AU2001213151A1 - X-ray measuring and testing system - Google Patents
X-ray measuring and testing systemInfo
- Publication number
- AU2001213151A1 AU2001213151A1 AU2001213151A AU2001213151A AU2001213151A1 AU 2001213151 A1 AU2001213151 A1 AU 2001213151A1 AU 2001213151 A AU2001213151 A AU 2001213151A AU 2001213151 A AU2001213151 A AU 2001213151A AU 2001213151 A1 AU2001213151 A1 AU 2001213151A1
- Authority
- AU
- Australia
- Prior art keywords
- testing system
- ray measuring
- ray
- measuring
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/RU2000/000324 WO2002012871A1 (en) | 2000-08-07 | 2000-08-07 | X-ray measuring and testing system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| AU2001213151A1 true AU2001213151A1 (en) | 2002-05-16 |
| AU2001213151B2 AU2001213151B2 (en) | 2005-06-02 |
Family
ID=20129538
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU1315101A Pending AU1315101A (en) | 2000-08-07 | 2000-08-07 | X-ray measuring and testing system |
| AU2001213151A Ceased AU2001213151B2 (en) | 2000-08-07 | 2000-08-07 | X-ray measuring and testing system |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU1315101A Pending AU1315101A (en) | 2000-08-07 | 2000-08-07 | X-ray measuring and testing system |
Country Status (10)
| Country | Link |
|---|---|
| US (1) | US7110503B1 (en) |
| EP (1) | EP1308717A4 (en) |
| JP (1) | JP3734254B2 (en) |
| KR (1) | KR100690457B1 (en) |
| CN (1) | CN1230674C (en) |
| AU (2) | AU1315101A (en) |
| CA (1) | CA2397070C (en) |
| RU (1) | RU2208227C2 (en) |
| UA (1) | UA59495C2 (en) |
| WO (1) | WO2002012871A1 (en) |
Families Citing this family (37)
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| US7248672B2 (en) * | 2005-04-21 | 2007-07-24 | Bruker Axs, Inc. | Multiple-position x-ray tube for diffractometer |
| WO2007019053A1 (en) * | 2005-08-04 | 2007-02-15 | X-Ray Optical Systems, Inc. | Monochromatic x-ray micro beam for trace element mapping |
| RU2300756C1 (en) * | 2005-09-19 | 2007-06-10 | Институт Информатики и Проблем Регионального Управления КБНЦ РАН | Method of fluoroscopic analysis of materials |
| US7742564B2 (en) * | 2006-01-24 | 2010-06-22 | The University Of North Carolina At Chapel Hill | Systems and methods for detecting an image of an object by use of an X-ray beam having a polychromatic distribution |
| JP2009236633A (en) * | 2008-03-26 | 2009-10-15 | Panasonic Electric Works Co Ltd | X-ray foreign matter inspection device |
| KR20110122665A (en) * | 2008-12-01 | 2011-11-10 | 유니버시티 오브 노스캐롤라이나 앳 채플 힐 | System and Method for Object Image Detection Using Multi-beam Imaging from X-Ray Beams with Multi-wavelength Dispersion |
| JP5347559B2 (en) * | 2009-02-25 | 2013-11-20 | 株式会社島津製作所 | X-ray analyzer |
| US8369674B2 (en) * | 2009-05-20 | 2013-02-05 | General Electric Company | Optimizing total internal reflection multilayer optics through material selection |
| US8204174B2 (en) | 2009-06-04 | 2012-06-19 | Nextray, Inc. | Systems and methods for detecting an image of an object by use of X-ray beams generated by multiple small area sources and by use of facing sides of adjacent monochromator crystals |
| CA2763367C (en) | 2009-06-04 | 2016-09-13 | Nextray, Inc. | Strain matching of crystals and horizontally-spaced monochromator and analyzer crystal arrays in diffraction enhanced imaging systems and related methods |
| US8548123B2 (en) * | 2010-04-29 | 2013-10-01 | Bruker Axs, Inc. | Method and apparatus for using an area X-ray detector as a point detector in an X-ray diffractometer |
| US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
| JP2013221882A (en) * | 2012-04-18 | 2013-10-28 | Hitachi Ltd | Measuring apparatus |
| RU2524792C1 (en) * | 2013-01-09 | 2014-08-10 | Федеральное государственное бюджетное учреждение науки Институт физики микроструктур Российской академии наук (ИФМ РАН) | Device for inspecting surface roughness |
| US9989758B2 (en) * | 2013-04-10 | 2018-06-05 | Kla-Tencor Corporation | Debris protection system for reflective optic utilizing gas flow |
| US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
| US10297359B2 (en) * | 2013-09-19 | 2019-05-21 | Sigray, Inc. | X-ray illumination system with multiple target microstructures |
| US10269528B2 (en) | 2013-09-19 | 2019-04-23 | Sigray, Inc. | Diverging X-ray sources using linear accumulation |
| USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
| US10304580B2 (en) | 2013-10-31 | 2019-05-28 | Sigray, Inc. | Talbot X-ray microscope |
| US10401309B2 (en) | 2014-05-15 | 2019-09-03 | Sigray, Inc. | X-ray techniques using structured illumination |
| JP6397690B2 (en) * | 2014-08-11 | 2018-09-26 | 株式会社日立ハイテクノロジーズ | X-ray transmission inspection apparatus and foreign object detection method |
| US10352880B2 (en) | 2015-04-29 | 2019-07-16 | Sigray, Inc. | Method and apparatus for x-ray microscopy |
| CN104865050B (en) * | 2015-05-13 | 2017-05-31 | 北京控制工程研究所 | Grazing incidence optics system focusing performance analysis method based on X-ray optical simulation |
| US10295486B2 (en) | 2015-08-18 | 2019-05-21 | Sigray, Inc. | Detector for X-rays with high spatial and high spectral resolution |
| DE102016014213A1 (en) * | 2015-12-08 | 2017-07-06 | Shimadzu Corporation | X-RAY SPECTROSCOPIC ANALYSIS DEVICE AND ELEMENTARY ANALYSIS METHOD |
| US10247683B2 (en) | 2016-12-03 | 2019-04-02 | Sigray, Inc. | Material measurement techniques using multiple X-ray micro-beams |
| JP6937380B2 (en) | 2017-03-22 | 2021-09-22 | シグレイ、インコーポレイテッド | Methods for performing X-ray spectroscopy and X-ray absorption spectroscopy systems |
| US10578566B2 (en) | 2018-04-03 | 2020-03-03 | Sigray, Inc. | X-ray emission spectrometer system |
| US10845491B2 (en) | 2018-06-04 | 2020-11-24 | Sigray, Inc. | Energy-resolving x-ray detection system |
| DE112019003777B4 (en) | 2018-07-26 | 2025-09-11 | Sigray, Inc. | HIGH BRIGHTNESS X-RAY REFLECTION SOURCE |
| US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
| DE112019004433B4 (en) | 2018-09-04 | 2024-09-12 | Sigray, Inc. | SYSTEM AND METHOD FOR X-RAY FLUORESCENCE WITH FILTERING |
| WO2020051221A2 (en) | 2018-09-07 | 2020-03-12 | Sigray, Inc. | System and method for depth-selectable x-ray analysis |
| EP3633360B1 (en) * | 2018-10-01 | 2022-07-13 | Scienta Omicron AB | Hard x-ray photoelectron spectroscopy arrangement and system |
| WO2021162947A1 (en) | 2020-02-10 | 2021-08-19 | Sigray, Inc. | X-ray mirror optics with multiple hyperboloidal / hyperbolic surface profiles |
| CN116099135B (en) * | 2023-04-13 | 2023-06-27 | 智维精准(北京)医疗科技有限公司 | Detection device and linear accelerator using same |
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| US3980568A (en) * | 1975-10-17 | 1976-09-14 | Hankison Corporation | Radiation detection system |
| NL7806330A (en) * | 1978-06-12 | 1979-12-14 | Philips Nv | ROSEGEN PEK TROMETER. |
| GB2133208B (en) | 1982-11-18 | 1986-02-19 | Kratos Ltd | X-ray sources |
| DE3330806A1 (en) * | 1983-08-26 | 1985-03-14 | Feinfocus Röntgensysteme GmbH, 3050 Wunstorf | X-ray lithography apparatus |
| US4631743A (en) * | 1983-09-22 | 1986-12-23 | Agency Of Industrial Science & Technology | X-ray generating apparatus |
| US4719645A (en) * | 1985-08-12 | 1988-01-12 | Fujitsu Limited | Rotary anode assembly for an X-ray source |
| US5204506A (en) * | 1987-12-07 | 1993-04-20 | The Regents Of The University Of California | Plasma pinch surface treating apparatus and method of using same |
| US5073913A (en) * | 1988-04-26 | 1991-12-17 | Acctek Associates, Inc. | Apparatus for acceleration and application of negative ions and electrons |
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| JP3167074B2 (en) * | 1993-06-30 | 2001-05-14 | キヤノン株式会社 | SOR exposure system and mask manufactured using the same |
| US5459771A (en) * | 1994-04-01 | 1995-10-17 | University Of Central Florida | Water laser plasma x-ray point source and apparatus |
| GB2288961B (en) | 1994-04-22 | 1998-10-14 | Rolls Royce Plc | An apparatus and a method for inspecting a crystal |
| US5570408A (en) * | 1995-02-28 | 1996-10-29 | X-Ray Optical Systems, Inc. | High intensity, small diameter x-ray beam, capillary optic system |
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| US5512759A (en) * | 1995-06-06 | 1996-04-30 | Sweatt; William C. | Condenser for illuminating a ringfield camera with synchrotron emission light |
| US5745547A (en) * | 1995-08-04 | 1998-04-28 | X-Ray Optical Systems, Inc. | Multiple channel optic |
| GB9519687D0 (en) * | 1995-09-27 | 1995-11-29 | Schlumberger Ltd | Method of determining earth formation characteristics |
| US5682415A (en) * | 1995-10-13 | 1997-10-28 | O'hara; David B. | Collimator for x-ray spectroscopy |
| CN1069136C (en) * | 1996-02-17 | 2001-08-01 | 北京师范大学 | Integral X-ray lens and manufacturing method thereof and equipment using the same |
| US5784430A (en) * | 1996-04-16 | 1998-07-21 | Northrop Grumman Corporation | Multiple station gamma ray absorption contraband detection system |
| RU2112290C1 (en) * | 1996-07-26 | 1998-05-27 | Мурадин Абубекирович Кумахов | Device for converting neutral or charged particle beams and its manufacturing process (options) |
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| US6049588A (en) * | 1997-07-10 | 2000-04-11 | Focused X-Rays | X-ray collimator for lithography |
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| RU2180439C2 (en) * | 2000-02-11 | 2002-03-10 | Кумахов Мурадин Абубекирович | Process of generation of image of internal structure of object with use of x-rays and device for its realization |
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| US6949748B2 (en) * | 2002-04-16 | 2005-09-27 | The Regents Of The University Of California | Biomedical nuclear and X-ray imager using high-energy grazing incidence mirrors |
-
2000
- 2000-07-08 UA UA2002032039A patent/UA59495C2/en unknown
- 2000-08-07 CA CA002397070A patent/CA2397070C/en not_active Expired - Fee Related
- 2000-08-07 KR KR1020027004425A patent/KR100690457B1/en not_active Expired - Fee Related
- 2000-08-07 AU AU1315101A patent/AU1315101A/en active Pending
- 2000-08-07 US US10/181,561 patent/US7110503B1/en not_active Expired - Fee Related
- 2000-08-07 CN CNB008199469A patent/CN1230674C/en not_active Expired - Fee Related
- 2000-08-07 AU AU2001213151A patent/AU2001213151B2/en not_active Ceased
- 2000-08-07 RU RU2001119066/09A patent/RU2208227C2/en not_active IP Right Cessation
- 2000-08-07 JP JP2002517505A patent/JP3734254B2/en not_active Expired - Fee Related
- 2000-08-07 WO PCT/RU2000/000324 patent/WO2002012871A1/en not_active Ceased
- 2000-08-07 EP EP00975043A patent/EP1308717A4/en not_active Withdrawn
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