AU2002239563A1 - Photoacid generators and photoresists comprising same - Google Patents
Photoacid generators and photoresists comprising sameInfo
- Publication number
- AU2002239563A1 AU2002239563A1 AU2002239563A AU3956302A AU2002239563A1 AU 2002239563 A1 AU2002239563 A1 AU 2002239563A1 AU 2002239563 A AU2002239563 A AU 2002239563A AU 3956302 A AU3956302 A AU 3956302A AU 2002239563 A1 AU2002239563 A1 AU 2002239563A1
- Authority
- AU
- Australia
- Prior art keywords
- photoresists
- same
- photoacid generators
- photoacid
- generators
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C303/00—Preparation of esters or amides of sulfuric acids; Preparation of sulfonic acids or of their esters, halides, anhydrides or amides
- C07C303/02—Preparation of esters or amides of sulfuric acids; Preparation of sulfonic acids or of their esters, halides, anhydrides or amides of sulfonic acids or halides thereof
- C07C303/20—Preparation of esters or amides of sulfuric acids; Preparation of sulfonic acids or of their esters, halides, anhydrides or amides of sulfonic acids or halides thereof by addition of sulfurous acid or salts thereof to compounds having carbon-to-carbon multiple bonds
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C303/00—Preparation of esters or amides of sulfuric acids; Preparation of sulfonic acids or of their esters, halides, anhydrides or amides
- C07C303/32—Preparation of esters or amides of sulfuric acids; Preparation of sulfonic acids or of their esters, halides, anhydrides or amides of salts of sulfonic acids
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C309/00—Sulfonic acids; Halides, esters, or anhydrides thereof
- C07C309/01—Sulfonic acids
- C07C309/02—Sulfonic acids having sulfo groups bound to acyclic carbon atoms
- C07C309/24—Sulfonic acids having sulfo groups bound to acyclic carbon atoms of a carbon skeleton containing six-membered aromatic rings
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C381/00—Compounds containing carbon and sulfur and having functional groups not covered by groups C07C301/00 - C07C337/00
- C07C381/12—Sulfonium compounds
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
- G03F7/0382—Macromolecular compounds which are rendered insoluble or differentially wettable the macromolecular compound being present in a chemically amplified negative photoresist composition
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
- G03F7/0397—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having an alicyclic moiety in a side chain
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/114—Initiator containing
- Y10S430/115—Cationic or anionic
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/114—Initiator containing
- Y10S430/122—Sulfur compound containing
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Materials For Photolithography (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Low-Molecular Organic Synthesis Reactions Using Catalysts (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US24584800P | 2000-11-03 | 2000-11-03 | |
| US60/245,848 | 2000-11-03 | ||
| PCT/US2001/047370 WO2002042845A2 (en) | 2000-11-03 | 2001-11-03 | Photoacid generators and photoresists comprising same |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| AU2002239563A1 true AU2002239563A1 (en) | 2002-06-03 |
Family
ID=22928331
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU2002239563A Abandoned AU2002239563A1 (en) | 2000-11-03 | 2001-11-03 | Photoacid generators and photoresists comprising same |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6849374B2 (en) |
| JP (7) | JP4211971B2 (en) |
| AU (1) | AU2002239563A1 (en) |
| WO (1) | WO2002042845A2 (en) |
Families Citing this family (73)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3425606B2 (en) | 1993-04-09 | 2003-07-14 | 佐藤 朝夫 | Water treatment method |
| US6749987B2 (en) * | 2000-10-20 | 2004-06-15 | Fuji Photo Film Co., Ltd. | Positive photosensitive composition |
| WO2002042845A2 (en) * | 2000-11-03 | 2002-05-30 | Shipley Company, L.L.C. | Photoacid generators and photoresists comprising same |
| TWI304060B (en) * | 2001-06-29 | 2008-12-11 | Jsr Corp | Acid generator and radiation-sensitive resin composition |
| JP4924256B2 (en) * | 2001-06-29 | 2012-04-25 | Jsr株式会社 | Radiation sensitive resin composition |
| DE60234409D1 (en) | 2001-06-29 | 2009-12-31 | Jsr Corp | Acid generator, sulfonic acid, sulfonic acid derivatives and radiation-sensitive composition |
| US6841333B2 (en) * | 2002-11-01 | 2005-01-11 | 3M Innovative Properties Company | Ionic photoacid generators with segmented hydrocarbon-fluorocarbon sulfonate anions |
| JP4590821B2 (en) * | 2003-01-14 | 2010-12-01 | コニカミノルタホールディングス株式会社 | Actinic ray curable ink composition and image forming method using the same |
| JP4366947B2 (en) * | 2003-02-13 | 2009-11-18 | コニカミノルタホールディングス株式会社 | Actinic ray curable ink composition and image forming method using the same |
| US7122294B2 (en) * | 2003-05-22 | 2006-10-17 | 3M Innovative Properties Company | Photoacid generators with perfluorinated multifunctional anions |
| JP4347110B2 (en) * | 2003-10-22 | 2009-10-21 | 東京応化工業株式会社 | Positive resist composition for electron beam or EUV |
| JP2005215112A (en) * | 2004-01-28 | 2005-08-11 | Tokyo Ohka Kogyo Co Ltd | Negative resist composition and method for forming resist pattern |
| US7449573B2 (en) | 2004-02-16 | 2008-11-11 | Fujifilm Corporation | Photosensitive composition, compound for use in the photosensitive composition, and method of pattern formation with the photosensitive composition |
| US7776504B2 (en) * | 2004-02-23 | 2010-08-17 | Nissan Chemical Industries, Ltd. | Dye-containing resist composition and color filter using same |
| WO2005089355A2 (en) * | 2004-03-16 | 2005-09-29 | Cornell Research Foundation, Inc. | Environmentally friendly photoacid generators (pags) with no perfluorooctyl sulfonates (pfos) |
| KR100574495B1 (en) * | 2004-12-15 | 2006-04-27 | 주식회사 하이닉스반도체 | Photoacid generator polymer, preparation method thereof, and upper anti-reflective coating composition containing same |
| JP4452632B2 (en) * | 2005-01-24 | 2010-04-21 | 富士フイルム株式会社 | Photosensitive composition, compound used for photosensitive composition, and pattern formation method using the photosensitive composition |
| TWI332122B (en) | 2005-04-06 | 2010-10-21 | Shinetsu Chemical Co | Novel sulfonate salts and derivatives, photoacid generators, resist compositions and patterning process |
| JP4774996B2 (en) * | 2005-07-26 | 2011-09-21 | Jsr株式会社 | Radiation sensitive resin composition |
| JP4905667B2 (en) * | 2005-10-31 | 2012-03-28 | 信越化学工業株式会社 | Novel sulfonate and derivative thereof, photoacid generator, resist material and pattern forming method using the same |
| EP1780198B1 (en) | 2005-10-31 | 2011-10-05 | Shin-Etsu Chemical Co., Ltd. | Novel fluorosulfonyloxyalkyl sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process |
| JP4905666B2 (en) * | 2005-10-31 | 2012-03-28 | 信越化学工業株式会社 | Novel sulfonate and derivative thereof, photoacid generator, resist material and pattern forming method using the same |
| EP1780199B1 (en) | 2005-10-31 | 2012-02-01 | Shin-Etsu Chemical Co., Ltd. | Novel fluorohydroxyalkyl sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process |
| WO2007124092A2 (en) * | 2006-04-21 | 2007-11-01 | Cornell Research Foundation, Inc. | Photoacid generator compounds and compositions |
| JP4548616B2 (en) | 2006-05-15 | 2010-09-22 | 信越化学工業株式会社 | Thermal acid generator, resist underlayer film material containing the same, and pattern formation method using this resist underlayer film material |
| JP5124806B2 (en) | 2006-06-27 | 2013-01-23 | 信越化学工業株式会社 | Photoacid generator, resist material and pattern forming method using the same |
| JP5124805B2 (en) * | 2006-06-27 | 2013-01-23 | 信越化学工業株式会社 | Photoacid generator, resist material and pattern forming method using the same |
| JP4718390B2 (en) * | 2006-08-01 | 2011-07-06 | 信越化学工業株式会社 | Resist underlayer film material, resist underlayer film substrate using the same, and pattern forming method |
| US7527912B2 (en) * | 2006-09-28 | 2009-05-05 | Shin-Etsu Chemical Co., Ltd. | Photoacid generators, resist compositions, and patterning process |
| US7569326B2 (en) | 2006-10-27 | 2009-08-04 | Shin-Etsu Chemical Co., Ltd. | Sulfonium salt having polymerizable anion, polymer, resist composition, and patterning process |
| JP4355725B2 (en) | 2006-12-25 | 2009-11-04 | 信越化学工業株式会社 | Positive resist material and pattern forming method |
| JP5019071B2 (en) | 2007-09-05 | 2012-09-05 | 信越化学工業株式会社 | Novel photoacid generator, resist material and pattern forming method using the same |
| JP5347349B2 (en) * | 2007-09-18 | 2013-11-20 | セントラル硝子株式会社 | Process for producing 2-bromo-2,2-difluoroethanol and 2- (alkylcarbonyloxy) -1,1-difluoroethanesulfonates |
| US8283106B2 (en) | 2007-11-01 | 2012-10-09 | Central Glass Company, Limited | Sulfonic acid salt and derivative thereof, photoacid generator agent, and resist material and pattern formation method using the photoacid generator agent |
| US8039194B2 (en) * | 2008-01-08 | 2011-10-18 | Internatinal Business Machines Corporation | Photoacid generators for extreme ultraviolet lithography |
| US7968276B2 (en) * | 2008-01-15 | 2011-06-28 | Tokyo Ohka Kogyo Co., Ltd. | Positive resist composition and method of forming resist pattern |
| JP4513990B2 (en) | 2008-01-18 | 2010-07-28 | 信越化学工業株式会社 | Positive resist material and pattern forming method |
| JP4844761B2 (en) | 2008-01-18 | 2011-12-28 | 信越化学工業株式会社 | Positive resist material and pattern forming method |
| JP4513989B2 (en) | 2008-01-18 | 2010-07-28 | 信越化学工業株式会社 | Positive resist material and pattern forming method |
| JP5131482B2 (en) * | 2008-02-13 | 2013-01-30 | 信越化学工業株式会社 | Positive resist material and pattern forming method |
| EP2101217B1 (en) | 2008-03-14 | 2011-05-11 | Shin-Etsu Chemical Co., Ltd. | Sulfonium salt-containing polymer, resist compositon, and patterning process |
| JP5245956B2 (en) * | 2008-03-25 | 2013-07-24 | 信越化学工業株式会社 | Novel photoacid generator, resist material and pattern forming method using the same |
| US8163461B2 (en) * | 2008-04-09 | 2012-04-24 | Cornell Research Foundation, Inc. | Photoacid generator compounds and compositions |
| JP4998746B2 (en) | 2008-04-24 | 2012-08-15 | 信越化学工業株式会社 | Polymer compound containing sulfonium salt, resist material, and pattern forming method |
| JP4569786B2 (en) | 2008-05-01 | 2010-10-27 | 信越化学工業株式会社 | Novel photoacid generator, resist material and pattern forming method using the same |
| JP5746818B2 (en) * | 2008-07-09 | 2015-07-08 | 富士フイルム株式会社 | Actinic ray-sensitive or radiation-sensitive resin composition and pattern forming method using the same |
| JP5201363B2 (en) | 2008-08-28 | 2013-06-05 | 信越化学工業株式会社 | Sulfonium salt and polymer compound having polymerizable anion, resist material and pattern forming method |
| TWI400226B (en) | 2008-10-17 | 2013-07-01 | Shinetsu Chemical Co | Polymerizable anion-containing sulfonium salt and polymer, resist composition, and patterning process |
| KR100998503B1 (en) * | 2008-10-30 | 2010-12-07 | 금호석유화학 주식회사 | Acid generators containing aromatic rings |
| JP4813537B2 (en) | 2008-11-07 | 2011-11-09 | 信越化学工業株式会社 | Resist underlayer material containing thermal acid generator, resist underlayer film forming substrate, and pattern forming method |
| CN101930173B (en) | 2009-06-22 | 2014-05-14 | 罗门哈斯电子材料有限公司 | Photoacid generators and photoresists comprising same |
| JP5287552B2 (en) * | 2009-07-02 | 2013-09-11 | 信越化学工業株式会社 | Photoacid generator, resist material and pattern forming method |
| JP5675125B2 (en) | 2009-09-30 | 2015-02-25 | 富士フイルム株式会社 | Actinic ray-sensitive or radiation-sensitive resin composition, and pattern formation method using the photosensitive composition |
| EP2332960B1 (en) | 2009-12-10 | 2016-08-10 | Rohm and Haas Electronic Materials LLC | Cholate photoacid generators and photoresists comprising same |
| EP2360153B1 (en) | 2009-12-10 | 2015-04-08 | Rohm and Haas Electronic Materials LLC | Photoacid generators and photoresists comprising same |
| JP5851688B2 (en) | 2009-12-31 | 2016-02-03 | ローム アンド ハース エレクトロニック マテリアルズ エルエルシーRohm and Haas Electronic Materials LLC | Photosensitive composition |
| JP5216032B2 (en) | 2010-02-02 | 2013-06-19 | 信越化学工業株式会社 | Novel sulfonium salt, polymer compound, method for producing polymer compound, resist material and pattern forming method |
| CN102781911B (en) | 2010-02-24 | 2015-07-22 | 巴斯夫欧洲公司 | Latent acids and their use |
| JP5969171B2 (en) * | 2010-03-31 | 2016-08-17 | ローム アンド ハース エレクトロニック マテリアルズ エルエルシーRohm and Haas Electronic Materials LLC | Photoacid generator and photoresist containing the same |
| JP5782283B2 (en) | 2010-03-31 | 2015-09-24 | ローム アンド ハース エレクトロニック マテリアルズ エルエルシーRohm and Haas Electronic Materials LLC | Novel polymer and photoresist compositions |
| JP5756672B2 (en) | 2010-04-27 | 2015-07-29 | ローム アンド ハース エレクトロニック マテリアルズ エルエルシーRohm and Haas Electronic Materials LLC | Photoacid generator and photoresist containing the same |
| JP5491450B2 (en) | 2011-05-30 | 2014-05-14 | 信越化学工業株式会社 | A polymer compound, a chemically amplified resist material, and a pattern forming method using the chemically amplified resist material. |
| JP5411893B2 (en) | 2011-05-30 | 2014-02-12 | 信越化学工業株式会社 | Sulfonium salt, polymer compound, chemically amplified resist composition and resist pattern forming method using the polymer compound |
| US9223208B2 (en) * | 2011-12-29 | 2015-12-29 | Fujifilm Corporation | Actinic-ray- or radiation-sensitive resin composition and method of forming pattern using the composition |
| JP5668710B2 (en) | 2012-02-27 | 2015-02-12 | 信越化学工業株式会社 | POLYMER COMPOUND, RESIST MATERIAL CONTAINING SAME, PATTERN FORMING METHOD, AND METHOD FOR PRODUCING THE POLYMER COMPOUND |
| JP2013173855A (en) | 2012-02-27 | 2013-09-05 | Shin-Etsu Chemical Co Ltd | Method for producing polymer compound, polymer compound produced by the production method, resist material containing the same and method for forming pattern |
| JP6013218B2 (en) | 2012-02-28 | 2016-10-25 | 信越化学工業株式会社 | Acid generator, chemically amplified resist material, and pattern forming method |
| JP5615860B2 (en) | 2012-03-07 | 2014-10-29 | 信越化学工業株式会社 | Acid generator, chemically amplified resist material, and pattern forming method |
| WO2013146812A1 (en) | 2012-03-27 | 2013-10-03 | 富士フイルム株式会社 | Active-light-sensitive or radiation-sensitive composition, and resist film, resist coating mask blank, resist pattern formation method, and photomask employing same |
| KR102537349B1 (en) | 2015-02-02 | 2023-05-26 | 바스프 에스이 | Potential Acids and Their Uses |
| JP2020011463A (en) * | 2018-07-19 | 2020-01-23 | 京セラドキュメントソリューションズ株式会社 | Pretreatment liquid for inkjet recording, inkjet recording device and image formation method |
| KR102080079B1 (en) * | 2018-10-30 | 2020-02-21 | 인하대학교 산학협력단 | Highly fluorinated monomolecular photoresist having solubility in high fluorine solvent and method of forming pattern using the same |
| US12134690B2 (en) * | 2019-12-31 | 2024-11-05 | Taiwan Semiconductor Manufacturing Company, Ltd. | Photoresist composition and method of manufacturing a semiconductor device |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE295421C (en) | ||||
| JPS59184152A (en) * | 1983-04-01 | 1984-10-19 | Japan Synthetic Rubber Co Ltd | Method for producing sulfonated products |
| JP2696544B2 (en) * | 1988-12-21 | 1998-01-14 | 大塚化学株式会社 | Fluoroalkylsulfonic acids and their uses |
| DE3929985A1 (en) * | 1989-09-08 | 1991-03-14 | Henkel Kgaa | METHOD FOR PRODUCING SHORT CHAIN ALKANESULPHONIC ACIDS FROM OLEFINS |
| DD295421A5 (en) * | 1990-06-19 | 1991-10-31 | Humboldt-Universitaet Zu Berlin,Direktorat Fuer Forschung,De | POSITIVE WORKING PHOTO COPIER PAINT WITH CHEMICAL REINFORCEMENT |
| US5296332A (en) * | 1991-11-22 | 1994-03-22 | International Business Machines Corporation | Crosslinkable aqueous developable photoresist compositions and method for use thereof |
| DE4227027A1 (en) * | 1992-08-14 | 1994-02-17 | Bayer Ag | Process for the preparation of 2-aryl-ethane-sulfonic acids |
| JPH06213855A (en) * | 1993-01-20 | 1994-08-05 | Unisia Jecs Corp | Apparatus for determining fuel nature |
| US5488147A (en) * | 1994-07-21 | 1996-01-30 | Minnesota Mining And Manufacturing Company | Diaryliodonium fluoroalkyl sulfonate salts and a method of making |
| JPH10130178A (en) * | 1996-09-06 | 1998-05-19 | Chisso Corp | Production of gem-difluoroolefins, zirconocene for the production, and production thereof |
| TWI250379B (en) * | 1998-08-07 | 2006-03-01 | Az Electronic Materials Japan | Chemical amplified radiation-sensitive composition which contains onium salt and generator |
| US6280911B1 (en) * | 1998-09-10 | 2001-08-28 | Shipley Company, L.L.C. | Photoresist compositions comprising blends of ionic and non-ionic photoacid generators |
| US6749987B2 (en) * | 2000-10-20 | 2004-06-15 | Fuji Photo Film Co., Ltd. | Positive photosensitive composition |
| JP4262402B2 (en) * | 2000-10-20 | 2009-05-13 | 富士フイルム株式会社 | Positive resist composition |
| JP2002139838A (en) * | 2000-10-31 | 2002-05-17 | Fuji Photo Film Co Ltd | Positive type resist composition |
| WO2002042845A2 (en) * | 2000-11-03 | 2002-05-30 | Shipley Company, L.L.C. | Photoacid generators and photoresists comprising same |
-
2001
- 2001-11-03 WO PCT/US2001/047370 patent/WO2002042845A2/en not_active Ceased
- 2001-11-03 US US10/007,855 patent/US6849374B2/en not_active Expired - Lifetime
- 2001-11-03 JP JP2002545309A patent/JP4211971B2/en not_active Expired - Lifetime
- 2001-11-03 AU AU2002239563A patent/AU2002239563A1/en not_active Abandoned
-
2008
- 2008-02-14 JP JP2008032677A patent/JP5184129B2/en not_active Expired - Lifetime
-
2012
- 2012-11-22 JP JP2012255880A patent/JP5918111B2/en not_active Ceased
-
2014
- 2014-06-18 JP JP2014125020A patent/JP2014225023A/en active Pending
-
2016
- 2016-10-13 JP JP2016201651A patent/JP2017083826A/en active Pending
-
2019
- 2019-07-04 JP JP2019125061A patent/JP2019207415A/en active Pending
-
2020
- 2020-07-30 JP JP2020129030A patent/JP2020197729A/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| JP5184129B2 (en) | 2013-04-17 |
| JP2019207415A (en) | 2019-12-05 |
| JP2013080234A (en) | 2013-05-02 |
| JP2004531749A (en) | 2004-10-14 |
| JP2014225023A (en) | 2014-12-04 |
| JP2008174562A (en) | 2008-07-31 |
| JP4211971B2 (en) | 2009-01-21 |
| JP2017083826A (en) | 2017-05-18 |
| WO2002042845A2 (en) | 2002-05-30 |
| US20030027061A1 (en) | 2003-02-06 |
| JP2020197729A (en) | 2020-12-10 |
| JP5918111B2 (en) | 2016-05-18 |
| WO2002042845A3 (en) | 2004-01-08 |
| US6849374B2 (en) | 2005-02-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| AU2002239563A1 (en) | Photoacid generators and photoresists comprising same | |
| AU2001286707A1 (en) | Photoacid generators and photoresists comprising same | |
| AU2001286956A1 (en) | Software development systems and methods | |
| AU2001272014A1 (en) | Distributed simulation | |
| AU2001286419A1 (en) | Endourethral device and method | |
| AU2002235128A1 (en) | Expression miniarrays and uses thereof | |
| AU2002233991A1 (en) | Layout generator system and method | |
| AU2001271397A1 (en) | Component models | |
| AU2001292265A1 (en) | Image creating device and image creating method | |
| AU2000235753A1 (en) | Inertial exercise device and exercise method | |
| AU2001280599A1 (en) | Compounds and methods | |
| AU2001253418A1 (en) | Compounds and methods | |
| AU2002255451A1 (en) | Procaryotic libraries and uses | |
| AU2001226961A1 (en) | Combustion simulating device | |
| AU2002210726A1 (en) | Software development | |
| AU2001259196A1 (en) | Structural protection device and method of installing the same | |
| AU2002211717A1 (en) | Stresscopins and their uses | |
| EP1170035A3 (en) | Method and device for optimizing the use of a tanning-related device | |
| AU2001243394A1 (en) | Compounds and methods | |
| AU2001281046A1 (en) | Approximating the magntidue and phase of a complex number | |
| AU2001292936A1 (en) | Octahydro-indolizines and quinolizines and hexahydro-pyrrolizines | |
| AU2001238706A1 (en) | Photoacid generators and photoresists comprising same | |
| AU2001291757A1 (en) | Slimming device | |
| AU2001286743A1 (en) | Oxime sulfonate and n-oxyimidosulfonate photoacid generators and photoresists comprising same | |
| AU2001295185A1 (en) | Multiplexing-interleaving and demultiplexing-deinterleaving |