN108318363B (en) * 2018-02-12 2023-10-27 三峡大学 Detection device and detection method for wear of bottom pivot mushroom head
CN110836626A (en) * 2019-11-04 2020-02-25 上海天庹智能设备有限公司 Accurate measuring device for compressor blade size
CN111947553B (en) * 2020-07-17 2022-05-27 苏州华亚智能科技股份有限公司 Flatness detection device for metro traction converter cabinet
CN112484605B (en) * 2020-12-21 2024-05-03 昆明理工大学 Portable rock mass structural surface roughness profile measuring instrument and measuring method thereof
CN113048866B (en) * 2021-02-19 2023-06-06 深圳市普乐华科技有限公司 Detection mechanism for amorphous nanocrystalline iron core winding machine
CN118197016B (en) * 2024-01-23 2024-12-03 河北康合电杆有限公司 Rod body identification alarm system for erecting power transmission cable
CN119304692B (en) * 2024-12-03 2025-09-09 中国石油大学(华东) Workpiece in-situ detection device and method based on numerical control machine tool
CN119223233B (en) * 2024-12-04 2025-02-18 洛阳奥内斯机械科技有限公司 A blade shape and position tolerance measuring tool
CN120293037A (en) * 2025-04-08 2025-07-11 哈尔滨工业大学 System and method for measuring the perpendicularity between the end face of annular parts and the outer contour of a cylinder

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD156635B (en) *
US4560924A (en) * 1983-07-22 1985-12-24 Magnetic Peripherals Inc. Flatness measuring apparatus
GB2165361B (en) * 1984-04-10 1988-01-27 Mitutoyo Mfg Co Ltd Surface roughness measuring machine
US4706360A (en) * 1986-05-13 1987-11-17 Morton Thiokol, Inc. Thread gage
FR2620223B1 (en) * 1987-09-09 1994-03-25 Institut Superieur Etat Surface METHOD FOR SLIDING A MOBILE MEDIUM ON A REFERENCE SURFACE AND ASSOCIATED DEVICE
JPH0614112A (en) * 1992-06-29 1994-01-21 Fujitsu Ltd Calling number voice notification system

Also Published As

Publication number Publication date
FR2645638A1 (en) 1990-10-12
WO1990012277A1 (en) 1990-10-18

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