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NO970707D0 - Method of Element Selective Detection, Microplasma Mass Spectrometer for Use in the Method and Plasma Ion Source, and Applications of These - Google Patents

Method of Element Selective Detection, Microplasma Mass Spectrometer for Use in the Method and Plasma Ion Source, and Applications of These

Info

Publication number
NO970707D0
NO970707D0 NO970707A NO970707A NO970707D0 NO 970707 D0 NO970707 D0 NO 970707D0 NO 970707 A NO970707 A NO 970707A NO 970707 A NO970707 A NO 970707A NO 970707 D0 NO970707 D0 NO 970707D0
Authority
NO
Norway
Prior art keywords
microplasma
applications
mass spectrometer
ion source
plasma ion
Prior art date
Application number
NO970707A
Other languages
Norwegian (no)
Other versions
NO970707L (en
NO304861B1 (en
Inventor
Cato Brede
Stig Pedersen-Bjergaard
Elsa Lundanes
Tyge Greibrokk
Original Assignee
Cato Brede
Pedersen Bjergaard Stig
Elsa Lundanes
Tyge Greibrokk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cato Brede, Pedersen Bjergaard Stig, Elsa Lundanes, Tyge Greibrokk filed Critical Cato Brede
Priority to NO970707A priority Critical patent/NO304861B1/en
Publication of NO970707D0 publication Critical patent/NO970707D0/en
Priority to EP98904444A priority patent/EP0960431B1/en
Priority to PCT/NO1998/000048 priority patent/WO1998036440A1/en
Priority to JP53562498A priority patent/JP2001512617A/en
Priority to AU62314/98A priority patent/AU719247B2/en
Priority to CA002278807A priority patent/CA2278807A1/en
Priority to DE69804772T priority patent/DE69804772T2/en
Publication of NO970707L publication Critical patent/NO970707L/en
Publication of NO304861B1 publication Critical patent/NO304861B1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
NO970707A 1997-02-14 1997-02-14 Method of Element Selective Detection, Microplasma Mass Spectrometer for Use in the Method and Plasma Ion Source, and Applications of These NO304861B1 (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
NO970707A NO304861B1 (en) 1997-02-14 1997-02-14 Method of Element Selective Detection, Microplasma Mass Spectrometer for Use in the Method and Plasma Ion Source, and Applications of These
EP98904444A EP0960431B1 (en) 1997-02-14 1998-02-12 A method for element-selective detection, a micro plasma mass spectrometer for use in the method and a micro plasma ion source, together with applications thereof
PCT/NO1998/000048 WO1998036440A1 (en) 1997-02-14 1998-02-12 A method for element-selective detection, a micro plasma mass spectrometer for use in the method and a plasma ion source, together with applications thereof
JP53562498A JP2001512617A (en) 1997-02-14 1998-02-12 Element-selective detection method, microplasma mass spectrometer using the method, microplasma ion source, and their applications
AU62314/98A AU719247B2 (en) 1997-02-14 1998-02-12 A method for element-selective detection, a micro plasma mass spectrometer for use in the method and a micro plasma ion source, together with applications thereof
CA002278807A CA2278807A1 (en) 1997-02-14 1998-02-12 A method for element-selective detection, a micro plasma mass spectrometer for use in the method and a plasma ion source, together with applications thereof
DE69804772T DE69804772T2 (en) 1997-02-14 1998-02-12 ELEMENT-SELECTIVE DETECTION METHOD, MICRO-PLASMA MASS SPECTROMETER AND MICRO-PLASMA ION SOURCE FOR IT AND ITS APPLICATIONS

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NO970707A NO304861B1 (en) 1997-02-14 1997-02-14 Method of Element Selective Detection, Microplasma Mass Spectrometer for Use in the Method and Plasma Ion Source, and Applications of These

Publications (3)

Publication Number Publication Date
NO970707D0 true NO970707D0 (en) 1997-02-14
NO970707L NO970707L (en) 1998-08-17
NO304861B1 NO304861B1 (en) 1999-02-22

Family

ID=19900391

Family Applications (1)

Application Number Title Priority Date Filing Date
NO970707A NO304861B1 (en) 1997-02-14 1997-02-14 Method of Element Selective Detection, Microplasma Mass Spectrometer for Use in the Method and Plasma Ion Source, and Applications of These

Country Status (7)

Country Link
EP (1) EP0960431B1 (en)
JP (1) JP2001512617A (en)
AU (1) AU719247B2 (en)
CA (1) CA2278807A1 (en)
DE (1) DE69804772T2 (en)
NO (1) NO304861B1 (en)
WO (1) WO1998036440A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7274015B2 (en) * 2001-08-08 2007-09-25 Sionex Corporation Capacitive discharge plasma ion source
DE10248055B4 (en) * 2002-10-11 2012-02-23 Spectro Analytical Instruments Gmbh & Co. Kg Method for excitation of optical atomic emission and apparatus for spectrochemical analysis
US7460225B2 (en) 2004-03-05 2008-12-02 Vassili Karanassios Miniaturized source devices for optical and mass spectrometry
GB2432711B (en) * 2005-10-11 2008-04-02 Gv Instr Ion source preparation system
DE102009046504B4 (en) * 2009-11-06 2016-06-09 Westfälische Wilhelms-Universität Münster Method and device for analyzing a substance mixture
WO2012162036A1 (en) * 2011-05-20 2012-11-29 Purdue Research Foundation (Prf) Systems and methods for analyzing a sample

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3215487B2 (en) * 1992-04-13 2001-10-09 セイコーインスツルメンツ株式会社 Inductively coupled plasma mass spectrometer
CA2116821C (en) * 1993-03-05 2003-12-23 Stephen Esler Anderson Improvements in plasma mass spectrometry
JPH07272671A (en) * 1994-03-29 1995-10-20 Ulvac Japan Ltd Method and device for gas analysis
WO1997020620A1 (en) * 1995-12-07 1997-06-12 The Regents Of The University Of California Improvements in method and apparatus for isotope enhancement in a plasma apparatus
EP0792091B1 (en) * 1995-12-27 2002-03-13 Nippon Telegraph And Telephone Corporation Elemental analysis method

Also Published As

Publication number Publication date
AU6231498A (en) 1998-09-08
DE69804772D1 (en) 2002-05-16
DE69804772T2 (en) 2002-11-28
NO970707L (en) 1998-08-17
AU719247B2 (en) 2000-05-04
JP2001512617A (en) 2001-08-21
WO1998036440A1 (en) 1998-08-20
NO304861B1 (en) 1999-02-22
CA2278807A1 (en) 1998-08-20
EP0960431B1 (en) 2002-04-10
EP0960431A1 (en) 1999-12-01

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Legal Events

Date Code Title Description
MM1K Lapsed by not paying the annual fees

Free format text: LAPSED IN AUGUST 2003