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AU2002215491A1 - Measuring device for detecting the dimensions of test samples - Google Patents

Measuring device for detecting the dimensions of test samples

Info

Publication number
AU2002215491A1
AU2002215491A1 AU2002215491A AU1549102A AU2002215491A1 AU 2002215491 A1 AU2002215491 A1 AU 2002215491A1 AU 2002215491 A AU2002215491 A AU 2002215491A AU 1549102 A AU1549102 A AU 1549102A AU 2002215491 A1 AU2002215491 A1 AU 2002215491A1
Authority
AU
Australia
Prior art keywords
dimensions
detecting
measuring device
test samples
samples
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2002215491A
Inventor
Stefan Franz
Robert Windecker
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Joh and Ernst Link GmbH and Co KG
Original Assignee
Link Johann & Ernst & Co GmbH
Joh and Ernst Link GmbH and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE2000129383 external-priority patent/DE10029383A1/en
Application filed by Link Johann & Ernst & Co GmbH, Joh and Ernst Link GmbH and Co KG filed Critical Link Johann & Ernst & Co GmbH
Publication of AU2002215491A1 publication Critical patent/AU2002215491A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/24—Arrangements for observing, indicating or measuring on machine tools using optics or electromagnetic waves
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
    • B23Q17/20—Arrangements for observing, indicating or measuring on machine tools for indicating or measuring workpiece characteristics, e.g. contour, dimension, hardness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/12—Measuring arrangements characterised by the use of optical techniques for measuring diameters internal diameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/22—Measuring arrangements characterised by the use of optical techniques for measuring depth
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02049—Interferometers characterised by particular mechanical design details
    • G01B9/0205—Interferometers characterised by particular mechanical design details of probe head
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/30—Grating as beam-splitter

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
AU2002215491A 2000-06-21 2001-06-15 Measuring device for detecting the dimensions of test samples Abandoned AU2002215491A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE2000129383 DE10029383A1 (en) 1998-12-23 2000-06-21 Interferometer for determining test sample dimensions has reference mirror and receiver, which are laterally offset relative to the interferometer's optical axis
DE10029383 2000-06-21
PCT/DE2001/002258 WO2001098732A1 (en) 2000-06-21 2001-06-15 Measuring device for detecting the dimensions of test samples

Publications (1)

Publication Number Publication Date
AU2002215491A1 true AU2002215491A1 (en) 2002-01-02

Family

ID=7645757

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2002215491A Abandoned AU2002215491A1 (en) 2000-06-21 2001-06-15 Measuring device for detecting the dimensions of test samples

Country Status (5)

Country Link
US (1) US7092102B2 (en)
EP (1) EP1292805B1 (en)
JP (1) JP5264034B2 (en)
AU (1) AU2002215491A1 (en)
WO (1) WO2001098732A1 (en)

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DE10304187A1 (en) * 2003-01-29 2004-08-19 Iqsun Gmbh 3D scanner
GB2402638A (en) * 2003-06-10 2004-12-15 Hsien Lu Peng Lens apparatus and method for detecting inaccuracy of machining of finished workpiece
DE10337894A1 (en) * 2003-08-18 2005-03-17 Robert Bosch Gmbh Optical measuring system for acquiring geometric data from surfaces
US7665221B2 (en) * 2006-05-25 2010-02-23 The Boeing Company Method and apparatus for hole diameter profile measurement
US20080079936A1 (en) * 2006-09-29 2008-04-03 Caterpillar Inc. Internal thread inspection probe
US8860954B2 (en) * 2006-10-04 2014-10-14 Schlumberger Technology Corporation Physical property measurement device
WO2008056383A1 (en) * 2006-11-08 2008-05-15 Sintesi S.C.P.A. Industrial machine provided with interferometric measuring means
DE102014108629A1 (en) * 2014-06-18 2015-12-24 Brötje-Automation GmbH manufacturing system
US10656617B2 (en) 2014-07-16 2020-05-19 Faro Technologies, Inc. Measurement device for machining center
US20160016274A1 (en) * 2014-07-16 2016-01-21 Faro Technologies, Inc. Measurement device for machining center
DE102014113663A1 (en) 2014-09-22 2016-03-24 Broetje-Automation Gmbh Processing plant for aircraft structural components
DE202015104273U1 (en) 2015-08-13 2016-11-15 Brötje-Automation GmbH processing station
CN105758321B (en) * 2016-05-04 2018-04-10 安徽工业大学 Train wheel wheelboss inner hole diameter laser measuring system and its measuring method
US10107614B1 (en) * 2017-04-18 2018-10-23 Quality Vision International, Inc. Optical pen for interferometric measuring machine
CN107014302B (en) * 2017-05-22 2019-03-22 安徽工业大学 A kind of scaling method of train wheel wheelboss inner hole diameter laser measurement sensor position
EP3686548B1 (en) 2019-01-22 2021-10-27 AB Sandvik Coromant Method and arrangment for measuring diameter of workpiece

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US4153370A (en) * 1977-12-05 1979-05-08 The United States Of America As Represented By The United States Department Of Energy Microinterferometer transducer
US4561776A (en) * 1981-03-25 1985-12-31 Diffracto Ltd. Electro-optical sensors for tool and robotic inspection
JPS57194854A (en) * 1981-05-23 1982-11-30 Agency Of Ind Science & Technol Ultra-precision machining
JPH0698567B2 (en) * 1985-04-12 1994-12-07 トヨタ自動車株式会社 Free curved surface processing machine
DE3617790A1 (en) * 1985-07-04 1987-01-08 Hansen Dieter Ag Ultrasonic machine tool
GB8626812D0 (en) * 1986-11-10 1986-12-10 Sira Ltd Surface inspection
JP2694349B2 (en) * 1988-09-30 1997-12-24 京セラ株式会社 Micro displacement measurement device
US5392122A (en) * 1990-10-01 1995-02-21 Ulanov; Mark Apparatus and method for the determination of geometrical dimensions and physical characteristics of objects
US5434669A (en) * 1990-10-23 1995-07-18 Olympus Optical Co., Ltd. Measuring interferometric endoscope having a laser radiation source
US5153669A (en) * 1991-03-27 1992-10-06 Hughes Danbury Optical Systems, Inc. Three wavelength optical measurement apparatus and method
US6134003A (en) * 1991-04-29 2000-10-17 Massachusetts Institute Of Technology Method and apparatus for performing optical measurements using a fiber optic imaging guidewire, catheter or endoscope
US5716324A (en) * 1992-08-25 1998-02-10 Fuji Photo Film Co., Ltd. Endoscope with surface and deep portion imaging systems
US5325177A (en) * 1992-10-29 1994-06-28 Environmental Research Institute Of Michigan Optical, interferometric hole gauge
JP3400503B2 (en) * 1993-10-26 2003-04-28 松下電工株式会社 Interferometer
JP3354675B2 (en) * 1993-12-27 2002-12-09 オリンパス光学工業株式会社 Circumferential surface shape measurement method
JP2000505578A (en) * 1996-03-01 2000-05-09 フラウンホーファー・ゲゼルシャフト ツア フェルデルンク デア アンゲヴァンテン フォルシュンク アインゲトラーゲナー フェアアイン Method and apparatus for correcting dynamic displacement in cutting machine tools
JPH09298176A (en) * 1996-05-09 1997-11-18 Canon Inc Polishing method and polishing apparatus using the same
JP3290888B2 (en) * 1996-05-27 2002-06-10 日本電信電話株式会社 Laser length measuring device and manufacturing method thereof
DE19714202A1 (en) * 1997-04-07 1998-10-15 Bosch Gmbh Robert Device for the optical inspection of surfaces
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JP3501639B2 (en) * 1997-10-31 2004-03-02 キヤノン株式会社 3D shape measuring device
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JP2001353651A (en) * 2000-06-13 2001-12-25 Mitsubishi Heavy Ind Ltd Propeller manufacturing device, and propeller manufacturing method
WO2002004889A1 (en) * 2000-07-07 2002-01-17 Robert Bosch Gmbh Interferometric, low coherence shape measurement device for a plurality of surfaces (valve seat) via several reference planes
DE10057539B4 (en) * 2000-11-20 2008-06-12 Robert Bosch Gmbh Interferometric measuring device

Also Published As

Publication number Publication date
JP5264034B2 (en) 2013-08-14
JP2004501368A (en) 2004-01-15
WO2001098732A1 (en) 2001-12-27
EP1292805B1 (en) 2012-08-22
EP1292805A1 (en) 2003-03-19
US20040090635A1 (en) 2004-05-13
US7092102B2 (en) 2006-08-15

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