AU2002245700A1 - Screening of combinatorial library using x-ray analysis - Google Patents

Screening of combinatorial library using x-ray analysis

Info

Publication number: AU2002245700A1
Authority: AU; Australia
Prior art keywords: screening; ray analysis; combinatorial library; combinatorial; library
Prior art date: 2002-03-19
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Abandoned

Application number

AU2002245700A

Inventor

David M. Gibson

Jeffrey P. Nicolich

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

X Ray Optical Systems Inc

Original Assignee

X Ray Optical Systems Inc

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2002-03-19

Filing date

2002-03-19

Publication date

2003-10-08

2002-03-19 Application filed by X Ray Optical Systems Inc filed Critical X Ray Optical Systems Inc

2003-10-08 Publication of AU2002245700A1 publication Critical patent/AU2002245700A1/en

Status Abandoned legal-status Critical Current

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence

Landscapes

Physics & Mathematics (AREA)
Chemical & Material Sciences (AREA)
Immunology (AREA)
Pathology (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
General Health & Medical Sciences (AREA)
General Physics & Mathematics (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
Spectroscopy & Molecular Physics (AREA)
Engineering & Computer Science (AREA)
General Engineering & Computer Science (AREA)
High Energy & Nuclear Physics (AREA)
Crystallography & Structural Chemistry (AREA)
Analysing Materials By The Use Of Radiation (AREA)

AU2002245700A 2002-03-19 2002-03-19 Screening of combinatorial library using x-ray analysis Abandoned AU2002245700A1 (en)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
PCT/US2002/008434 WO2003081222A1 (en)	2002-03-19	2002-03-19	Screening of combinatorial library using x-ray analysis

Publications (1)

Publication Number	Publication Date
AU2002245700A1 true AU2002245700A1 (en)	2003-10-08

Family

ID=28452135

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
AU2002245700A Abandoned AU2002245700A1 (en)	2002-03-19	2002-03-19	Screening of combinatorial library using x-ray analysis

Country Status (2)

Country	Link
AU (1)	AU2002245700A1 (en)
WO (1)	WO2003081222A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
EP1953537A1 (en) *	2007-01-30	2008-08-06	KEMMER, Josef, Dr.	Device for detecting or guiding x-radiation using x-ray optics
WO2008112950A1 (en) *	2007-03-15	2008-09-18	X-Ray Optical Systems, Inc.	Small spot and high energy resolution xrf system for valence state determination
CN106288796A (en) *	2016-07-26	2017-01-04	中国科学院上海应用物理研究所	A kind of glancing incidence XAFS high-temp in-situ stove
CN109324072B (en) *	2017-07-28	2021-05-14	中国科学院苏州纳米技术与纳米仿生研究所	Detection system and detection method for high-flux combined material chip

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
NL8801019A (en) *	1988-04-20	1989-11-16	Philips Nv	ROENTGEN SPECTROMETER WITH DOUBLE-CURVED CRYSTAL.
DE69427152T2 (en) *	1994-07-08	2001-11-22	Muradin Abubekirovic Kumachov	METHOD FOR GUIDING NEUTRAL AND CARGO BEAMS AND A DEVICE FOR IMPLEMENTING THE METHOD
CA2267897C (en) *	1996-10-09	2005-12-06	Symyx Technologies	Infrared spectroscopy and imaging of libraries
GB9815968D0 (en) *	1998-07-23	1998-09-23	Bede Scient Instr Ltd	X-ray focusing apparatus
EP1149282A2 (en) *	1998-12-18	2001-10-31	Symyx Technologies, Inc.	Apparatus and method for characterizing libraries of different materials using x-ray scattering
US6389101B1 (en) *	1999-05-24	2002-05-14	Jmar Research, Inc.	Parallel x-ray nanotomography
JP3373803B2 (en) *	1999-05-28	2003-02-04	科学技術振興事業団	Combinatorial X-ray diffractometer
WO2001007940A1 (en) *	1999-07-21	2001-02-01	Jmar Research, Inc.	High collection angle short wavelength radiation collimator and focusing optic

2002
- 2002-03-19 WO PCT/US2002/008434 patent/WO2003081222A1/en not_active Ceased
- 2002-03-19 AU AU2002245700A patent/AU2002245700A1/en not_active Abandoned

Also Published As

Publication number	Publication date
WO2003081222A1 (en)	2003-10-02

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Legal Events

Date	Code	Title	Description
2004-12-09	MK6	Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase