Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N21/84—Systems specially adapted for particular applications
  • G01N21/88—Investigating the presence of flaws or contamination
• • B—PERFORMING OPERATIONS; TRANSPORTING
  • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
  • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
  • B23K9/00—Arc welding or cutting
  • B23K9/12—Automatic feeding or moving of electrodes or work for spot or seam welding or cutting
  • B23K9/127—Means for tracking lines during arc welding or cutting
• • B—PERFORMING OPERATIONS; TRANSPORTING
  • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
  • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
  • B23K31/00—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups
  • B23K31/12—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups relating to investigating the properties, e.g. the weldability, of materials
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N21/84—Systems specially adapted for particular applications
  • G01N21/88—Investigating the presence of flaws or contamination
  • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
  • G01N21/956—Inspecting patterns on the surface of objects
  • G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements

Landscapes

• Physics & Mathematics (AREA)
• Engineering & Computer Science (AREA)
• Biochemistry (AREA)
• General Health & Medical Sciences (AREA)
• Health & Medical Sciences (AREA)
• Life Sciences & Earth Sciences (AREA)
• Chemical & Material Sciences (AREA)
• Analytical Chemistry (AREA)
• Pathology (AREA)
• Mechanical Engineering (AREA)
• General Physics & Mathematics (AREA)
• Immunology (AREA)
• Plasma & Fusion (AREA)
• Length Measuring Devices By Optical Means (AREA)
• Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
• Electric Connection Of Electric Components To Printed Circuits (AREA)

Applications Claiming Priority (2)

Publications (2)

Family

ID=7754544

Family Applications (1)

Country Status (11)

Families Citing this family (7)

Family Cites Families (5)

• 1995
  • 1995-02-21 DE DE19505832A patent/DE19505832C2/de not_active Expired - Fee Related
• 1996
  • 1996-01-25 DE DE59600711T patent/DE59600711D1/de not_active Expired - Fee Related
  • 1996-01-25 KR KR1019970704190A patent/KR980700149A/ko not_active Withdrawn
  • 1996-01-25 WO PCT/EP1996/000301 patent/WO1996026033A1/de not_active Ceased
  • 1996-01-25 CA CA002208480A patent/CA2208480A1/en not_active Abandoned
  • 1996-01-25 EP EP96902921A patent/EP0810912B1/de not_active Expired - Lifetime
  • 1996-01-25 JP JP8525333A patent/JPH11500225A/ja active Pending
  • 1996-01-25 ES ES96902921T patent/ES2126385T3/es not_active Expired - Lifetime
  • 1996-01-25 AU AU47140/96A patent/AU4714096A/en not_active Abandoned
  • 1996-01-25 CZ CZ971943A patent/CZ194397A3/cs unknown
• 1997
  • 1997-06-19 FI FI972672A patent/FI972672A7/fi unknown
  • 1997-06-20 NO NO972870A patent/NO972870L/no unknown

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