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AU2001292780A1 - A non-intrusive method and apparatus for characterizing particles based on scattering of elliptically polarized radiation - Google Patents

A non-intrusive method and apparatus for characterizing particles based on scattering of elliptically polarized radiation

Info

Publication number
AU2001292780A1
AU2001292780A1 AU2001292780A AU9278001A AU2001292780A1 AU 2001292780 A1 AU2001292780 A1 AU 2001292780A1 AU 2001292780 A AU2001292780 A AU 2001292780A AU 9278001 A AU9278001 A AU 9278001A AU 2001292780 A1 AU2001292780 A1 AU 2001292780A1
Authority
AU
Australia
Prior art keywords
scattering
elliptically polarized
particles based
polarized radiation
characterizing particles
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001292780A
Inventor
Sivakumar Manickavasagam
M. Pinar Menguc
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of AU2001292780A1 publication Critical patent/AU2001292780A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AU2001292780A 2000-09-20 2001-09-19 A non-intrusive method and apparatus for characterizing particles based on scattering of elliptically polarized radiation Abandoned AU2001292780A1 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US23406100P 2000-09-20 2000-09-20
US23386400P 2000-09-20 2000-09-20
US60/233,864 2000-09-20
US60/234,061 2000-09-20
PCT/US2001/029240 WO2002025247A2 (en) 2000-09-20 2001-09-19 A non-intrusive method and apparatus for characterizing particles based on scattering of elliptically polarized radiation

Publications (1)

Publication Number Publication Date
AU2001292780A1 true AU2001292780A1 (en) 2002-04-02

Family

ID=26927309

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001292780A Abandoned AU2001292780A1 (en) 2000-09-20 2001-09-19 A non-intrusive method and apparatus for characterizing particles based on scattering of elliptically polarized radiation

Country Status (3)

Country Link
US (1) US6721051B2 (en)
AU (1) AU2001292780A1 (en)
WO (1) WO2002025247A2 (en)

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WO2004049005A2 (en) * 2002-11-26 2004-06-10 The Trustees Of Columbia University In The City Of New York Systems and methods for modeling the impact of a medium on the appearances of encompassed light sources
WO2005008195A2 (en) * 2003-07-16 2005-01-27 Mcgill University Quantification of optical properties in scattering media using fractal analysis of photon distribution measurements
US7274456B2 (en) 2004-05-12 2007-09-25 Pioneer Hi-Bred International, Inc. Non-destructive single seed or several seeds NIR analyzer and method
US7274457B2 (en) 2004-05-12 2007-09-25 Pioneer Hi-Bred International, Inc. Non-destructive derivation of weight of single seed or several seeds
WO2005114143A1 (en) * 2004-05-12 2005-12-01 Pioneer Hi-Bred International, Inc. Non-destructive single seed or several seeds nir analyzer and method
US7630075B2 (en) * 2004-09-27 2009-12-08 Honeywell International Inc. Circular polarization illumination based analyzer system
JP3909363B2 (en) * 2005-03-28 2007-04-25 オムロン株式会社 Spectral polarization measurement method
DE102005025181A1 (en) * 2005-06-01 2006-12-07 Sick Engineering Gmbh Particle concentration measuring device and measuring method
DE102005025183A1 (en) * 2005-06-01 2006-12-07 Sick Engineering Gmbh Particle concentration measuring device and adjustment method therefor
WO2007120181A2 (en) * 2005-10-03 2007-10-25 Henry M. Jackson Foundation For The Advancement Of Military Medicine, Inc. Process and apparatus for measurements of mueller matrix parameters of polarized light scattering
US20100103417A1 (en) * 2006-03-20 2010-04-29 Yukitoshi Otani Optical Characteristic Measuring Apparatus, Optical Characteristic Measuring Method, and Optical Characteristic Measuring Unit
US7495763B2 (en) * 2006-03-23 2009-02-24 Hach Company Dual function measurement system
JP5086958B2 (en) * 2008-09-26 2012-11-28 株式会社堀場製作所 Particle property measuring device
CN102159934A (en) * 2008-09-26 2011-08-17 株式会社堀场制作所 Particle property measurement device
JP5514490B2 (en) * 2008-09-26 2014-06-04 株式会社堀場製作所 Particle property measuring device
JP4944859B2 (en) * 2008-09-26 2012-06-06 株式会社堀場製作所 Particle property measuring device
JP5002564B2 (en) * 2008-09-26 2012-08-15 株式会社堀場製作所 Particle property measuring device
IT1394971B1 (en) * 2009-07-31 2012-08-07 Gen Impianti S R L METHOD AND EQUIPMENT TO DETERMINE DIMENSIONS AND COMPOSITION OF A PARTICULATE IN A SMOKE FLOW
KR20140128741A (en) * 2013-04-29 2014-11-06 삼성디스플레이 주식회사 Apparatus for detecting crystallizing stain
DE102013217157A1 (en) * 2013-08-28 2015-03-05 Siemens Healthcare Diagnostics Products Gmbh Analysis method for the determination of types and concentrations of biological particles
WO2015106118A1 (en) 2014-01-09 2015-07-16 Sonitec Llc Systems and methods using ultrasound for treatment
US9823183B2 (en) * 2015-09-15 2017-11-21 Ut-Battelle, Llc Extending the range of turbidity measurement using polarimetry
CN107271336B (en) * 2017-06-13 2019-07-09 南京航空航天大学 The inversion method of spheric granules fractal aggregation characteristic parameter based on continuous laser multi-angle scatterometry
CN107300514B (en) * 2017-06-13 2019-07-09 南京航空航天大学 Utilize the method for index with single-frequency modulation laser irradiation technology measurement spheric granules fractal aggregation characteristic parameter
GB201820796D0 (en) * 2018-12-20 2019-02-06 Dublin Institute Of Tech Imaging of biological tissue
FR3100333B1 (en) * 2019-09-03 2021-09-17 Cordouan Tech Sas Device and method for determining characteristic parameters of the dimensions of nanoparticles
EP4290214A4 (en) * 2021-02-02 2024-08-14 FUJIFILM Corporation DYNAMIC LIGHT SCATTERING MEASURING METHOD AND DYNAMIC LIGHT SCATTERING MEASURING DEVICE

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Also Published As

Publication number Publication date
WO2002025247A3 (en) 2002-08-01
US20020057433A1 (en) 2002-05-16
WO2002025247A2 (en) 2002-03-28
US6721051B2 (en) 2004-04-13

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