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AU3105400A - Methods and apparatus for holding and positioning semiconductor workpieces during electropolishing and/or electroplating of the workpieces - Google Patents

Methods and apparatus for holding and positioning semiconductor workpieces during electropolishing and/or electroplating of the workpieces

Info

Publication number
AU3105400A
AU3105400A AU31054/00A AU3105400A AU3105400A AU 3105400 A AU3105400 A AU 3105400A AU 31054/00 A AU31054/00 A AU 31054/00A AU 3105400 A AU3105400 A AU 3105400A AU 3105400 A AU3105400 A AU 3105400A
Authority
AU
Australia
Prior art keywords
workpieces
electroplating
holding
methods
during electropolishing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU31054/00A
Inventor
Felix Gutman
Voha Nuch
Hui Wang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ACM Research Inc
Original Assignee
ACM Research Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ACM Research Inc filed Critical ACM Research Inc
Publication of AU3105400A publication Critical patent/AU3105400A/en
Abandoned legal-status Critical Current

Links

Classifications

    • H10P72/7606
    • H10P72/50
    • H10P14/47
    • H10P72/7624
    • H10P72/7626
    • H10P95/04
AU31054/00A 1998-11-28 1999-11-24 Methods and apparatus for holding and positioning semiconductor workpieces during electropolishing and/or electroplating of the workpieces Abandoned AU3105400A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11013698P 1998-11-28 1998-11-28
US60110136 1998-11-28
PCT/US1999/028106 WO2000033356A2 (en) 1998-11-28 1999-11-24 Methods and apparatus for holding and positioning semiconductor workpieces during electropolishing and/or electroplating of the workpieces

Publications (1)

Publication Number Publication Date
AU3105400A true AU3105400A (en) 2000-06-19

Family

ID=22331393

Family Applications (1)

Application Number Title Priority Date Filing Date
AU31054/00A Abandoned AU3105400A (en) 1998-11-28 1999-11-24 Methods and apparatus for holding and positioning semiconductor workpieces during electropolishing and/or electroplating of the workpieces

Country Status (9)

Country Link
EP (1) EP1133786A2 (en)
JP (2) JP2002531702A (en)
KR (3) KR100562011B1 (en)
CN (2) CN100382235C (en)
AU (1) AU3105400A (en)
CA (1) CA2352160A1 (en)
IL (1) IL143316A (en)
TW (1) TW430919B (en)
WO (1) WO2000033356A2 (en)

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US6537144B1 (en) 2000-02-17 2003-03-25 Applied Materials, Inc. Method and apparatus for enhanced CMP using metals having reductive properties
US6991526B2 (en) 2002-09-16 2006-01-31 Applied Materials, Inc. Control of removal profile in electrochemically assisted CMP
US7059948B2 (en) 2000-12-22 2006-06-13 Applied Materials Articles for polishing semiconductor substrates
US7303662B2 (en) 2000-02-17 2007-12-04 Applied Materials, Inc. Contacts for electrochemical processing
US7125477B2 (en) 2000-02-17 2006-10-24 Applied Materials, Inc. Contacts for electrochemical processing
US6979248B2 (en) 2002-05-07 2005-12-27 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US7374644B2 (en) 2000-02-17 2008-05-20 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US6991528B2 (en) 2000-02-17 2006-01-31 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US7303462B2 (en) 2000-02-17 2007-12-04 Applied Materials, Inc. Edge bead removal by an electro polishing process
US6848970B2 (en) 2002-09-16 2005-02-01 Applied Materials, Inc. Process control in electrochemically assisted planarization
US7077721B2 (en) 2000-02-17 2006-07-18 Applied Materials, Inc. Pad assembly for electrochemical mechanical processing
US7066800B2 (en) 2000-02-17 2006-06-27 Applied Materials Inc. Conductive polishing article for electrochemical mechanical polishing
US6962524B2 (en) 2000-02-17 2005-11-08 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US7029365B2 (en) 2000-02-17 2006-04-18 Applied Materials Inc. Pad assembly for electrochemical mechanical processing
JP4644926B2 (en) * 2000-10-13 2011-03-09 ソニー株式会社 Semiconductor manufacturing apparatus and semiconductor device manufacturing method
US6896776B2 (en) 2000-12-18 2005-05-24 Applied Materials Inc. Method and apparatus for electro-chemical processing
WO2002083995A1 (en) * 2001-04-12 2002-10-24 Arthur, Keigler Method of and apparatus for controlling fluid flow
US7344432B2 (en) 2001-04-24 2008-03-18 Applied Materials, Inc. Conductive pad with ion exchange membrane for electrochemical mechanical polishing
US7137879B2 (en) 2001-04-24 2006-11-21 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
JP2003027280A (en) * 2001-07-18 2003-01-29 Ebara Corp Plating equipment
US7169280B2 (en) * 2001-08-31 2007-01-30 Semitool, Inc. Apparatus and method for deposition of an electrophoretic emulsion
US6837983B2 (en) 2002-01-22 2005-01-04 Applied Materials, Inc. Endpoint detection for electro chemical mechanical polishing and electropolishing processes
TWI275436B (en) 2002-01-31 2007-03-11 Ebara Corp Electrochemical machining device, and substrate processing apparatus and method
TWI274393B (en) * 2002-04-08 2007-02-21 Acm Res Inc Electropolishing and/or electroplating apparatus and methods
JP2006511699A (en) * 2002-07-22 2006-04-06 エーシーエム リサーチ,インコーポレイティド Adaptive electropolishing and barrier and sacrificial layer removal using thickness measurements
US7112270B2 (en) 2002-09-16 2006-09-26 Applied Materials, Inc. Algorithm for real-time process control of electro-polishing
JP3860111B2 (en) * 2002-12-19 2006-12-20 大日本スクリーン製造株式会社 Plating apparatus and plating method
US7842169B2 (en) 2003-03-04 2010-11-30 Applied Materials, Inc. Method and apparatus for local polishing control
US7186164B2 (en) 2003-12-03 2007-03-06 Applied Materials, Inc. Processing pad assembly with zone control
US7390744B2 (en) 2004-01-29 2008-06-24 Applied Materials, Inc. Method and composition for polishing a substrate
US7084064B2 (en) 2004-09-14 2006-08-01 Applied Materials, Inc. Full sequence metal and barrier layer electrochemical mechanical processing
US7520968B2 (en) 2004-10-05 2009-04-21 Applied Materials, Inc. Conductive pad design modification for better wafer-pad contact
US7427340B2 (en) 2005-04-08 2008-09-23 Applied Materials, Inc. Conductive pad
US7422982B2 (en) 2006-07-07 2008-09-09 Applied Materials, Inc. Method and apparatus for electroprocessing a substrate with edge profile control
US8804535B2 (en) * 2009-03-25 2014-08-12 Avaya Inc. System and method for sending packets using another device's network address
TWI410531B (en) * 2010-05-07 2013-10-01 Taiwan Semiconductor Mfg Vertical plating equipment and plating method thereof
KR101211826B1 (en) * 2010-06-14 2012-12-18 연세대학교 산학협력단 Apparatus and method for polishing workpiece using magnetorheological fluid)
JP5782398B2 (en) 2012-03-27 2015-09-24 株式会社荏原製作所 Plating method and plating apparatus
US9399827B2 (en) 2013-04-29 2016-07-26 Applied Materials, Inc. Microelectronic substrate electro processing system
WO2014179968A1 (en) * 2013-05-09 2014-11-13 Acm Research (Shanghai) Inc. Apparatus and method for plating and/or polishing wafer
KR101353378B1 (en) * 2013-08-19 2014-01-22 주식회사 케이엠 Mixing joint for syringe
CN104465481A (en) * 2013-09-22 2015-03-25 盛美半导体设备(上海)有限公司 Wafer chuck
CN105297127B (en) * 2014-05-30 2019-04-05 盛美半导体设备(上海)有限公司 Ejecting device with electrode
JP6449091B2 (en) * 2015-04-20 2019-01-09 東京エレクトロン株式会社 Slip ring, support mechanism and plasma processing apparatus
US10053793B2 (en) * 2015-07-09 2018-08-21 Lam Research Corporation Integrated elastomeric lipseal and cup bottom for reducing wafer sticking
GB201701166D0 (en) * 2017-01-24 2017-03-08 Picofluidics Ltd An apparatus for electrochemically processing semiconductor substrates
KR102156430B1 (en) * 2020-04-28 2020-09-15 주식회사 스마트코리아피씨비 Rotary Plating Equipment for Circuit Board
EP3998374A4 (en) 2020-09-16 2022-08-03 Changxin Memory Technologies, Inc. AIR LEAK DETECTION DEVICE AND METHOD, AND WAFER ELECTRODEPOSITION METHOD
CN114262920A (en) * 2020-09-16 2022-04-01 长鑫存储技术有限公司 Wafer electroplating equipment, air leakage detection device and method and wafer electroplating method
CN112144096B (en) * 2020-09-25 2022-05-10 深圳市生利科技有限公司 Zinc-nickel alloy electroplating equipment
CN113013078A (en) * 2021-03-04 2021-06-22 苏州竣合信半导体科技有限公司 Compatible chip positioning groove for positioning chip and using method thereof

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JPS5419649A (en) * 1977-07-15 1979-02-14 Hitachi Ltd Wafer holding jig for electrtolytic plating
JPS58181898A (en) * 1982-04-14 1983-10-24 Fujitsu Ltd Current supply apparatus used in plating
JPS6396292A (en) * 1986-10-13 1988-04-27 Mitsubishi Electric Corp Device for electrolytic plating
JPH0375394A (en) * 1989-08-18 1991-03-29 Fujitsu Ltd Plating equipment
JPH03232994A (en) * 1990-02-06 1991-10-16 Fujitsu Ltd Plating device
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DE4024576A1 (en) * 1990-08-02 1992-02-06 Bosch Gmbh Robert DEVICE FOR SINGLE-SIDED ASSEMBLY OF A SEMICONDUCTOR DISC
JPH04186630A (en) * 1990-11-19 1992-07-03 Oki Electric Ind Co Ltd Bump electrode plating apparatus for semiconductor wafer
JP2704796B2 (en) * 1991-04-22 1998-01-26 株式会社東芝 Jig for plating semiconductor wafers
JPH05243236A (en) * 1992-03-03 1993-09-21 Fujitsu Ltd Electroplating apparatus
US5405518A (en) * 1994-04-26 1995-04-11 Industrial Technology Research Institute Workpiece holder apparatus
US5670034A (en) * 1995-07-11 1997-09-23 American Plating Systems Reciprocating anode electrolytic plating apparatus and method
US5620581A (en) * 1995-11-29 1997-04-15 Aiwa Research And Development, Inc. Apparatus for electroplating metal films including a cathode ring, insulator ring and thief ring
US5980706A (en) * 1996-07-15 1999-11-09 Semitool, Inc. Electrode semiconductor workpiece holder
TW334609B (en) * 1996-09-19 1998-06-21 Hitachi Ltd Electrostatic chuck, method and device for processing sanyle use the same
JP3627884B2 (en) * 1996-10-17 2005-03-09 株式会社デンソー Plating equipment

Also Published As

Publication number Publication date
EP1133786A2 (en) 2001-09-19
JP2007119923A (en) 2007-05-17
IL143316A (en) 2005-03-20
CN1346510A (en) 2002-04-24
KR20010086051A (en) 2001-09-07
KR20040070317A (en) 2004-08-06
KR100503553B1 (en) 2005-07-26
CN1632914A (en) 2005-06-29
IL143316A0 (en) 2002-04-21
WO2000033356A2 (en) 2000-06-08
KR100516776B1 (en) 2005-09-26
KR20050013179A (en) 2005-02-02
JP2002531702A (en) 2002-09-24
CN1191605C (en) 2005-03-02
CA2352160A1 (en) 2000-06-08
WO2000033356A3 (en) 2001-07-12
TW430919B (en) 2001-04-21
KR100562011B1 (en) 2006-03-22
WO2000033356A9 (en) 2001-08-02
CN100382235C (en) 2008-04-16

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase