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MXPA05010244A - Metodo y sistema para detectar fugas en dispositivos electronicos. - Google Patents

Metodo y sistema para detectar fugas en dispositivos electronicos.

Info

Publication number
MXPA05010244A
MXPA05010244A MXPA05010244A MXPA05010244A MXPA05010244A MX PA05010244 A MXPA05010244 A MX PA05010244A MX PA05010244 A MXPA05010244 A MX PA05010244A MX PA05010244 A MXPA05010244 A MX PA05010244A MX PA05010244 A MXPA05010244 A MX PA05010244A
Authority
MX
Mexico
Prior art keywords
sealed package
test gas
electronic devices
leak
detection
Prior art date
Application number
MXPA05010244A
Other languages
English (en)
Inventor
William J Cummings
Original Assignee
Idc Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Idc Llc filed Critical Idc Llc
Publication of MXPA05010244A publication Critical patent/MXPA05010244A/es

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00Investigating fluid-tightness of structures
    • G01M3/02Investigating fluid-tightness of structures by using fluid or vacuum
    • G01M3/04Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
    • G01M3/20Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
    • G01M3/22Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators
    • G01M3/226Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators for containers, e.g. radiators
    • G01M3/229Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators for containers, e.g. radiators removably mounted in a test cell

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Examining Or Testing Airtightness (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

Se describen metodos y sistemas para probar dispositivos electronicos para deteccion de fugas, en donde la prueba no destruye los dispositivos electronicos. En un metodo para detectar una fuga en un paquete sellado, un paquete sellado se coloca en un ambiente de gas de prueba, permitiendo con esto que el gas de prueba se difunda en un espacio interno del paquete sellado a traves de una fuga formada en el paquete sellado. Despues de esto, el paquete sellado se coloca en un ambiente sustancialmente libre del gas de prueba y permite que el gas de prueba se difunda fuera del espacio interno. La cantidad de gas de prueba en el ambiente libre de gas de prueba se detecta. Basandose en la informacion obtenida de la deteccion, se determina si el paquete sellado tiene una o mas fugas no pretendidas basandose en la informacion obtenida de la deteccion.
MXPA05010244A 2004-09-27 2005-09-23 Metodo y sistema para detectar fugas en dispositivos electronicos. MXPA05010244A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US61338504P 2004-09-27 2004-09-27
US11/090,775 US7299681B2 (en) 2004-09-27 2005-03-25 Method and system for detecting leak in electronic devices

Publications (1)

Publication Number Publication Date
MXPA05010244A true MXPA05010244A (es) 2006-03-29

Family

ID=35094553

Family Applications (1)

Application Number Title Priority Date Filing Date
MXPA05010244A MXPA05010244A (es) 2004-09-27 2005-09-23 Metodo y sistema para detectar fugas en dispositivos electronicos.

Country Status (12)

Country Link
US (2) US7299681B2 (es)
EP (1) EP1640698A3 (es)
JP (1) JP2006091004A (es)
KR (1) KR20060092866A (es)
AU (1) AU2005203231A1 (es)
BR (1) BRPI0503886A (es)
CA (1) CA2512922A1 (es)
MX (1) MXPA05010244A (es)
MY (1) MY141411A (es)
RU (1) RU2379642C2 (es)
SG (1) SG121040A1 (es)
TW (1) TW200628775A (es)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6997043B2 (en) * 2002-08-15 2006-02-14 The Boeing Company Integration of atmospheric intrusion sensors in electronic component packages
US20070157457A1 (en) * 2004-09-10 2007-07-12 Lance Fried Assembly Method and Machinery for Waterproof Testing of Electronic Devices
DE102004045803A1 (de) * 2004-09-22 2006-04-06 Inficon Gmbh Leckprüfverfahren und Leckprüfvorrichtung
US7343080B2 (en) * 2004-09-27 2008-03-11 Idc, Llc System and method of testing humidity in a sealed MEMS device
WO2006127814A2 (en) * 2005-05-25 2006-11-30 Northrop Grumman Corporation Method for optimizing direct wafer bond line width for reduction of parasitic capacitance in mems accelerometers
DE102006016747A1 (de) * 2006-04-10 2007-10-18 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und Vorrichtung zur Leckprüfung
US20080194963A1 (en) * 2007-02-08 2008-08-14 Randall Kevin S Probes for ultrasound imaging systems
US7891230B2 (en) * 2007-02-08 2011-02-22 Penrith Corporation Methods for verifying the integrity of probes for ultrasound imaging systems
DE102007060392A1 (de) 2007-12-14 2009-06-18 Krones Ag Drehverteiler mit Leckageerkennung
GB2470508B (en) * 2008-03-05 2012-04-04 Tamarack Habilitation Tech Inc Seat cushion
SI2449356T1 (sl) * 2009-07-01 2013-11-29 Wilco Ag Postopek za preizkušanje puščanja zaprth, vsaj delno s plinom napolnjenih vsebnikov
US20110048111A1 (en) * 2009-08-31 2011-03-03 United Technologies Corporation Method of leak testing aerospace components
BR112012026325A2 (pt) 2010-04-16 2019-09-24 Flex Lighting Ii Llc dispositivo de iluminação compreendendo um guia de luz baseado em película
KR101821727B1 (ko) 2010-04-16 2018-01-24 플렉스 라이팅 투 엘엘씨 필름 기반 라이트가이드를 포함하는 프론트 조명 디바이스
US9010175B2 (en) * 2012-01-06 2015-04-21 GM Global Technology Operations LLC Die coolant system with an integral and automatic leak test
KR101302005B1 (ko) * 2012-04-04 2013-08-30 한국기계전기전자시험연구원 엘이디 박리 검사를 위한 헬륨 가스 디텍팅 장치
CN103674441A (zh) * 2012-09-14 2014-03-26 亚旭电脑股份有限公司 测试治具与测试方法
TW201411108A (zh) * 2012-09-14 2014-03-16 Askey Computer Corp 測試治具與測試方法
US9429494B1 (en) 2012-11-21 2016-08-30 Western Digital Technologies, Inc. Leakage test method for a hermetically sealed disk drive enclosure
US8921128B2 (en) * 2013-05-29 2014-12-30 Analog Devices, Inc. Method of manufacturing MEMS devices with reliable hermetic seal
US9884197B2 (en) * 2013-07-01 2018-02-06 Newsouth Innovations Pty Ltd Encapsulated electronic circuit
JP6243762B2 (ja) * 2014-03-14 2017-12-06 サーパス工業株式会社 圧力センサ
US9733148B2 (en) 2014-12-03 2017-08-15 International Business Machines Corporation Measuring moisture leakage through liquid-carrying hardware
US10001426B2 (en) 2016-09-13 2018-06-19 Dong Un Kim Apparatus for testing water resistance of mobile terminal using reference chamber unit
FR3068781A1 (fr) * 2017-07-06 2019-01-11 Ateq Procede de detection de fuite d'une piece creuse et installation pour la mise en œuvre d'un tel procede
HK1256664A2 (zh) * 2017-08-25 2019-09-27 周锦富 一种用於较准气体检测器件的系统与方法
JP6708191B2 (ja) * 2017-09-21 2020-06-10 株式会社デンソー 漏れ検査装置及び漏れ検査方法
JP7397253B2 (ja) * 2018-09-20 2023-12-13 Ignite株式会社 自動検査機構を有するmems表示装置
CN110940463B (zh) * 2018-09-25 2022-05-17 宁波方太厨具有限公司 一种漏水检测方法及漏水检测装置
US11847311B2 (en) * 2019-05-22 2023-12-19 Apple Inc. Characterization of a venting state or other system parameter that affects the characterization of a force applied to a device
CN111678659A (zh) * 2020-06-09 2020-09-18 江苏省如高高压电器有限公司 一种瓷柱式断路器检漏方法
CN112484925A (zh) * 2020-11-06 2021-03-12 江苏创励安科技有限公司 一种游泳模拟机构及游泳模拟设备
CN113328346B (zh) * 2021-07-04 2022-01-18 兴化市永安电力工具有限公司 一种户外用配电柜
CN114623391B (zh) * 2022-04-11 2023-11-21 广州燃气集团有限公司 一种燃气管道泄漏位置的定位方法

Family Cites Families (317)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6347009B1 (en) * 1997-08-06 2002-02-12 Nikon Corporation Illuminating light selection device for a microscope
US2534846A (en) 1946-06-20 1950-12-19 Emi Ltd Color filter
US2836058A (en) * 1953-01-06 1958-05-27 Sr Lewis M Oden Spark plug bomb and leak tester
DE1288651B (de) * 1963-06-28 1969-02-06 Siemens Ag Anordnung elektrischer Dipole fuer Wellenlaengen unterhalb 1 mm und Verfahren zur Herstellung einer derartigen Anordnung
US3416359A (en) 1966-07-01 1968-12-17 Texas Instruments Inc Method and apparatus for testing hermetically sealed transistor devices
US3487677A (en) 1968-01-08 1970-01-06 Victor D Molitor Method for leak detection
FR1603131A (es) * 1968-07-05 1971-03-22
US3578758A (en) * 1969-05-07 1971-05-18 Nasa Orifice gross leak tester
US3813265A (en) 1970-02-16 1974-05-28 A Marks Electro-optical dipolar material
US3653741A (en) * 1970-02-16 1972-04-04 Alvin M Marks Electro-optical dipolar material
US3672207A (en) * 1971-01-04 1972-06-27 North American Rockwell Apparatus for verifying hermeticity of small electronic assemblies
DE2336930A1 (de) 1973-07-20 1975-02-06 Battelle Institut E V Infrarot-modulator (ii.)
US3899295A (en) 1973-11-23 1975-08-12 Bio Medical Sciences Inc Integrity indicator
NL7403213A (nl) * 1974-03-11 1975-09-15 Neratoom Werkwijze voor het detecteren van zeer kleine gaslekken door een vloeistofafdichting om een doorvoering.
JPS5110798A (es) * 1974-07-17 1976-01-28 Citizen Watch Co Ltd
US3956923A (en) 1975-01-17 1976-05-18 The Procter & Gamble Company Method of detecting small gas leaks in filled aerosol containers
US4099854A (en) 1976-10-12 1978-07-11 The Unites States Of America As Represented By The Secretary Of The Navy Optical notch filter utilizing electric dipole resonance absorption
US4389096A (en) 1977-12-27 1983-06-21 Matsushita Electric Industrial Co., Ltd. Image display apparatus of liquid crystal valve projection type
US4158960A (en) 1978-05-04 1979-06-26 The United States Of America As Represented By The Secretary Of The Army Microcircuit fine leak test apparatus
US4445050A (en) * 1981-12-15 1984-04-24 Marks Alvin M Device for conversion of light power to electric power
US4663083A (en) 1978-05-26 1987-05-05 Marks Alvin M Electro-optical dipole suspension with reflective-absorptive-transmissive characteristics
US4224565A (en) 1978-06-05 1980-09-23 Bell Telephone Laboratories, Incorporated Moisture level determination in sealed packages
GB2030721B (en) 1978-07-11 1982-10-27 Budapesti Mueszaki Agyetem Colorimeter
US4228437A (en) 1979-06-26 1980-10-14 The United States Of America As Represented By The Secretary Of The Navy Wideband polarization-transforming electromagnetic mirror
US4282744A (en) * 1979-11-02 1981-08-11 Western Electric Co., Inc. Leak testing hermetically sealed electronic articles
NL8001281A (nl) 1980-03-04 1981-10-01 Philips Nv Weergeefinrichting.
US4377324A (en) * 1980-08-04 1983-03-22 Honeywell Inc. Graded index Fabry-Perot optical filter device
US4441791A (en) * 1980-09-02 1984-04-10 Texas Instruments Incorporated Deformable mirror light modulator
FR2506026A1 (fr) 1981-05-18 1982-11-19 Radant Etudes Procede et dispositif pour l'analyse d'un faisceau de rayonnement d'ondes electromagnetiques hyperfrequence
US4398413A (en) * 1981-05-18 1983-08-16 Medtronic, Inc. Leak detection for hermetic enclosures
NL8103377A (nl) 1981-07-16 1983-02-16 Philips Nv Weergeefinrichting.
US4565093A (en) * 1981-10-05 1986-01-21 Medtronic, Inc. Method for facilitating hermeticity leakage testing of an electrical feedthrough
US4571603A (en) * 1981-11-03 1986-02-18 Texas Instruments Incorporated Deformable mirror electrostatic printer
FR2516785A1 (fr) 1981-11-20 1983-05-27 Rech Geolog Miniere Procede de mesure de la repartition spectrale de la lumiere diffusee par des dents ou objets en vue de leur reproduction et moyen de mise en oeuvre
NL8200354A (nl) 1982-02-01 1983-09-01 Philips Nv Passieve weergeefinrichting.
US4500171A (en) * 1982-06-02 1985-02-19 Texas Instruments Incorporated Process for plastic LCD fill hole sealing
US4459844A (en) * 1982-06-17 1984-07-17 Smith & Denison Gas separation chamber and portable leak detection system
US4482213A (en) 1982-11-23 1984-11-13 Texas Instruments Incorporated Perimeter seal reinforcement holes for plastic LCDs
US4553435A (en) * 1983-07-19 1985-11-19 The United States Of America As Represented By The Secretary Of The Air Force Elevated transient temperature leak test for unstable microelectronic packages
US4920785A (en) * 1984-06-21 1990-05-01 Web Technology, Inc. Hermeticity testing method and system
US4710732A (en) 1984-07-31 1987-12-01 Texas Instruments Incorporated Spatial light modulator and method
US4566935A (en) * 1984-07-31 1986-01-28 Texas Instruments Incorporated Spatial light modulator and method
US5061049A (en) 1984-08-31 1991-10-29 Texas Instruments Incorporated Spatial light modulator and method
US4596992A (en) 1984-08-31 1986-06-24 Texas Instruments Incorporated Linear spatial light modulator and printer
US5096279A (en) * 1984-08-31 1992-03-17 Texas Instruments Incorporated Spatial light modulator and method
US4662746A (en) 1985-10-30 1987-05-05 Texas Instruments Incorporated Spatial light modulator and method
US4615595A (en) 1984-10-10 1986-10-07 Texas Instruments Incorporated Frame addressed spatial light modulator
US4608866A (en) * 1985-03-13 1986-09-02 Martin Marietta Corporation Small component helium leak detector
US5172262A (en) 1985-10-30 1992-12-15 Texas Instruments Incorporated Spatial light modulator and method
US5835255A (en) 1986-04-23 1998-11-10 Etalon, Inc. Visible spectrum modulator arrays
GB8610129D0 (en) 1986-04-25 1986-05-29 Secr Defence Electro-optical device
SU1357737A1 (ru) * 1986-05-29 1987-12-07 Предприятие П/Я В-2739 Способ испытани на герметичность изделий
US4748366A (en) 1986-09-02 1988-05-31 Taylor George W Novel uses of piezoelectric materials for creating optical effects
US4786128A (en) 1986-12-02 1988-11-22 Quantum Diagnostics, Ltd. Device for modulating and reflecting electromagnetic radiation employing electro-optic layer having a variable index of refraction
US4785666A (en) * 1986-12-19 1988-11-22 Martin Marietta Corporation Method of increasing the sensitivity of a leak detector in the probe mode
US4897360A (en) * 1987-12-09 1990-01-30 Wisconsin Alumni Research Foundation Polysilicon thin film process
US4956619A (en) 1988-02-19 1990-09-11 Texas Instruments Incorporated Spatial light modulator
JPH01259243A (ja) 1988-04-08 1989-10-16 Sumitomo Metal Mining Co Ltd 不透明鉱物等の顕微鏡画像の自動定量測定方法および装置
US4856863A (en) 1988-06-22 1989-08-15 Texas Instruments Incorporated Optical fiber interconnection network including spatial light modulator
US5028939A (en) 1988-08-23 1991-07-02 Texas Instruments Incorporated Spatial light modulator system
US4893499A (en) * 1988-12-05 1990-01-16 Unisys Corporation Method and apparatus for detecting leaks in IC packages by sensing package deflections
US4982184A (en) * 1989-01-03 1991-01-01 General Electric Company Electrocrystallochromic display and element
US5170156A (en) 1989-02-27 1992-12-08 Texas Instruments Incorporated Multi-frequency two dimensional display system
US5272473A (en) 1989-02-27 1993-12-21 Texas Instruments Incorporated Reduced-speckle display system
US5287096A (en) * 1989-02-27 1994-02-15 Texas Instruments Incorporated Variable luminosity display system
US5162787A (en) 1989-02-27 1992-11-10 Texas Instruments Incorporated Apparatus and method for digitized video system utilizing a moving display surface
US5079544A (en) * 1989-02-27 1992-01-07 Texas Instruments Incorporated Standard independent digitized video system
US5446479A (en) 1989-02-27 1995-08-29 Texas Instruments Incorporated Multi-dimensional array video processor system
US5192946A (en) * 1989-02-27 1993-03-09 Texas Instruments Incorporated Digitized color video display system
US5214419A (en) 1989-02-27 1993-05-25 Texas Instruments Incorporated Planarized true three dimensional display
KR100202246B1 (ko) 1989-02-27 1999-06-15 윌리엄 비. 켐플러 디지탈화 비디오 시스템을 위한 장치 및 방법
US5206629A (en) * 1989-02-27 1993-04-27 Texas Instruments Incorporated Spatial light modulator and memory for digitized video display
US5214420A (en) 1989-02-27 1993-05-25 Texas Instruments Incorporated Spatial light modulator projection system with random polarity light
US5022745A (en) 1989-09-07 1991-06-11 Massachusetts Institute Of Technology Electrostatically deformable single crystal dielectrically coated mirror
US4954789A (en) 1989-09-28 1990-09-04 Texas Instruments Incorporated Spatial light modulator
US5381253A (en) * 1991-11-14 1995-01-10 Board Of Regents Of University Of Colorado Chiral smectic liquid crystal optical modulators having variable retardation
US5124834A (en) 1989-11-16 1992-06-23 General Electric Company Transferrable, self-supporting pellicle for elastomer light valve displays and method for making the same
US5037173A (en) 1989-11-22 1991-08-06 Texas Instruments Incorporated Optical interconnection network
DE58906917D1 (de) * 1989-12-15 1994-03-17 Alcatel Hochvakuumtechnik Gmbh Vorrichtung und Verfahren zur Leckprüfung.
US5500635A (en) * 1990-02-20 1996-03-19 Mott; Jonathan C. Products incorporating piezoelectric material
CH682523A5 (fr) * 1990-04-20 1993-09-30 Suisse Electronique Microtech Dispositif de modulation de lumière à adressage matriciel.
GB9012099D0 (en) 1990-05-31 1990-07-18 Kodak Ltd Optical article for multicolour imaging
US5099353A (en) * 1990-06-29 1992-03-24 Texas Instruments Incorporated Architecture and process for integrating DMD with control circuit substrates
US5142405A (en) 1990-06-29 1992-08-25 Texas Instruments Incorporated Bistable dmd addressing circuit and method
DE69113150T2 (de) * 1990-06-29 1996-04-04 Texas Instruments Inc Deformierbare Spiegelvorrichtung mit aktualisiertem Raster.
US5083857A (en) * 1990-06-29 1992-01-28 Texas Instruments Incorporated Multi-level deformable mirror device
US5216537A (en) 1990-06-29 1993-06-01 Texas Instruments Incorporated Architecture and process for integrating DMD with control circuit substrates
US5018256A (en) 1990-06-29 1991-05-28 Texas Instruments Incorporated Architecture and process for integrating DMD with control circuit substrates
US5153771A (en) 1990-07-18 1992-10-06 Northrop Corporation Coherent light modulation and detector
US5082366A (en) * 1990-08-30 1992-01-21 Laser Technology, Inc. Apparatus and method for detecting leaks in packages
US5526688A (en) 1990-10-12 1996-06-18 Texas Instruments Incorporated Digital flexure beam accelerometer and method
US5192395A (en) * 1990-10-12 1993-03-09 Texas Instruments Incorporated Method of making a digital flexure beam accelerometer
US5044736A (en) 1990-11-06 1991-09-03 Motorola, Inc. Configurable optical filter or display
US5331454A (en) 1990-11-13 1994-07-19 Texas Instruments Incorporated Low reset voltage process for DMD
US5602671A (en) * 1990-11-13 1997-02-11 Texas Instruments Incorporated Low surface energy passivation layer for micromechanical devices
US5081687A (en) 1990-11-30 1992-01-14 Photon Dynamics, Inc. Method and apparatus for testing LCD panel array prior to shorting bar removal
US5175772A (en) 1991-01-02 1992-12-29 Motorola, Inc. Automated test for displays using display patterns
JP2500488B2 (ja) * 1991-02-08 1996-05-29 ヤマハ株式会社 漏洩試験方法及び漏洩試験装置
US5233459A (en) 1991-03-06 1993-08-03 Massachusetts Institute Of Technology Electric display device
CA2063744C (en) * 1991-04-01 2002-10-08 Paul M. Urbanus Digital micromirror device architecture and timing for use in a pulse-width modulated display system
US5226099A (en) 1991-04-26 1993-07-06 Texas Instruments Incorporated Digital micromirror shutter device
US5179274A (en) * 1991-07-12 1993-01-12 Texas Instruments Incorporated Method for controlling operation of optical systems and devices
US5168406A (en) 1991-07-31 1992-12-01 Texas Instruments Incorporated Color deformable mirror device and method for manufacture
US5254980A (en) 1991-09-06 1993-10-19 Texas Instruments Incorporated DMD display system controller
US5459409A (en) 1991-09-10 1995-10-17 Photon Dynamics, Inc. Testing device for liquid crystal display base plate
US5563398A (en) 1991-10-31 1996-10-08 Texas Instruments Incorporated Spatial light modulator scanning system
CA2081753C (en) 1991-11-22 2002-08-06 Jeffrey B. Sampsell Dmd scanner
US5233385A (en) 1991-12-18 1993-08-03 Texas Instruments Incorporated White light enhanced color field sequential projection
US5233456A (en) 1991-12-20 1993-08-03 Texas Instruments Incorporated Resonant mirror and method of manufacture
CA2087625C (en) 1992-01-23 2006-12-12 William E. Nelson Non-systolic time delay and integration printing
US5296950A (en) * 1992-01-31 1994-03-22 Texas Instruments Incorporated Optical signal free-space conversion board
US5231532A (en) 1992-02-05 1993-07-27 Texas Instruments Incorporated Switchable resonant filter for optical radiation
EP0562424B1 (en) 1992-03-25 1997-05-28 Texas Instruments Incorporated Embedded optical calibration system
US5312513A (en) * 1992-04-03 1994-05-17 Texas Instruments Incorporated Methods of forming multiple phase light modulators
WO1993021663A1 (en) * 1992-04-08 1993-10-28 Georgia Tech Research Corporation Process for lift-off of thin film materials from a growth substrate
US5369983A (en) 1992-04-17 1994-12-06 Minnesota Mining And Manufacturing Company Detection medium and method for use in hermetic seal testing
US5311360A (en) 1992-04-28 1994-05-10 The Board Of Trustees Of The Leland Stanford, Junior University Method and apparatus for modulating a light beam
JPH0651250A (ja) * 1992-05-20 1994-02-25 Texas Instr Inc <Ti> モノリシックな空間的光変調器およびメモリのパッケージ
JPH06214169A (ja) * 1992-06-08 1994-08-05 Texas Instr Inc <Ti> 制御可能な光学的周期的表面フィルタ
US5309752A (en) * 1992-07-17 1994-05-10 Praxair Technology, Inc. Leakage measurement into a gas-charged collapsible container
US5818095A (en) * 1992-08-11 1998-10-06 Texas Instruments Incorporated High-yield spatial light modulator with light blocking layer
CH685887A5 (de) 1992-08-12 1995-10-31 Martin Lehmann Verfahren zur Pruefung von Behaeltnissen Anwendung des Verfahrens sowie Pruefanordnung
US5327286A (en) 1992-08-31 1994-07-05 Texas Instruments Incorporated Real time optical correlation system
US5325116A (en) 1992-09-18 1994-06-28 Texas Instruments Incorporated Device for writing to and reading from optical storage media
US5659374A (en) 1992-10-23 1997-08-19 Texas Instruments Incorporated Method of repairing defective pixels
JP3547160B2 (ja) 1993-01-11 2004-07-28 テキサス インスツルメンツ インコーポレイテツド 空間光変調器
US6674562B1 (en) 1994-05-05 2004-01-06 Iridigm Display Corporation Interferometric modulation of radiation
US5461411A (en) 1993-03-29 1995-10-24 Texas Instruments Incorporated Process and architecture for digital micromirror printer
US5489952A (en) * 1993-07-14 1996-02-06 Texas Instruments Incorporated Method and device for multi-format television
US5365283A (en) 1993-07-19 1994-11-15 Texas Instruments Incorporated Color phase control for projection display using spatial light modulator
US5526172A (en) 1993-07-27 1996-06-11 Texas Instruments Incorporated Microminiature, monolithic, variable electrical signal processor and apparatus including same
US5581272A (en) 1993-08-25 1996-12-03 Texas Instruments Incorporated Signal generator for controlling a spatial light modulator
FR2710161B1 (fr) 1993-09-13 1995-11-24 Suisse Electronique Microtech Réseau miniature d'obturateurs de lumière.
US5457493A (en) 1993-09-15 1995-10-10 Texas Instruments Incorporated Digital micro-mirror based image simulation system
US5526051A (en) 1993-10-27 1996-06-11 Texas Instruments Incorporated Digital television system
US5497197A (en) * 1993-11-04 1996-03-05 Texas Instruments Incorporated System and method for packaging data into video processor
US5459602A (en) 1993-10-29 1995-10-17 Texas Instruments Micro-mechanical optical shutter
US5452024A (en) 1993-11-01 1995-09-19 Texas Instruments Incorporated DMD display system
US5517347A (en) 1993-12-01 1996-05-14 Texas Instruments Incorporated Direct view deformable mirror device
CA2137059C (en) 1993-12-03 2004-11-23 Texas Instruments Incorporated Dmd architecture to improve horizontal resolution
US5583688A (en) 1993-12-21 1996-12-10 Texas Instruments Incorporated Multi-level digital micromirror device
US5448314A (en) 1994-01-07 1995-09-05 Texas Instruments Method and apparatus for sequential color imaging
US5500761A (en) * 1994-01-27 1996-03-19 At&T Corp. Micromechanical modulator
US5444566A (en) 1994-03-07 1995-08-22 Texas Instruments Incorporated Optimized electronic operation of digital micromirror devices
US5729245A (en) * 1994-03-21 1998-03-17 Texas Instruments Incorporated Alignment for display having multiple spatial light modulators
US5665997A (en) 1994-03-31 1997-09-09 Texas Instruments Incorporated Grated landing area to eliminate sticking of micro-mechanical devices
US20010003487A1 (en) 1996-11-05 2001-06-14 Mark W. Miles Visible spectrum modulator arrays
US7123216B1 (en) 1994-05-05 2006-10-17 Idc, Llc Photonic MEMS and structures
US7460291B2 (en) * 1994-05-05 2008-12-02 Idc, Llc Separable modulator
US6710908B2 (en) * 1994-05-05 2004-03-23 Iridigm Display Corporation Controlling micro-electro-mechanical cavities
US6040937A (en) * 1994-05-05 2000-03-21 Etalon, Inc. Interferometric modulation
US6680792B2 (en) 1994-05-05 2004-01-20 Iridigm Display Corporation Interferometric modulation of radiation
US7550794B2 (en) 2002-09-20 2009-06-23 Idc, Llc Micromechanical systems device comprising a displaceable electrode and a charge-trapping layer
EP0686934B1 (en) 1994-05-17 2001-09-26 Texas Instruments Incorporated Display device with pointer position detection
US5497172A (en) * 1994-06-13 1996-03-05 Texas Instruments Incorporated Pulse width modulation for spatial light modulator with split reset addressing
US5673106A (en) 1994-06-17 1997-09-30 Texas Instruments Incorporated Printing system with self-monitoring and adjustment
US5454906A (en) 1994-06-21 1995-10-03 Texas Instruments Inc. Method of providing sacrificial spacer for micro-mechanical devices
US5499062A (en) * 1994-06-23 1996-03-12 Texas Instruments Incorporated Multiplexed memory timing with block reset and secondary memory
JPH0815497A (ja) * 1994-06-29 1996-01-19 Hitachi Ltd 使用済燃料の貯蔵監視方法およびその貯蔵設備
US5485304A (en) 1994-07-29 1996-01-16 Texas Instruments, Inc. Support posts for micro-mechanical devices
US5636052A (en) 1994-07-29 1997-06-03 Lucent Technologies Inc. Direct view display based on a micromechanical modulation
US5703710A (en) 1994-09-09 1997-12-30 Deacon Research Method for manipulating optical energy using poled structure
US6053617A (en) 1994-09-23 2000-04-25 Texas Instruments Incorporated Manufacture method for micromechanical devices
US5619059A (en) * 1994-09-28 1997-04-08 National Research Council Of Canada Color deformable mirror device having optical thin film interference color coatings
US5650881A (en) 1994-11-02 1997-07-22 Texas Instruments Incorporated Support post architecture for micromechanical devices
US5552924A (en) 1994-11-14 1996-09-03 Texas Instruments Incorporated Micromechanical device having an improved beam
US5610624A (en) * 1994-11-30 1997-03-11 Texas Instruments Incorporated Spatial light modulator with reduced possibility of an on state defect
US5567334A (en) 1995-02-27 1996-10-22 Texas Instruments Incorporated Method for creating a digital micromirror device using an aluminum hard mask
US5610438A (en) * 1995-03-08 1997-03-11 Texas Instruments Incorporated Micro-mechanical device with non-evaporable getter
US5535047A (en) 1995-04-18 1996-07-09 Texas Instruments Incorporated Active yoke hidden hinge digital micromirror device
US5784190A (en) 1995-04-27 1998-07-21 John M. Baker Electro-micro-mechanical shutters on transparent substrates
DE19525081B4 (de) 1995-07-10 2006-06-29 Display Products Group, Inc., Hayward Verfahren und Vorrichtung zum Testen der Funktion von Mikrostrukturelementen
US5739945A (en) * 1995-09-29 1998-04-14 Tayebati; Parviz Electrically tunable optical filter utilizing a deformable multi-layer mirror
WO1997017628A1 (en) 1995-11-06 1997-05-15 Etalon, Inc. Interferometric modulation
US5825528A (en) 1995-12-26 1998-10-20 Lucent Technologies Inc. Phase-mismatched fabry-perot cavity micromechanical modulator
JP3799092B2 (ja) * 1995-12-29 2006-07-19 アジレント・テクノロジーズ・インク 光変調装置及びディスプレイ装置
US5710656A (en) * 1996-07-30 1998-01-20 Lucent Technologies Inc. Micromechanical optical modulator having a reduced-mass composite membrane
US5999012A (en) 1996-08-15 1999-12-07 Listwan; Andrew Method and apparatus for testing an electrically conductive substrate
US5912758A (en) 1996-09-11 1999-06-15 Texas Instruments Incorporated Bipolar reset for spatial light modulators
US5771116A (en) 1996-10-21 1998-06-23 Texas Instruments Incorporated Multiple bias level reset waveform for enhanced DMD control
WO1998040871A1 (en) 1997-03-12 1998-09-17 Seiko Epson Corporation Pixel circuit, display device and electronic equipment having current-driven light-emitting device
EP0877272B1 (en) * 1997-05-08 2002-07-31 Texas Instruments Incorporated Improvements in or relating to spatial light modulators
US6480177B2 (en) 1997-06-04 2002-11-12 Texas Instruments Incorporated Blocked stepped address voltage for micromechanical devices
JP3897860B2 (ja) * 1997-07-11 2007-03-28 株式会社アルバック 密閉品のリークテスト方法
US6088474A (en) 1997-07-23 2000-07-11 Texas Instruments Incorporated Inspection system for micromechanical devices
US6028690A (en) * 1997-11-26 2000-02-22 Texas Instruments Incorporated Reduced micromirror mirror gaps for improved contrast ratio
US6180428B1 (en) * 1997-12-12 2001-01-30 Xerox Corporation Monolithic scanning light emitting devices using micromachining
US6078183A (en) 1998-03-03 2000-06-20 Sandia Corporation Thermally-induced voltage alteration for integrated circuit analysis
US6170319B1 (en) * 1998-03-31 2001-01-09 Betzdearborn Inc. Methods and apparatus for monitoring water process equipment
KR100703140B1 (ko) 1998-04-08 2007-04-05 이리다임 디스플레이 코포레이션 간섭 변조기 및 그 제조 방법
US6160833A (en) 1998-05-06 2000-12-12 Xerox Corporation Blue vertical cavity surface emitting laser
US6282010B1 (en) 1998-05-14 2001-08-28 Texas Instruments Incorporated Anti-reflective coatings for spatial light modulators
US6323982B1 (en) 1998-05-22 2001-11-27 Texas Instruments Incorporated Yield superstructure for digital micromirror device
JP3950232B2 (ja) 1998-05-25 2007-07-25 Idec株式会社 カラーセンサ用光学ユニット
US6147790A (en) 1998-06-02 2000-11-14 Texas Instruments Incorporated Spring-ring micromechanical device
US6295154B1 (en) 1998-06-05 2001-09-25 Texas Instruments Incorporated Optical switching apparatus
US6496122B2 (en) 1998-06-26 2002-12-17 Sharp Laboratories Of America, Inc. Image display and remote control system capable of displaying two distinct images
US6113239A (en) 1998-09-04 2000-09-05 Sharp Laboratories Of America, Inc. Projection display system for reflective light valves
US6223586B1 (en) * 1998-12-23 2001-05-01 Visteon Global Technologies, Inc. Micro-electromechanical device inspection
US6233908B1 (en) * 1998-12-24 2001-05-22 Autoliv Asp, Inc. Method of introducing a leak trace material into an airbag inflator
US6606175B1 (en) 1999-03-16 2003-08-12 Sharp Laboratories Of America, Inc. Multi-segment light-emitting diode
US6286362B1 (en) * 1999-03-31 2001-09-11 Applied Materials, Inc. Dual mode leak detector
US6201633B1 (en) * 1999-06-07 2001-03-13 Xerox Corporation Micro-electromechanical based bistable color display sheets
KR100563406B1 (ko) 1999-06-30 2006-03-23 가부시끼가이샤 히다치 세이사꾸쇼 플라즈마 디스플레이 장치
US6862029B1 (en) * 1999-07-27 2005-03-01 Hewlett-Packard Development Company, L.P. Color display system
US6750152B1 (en) 1999-10-01 2004-06-15 Delphi Technologies, Inc. Method and apparatus for electrically testing and characterizing formation of microelectric features
WO2003007049A1 (en) * 1999-10-05 2003-01-23 Iridigm Display Corporation Photonic mems and structures
US6549338B1 (en) 1999-11-12 2003-04-15 Texas Instruments Incorporated Bandpass filter to reduce thermal impact of dichroic light shift
US6552840B2 (en) 1999-12-03 2003-04-22 Texas Instruments Incorporated Electrostatic efficiency of micromechanical devices
US6545335B1 (en) 1999-12-27 2003-04-08 Xerox Corporation Structure and method for electrical isolation of optoelectronic integrated circuits
US6674090B1 (en) * 1999-12-27 2004-01-06 Xerox Corporation Structure and method for planar lateral oxidation in active
US6548908B2 (en) 1999-12-27 2003-04-15 Xerox Corporation Structure and method for planar lateral oxidation in passive devices
US6466358B2 (en) 1999-12-30 2002-10-15 Texas Instruments Incorporated Analog pulse width modulation cell for digital micromechanical device
ATE302429T1 (de) 2000-03-14 2005-09-15 Koninkl Philips Electronics Nv Flüssigkristallanzeigevorrichtung mit mitteln zur temperaturkompensation der betriebsspannung
US6567715B1 (en) 2000-04-19 2003-05-20 Sandia Corporation Method and system for automated on-chip material and structural certification of MEMS devices
US6473274B1 (en) 2000-06-28 2002-10-29 Texas Instruments Incorporated Symmetrical microactuator structure for use in mass data storage devices, or the like
JP4391682B2 (ja) * 2000-07-21 2009-12-24 トヨタ自動車株式会社 漏洩ガス測定装置、及び漏洩ガス測定装置の評価装置
US6853129B1 (en) * 2000-07-28 2005-02-08 Candescent Technologies Corporation Protected substrate structure for a field emission display device
US6778155B2 (en) 2000-07-31 2004-08-17 Texas Instruments Incorporated Display operation with inserted block clears
US6643069B2 (en) 2000-08-31 2003-11-04 Texas Instruments Incorporated SLM-base color projection display having multiple SLM's and multiple projection lenses
US6798517B2 (en) 2000-09-28 2004-09-28 Color-Spec Technologies, Inc. Handheld, portable color measuring device with display
GB2368635B (en) 2000-11-01 2004-12-22 Nokia Mobile Phones Ltd Testing an image display device
US6824739B1 (en) 2000-11-03 2004-11-30 Agere Systems Inc. Oxidation sensor for an electrical circuit and a method of manufacture therefor
US6859218B1 (en) * 2000-11-07 2005-02-22 Hewlett-Packard Development Company, L.P. Electronic display devices and methods
US6530264B1 (en) * 2000-11-16 2003-03-11 Autoliv Asp, Inc. Detection systems and methods
US6775174B2 (en) 2000-12-28 2004-08-10 Texas Instruments Incorporated Memory architecture for micromirror cell
US6625047B2 (en) 2000-12-31 2003-09-23 Texas Instruments Incorporated Micromechanical memory element
JP4409098B2 (ja) * 2001-01-09 2010-02-03 株式会社フクダ リークテストシステム及びリークテスト方法
SE518522C2 (sv) * 2001-03-21 2002-10-22 Sensistor Ab Metod och anordning vid täthetsprovning och läcksökning
JP3904933B2 (ja) * 2001-03-30 2007-04-11 日本碍子株式会社 欠陥を検出する検査方法及び検査装置
US6630786B2 (en) 2001-03-30 2003-10-07 Candescent Technologies Corporation Light-emitting device having light-reflective layer formed with, or/and adjacent to, material that enhances device performance
US6465355B1 (en) 2001-04-27 2002-10-15 Hewlett-Packard Company Method of fabricating suspended microstructures
US6626027B1 (en) * 2001-06-12 2003-09-30 Intertech Development Company Method and apparatus for detecting a gas leak using nuclear magnetic resonance
CN1529820A (zh) * 2001-06-19 2004-09-15 �ʼҷ����ֵ������޹�˾ 电致发光器件的检漏方法和仪器
US6822628B2 (en) 2001-06-28 2004-11-23 Candescent Intellectual Property Services, Inc. Methods and systems for compensating row-to-row brightness variations of a field emission display
US6862022B2 (en) * 2001-07-20 2005-03-01 Hewlett-Packard Development Company, L.P. Method and system for automatically selecting a vertical refresh rate for a video display monitor
US6589625B1 (en) 2001-08-01 2003-07-08 Iridigm Display Corporation Hermetic seal and method to create the same
US6600201B2 (en) 2001-08-03 2003-07-29 Hewlett-Packard Development Company, L.P. Systems with high density packing of micromachines
US6632698B2 (en) 2001-08-07 2003-10-14 Hewlett-Packard Development Company, L.P. Microelectromechanical device having a stiffened support beam, and methods of forming stiffened support beams in MEMS
US6696364B2 (en) 2001-10-19 2004-02-24 Stmicroelectronics S.R.L. Method for manipulating MEMS devices, integrated on a wafer semiconductor and intended to be diced one from the other, and relevant support
US6870581B2 (en) * 2001-10-30 2005-03-22 Sharp Laboratories Of America, Inc. Single panel color video projection display using reflective banded color falling-raster illumination
US6553809B1 (en) * 2001-11-01 2003-04-29 Plastic Technologies, Inc. Method and apparatus for detecting holes in plastic containers
JP4074502B2 (ja) 2001-12-12 2008-04-09 セイコーエプソン株式会社 表示装置用電源回路、表示装置及び電子機器
US6794119B2 (en) 2002-02-12 2004-09-21 Iridigm Display Corporation Method for fabricating a structure for a microelectromechanical systems (MEMS) device
JP3698108B2 (ja) * 2002-02-20 2005-09-21 株式会社デンソー 気密漏れ検査方法及び装置
US6574033B1 (en) 2002-02-27 2003-06-03 Iridigm Display Corporation Microelectromechanical systems device and method for fabricating same
US6753528B1 (en) 2002-04-18 2004-06-22 Kla-Tencor Technologies Corporation System for MEMS inspection and characterization
US20030202264A1 (en) 2002-04-30 2003-10-30 Weber Timothy L. Micro-mirror device
US6954297B2 (en) 2002-04-30 2005-10-11 Hewlett-Packard Development Company, L.P. Micro-mirror device including dielectrophoretic liquid
US6972882B2 (en) 2002-04-30 2005-12-06 Hewlett-Packard Development Company, L.P. Micro-mirror device with light angle amplification
US20040212026A1 (en) 2002-05-07 2004-10-28 Hewlett-Packard Company MEMS device having time-varying control
DE60319770T2 (de) 2002-05-29 2009-04-23 Imec Vzw, Interuniversitair Microelectronica Centrum Vzw Gerät und Verfahren, um die Leistung von Mikromaschinen oder mikroelektromechanischen Bauelementen zu bestimmen
JP2004029553A (ja) * 2002-06-27 2004-01-29 Pioneer Electronic Corp 表示パネルの駆動装置
US6741377B2 (en) * 2002-07-02 2004-05-25 Iridigm Display Corporation Device having a light-absorbing mask and a method for fabricating same
US6742384B2 (en) * 2002-07-02 2004-06-01 Carrier Corporation Trace gas management system for leak detection operations
EP1540317A4 (en) * 2002-08-29 2010-06-30 Norcom Systems Inc SYSTEM AND PROCESS FOR DETECTING LEAKS IN SEALED ARTICLES
TW544787B (en) * 2002-09-18 2003-08-01 Promos Technologies Inc Method of forming self-aligned contact structure with locally etched gate conductive layer
US6747785B2 (en) 2002-10-24 2004-06-08 Hewlett-Packard Development Company, L.P. MEMS-actuated color light modulator and methods
US6666561B1 (en) 2002-10-28 2003-12-23 Hewlett-Packard Development Company, L.P. Continuously variable analog micro-mirror device
US7370185B2 (en) 2003-04-30 2008-05-06 Hewlett-Packard Development Company, L.P. Self-packaged optical interference display device having anti-stiction bumps, integral micro-lens, and reflection-absorbing layers
JP2004184207A (ja) * 2002-12-03 2004-07-02 Toyota Motor Corp 漏洩ガス測定装置および漏洩ガス測定方法
US6741503B1 (en) 2002-12-04 2004-05-25 Texas Instruments Incorporated SLM display data address mapping for four bank frame buffer
US6763702B2 (en) * 2002-12-19 2004-07-20 Agilent Technologies, Inc. Method and apparatus for hermeticity determination and leak detection in semiconductor packaging
TWI289708B (en) 2002-12-25 2007-11-11 Qualcomm Mems Technologies Inc Optical interference type color display
TW559686B (en) 2002-12-27 2003-11-01 Prime View Int Co Ltd Optical interference type panel and the manufacturing method thereof
TW594155B (en) 2002-12-27 2004-06-21 Prime View Int Corp Ltd Optical interference type color display and optical interference modulator
US6851316B2 (en) * 2003-01-27 2005-02-08 The Boc Group, Inc. Apparatus and method for recovery and recycle of tracer gas from leak testing process with randomly varying demand
TW557395B (en) 2003-01-29 2003-10-11 Yen Sun Technology Corp Optical interference type reflection panel and the manufacturing method thereof
US20040147056A1 (en) 2003-01-29 2004-07-29 Mckinnell James C. Micro-fabricated device and method of making
TW200413810A (en) 2003-01-29 2004-08-01 Prime View Int Co Ltd Light interference display panel and its manufacturing method
US7205675B2 (en) 2003-01-29 2007-04-17 Hewlett-Packard Development Company, L.P. Micro-fabricated device with thermoelectric device and method of making
US6903487B2 (en) 2003-02-14 2005-06-07 Hewlett-Packard Development Company, L.P. Micro-mirror device with increased mirror tilt
TW200417806A (en) 2003-03-05 2004-09-16 Prime View Int Corp Ltd A structure of a light-incidence electrode of an optical interference display plate
US6844953B2 (en) 2003-03-12 2005-01-18 Hewlett-Packard Development Company, L.P. Micro-mirror device including dielectrophoretic liquid
US20040206953A1 (en) 2003-04-16 2004-10-21 Robert Morena Hermetically sealed glass package and method of fabrication
TWI226504B (en) 2003-04-21 2005-01-11 Prime View Int Co Ltd A structure of an interference display cell
TWI224235B (en) 2003-04-21 2004-11-21 Prime View Int Co Ltd A method for fabricating an interference display cell
TW567355B (en) 2003-04-21 2003-12-21 Prime View Int Co Ltd An interference display cell and fabrication method thereof
TW594360B (en) 2003-04-21 2004-06-21 Prime View Int Corp Ltd A method for fabricating an interference display cell
US7358966B2 (en) 2003-04-30 2008-04-15 Hewlett-Packard Development Company L.P. Selective update of micro-electromechanical device
US6829132B2 (en) * 2003-04-30 2004-12-07 Hewlett-Packard Development Company, L.P. Charge control of micro-electromechanical device
US6741384B1 (en) 2003-04-30 2004-05-25 Hewlett-Packard Development Company, L.P. Control of MEMS and light modulator arrays
US6853476B2 (en) 2003-04-30 2005-02-08 Hewlett-Packard Development Company, L.P. Charge control circuit for a micro-electromechanical device
US7400489B2 (en) 2003-04-30 2008-07-15 Hewlett-Packard Development Company, L.P. System and a method of driving a parallel-plate variable micro-electromechanical capacitor
US7072093B2 (en) 2003-04-30 2006-07-04 Hewlett-Packard Development Company, L.P. Optical interference pixel display with charge control
US6819469B1 (en) 2003-05-05 2004-11-16 Igor M. Koba High-resolution spatial light modulator for 3-dimensional holographic display
US7218499B2 (en) 2003-05-14 2007-05-15 Hewlett-Packard Development Company, L.P. Charge control circuit
TW570896B (en) * 2003-05-26 2004-01-11 Prime View Int Co Ltd A method for fabricating an interference display cell
TW591716B (en) * 2003-05-26 2004-06-11 Prime View Int Co Ltd A structure of a structure release and manufacturing the same
US6917459B2 (en) 2003-06-03 2005-07-12 Hewlett-Packard Development Company, L.P. MEMS device and method of forming MEMS device
US6811267B1 (en) 2003-06-09 2004-11-02 Hewlett-Packard Development Company, L.P. Display system with nonvisible data projection
EP1631805B1 (en) * 2003-06-11 2016-07-20 Agilent Technologies, Inc. Methods and apparatus for leak detection by the accumulation method
WO2004111598A1 (en) * 2003-06-11 2004-12-23 Varian, Inc. Methods and apparatus for detection of large leaks in sealed articles
US7221495B2 (en) 2003-06-24 2007-05-22 Idc Llc Thin film precursor stack for MEMS manufacturing
US7190380B2 (en) * 2003-09-26 2007-03-13 Hewlett-Packard Development Company, L.P. Generating and displaying spatially offset sub-frames
US7173314B2 (en) * 2003-08-13 2007-02-06 Hewlett-Packard Development Company, L.P. Storage device having a probe and a storage cell with moveable parts
TWI251712B (en) * 2003-08-15 2006-03-21 Prime View Int Corp Ltd Interference display plate
TWI305599B (en) * 2003-08-15 2009-01-21 Qualcomm Mems Technologies Inc Interference display panel and method thereof
TW200506479A (en) * 2003-08-15 2005-02-16 Prime View Int Co Ltd Color changeable pixel for an interference display
TW593127B (en) * 2003-08-18 2004-06-21 Prime View Int Co Ltd Interference display plate and manufacturing method thereof
TWI231865B (en) * 2003-08-26 2005-05-01 Prime View Int Co Ltd An interference display cell and fabrication method thereof
US20050057442A1 (en) * 2003-08-28 2005-03-17 Olan Way Adjacent display of sequential sub-images
TWI230801B (en) 2003-08-29 2005-04-11 Prime View Int Co Ltd Reflective display unit using interferometric modulation and manufacturing method thereof
TWI232333B (en) * 2003-09-03 2005-05-11 Prime View Int Co Ltd Display unit using interferometric modulation and manufacturing method thereof
US6982820B2 (en) * 2003-09-26 2006-01-03 Prime View International Co., Ltd. Color changeable pixel
TW593126B (en) 2003-09-30 2004-06-21 Prime View Int Co Ltd A structure of a micro electro mechanical system and manufacturing the same
US20050068583A1 (en) * 2003-09-30 2005-03-31 Gutkowski Lawrence J. Organizing a digital image
US6861277B1 (en) * 2003-10-02 2005-03-01 Hewlett-Packard Development Company, L.P. Method of forming MEMS device
US7051577B2 (en) * 2003-12-12 2006-05-30 Radiaulics, Inc. Multi-functional leak detection instrument along with sensor mounting assembly and methodology utilizing the same
US6822742B1 (en) * 2003-12-19 2004-11-23 Eastman Kodak Company System and method for remote quantitative detection of fluid leaks from a natural gas or oil pipeline
TWI235345B (en) 2004-01-20 2005-07-01 Prime View Int Co Ltd A structure of an optical interference display unit
TWI256941B (en) 2004-02-18 2006-06-21 Qualcomm Mems Technologies Inc A micro electro mechanical system display cell and method for fabricating thereof
TW200530669A (en) 2004-03-05 2005-09-16 Prime View Int Co Ltd Interference display plate and manufacturing method thereof
TWI261683B (en) 2004-03-10 2006-09-11 Qualcomm Mems Technologies Inc Interference reflective element and repairing method thereof
US7476327B2 (en) 2004-05-04 2009-01-13 Idc, Llc Method of manufacture for microelectromechanical devices
US7327510B2 (en) * 2004-09-27 2008-02-05 Idc, Llc Process for modifying offset voltage characteristics of an interferometric modulator
US20070080695A1 (en) * 2005-10-11 2007-04-12 Morrell Gary A Testing system and method for a MEMS sensor

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US20080066524A1 (en) 2008-03-20
EP1640698A2 (en) 2006-03-29
BRPI0503886A (pt) 2006-05-09
CA2512922A1 (en) 2006-03-27
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US7299681B2 (en) 2007-11-27
US20060065043A1 (en) 2006-03-30

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