AU2000270415A1 - Polishing apparatus comprising pad and polishing method using the same - Google Patents
Polishing apparatus comprising pad and polishing method using the sameInfo
- Publication number
- AU2000270415A1 AU2000270415A1 AU2000270415A AU7041500A AU2000270415A1 AU 2000270415 A1 AU2000270415 A1 AU 2000270415A1 AU 2000270415 A AU2000270415 A AU 2000270415A AU 7041500 A AU7041500 A AU 7041500A AU 2000270415 A1 AU2000270415 A1 AU 2000270415A1
- Authority
- AU
- Australia
- Prior art keywords
- polishing
- pad
- same
- polishing apparatus
- polishing method
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- H10P52/403—
-
- H10P50/00—
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/14—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the temperature during grinding
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR0048870 | 2000-08-23 | ||
| KR10-2000-0048870A KR100470137B1 (en) | 2000-08-23 | 2000-08-23 | Polishing apparatus comprising frozen pad and method for polishing using the same |
| PCT/KR2000/001030 WO2002017411A1 (en) | 2000-08-23 | 2000-09-09 | Polishing apparatus comprising pad and polishing method using the same |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| AU2000270415A1 true AU2000270415A1 (en) | 2002-03-04 |
Family
ID=19684638
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU2000270415A Abandoned AU2000270415A1 (en) | 2000-08-23 | 2000-09-09 | Polishing apparatus comprising pad and polishing method using the same |
Country Status (3)
| Country | Link |
|---|---|
| KR (1) | KR100470137B1 (en) |
| AU (1) | AU2000270415A1 (en) |
| WO (1) | WO2002017411A1 (en) |
Families Citing this family (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20030050105A (en) * | 2001-12-18 | 2003-06-25 | 삼성전자주식회사 | Chemical mechanical polishing apparatus |
| JP2003332274A (en) | 2002-05-17 | 2003-11-21 | Tokyo Seimitsu Co Ltd | Chemical mechanical polishing method and chemical mechanical polishing apparatus |
| KR20030095589A (en) * | 2002-06-12 | 2003-12-24 | 동부전자 주식회사 | Method For Manufacturing Semiconductors |
| CN100425405C (en) * | 2006-08-03 | 2008-10-15 | 南京航空航天大学 | Freezing nanometer abrasive polishing pad and its prepn. method |
| CN101774160B (en) * | 2010-03-01 | 2011-05-11 | 南京航空航天大学 | Grainofice-type concretion abrasive polishing pad as well as rapid preparation method and device |
| KR101330827B1 (en) * | 2011-11-10 | 2013-11-18 | 한국기계연구원 | Apparatus forming frost, laser processing system including the same and laser processing method using the same |
| CN102615555B (en) * | 2012-04-16 | 2014-02-05 | 大连理工大学 | Kindle direct publishing (KDP) crystal micro-nano hygroscopic ultraprecision polishing method based on ultrasonic atomization moisture |
| CN104875116B (en) * | 2015-06-09 | 2017-09-12 | 青岛理工大学 | Nanofluid electrostatic atomization and electrocaloric heat pipe integrated trace lubrication grinding device |
| US10058975B2 (en) | 2016-02-12 | 2018-08-28 | Applied Materials, Inc. | In-situ temperature control during chemical mechanical polishing with a condensed gas |
| WO2020005749A1 (en) | 2018-06-27 | 2020-01-02 | Applied Materials, Inc. | Temperature control of chemical mechanical polishing |
| CN109037033A (en) * | 2018-07-17 | 2018-12-18 | 武汉新芯集成电路制造有限公司 | A kind of wafer thining method |
| CN110039382A (en) * | 2018-10-16 | 2019-07-23 | 天通控股股份有限公司 | A kind of thining method of large-size ultra-thin lithium tantalate wafer |
| TWI838459B (en) | 2019-02-20 | 2024-04-11 | 美商應用材料股份有限公司 | Chemical mechanical polishing apparatus and method of chemical mechanical polishing |
| US11628478B2 (en) | 2019-05-29 | 2023-04-18 | Applied Materials, Inc. | Steam cleaning of CMP components |
| TWI859239B (en) | 2019-05-29 | 2024-10-21 | 美商應用材料股份有限公司 | Apparatus and method for steam treatment stations for chemical mechanical polishing system |
| US11633833B2 (en) | 2019-05-29 | 2023-04-25 | Applied Materials, Inc. | Use of steam for pre-heating of CMP components |
| CN110190020A (en) * | 2019-07-03 | 2019-08-30 | 中国振华集团云科电子有限公司 | A kind of lithographic method and system |
| JP7295412B2 (en) * | 2019-07-09 | 2023-06-21 | 日本製鉄株式会社 | Evaluation method for metallic materials |
| TWI872101B (en) | 2019-08-13 | 2025-02-11 | 美商應用材料股份有限公司 | Apparatus and method for cmp temperature control |
| US11897079B2 (en) | 2019-08-13 | 2024-02-13 | Applied Materials, Inc. | Low-temperature metal CMP for minimizing dishing and corrosion, and improving pad asperity |
| WO2022006008A1 (en) | 2020-06-29 | 2022-01-06 | Applied Materials, Inc. | Control of steam generation for chemical mechanical polishing |
| KR20240165485A (en) | 2020-06-29 | 2024-11-22 | 어플라이드 머티어리얼스, 인코포레이티드 | Temperature and slurry flow rate control in cmp |
| US11919123B2 (en) | 2020-06-30 | 2024-03-05 | Applied Materials, Inc. | Apparatus and method for CMP temperature control |
| US11577358B2 (en) | 2020-06-30 | 2023-02-14 | Applied Materials, Inc. | Gas entrainment during jetting of fluid for temperature control in chemical mechanical polishing |
| CN112139859A (en) * | 2020-09-21 | 2020-12-29 | 大连理工大学 | Method for anhydrous polishing of KDP crystal |
| CN117448001A (en) * | 2023-11-01 | 2024-01-26 | 广东先导微电子科技有限公司 | A dislocation etching liquid for gallium arsenide polycrystal and its dislocation etching method |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4450652A (en) * | 1981-09-04 | 1984-05-29 | Monsanto Company | Temperature control for wafer polishing |
| US5127196A (en) * | 1990-03-01 | 1992-07-07 | Intel Corporation | Apparatus for planarizing a dielectric formed over a semiconductor substrate |
| JPH09123059A (en) * | 1995-11-02 | 1997-05-13 | Fujitsu Ltd | Polishing method |
| JPH11347935A (en) * | 1998-06-10 | 1999-12-21 | Ebara Corp | Polishing device |
-
2000
- 2000-08-23 KR KR10-2000-0048870A patent/KR100470137B1/en not_active Expired - Fee Related
- 2000-09-09 WO PCT/KR2000/001030 patent/WO2002017411A1/en not_active Ceased
- 2000-09-09 AU AU2000270415A patent/AU2000270415A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| KR100470137B1 (en) | 2005-02-04 |
| WO2002017411A1 (en) | 2002-02-28 |
| KR20000064128A (en) | 2000-11-06 |
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