[go: up one dir, main page]

AR059011A1 - Verificacion de atributos de desempeno de circuitos integrados empaquetados - Google Patents

Verificacion de atributos de desempeno de circuitos integrados empaquetados

Info

Publication number
AR059011A1
AR059011A1 ARP070100162A ARP070100162A AR059011A1 AR 059011 A1 AR059011 A1 AR 059011A1 AR P070100162 A ARP070100162 A AR P070100162A AR P070100162 A ARP070100162 A AR P070100162A AR 059011 A1 AR059011 A1 AR 059011A1
Authority
AR
Argentina
Prior art keywords
packaged
order
signature
performance
ics
Prior art date
Application number
ARP070100162A
Other languages
English (en)
Inventor
Russell P Cowburn
James David Ralph Buchanan
Original Assignee
Ingenia Holdings Uk Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ingenia Holdings Uk Ltd filed Critical Ingenia Holdings Uk Ltd
Publication of AR059011A1 publication Critical patent/AR059011A1/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31719—Security aspects, e.g. preventing unauthorised access during test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2896—Testing of IC packages; Test features related to IC packages
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31718—Logistic aspects, e.g. binning, selection, sorting of devices under test, tester/handler interaction networks, Test management software, e.g. software for test statistics or test evaluation, yield analysis
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/544—Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/57—Protection from inspection, reverse engineering or tampering
    • H01L23/573—Protection from inspection, reverse engineering or tampering using passive means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/544—Marks applied to semiconductor devices or parts
    • H01L2223/54406—Marks applied to semiconductor devices or parts comprising alphanumeric information
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/544—Marks applied to semiconductor devices or parts
    • H01L2223/54413—Marks applied to semiconductor devices or parts comprising digital information, e.g. bar codes, data matrix
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/544—Marks applied to semiconductor devices or parts
    • H01L2223/54473—Marks applied to semiconductor devices or parts for use after dicing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/544—Marks applied to semiconductor devices or parts
    • H01L2223/54473—Marks applied to semiconductor devices or parts for use after dicing
    • H01L2223/54486—Located on package parts, e.g. encapsulation, leads, package substrate
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Security & Cryptography (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Power Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Storage Device Security (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Supply And Installment Of Electrical Components (AREA)

Abstract

Los circuitos integrados empaquetados (ICs) de algunos tipos, como ser procesadores, se clasifican y venden de acuerdo con una escala de desempeno, como ser la velocidad de reloj especificada máxima, que establece el fabricante como resultado de una prueba. Como registro de esta clasificacion algunas partes del envase, frecuentemente la superficie superior, se marca con un atributo de desempeno especificado. Sin embargo la actividad criminal desarrollo el lugar donde el envase se reetiqueta con el fin de mostrar una especificacion superior de modo tal que los ICs pueden revenderse fraudulentamente a un precio mayor. Con el fin de tratar este problema, la presente prevé que los fabricantes mantengan una base de datos de producto para cada IC empaquetado donde se registre no solo la especificacion de desempeno, sino también una firma digital que deriva de un diseno granulado que se obtiene del envase. Posteriormente, cualquier lC empaquetado se puede reescanear con el fin de interrogar su diseno granulado y recomputar la firma. Luego, la firma se utiliza para encontrar el producto en la base de datos, a través de lo cual, se recupera el atributo de desempeno especificado originariamente. Luego, se puede detectar el fraude. Este método se puede utilizar con el fin de probar los productos que se devuelven, por ejemplo, tras un reclamo por garantía.
ARP070100162A 2006-01-16 2007-01-15 Verificacion de atributos de desempeno de circuitos integrados empaquetados AR059011A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB0600828A GB2434442A (en) 2006-01-16 2006-01-16 Verification of performance attributes of packaged integrated circuits

Publications (1)

Publication Number Publication Date
AR059011A1 true AR059011A1 (es) 2008-03-05

Family

ID=35998105

Family Applications (1)

Application Number Title Priority Date Filing Date
ARP070100162A AR059011A1 (es) 2006-01-16 2007-01-15 Verificacion de atributos de desempeno de circuitos integrados empaquetados

Country Status (5)

Country Link
US (1) US20070164729A1 (es)
AR (1) AR059011A1 (es)
GB (1) GB2434442A (es)
TW (1) TW200735318A (es)
WO (1) WO2007080375A1 (es)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8171567B1 (en) 2002-09-04 2012-05-01 Tracer Detection Technology Corp. Authentication method and system
EP2128790A3 (en) 2004-03-12 2011-01-26 Ingenia Technology Limited Authenticity verification with linearised data
ATE433164T1 (de) 2004-03-12 2009-06-15 Ingenia Technology Ltd Verfahren und vorrichtungen zur erzeugung authentifizierbarer gegenstände und ihrer nachfolgenden überprüfung
GB2417592B (en) 2004-08-13 2006-07-26 Ingenia Technology Ltd Authenticity verification of articles
JP5123181B2 (ja) 2005-07-27 2013-01-16 インジェニア・テクノロジー・（ユーケイ）・リミテッド 真正性の検証
WO2007012821A1 (en) * 2005-07-27 2007-02-01 Ingenia Technology Limited Verification of the signature of an article created from signals obtained from scatter of coherent optical radiation from the surface of the article
US7731435B2 (en) * 2005-08-12 2010-06-08 Ricoh Company, Ltd. Techniques for printing with integrated paper sheet identification
US7809156B2 (en) * 2005-08-12 2010-10-05 Ricoh Company, Ltd. Techniques for generating and using a fingerprint for an article
GB2429950B (en) * 2005-09-08 2007-08-22 Ingenia Holdings Copying
GB2448245B (en) 2005-12-23 2009-11-04 Ingenia Holdings Optical authentication
US8756673B2 (en) 2007-03-30 2014-06-17 Ricoh Company, Ltd. Techniques for sharing data
US7865124B2 (en) * 2007-03-30 2011-01-04 Ricoh Company, Ltd. Pre-scanning printer with paper fingerprinting
US8281997B2 (en) * 2008-02-19 2012-10-09 Bilcare Technologies Singapore Pte. Ltd. Reading device for identifying a tag or an object adapted to be identified, related methods and systems
GB2460625B (en) * 2008-05-14 2010-05-26 Ingenia Holdings Two tier authentication
GB2462409A (en) * 2008-07-11 2010-02-10 Ingenia Holdings Signature of moulded article
GB2462059A (en) * 2008-07-11 2010-01-27 Ingenia Holdings Authentication scanner
ES2311437B1 (es) * 2008-07-31 2009-10-14 Jose Luis Novo Rodriguez Sistema de reconocimiento de superficies de piezas ceramicas mediante vision artificial.
GB2466311B (en) 2008-12-19 2010-11-03 Ingenia Holdings Self-calibration of a matching algorithm for determining authenticity
GB2466465B (en) 2008-12-19 2011-02-16 Ingenia Holdings Authentication
GB2476226B (en) 2009-11-10 2012-03-28 Ingenia Holdings Ltd Optimisation
US8365983B2 (en) * 2009-11-20 2013-02-05 Intel Corporation Radio-frequency reconfigurations of microelectronic systems in commercial packages
JP5214656B2 (ja) * 2010-03-29 2013-06-19 株式会社東芝 評価装置および評価プログラム
US8499141B2 (en) 2010-08-02 2013-07-30 Intel Corporation Multi-socket server management with RFID
CN106226040A (zh) * 2016-08-29 2016-12-14 成都美律科技有限公司 Led元件测试系统
CN106226039A (zh) * 2016-08-29 2016-12-14 成都美律科技有限公司 一种led元件测试系统
CN106226038A (zh) * 2016-08-29 2016-12-14 成都美律科技有限公司 一种led元件测试装置
CN106441813A (zh) * 2016-08-29 2017-02-22 成都美律科技有限公司 一种led元件的测试平台
US10789550B2 (en) * 2017-04-13 2020-09-29 Battelle Memorial Institute System and method for generating test vectors
JP2019066399A (ja) * 2017-10-04 2019-04-25 三菱電機株式会社 半導体装置仕分けシステムおよび半導体装置
US11276098B2 (en) * 2017-10-25 2022-03-15 Xilinx, Inc. Database lookup using a scannable code for part selection
DE102019213774A1 (de) * 2019-09-10 2021-03-11 Robert Bosch Gmbh Verfahren zum Bereitstellen von Homologationskennzeichnungen
CN120846649B (zh) * 2025-09-22 2025-12-30 晋城市光机电产业协调服务中心(晋城市光机电产业研究院) 一种半导体激光器综合性能测试系统

Family Cites Families (99)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4599509A (en) * 1970-09-21 1986-07-08 Daniel Silverman Access security control
US3781109A (en) * 1970-12-31 1973-12-25 Coded Signatures Inc Data encoding and decoding apparatus and method
US4218674A (en) * 1975-09-09 1980-08-19 Dasy Inter S.A. Method and a system for verifying authenticity safe against forgery
US4179212A (en) * 1977-09-06 1979-12-18 Xerox Corporation Demand publishing royalty accounting system
US4423415A (en) * 1980-06-23 1983-12-27 Light Signatures, Inc. Non-counterfeitable document system
US4568936A (en) * 1980-06-23 1986-02-04 Light Signatures, Inc. Verification system for document substance and content
US4785290A (en) * 1980-06-23 1988-11-15 Light Signatures, Inc. Non-counterfeitable document system
CH653162A5 (de) * 1981-10-27 1985-12-13 Landis & Gyr Ag Einrichtung zur echtheitspruefung von dokumenten.
US4920385A (en) * 1984-02-14 1990-04-24 Diffracto Ltd. Panel surface flaw inspection
NL8502567A (nl) * 1985-09-19 1987-04-16 Bekaert Sa Nv Werkwijze en inrichting voor het op echtheid controleren van voorwerpen en voorwerp geschikt voor het toepassen van deze werkwijze.
US4817176A (en) * 1986-02-14 1989-03-28 William F. McWhortor Method and apparatus for pattern recognition
DE3788646D1 (de) * 1986-03-12 1994-02-10 Skidata Gmbh Fälschungsgesicherter datenträger und vorrichtung zur behandlung, bearbeitung und kontrolle des datenträgers.
US4738901A (en) * 1986-05-30 1988-04-19 Xerox Corporation Method and apparatus for the prevention of unauthorized copying of documents
US4748316A (en) * 1986-06-13 1988-05-31 International Business Machines Corporation Optical scanner for reading bar codes detected within a large depth of field
GB8812890D0 (en) * 1988-05-31 1988-07-06 De La Rue Co Plc Security device & methods & apparatus for verification
ATE125967T1 (de) * 1988-09-30 1995-08-15 Landis & Gry Tech Innovat Ag Strichkodefeld und strichkodeleser.
US5054066A (en) * 1988-11-16 1991-10-01 Grumman Corporation Error correcting public key cryptographic method and program
US5243405A (en) * 1991-01-07 1993-09-07 Tichenor Clyde L Optical system for surface verification
US5194918A (en) * 1991-05-14 1993-03-16 The Board Of Trustees Of The Leland Stanford Junior University Method of providing images of surfaces with a correlation microscope by transforming interference signals
DE69215760T2 (de) * 1991-06-10 1998-02-05 Eastman Kodak Co Kreuzkorrelationsausrichtsystem für einen Bildsensor
US5133601A (en) * 1991-06-12 1992-07-28 Wyko Corporation Rough surface profiler and method
JP2862030B2 (ja) * 1991-06-13 1999-02-24 三菱電機株式会社 暗号化方式
US5120126A (en) * 1991-06-14 1992-06-09 Ball Corporation System for non-contact colored label identification and inspection and method therefor
US5142578A (en) * 1991-08-22 1992-08-25 International Business Machines Corporation Hybrid public key algorithm/data encryption algorithm key distribution method based on control vectors
US5325167A (en) * 1992-05-11 1994-06-28 Canon Research Center America, Inc. Record document authentication by microscopic grain structure and method
US5307423A (en) * 1992-06-04 1994-04-26 Digicomp Research Corporation Machine recognition of handwritten character strings such as postal zip codes or dollar amount on bank checks
US5384717A (en) * 1992-11-23 1995-01-24 Ford Motor Company Non-contact method of obtaining dimensional information about an object
US5546462A (en) * 1993-04-09 1996-08-13 Washington University Method and apparatus for fingerprinting and authenticating various magnetic media
US5521984A (en) * 1993-06-10 1996-05-28 Verification Technologies, Inc. System for registration, identification and verification of items utilizing unique intrinsic features
US5451759A (en) * 1993-06-24 1995-09-19 Nhk Spring Co., Ltd. Using high-permeability magnetic elements randomly scattered in the objects
DE69417319T2 (de) * 1993-08-30 1999-07-15 Hewlett-Packard Co., Palo Alto, Calif. Bildabtastkopf für einen thermischen Tintenstrahldrucker
US5485312A (en) * 1993-09-14 1996-01-16 The United States Of America As Represented By The Secretary Of The Air Force Optical pattern recognition system and method for verifying the authenticity of a person, product or thing
US5647010A (en) * 1993-09-14 1997-07-08 Ricoh Company, Ltd. Image forming apparatus with security feature which prevents copying of specific types of documents
US6882738B2 (en) * 1994-03-17 2005-04-19 Digimarc Corporation Methods and tangible objects employing textured machine readable data
GB2288476A (en) * 1994-04-05 1995-10-18 Ibm Authentication of printed documents.
US5510199A (en) * 1994-06-06 1996-04-23 Clarke American Checks, Inc. Photocopy resistant document and method of making same
JPH0837598A (ja) * 1994-07-22 1996-02-06 Minolta Co Ltd 画像形成装置
GB9524319D0 (en) * 1995-11-23 1996-01-31 Kodak Ltd Improvements in or relating to the recording of images
US6363164B1 (en) * 1996-05-13 2002-03-26 Cummins-Allison Corp. Automated document processing system using full image scanning
US5886798A (en) * 1995-08-21 1999-03-23 Landis & Gyr Technology Innovation Ag Information carriers with diffraction structures
US5637854A (en) * 1995-09-22 1997-06-10 Microscan Systems Incorporated Optical bar code scanner having object detection
US6950094B2 (en) * 1998-03-30 2005-09-27 Agilent Technologies, Inc Seeing eye mouse for a computer system
CA2242596C (en) * 1996-01-11 2012-06-19 Mrj, Inc. System for controlling access and distribution of digital property
US5790025A (en) * 1996-08-01 1998-08-04 International Business Machines Corporation Tamper detection using bulk multiple scattering
US6029150A (en) * 1996-10-04 2000-02-22 Certco, Llc Payment and transactions in electronic commerce system
US5784463A (en) * 1996-12-04 1998-07-21 V-One Corporation Token distribution, registration, and dynamic configuration of user entitlement for an application level security system and method
US5903721A (en) * 1997-03-13 1999-05-11 cha|Technologies Services, Inc. Method and system for secure online transaction processing
JPH10285378A (ja) * 1997-03-28 1998-10-23 Internatl Business Mach Corp <Ibm> 複写装置及びその制御方法
CH693693A5 (de) * 1997-06-06 2003-12-15 Ovd Kinegram Ag Vorrichtung zum Erkennen beugungsoptischer Markierungen.
GB2326003B (en) * 1997-06-07 2001-02-28 Aquasol Ltd Coding systems
WO1999023601A1 (en) * 1997-10-31 1999-05-14 Cummins-Allison Corp. Currency evaluation and recording system
US6060169A (en) * 1997-11-24 2000-05-09 International Business Machines Corporation Coating Material and method for providing asset protection
US6223166B1 (en) * 1997-11-26 2001-04-24 International Business Machines Corporation Cryptographic encoded ticket issuing and collection system for remote purchasers
US6182892B1 (en) * 1998-03-25 2001-02-06 Compaq Computer Corporation Smart card with fingerprint image pass-through
US6141119A (en) * 1998-04-20 2000-10-31 Umax Data Systems Inc. Imaging cartridge for a computer system
JP3927326B2 (ja) * 1998-09-11 2007-06-06 中央電子株式会社 レーザ反射光のスペックルパターンを利用した人又は物品のロット管理方法
AU1624800A (en) * 1998-11-19 2000-06-13 Digimarc Corporation Printing and validation of self validating security documents
US6760472B1 (en) * 1998-12-14 2004-07-06 Hitachi, Ltd. Identification method for an article using crystal defects
US7111321B1 (en) * 1999-01-25 2006-09-19 Dell Products L.P. Portable computer system with hierarchical and token-based security policies
US6584214B1 (en) * 1999-04-23 2003-06-24 Massachusetts Institute Of Technology Identification and verification using complex, three-dimensional structural features
US7143949B1 (en) * 2000-04-05 2006-12-05 Digimarc Corporation Internet-linking scanner
US6332663B1 (en) * 1999-06-16 2001-12-25 Xerox Corporation Methods and apparatus for marking images and obtaining image data using a single marking engine platform
AU6503800A (en) * 1999-07-30 2001-02-19 Pixlogic Llc Perceptual similarity image retrieval
DE19940217C5 (de) * 1999-08-25 2006-08-10 Zwick Gmbh & Co Verfahren zur berührungslosen Messung der Veränderung der räumlichen Gestalt einer Meßprobe, insbesondere zur Messung der Längenänderung der einer äußeren Kraft unterliegenden Meßprobe und Vorrichtung zur Durchführung des Verfahrens
US6621916B1 (en) * 1999-09-02 2003-09-16 West Virginia University Method and apparatus for determining document authenticity
US7605940B2 (en) * 1999-09-17 2009-10-20 Silverbrook Research Pty Ltd Sensing device for coded data
AU2087200A (en) * 1999-12-08 2001-06-18 Valentin Alexandrovich Mischenko Method and system for authentication of articles
US6473165B1 (en) * 2000-01-21 2002-10-29 Flex Products, Inc. Automated verification systems and methods for use with optical interference devices
US7346184B1 (en) * 2000-05-02 2008-03-18 Digimarc Corporation Processing methods combining multiple frames of image data
LU90580B1 (fr) * 2000-05-08 2001-11-09 Europ Economic Community M-thode d'identification d'un objet
US7152047B1 (en) * 2000-05-24 2006-12-19 Esecure.Biz, Inc. System and method for production and authentication of original documents
JP2001357377A (ja) * 2000-06-15 2001-12-26 Hitachi Ltd シート状媒体，真贋判定方法，真贋判定装置及び証明書発行機
US7164810B2 (en) * 2001-11-21 2007-01-16 Metrologic Instruments, Inc. Planar light illumination and linear imaging (PLILIM) device with image-based velocity detection and aspect ratio compensation
US7602904B2 (en) * 2000-11-27 2009-10-13 Rsa Security, Inc. Order invariant fuzzy commitment system
GB0031016D0 (en) * 2000-12-20 2001-01-31 Alphafox Systems Ltd Security systems
US6961449B2 (en) * 2001-01-16 2005-11-01 University Of Massachusetts Lowell Method of correlation of images in biometric applications
US6779720B2 (en) * 2001-01-19 2004-08-24 Hewlett-Packard Development Company, L.P. Method and apparatus for generating a ticket including an image of a person
US6850147B2 (en) * 2001-04-02 2005-02-01 Mikos, Ltd. Personal biometric key
US6973196B2 (en) * 2001-08-15 2005-12-06 Eastman Kodak Company Authentic document and method of making
US7222361B2 (en) * 2001-11-15 2007-05-22 Hewlett-Packard Development Company, L.P. Computer security with local and remote authentication
JP4664572B2 (ja) * 2001-11-27 2011-04-06 富士通株式会社 文書配布方法および文書管理方法
US6977791B2 (en) * 2002-03-23 2005-12-20 Kla-Tencor Technologies Corporation Media servowriting system
US7251347B2 (en) * 2002-04-09 2007-07-31 The Escher Group, Ltd. System and method for authentication of a workpiece using three dimensional shape recovery
US7200868B2 (en) * 2002-09-12 2007-04-03 Scientific-Atlanta, Inc. Apparatus for encryption key management
US7170391B2 (en) * 2002-11-23 2007-01-30 Kathleen Lane Birth and other legal documents having an RFID device and method of use for certification and authentication
FR2849245B1 (fr) * 2002-12-20 2006-02-24 Thales Sa Procede d'authentification et d'identification optique d'objets et dispositif de mise en oeuvre
JP2004220424A (ja) * 2003-01-16 2004-08-05 Canon Inc 文書管理システム
EP2436307B1 (en) * 2003-03-31 2015-10-21 The General Hospital Corporation Speckle reduction in optical coherence tomography by path length encoded angular compounding
US7221445B2 (en) * 2003-04-11 2007-05-22 Metrolaser, Inc. Methods and apparatus for detecting and quantifying surface characteristics and material conditions using light scattering
EP1618538A1 (en) * 2003-04-30 2006-01-25 E.I. Dupont De Nemours And Company Method for tracking and tracing marked articles
US7002675B2 (en) * 2003-07-10 2006-02-21 Synetics Solutions, Inc. Method and apparatus for locating/sizing contaminants on a polished planar surface of a dielectric or semiconductor material
US6955141B2 (en) * 2003-08-06 2005-10-18 General Motors Corporation Engine cooling system
US7389530B2 (en) * 2003-09-12 2008-06-17 International Business Machines Corporation Portable electronic door opener device and method for secure door opening
FR2860670B1 (fr) * 2003-10-02 2006-01-06 Novatec Procede de securisation de transaction a partir de cartes presentant des identificateurs uniques et inreproductibles
US7071481B2 (en) * 2003-10-09 2006-07-04 Igor V. Fetisov Automated reagentless system of product fingerprint authentication and trademark protection
US7497379B2 (en) * 2004-02-27 2009-03-03 Microsoft Corporation Counterfeit and tamper resistant labels with randomly occurring features
EP2128790A3 (en) * 2004-03-12 2011-01-26 Ingenia Technology Limited Authenticity verification with linearised data
US7577844B2 (en) * 2004-03-17 2009-08-18 Microsoft Corporation Systems and methods for encoding randomly distributed features in an object
US7321430B2 (en) * 2004-04-22 2008-01-22 Zygo Corporation Vibration resistant interferometry

Also Published As

Publication number Publication date
GB2434442A (en) 2007-07-25
TW200735318A (en) 2007-09-16
WO2007080375A1 (en) 2007-07-19
US20070164729A1 (en) 2007-07-19
GB0600828D0 (en) 2006-02-22

Similar Documents

Publication Publication Date Title
AR059011A1 (es) Verificacion de atributos de desempeno de circuitos integrados empaquetados
Guin et al. Low-cost on-chip structures for combating die and IC recycling
KR102718637B1 (ko) 시스템 패키징 기술을 기반으로 한 공정 설계 방법, 시스템, 매체 및 장치
US8707245B2 (en) Semiconductor device design method, system and computer-readable medium
CN103500405A (zh) 用于对目标终端标称型号进行鉴别的方法及其设备
CN109583910B (zh) 一种商品授权鉴定方法、装置及设备
TWI644384B (zh) 雷射雕刻設備
CN110263485B (zh) 一种芯片封装图的自动绘制系统以及计算机系统
TW200625586A (en) Semiconductor package, ID generating system thereof, ID recognizing system thereof, ID recognition method thereof, semiconductor integrated circuit chip, ID generating system thereof, ID recognizing system thereof, and ID recognition method thereof
CN109765476A (zh) 集成电路芯片防伪检测方法
CN109102324B (zh) 模型训练方法、基于模型的红包物料铺设预测方法及装置
Jeong Analyzing South Korea's Semiconductor Industry: Trade Dynamics and Global Position
US20140253222A1 (en) Preventing electronic device counterfeits
US20160049340A1 (en) Stress sensor for a semiconductor device
US9196549B2 (en) Method for generating die identification by measuring whether circuit is established in a package structure
CN203071048U (zh) 芯片测试机
KR20140042326A (ko) Ｐｃｂ 전기검사 시스템 및 그 방법
CN205081113U (zh) 集成电路芯片和系统封装
CN105633058B (zh) 器件标识结构及其制造方法
CN108363567A (zh) 一种基于数据库的验证平台激励器自动化生成方法
CN203069739U (zh) 芯片测试机
Han et al. Thermal modeling and analysis for a novel packaging structure of CMOS image sensor
JP2011216084A (ja) 半導体集積回路のレイアウト設計装置、レイアウト設計方法及びレイアウト設計プログラム並びに半導体集積回路装置の製造方法
CN113536022A (zh) 侵权图像的识别方法、装置、计算设备及计算机存储介质
JP2007094506A (ja) 回路検証システムと方法、及びプログラム

Legal Events

Date Code Title Description
FA Abandonment or withdrawal