AU2002224581A1 - Temperature-controlled thermal platform for automated testing - Google Patents

Temperature-controlled thermal platform for automated testing

Info

Publication number: AU2002224581A1
Authority: AU; Australia
Prior art keywords: temperature; automated testing; controlled thermal; thermal platform; platform
Prior art date: 2000-07-21
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Abandoned

Application number

AU2002224581A

Inventor

William M Stone

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Temptronic Corp

Original Assignee

Temptronic Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2000-07-21

Filing date

2001-07-18

Publication date

2002-02-05

2001-07-18 Application filed by Temptronic Corp filed Critical Temptronic Corp

2002-02-05 Publication of AU2002224581A1 publication Critical patent/AU2002224581A1/en

Status Abandoned legal-status Critical Current

Classifications

- H10P72/0432—

AU2002224581A 2000-07-21 2001-07-18 Temperature-controlled thermal platform for automated testing Abandoned AU2002224581A1 (en)

Applications Claiming Priority (5)

Application Number	Priority Date	Filing Date	Title
US22001600P	2000-07-21	2000-07-21
US60/220,016		2000-07-21
US26783001P	2001-02-09	2001-02-09
US60/267,830		2001-02-09
PCT/US2001/022574 WO2002009156A1 (en)	2000-07-21	2001-07-18	Temperature-controlled thermal platform for automated testing

Publications (1)

Publication Number	Publication Date
AU2002224581A1 true AU2002224581A1 (en)	2002-02-05

Family

ID=26914495

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
AU2002224581A Abandoned AU2002224581A1 (en)	2000-07-21	2001-07-18	Temperature-controlled thermal platform for automated testing

Country Status (5)

Country	Link
US (2)	US6744270B2 (en)
EP (1)	EP1312106A1 (en)
JP (1)	JP2004507886A (en)
AU (1)	AU2002224581A1 (en)
WO (1)	WO2002009156A1 (en)

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US6744270B2 (en) *	2000-07-21	2004-06-01	Temptronic Corporation	Temperature-controlled thermal platform for automated testing
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KR101468984B1 (en) *	2013-04-29	2014-12-05	(주) 예스티	Apparatus for testing led component
KR20160025863A (en) *	2014-08-28	2016-03-09	삼성전자주식회사	Contact structure for a test handler, test handler having contact structure and method of testing integrated circuit devices using the test handler
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CN106990268B (en) *	2017-04-21	2023-11-17	湖南人文科技学院	Electrochemical comprehensive tester
CN111584389B (en) *	2020-06-12	2025-02-07	苏州震坤科技有限公司	Automatic burn-in test equipment
CN114260039B (en) *	2021-12-31	2025-08-26	松山湖材料实验室	Rotating heating stage and two-dimensional material transfer device

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US6744270B2 (en) *	2000-07-21	2004-06-01	Temptronic Corporation	Temperature-controlled thermal platform for automated testing
US6518782B1 (en) *	2000-08-29	2003-02-11	Delta Design, Inc.	Active power monitoring using externally located current sensors

2001
- 2001-07-18 US US09/908,149 patent/US6744270B2/en not_active Expired - Fee Related
- 2001-07-18 EP EP01984365A patent/EP1312106A1/en not_active Withdrawn
- 2001-07-18 AU AU2002224581A patent/AU2002224581A1/en not_active Abandoned
- 2001-07-18 WO PCT/US2001/022574 patent/WO2002009156A1/en not_active Ceased
- 2001-07-18 JP JP2002514767A patent/JP2004507886A/en active Pending
2004
- 2004-03-16 US US10/802,961 patent/US6867611B2/en not_active Expired - Fee Related

Also Published As

Publication number	Publication date
WO2002009156A1 (en)	2002-01-31
US20020047702A1 (en)	2002-04-25
EP1312106A1 (en)	2003-05-21
US6744270B2 (en)	2004-06-01
WO2002009156A8 (en)	2003-03-13
JP2004507886A (en)	2004-03-11
US6867611B2 (en)	2005-03-15
US20040174181A1 (en)	2004-09-09

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AU2002224581A1 (en)	2002-02-05	Temperature-controlled thermal platform for automated testing
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