AU4999600A - Optical endpoint detection during chemical mechanical planarization - Google Patents
Optical endpoint detection during chemical mechanical planarizationInfo
- Publication number
- AU4999600A AU4999600A AU49996/00A AU4999600A AU4999600A AU 4999600 A AU4999600 A AU 4999600A AU 49996/00 A AU49996/00 A AU 49996/00A AU 4999600 A AU4999600 A AU 4999600A AU 4999600 A AU4999600 A AU 4999600A
- Authority
- AU
- Australia
- Prior art keywords
- chemical mechanical
- mechanical planarization
- endpoint detection
- during chemical
- detection during
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
- B24B37/013—Devices or means for detecting lapping completion
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/12—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
-
- H10P74/238—
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US30799599A | 1999-05-10 | 1999-05-10 | |
| US09307995 | 1999-05-10 | ||
| PCT/US2000/012776 WO2000067951A1 (en) | 1999-05-10 | 2000-05-10 | Optical endpoint detection during chemical mechanical planarization |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| AU4999600A true AU4999600A (en) | 2000-11-21 |
Family
ID=23192076
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU49996/00A Abandoned AU4999600A (en) | 1999-05-10 | 2000-05-10 | Optical endpoint detection during chemical mechanical planarization |
Country Status (2)
| Country | Link |
|---|---|
| AU (1) | AU4999600A (en) |
| WO (1) | WO2000067951A1 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6930782B1 (en) | 2003-03-28 | 2005-08-16 | Lam Research Corporation | End point detection with imaging matching in semiconductor processing |
| JP7023063B2 (en) * | 2017-08-08 | 2022-02-21 | 株式会社荏原製作所 | Substrate polishing equipment and method |
| JP7508327B2 (en) * | 2020-10-06 | 2024-07-01 | 株式会社荏原製作所 | Optical film thickness measuring device and polishing device |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3313505B2 (en) * | 1994-04-14 | 2002-08-12 | 株式会社日立製作所 | Polishing method |
| US5872633A (en) * | 1996-07-26 | 1999-02-16 | Speedfam Corporation | Methods and apparatus for detecting removal of thin film layers during planarization |
-
2000
- 2000-05-10 WO PCT/US2000/012776 patent/WO2000067951A1/en not_active Ceased
- 2000-05-10 AU AU49996/00A patent/AU4999600A/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| WO2000067951A9 (en) | 2002-07-11 |
| WO2000067951A1 (en) | 2000-11-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |