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AU2370570A - Radiation filters anda method of manufacturing thesame - Google Patents

Radiation filters anda method of manufacturing thesame

Info

Publication number
AU2370570A
AU2370570A AU23705/70A AU2370570A AU2370570A AU 2370570 A AU2370570 A AU 2370570A AU 23705/70 A AU23705/70 A AU 23705/70A AU 2370570 A AU2370570 A AU 2370570A AU 2370570 A AU2370570 A AU 2370570A
Authority
AU
Australia
Prior art keywords
radiation filters
anda method
manufacturing thesame
thesame
manufacturing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
AU23705/70A
Inventor
Henry Legoff Walter
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pye Electronic Products Ltd
Original Assignee
Pye Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pye Ltd filed Critical Pye Ltd
Publication of AU2370570A publication Critical patent/AU2370570A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/04Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity specially adapted for well-logging
    • G01V5/08Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity specially adapted for well-logging using primary nuclear radiation sources or X-rays
    • G01V5/12Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity specially adapted for well-logging using primary nuclear radiation sources or X-rays using gamma or X-ray sources
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/10Scattering devices; Absorbing devices; Ionising radiation filters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/10Different kinds of radiation or particles
    • G01N2223/101Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1013Different kinds of radiation or particles electromagnetic radiation gamma
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/313Accessories, mechanical or electrical features filters, rotating filter disc
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/50Detectors
    • G01N2223/505Detectors scintillation
    • G01N2223/5055Detectors scintillation scintillation crystal coupled to PMT

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Laminated Bodies (AREA)
AU23705/70A 1969-12-31 1970-12-23 Radiation filters anda method of manufacturing thesame Expired AU2370570A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB63527/69 1969-12-31
GB6352769 1969-12-31

Publications (1)

Publication Number Publication Date
AU2370570A true AU2370570A (en) 1972-06-29

Family

ID=10489098

Family Applications (1)

Application Number Title Priority Date Filing Date
AU23705/70A Expired AU2370570A (en) 1969-12-31 1970-12-23 Radiation filters anda method of manufacturing thesame

Country Status (2)

Country Link
AU (1) AU2370570A (en)
DE (1) DE2064320A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2439407A1 (en) * 1978-10-18 1980-05-16 Rech Geolog Miniere X=Ray fluorescent chemical analysis down borehole - using nip diode in solid ionisation chamber dependent upon emission voltage

Also Published As

Publication number Publication date
DE2064320A1 (en) 1971-07-08

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