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AU2003241194A1 - Apparatus and method for automatically arranging three dimensional scan data using optical marker - Google Patents

Apparatus and method for automatically arranging three dimensional scan data using optical marker

Info

Publication number
AU2003241194A1
AU2003241194A1 AU2003241194A AU2003241194A AU2003241194A1 AU 2003241194 A1 AU2003241194 A1 AU 2003241194A1 AU 2003241194 A AU2003241194 A AU 2003241194A AU 2003241194 A AU2003241194 A AU 2003241194A AU 2003241194 A1 AU2003241194 A1 AU 2003241194A1
Authority
AU
Australia
Prior art keywords
scan data
dimensional scan
optical marker
automatically arranging
arranging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003241194A
Inventor
Min-Ho Chang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SOLUTIONIX Corp
Original Assignee
SOLUTIONIX CORP
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR10-2003-0022624A external-priority patent/KR100502560B1/en
Application filed by SOLUTIONIX CORP filed Critical SOLUTIONIX CORP
Publication of AU2003241194A1 publication Critical patent/AU2003241194A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
AU2003241194A 2002-07-25 2003-06-03 Apparatus and method for automatically arranging three dimensional scan data using optical marker Abandoned AU2003241194A1 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
KR20020043830 2002-07-25
KR10-2002-0043830 2002-07-25
KR10-2003-0022624 2003-04-10
KR10-2003-0022624A KR100502560B1 (en) 2002-07-25 2003-04-10 Apparatus and Method for Registering Multiple Three Dimensional Scan Data by using Optical Marker
PCT/KR2003/001087 WO2004011876A1 (en) 2002-07-25 2003-06-03 Apparatus and method for automatically arranging three dimensional scan data using optical marker

Publications (1)

Publication Number Publication Date
AU2003241194A1 true AU2003241194A1 (en) 2004-02-16

Family

ID=31190416

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003241194A Abandoned AU2003241194A1 (en) 2002-07-25 2003-06-03 Apparatus and method for automatically arranging three dimensional scan data using optical marker

Country Status (4)

Country Link
JP (1) JP4226550B2 (en)
CN (1) CN1300551C (en)
AU (1) AU2003241194A1 (en)
WO (1) WO2004011876A1 (en)

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DE602004015799D1 (en) * 2003-07-24 2008-09-25 Cognitens Ltd METHOD AND SYSTEM FOR THE THREE-DIMENSIONAL SURFACE RECONSTRUCTION OF AN OBJECT
FR2870935A1 (en) * 2004-05-25 2005-12-02 Insidix Sarl DEVICE FOR MEASURING SURFACE DEFORMATIONS
US8111904B2 (en) * 2005-10-07 2012-02-07 Cognex Technology And Investment Corp. Methods and apparatus for practical 3D vision system
WO2007138904A1 (en) * 2006-05-30 2007-12-06 Panasonic Corporation Pattern projecting light source and compound eye distance measuring device
GB0615956D0 (en) * 2006-08-11 2006-09-20 Univ Heriot Watt Optical imaging of physical objects
JP5307549B2 (en) * 2006-11-08 2013-10-02 有限会社テクノドリーム二十一 Three-dimensional shape measuring method and apparatus
KR20080043047A (en) * 2006-11-13 2008-05-16 주식회사 고영테크놀러지 3D shape measurement device using shadow moire
US8126260B2 (en) 2007-05-29 2012-02-28 Cognex Corporation System and method for locating a three-dimensional object using machine vision
CA2606267A1 (en) * 2007-10-11 2009-04-11 Hydro-Quebec System and method for three-dimensional mapping of a structural surface
JP5322206B2 (en) * 2008-05-07 2013-10-23 国立大学法人 香川大学 Three-dimensional shape measuring method and apparatus
JP2010025759A (en) 2008-07-18 2010-02-04 Fuji Xerox Co Ltd Position measuring system
US9734419B1 (en) 2008-12-30 2017-08-15 Cognex Corporation System and method for validating camera calibration in a vision system
JP5435994B2 (en) * 2009-03-18 2014-03-05 本田技研工業株式会社 Non-contact shape measuring device
US9533418B2 (en) 2009-05-29 2017-01-03 Cognex Corporation Methods and apparatus for practical 3D vision system
DE102009032771B4 (en) * 2009-07-10 2017-06-29 Gom Gmbh Measuring device and method for the three-dimensional optical measurement of objects
JP5375479B2 (en) * 2009-09-17 2013-12-25 コニカミノルタ株式会社 Three-dimensional measurement system and three-dimensional measurement method
CN101813461B (en) * 2010-04-07 2011-06-22 河北工业大学 Absolute phase measurement method based on composite color fringe projection
WO2011137596A1 (en) * 2010-05-07 2011-11-10 深圳泰山在线科技有限公司 Structured-light measuring method and system
US9393694B2 (en) 2010-05-14 2016-07-19 Cognex Corporation System and method for robust calibration between a machine vision system and a robot
CN102346011A (en) * 2010-07-29 2012-02-08 上海通用汽车有限公司 Measuring tools and measuring methods
US9124873B2 (en) 2010-12-08 2015-09-01 Cognex Corporation System and method for finding correspondence between cameras in a three-dimensional vision system
DE102011114674C5 (en) * 2011-09-30 2020-05-28 Steinbichler Optotechnik Gmbh Method and device for determining the 3D coordinates of an object
US9163938B2 (en) * 2012-07-20 2015-10-20 Google Inc. Systems and methods for image acquisition
DE102013203399A1 (en) * 2013-02-28 2014-08-28 Siemens Aktiengesellschaft Method and projection device for marking a surface
US9789462B2 (en) * 2013-06-25 2017-10-17 The Boeing Company Apparatuses and methods for accurate structure marking and marking-assisted structure locating
DE102013110667B4 (en) 2013-09-26 2018-08-16 Deutsches Zentrum für Luft- und Raumfahrt e.V. Method for the non-destructive inspection of three-dimensional workpieces and apparatus for carrying out such a method
CN104315975A (en) * 2014-10-22 2015-01-28 合肥斯科尔智能科技有限公司 Linear three dimension and high precision scan method
KR101612254B1 (en) * 2014-10-30 2016-04-15 한국생산기술연구원 A multi-channel head assembly for 3D printer comprising polygon mirrors rotating in single direction, and a scanning method therewith and a 3D printer therewith
CN104359405B (en) * 2014-11-27 2017-11-07 上海集成电路研发中心有限公司 Three-dimensional scanner
CN105232161B (en) * 2015-10-16 2017-05-17 北京天智航医疗科技股份有限公司 Surgical robot mark point recognition and location method
US20170116462A1 (en) * 2015-10-22 2017-04-27 Canon Kabushiki Kaisha Measurement apparatus and method, program, article manufacturing method, calibration mark member, processing apparatus, and processing system
KR101788131B1 (en) * 2016-01-18 2017-10-19 한화첨단소재 주식회사 Apparatus for displaying a die mounting location of the thermosetting resin composition sheet for an electric vehicle
US20180108178A1 (en) * 2016-10-13 2018-04-19 General Electric Company System and method for measurement based quality inspection
DE102017109854A1 (en) * 2017-05-08 2018-11-08 Wobben Properties Gmbh Method for referencing a plurality of sensor units and associated measuring device
CN107169964B (en) * 2017-06-08 2020-11-03 广东嘉铭智能科技有限公司 Method and device for detecting surface defects of cambered surface reflecting lens
CN108225218A (en) * 2018-02-07 2018-06-29 苏州镭图光电科技有限公司 3-D scanning imaging method and imaging device based on optical micro electro-mechanical systems
DE102020213141A1 (en) * 2020-10-19 2022-04-21 Robert Bosch Gesellschaft mit beschränkter Haftung Method for generating an optical marking, method for detecting an optical marking and marking device with the optical marking
CN112461138B (en) * 2020-11-18 2022-06-28 苏州迈之升电子科技有限公司 Cross scanning measurement method, measurement grating and application thereof
KR102780525B1 (en) * 2024-11-19 2025-03-11 주식회사 심작 Method for restoring the shape and color of a relic without damaging the relic and device thereof

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5276613A (en) * 1988-12-14 1994-01-04 Etienne Schlumberger Process and device for coordinating several images of the same object
US5227985A (en) * 1991-08-19 1993-07-13 University Of Maryland Computer vision system for position monitoring in three dimensions using non-coplanar light sources attached to a monitored object
US6239868B1 (en) * 1996-01-02 2001-05-29 Lj Laboratories, L.L.C. Apparatus and method for measuring optical characteristics of an object
RU2123718C1 (en) * 1996-09-27 1998-12-20 Кузин Виктор Алексеевич Method for information input to computer

Also Published As

Publication number Publication date
JP4226550B2 (en) 2009-02-18
CN1672013A (en) 2005-09-21
CN1300551C (en) 2007-02-14
WO2004011876A1 (en) 2004-02-05
JP2005534026A (en) 2005-11-10

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase