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AU2001266240A1 - System initialization of microcode-based memory built-in self-test - Google Patents

System initialization of microcode-based memory built-in self-test

Info

Publication number
AU2001266240A1
AU2001266240A1 AU2001266240A AU6624001A AU2001266240A1 AU 2001266240 A1 AU2001266240 A1 AU 2001266240A1 AU 2001266240 A AU2001266240 A AU 2001266240A AU 6624001 A AU6624001 A AU 6624001A AU 2001266240 A1 AU2001266240 A1 AU 2001266240A1
Authority
AU
Australia
Prior art keywords
test
self
memory built
bist
microcode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001266240A
Inventor
Thomas Eckenrode
Steven Gregor
Kamran Zarrineh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of AU2001266240A1 publication Critical patent/AU2001266240A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/14—Implementation of control logic, e.g. test mode decoders
    • G11C29/16—Implementation of control logic, e.g. test mode decoders using microprogrammed units, e.g. state machines
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C2029/0401—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals in embedded memories

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)

Abstract

The functionality of a programmable memory built-in self-test (BIST) arrangement for testing an embedded memory structure of an integrated circuit is extended to system level testing to ascertain operability of the system after the integrated circuits and boards including them have been placed in service in larger systems, by generating default test signals which are loaded in an instruction store module when test instructions are not provided from an external tester. This additional utility of the BIST arrangement, increases efficiency of chip space utilization and improves the system level test. Loading of test instructions from an external tester during chip manufacture and/or board assembly is unaffected.
AU2001266240A 2000-07-26 2001-07-05 System initialization of microcode-based memory built-in self-test Abandoned AU2001266240A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/625,996 US6874111B1 (en) 2000-07-26 2000-07-26 System initialization of microcode-based memory built-in self-test
US09625996 2000-07-26
PCT/GB2001/002984 WO2002008904A2 (en) 2000-07-26 2001-07-05 System initialization of microcode-based memory built-in self-test

Publications (1)

Publication Number Publication Date
AU2001266240A1 true AU2001266240A1 (en) 2002-02-05

Family

ID=24508516

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001266240A Abandoned AU2001266240A1 (en) 2000-07-26 2001-07-05 System initialization of microcode-based memory built-in self-test

Country Status (9)

Country Link
US (1) US6874111B1 (en)
EP (1) EP1303815B1 (en)
JP (1) JP3823087B2 (en)
KR (1) KR100536393B1 (en)
AT (1) ATE260484T1 (en)
AU (1) AU2001266240A1 (en)
DE (1) DE60102164T2 (en)
TW (1) TWI226644B (en)
WO (1) WO2002008904A2 (en)

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EP1343174B1 (en) * 2002-03-04 2011-05-04 Synopsys, Inc. Programmable test for memories
US7096393B2 (en) * 2002-12-20 2006-08-22 Sun Microsystems, Inc. Built-in self-test (BIST) of memory interconnect
US7062694B2 (en) * 2003-02-07 2006-06-13 Sun Microsystems, Inc. Concurrently programmable dynamic memory built-in self-test (BIST)
US7392442B2 (en) 2003-03-20 2008-06-24 Qualcomm Incorporated Built-in self-test (BIST) architecture having distributed interpretation and generalized command protocol
US7184915B2 (en) * 2003-03-20 2007-02-27 Qualcomm, Incorporated Tiered built-in self-test (BIST) architecture for testing distributed memory modules
DE10334801B3 (en) * 2003-07-30 2005-01-27 Infineon Technologies Ag Semiconductor circuit for exchanging external data, addresses and/or commands during normal operation has a test interface for a test operation with a built-in self-test
US20050149786A1 (en) * 2003-12-19 2005-07-07 Hassan Mohamed A. Apparatus and method for determining threshold voltages in a flash memory unit
US20050149785A1 (en) * 2003-12-19 2005-07-07 Hassan Mohamed A. Apparatus and method for testing a flash memory unit using stress voltages
US20050138497A1 (en) * 2003-12-19 2005-06-23 Hassan Mohamed A. Apparatus and method for testing a flash memory unit
US7533309B2 (en) 2004-02-26 2009-05-12 Nilanjan Mukherjee Testing memories using algorithm selection
EP1825479A4 (en) * 2004-11-18 2008-04-16 Mentor Graphics Corp Programmable memory built-in-self-test (mbist) method and apparatus
FR2879337A1 (en) * 2004-12-15 2006-06-16 St Microelectronics Sa Memory circuit e.g. dynamic RAM or static RAM, for use in industrial application, has data buses that respectively serves to read and write memory modules, and address buses connected to inputs of multiplexers
US7716542B2 (en) * 2007-11-13 2010-05-11 Faraday Technology Corp. Programmable memory built-in self-test circuit and clock switching circuit thereof
US8570077B2 (en) * 2010-12-17 2013-10-29 Qualcomm Incorporated Methods and implementation of low-power power-on control circuits
CN102736013B (en) * 2011-04-12 2015-08-05 安凯(广州)微电子技术有限公司 A kind of idle condition method of testing of SoC chip, system and proving installation
US8677196B1 (en) 2011-06-20 2014-03-18 Cadence Design Systems, Inc. Low cost production testing for memory
JP6072437B2 (en) 2012-06-06 2017-02-01 ルネサスエレクトロニクス株式会社 Semiconductor integrated circuit and design method thereof
US9310426B2 (en) 2012-09-25 2016-04-12 Globalfoundries Inc. On-going reliability monitoring of integrated circuit chips in the field
US9009550B2 (en) * 2012-12-10 2015-04-14 Texas Instruments Incorporated pBIST engine with distributed data logging
US20140258780A1 (en) * 2013-03-05 2014-09-11 Micron Technology, Inc. Memory controllers including test mode engines and methods for repair of memory over busses used during normal operation of the memory
WO2015010164A1 (en) 2013-07-22 2015-01-29 National Ict Australia Limited Enhancing vision for a vision impaired user
CN103454575B (en) * 2013-09-06 2016-03-09 福州瑞芯微电子股份有限公司 For realizing system, PCBA board and method that PCBA board is tested
US10146607B2 (en) * 2013-11-26 2018-12-04 Anunta Technology Management Services Ltd. Troubleshooting of cloud-based application delivery
CN103744824B (en) * 2013-12-18 2016-09-07 乐视致新电子科技（天津）有限公司 One is dispatched from the factory method of testing and test system
US9946620B2 (en) 2015-02-03 2018-04-17 Invecas, Inc. Memory built-in self test system
US10509074B2 (en) 2018-02-22 2019-12-17 Taiwan Semiconductor Manufacturing Company, Ltd. Electrical testing apparatus for spintronics devices
US11079434B2 (en) 2018-10-10 2021-08-03 Nvidia Corporation Test systems for executing self-testing in deployed automotive platforms
US11373726B2 (en) 2019-04-03 2022-06-28 Texas Instruments Incorporated Management of multiple memory in-field self-repair options

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US5155819A (en) 1987-11-03 1992-10-13 Lsi Logic Corporation Flexible ASIC microcomputer permitting the modular modification of dedicated functions and macroinstructions
US5633812A (en) * 1992-09-29 1997-05-27 International Business Machines Corporation Fault simulation of testing for board circuit failures
US5617531A (en) * 1993-11-02 1997-04-01 Motorola, Inc. Data Processor having a built-in internal self test controller for testing a plurality of memories internal to the data processor
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US6070252A (en) * 1994-09-30 2000-05-30 Intel Corporation Method and apparatus for interactive built-in-self-testing with user-programmable test patterns
US5615335A (en) * 1994-11-10 1997-03-25 Emc Corporation Storage system self-test apparatus and method
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US5802071A (en) * 1995-11-17 1998-09-01 Fang; I Liang Micro-controller with a built-in test circuit and method for testing the same
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US5745500A (en) 1996-10-22 1998-04-28 The United States Of America As Represented By The Secretary Of The Army Built-in self testing for the identification of faulty integrated circuit chips in a multichip module
US5937154A (en) * 1997-03-05 1999-08-10 Hewlett-Packard Company Manufacturing functional testing of computing devices using microprogram based functional tests applied via the devices own emulation debug port
US6108798A (en) * 1997-07-02 2000-08-22 International Business Machines Corporation Self programmed built in self test
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US6012157A (en) * 1997-12-03 2000-01-04 Lsi Logic Corporation System for verifying the effectiveness of a RAM BIST controller's ability to detect faults in a RAM memory using states indicating by fault severity information
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Also Published As

Publication number Publication date
ATE260484T1 (en) 2004-03-15
WO2002008904A3 (en) 2002-05-02
WO2002008904A2 (en) 2002-01-31
DE60102164D1 (en) 2004-04-01
US6874111B1 (en) 2005-03-29
KR20030019589A (en) 2003-03-06
KR100536393B1 (en) 2005-12-12
DE60102164T2 (en) 2004-09-30
EP1303815A2 (en) 2003-04-23
JP3823087B2 (en) 2006-09-20
EP1303815B1 (en) 2004-02-25
TWI226644B (en) 2005-01-11
JP2004505395A (en) 2004-02-19

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