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AU2001268283A1 - Optical inspection system - Google Patents

Optical inspection system

Info

Publication number
AU2001268283A1
AU2001268283A1 AU2001268283A AU6828301A AU2001268283A1 AU 2001268283 A1 AU2001268283 A1 AU 2001268283A1 AU 2001268283 A AU2001268283 A AU 2001268283A AU 6828301 A AU6828301 A AU 6828301A AU 2001268283 A1 AU2001268283 A1 AU 2001268283A1
Authority
AU
Australia
Prior art keywords
inspection system
optical inspection
optical
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001268283A
Inventor
Richard D. Fleming
Douglas W. Raymond
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of AU2001268283A1 publication Critical patent/AU2001268283A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N2021/95638—Inspecting patterns on the surface of objects for PCB's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N2021/95638—Inspecting patterns on the surface of objects for PCB's
    • G01N2021/95646—Soldering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N2021/95638—Inspecting patterns on the surface of objects for PCB's
    • G01N2021/95661—Inspecting patterns on the surface of objects for PCB's for leads, e.g. position, curvature
    • G01N2021/95669—Inspecting patterns on the surface of objects for PCB's for leads, e.g. position, curvature for solder coating, coverage

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
AU2001268283A 2000-06-14 2001-06-11 Optical inspection system Abandoned AU2001268283A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09593352 2000-06-14
US09/593,352 US7075565B1 (en) 2000-06-14 2000-06-14 Optical inspection system
PCT/US2001/018649 WO2001096839A1 (en) 2000-06-14 2001-06-11 Optical inspection system

Publications (1)

Publication Number Publication Date
AU2001268283A1 true AU2001268283A1 (en) 2001-12-24

Family

ID=24374382

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001268283A Abandoned AU2001268283A1 (en) 2000-06-14 2001-06-11 Optical inspection system

Country Status (5)

Country Link
US (1) US7075565B1 (en)
CN (1) CN1199041C (en)
AU (1) AU2001268283A1 (en)
TW (1) TW530155B (en)
WO (1) WO2001096839A1 (en)

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JP3953988B2 (en) * 2003-07-29 2007-08-08 Ｔｄｋ株式会社 Inspection apparatus and inspection method
JP4220883B2 (en) * 2003-11-05 2009-02-04 本田技研工業株式会社 Frame grabber
KR20060097250A (en) * 2005-03-04 2006-09-14 아주하이텍(주) Automated Optical Inspection System and Method
KR101155816B1 (en) * 2005-06-17 2012-06-12 오므론 가부시키가이샤 Image processing device and image processing method for performing three dimensional measurements
US20080013823A1 (en) * 2006-06-30 2008-01-17 Behnke Merlin E Overhead traveling camera inspection system
DE102007060355A1 (en) * 2007-12-12 2009-06-25 Vistec Semiconductor Systems Gmbh Method and device for processing the image data of the surface of a wafer recorded by at least one camera
IL188825A0 (en) * 2008-01-16 2008-11-03 Orbotech Ltd Inspection of a substrate using multiple cameras
WO2009094489A1 (en) * 2008-01-23 2009-07-30 Cyberoptics Corporation High speed optical inspection system with multiple illumination imagery
US20110175997A1 (en) * 2008-01-23 2011-07-21 Cyberoptics Corporation High speed optical inspection system with multiple illumination imagery
US8894259B2 (en) * 2009-09-22 2014-11-25 Cyberoptics Corporation Dark field illuminator with large working area
US8670031B2 (en) * 2009-09-22 2014-03-11 Cyberoptics Corporation High speed optical inspection system with camera array and compact, integrated illuminator
US8681211B2 (en) * 2009-09-22 2014-03-25 Cyberoptics Corporation High speed optical inspection system with adaptive focusing
US8388204B2 (en) * 2009-09-22 2013-03-05 Cyberoptics Corporation High speed, high resolution, three dimensional solar cell inspection system
US8872912B2 (en) * 2009-09-22 2014-10-28 Cyberoptics Corporation High speed distributed optical sensor inspection system
FI20115241A0 (en) * 2011-03-10 2011-03-10 Mapvision Ltd Oy Machine vision system for quality control
US9417418B2 (en) 2011-09-12 2016-08-16 Commscope Technologies Llc Flexible lensed optical interconnect device for signal distribution
FI125320B (en) * 2012-01-05 2015-08-31 Helmee Imaging Oy EVENTS AND SIMILAR OPTICAL MEASUREMENT PROCEDURES
CN102788802A (en) * 2012-08-29 2012-11-21 苏州天准精密技术有限公司 A multi-camera workpiece quality detection method
AU2013323659B2 (en) 2012-09-28 2017-06-29 Commscope Asia Holdings B.V. Fiber optic cassette
US9223094B2 (en) 2012-10-05 2015-12-29 Tyco Electronics Nederland Bv Flexible optical circuit, cassettes, and methods
US9123172B2 (en) 2013-05-20 2015-09-01 Steven Sebring Systems and methods for producing visual representations of objects
CN104422694A (en) * 2013-09-11 2015-03-18 法国圣戈班玻璃公司 Processing device and processing method of measured data as well as optical measurement system
JP5866673B2 (en) * 2014-01-22 2016-02-17 トヨタ自動車株式会社 Image inspection apparatus and image inspection method for welds
KR101705086B1 (en) * 2014-03-06 2017-02-13 주식회사 미르기술 Apparatus for Controlling of Video signal in Vision inspection Device
US9927367B2 (en) * 2014-05-05 2018-03-27 Arconic Inc. Apparatus and methods for weld measurement
CN104483325B (en) * 2014-12-19 2017-12-15 华核（天津）新技术开发有限公司 On-line measuring device and detection method based on multimodal registration
CN104483324B (en) * 2014-12-19 2017-10-20 核工业理化工程研究院华核新技术开发公司 On-line measuring device based on multimodal registration
CN104469118B (en) * 2014-12-26 2018-04-27 大族激光科技产业集团股份有限公司 A kind of vision enhancement system of camera array
CN104568985A (en) * 2014-12-30 2015-04-29 东莞市合易自动化科技有限公司 A kind of AOI optical detection equipment
USD798936S1 (en) 2015-12-03 2017-10-03 Durst Sebring Revolution, Llc Photo booth
USD781948S1 (en) 2015-12-03 2017-03-21 Durst Sebring Revolution, Llc Photographic imaging system
USD782559S1 (en) 2015-12-03 2017-03-28 Durst Sebring Revolution, Llc Photo booth
USD812671S1 (en) 2015-12-03 2018-03-13 Durst Sebring Revolution, Llc 3D imaging system
US11132787B2 (en) * 2018-07-09 2021-09-28 Instrumental, Inc. Method for monitoring manufacture of assembly units
USD822746S1 (en) 2016-02-05 2018-07-10 Durst Sebring Revolution, Llc Photo booth
EP3692404A4 (en) 2017-10-02 2021-06-16 Commscope Technologies LLC OPTICAL CIRCUIT AND PREPARATION PROCESS
JP7088874B2 (en) * 2019-04-09 2022-06-21 株式会社日立製作所 Electronic component visual inspection system
CN113064019B (en) * 2019-12-31 2024-07-19 技嘉科技股份有限公司 Function expansion card test platform
RU2727527C1 (en) * 2020-03-10 2020-07-22 Вячеслав Михайлович Смелков Television system for monitoring movement of hot-rolled
WO2021202700A1 (en) 2020-03-31 2021-10-07 Commscope Technologies Llc Fiber optic cable management systems and methods
CN112964723B (en) * 2021-02-01 2023-11-03 苏州百迈半导体技术有限公司 Visual detection method and system for double-sided multi-target equidistant array
US12254383B2 (en) * 2021-03-30 2025-03-18 Accenture Global Solutions Limited Intelligent real-time defect prediction, detection, and AI driven automated correction solution
DE102021110149A1 (en) * 2021-04-21 2022-10-27 Genesys Elektronik Gmbh Testing device for checking component surfaces and method therefor
DE102023105796B4 (en) 2023-03-08 2025-01-02 Göpel electronic GmbH Device and method for solder gap measurement on components on printed circuit boards to be automatically optically inspected

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4896211A (en) * 1988-04-26 1990-01-23 Picker International, Inc. Asynchronously triggered single field transfer video camera
US5060065A (en) 1990-02-23 1991-10-22 Cimflex Teknowledge Corporation Apparatus and method for illuminating a printed circuit board for inspection
US5245421A (en) * 1990-09-19 1993-09-14 Control Automation, Incorporated Apparatus for inspecting printed circuit boards with surface mounted components
US5260779A (en) * 1992-02-21 1993-11-09 Control Automation, Inc. Method and apparatus for inspecting a printed circuit board
US5517234A (en) 1993-10-26 1996-05-14 Gerber Systems Corporation Automatic optical inspection system having a weighted transition database
US5550583A (en) 1994-10-03 1996-08-27 Lucent Technologies Inc. Inspection apparatus and method
BE1009814A5 (en) * 1995-11-06 1997-08-05 Framatome Connectors Belgium Method and device for the installation of electronic components in a plate with printed circuits.
US5974480A (en) * 1996-10-18 1999-10-26 Samsung Electronics Co., Ltd. DMA controller which receives size data for each DMA channel
US6064759A (en) * 1996-11-08 2000-05-16 Buckley; B. Shawn Computer aided inspection machine
KR100572945B1 (en) * 1998-02-04 2006-04-24 텍사스 인스트루먼츠 인코포레이티드 Digital signal processor with hardware coprocessor that can be efficiently connected
US6260081B1 (en) * 1998-11-24 2001-07-10 Advanced Micro Devices, Inc. Direct memory access engine for supporting multiple virtual direct memory access channels

Also Published As

Publication number Publication date
CN1436301A (en) 2003-08-13
WO2001096839A1 (en) 2001-12-20
TW530155B (en) 2003-05-01
CN1199041C (en) 2005-04-27
US7075565B1 (en) 2006-07-11

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