MX2018003586A - Sistema y metodo para probar la degradacion del dispositivo fotosensible. - Google Patents
Sistema y metodo para probar la degradacion del dispositivo fotosensible.Info
- Publication number
- MX2018003586A MX2018003586A MX2018003586A MX2018003586A MX2018003586A MX 2018003586 A MX2018003586 A MX 2018003586A MX 2018003586 A MX2018003586 A MX 2018003586A MX 2018003586 A MX2018003586 A MX 2018003586A MX 2018003586 A MX2018003586 A MX 2018003586A
- Authority
- MX
- Mexico
- Prior art keywords
- photosensitive device
- light
- test
- intensity
- photosensitive
- Prior art date
Links
- 230000015556 catabolic process Effects 0.000 title 1
- 238000006731 degradation reaction Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 238000005259 measurement Methods 0.000 abstract 2
- 230000007613 environmental effect Effects 0.000 abstract 1
- 238000012800 visualization Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S99/00—Subject matter not provided for in other groups of this subclass
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
- H02S50/15—Testing of PV devices, e.g. of PV modules or single PV cells using optical means, e.g. using electroluminescence
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Circuit Arrangement For Electric Light Sources In General (AREA)
- Photovoltaic Devices (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Debugging And Monitoring (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
El rendimiento de dispositivos fotosensibles a lo largo del tiempo puede probarse al configurar un sistema de prueba del dispositivo fotosensible que incluye una placa de fuente de luz que expone los dispositivos fotosensibles dentro de un contenedor a una intensidad de luz específica. La intensidad de la luz puede ajustarse por una fuente de energía programable de acuerdo con uno o más umbrales. Una prueba puede durar al menos una duración establecida con mediciones de rendimiento tomadas a intervalos predeterminados a travós de la duración. La realimentación del sistema de prueba del dispositivo fotosensible se puede registrar para determinar si se aumenta la intensidad de la luz, para detener la prueba, para continuar la prueba y si deben alterarse una o más condiciones ambientales. Las mediciones puede enviarse a un cliente para su análisis y visualización a un usuario.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201562232088P | 2015-09-24 | 2015-09-24 | |
| PCT/US2016/053806 WO2017053984A1 (en) | 2015-09-24 | 2016-09-26 | System and method for testing photosensitive device degradation |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| MX2018003586A true MX2018003586A (es) | 2018-07-06 |
| MX388217B MX388217B (es) | 2025-03-19 |
Family
ID=58387553
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| MX2018003586A MX388217B (es) | 2015-09-24 | 2016-09-26 | Sistema y método para probar la degradación del dispositivo fotosensible. |
| MX2021014474A MX2021014474A (es) | 2015-09-24 | 2016-09-26 | Sistema y metodo para probar degradacion de dispositivo fotosensible. |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| MX2021014474A MX2021014474A (es) | 2015-09-24 | 2016-09-26 | Sistema y metodo para probar degradacion de dispositivo fotosensible. |
Country Status (13)
| Country | Link |
|---|---|
| US (5) | US9831829B2 (es) |
| EP (3) | EP3958461B8 (es) |
| JP (4) | JP6738051B2 (es) |
| KR (4) | KR102456604B1 (es) |
| CN (2) | CN110690856B (es) |
| AU (3) | AU2016325716B2 (es) |
| BR (1) | BR112018005784B1 (es) |
| CA (2) | CA3022433C (es) |
| ES (2) | ES2955826T3 (es) |
| MX (2) | MX388217B (es) |
| MY (1) | MY185260A (es) |
| PL (1) | PL3353890T3 (es) |
| WO (1) | WO2017053984A1 (es) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
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| ES2823182T3 (es) | 2016-07-19 | 2021-05-06 | Autronica Fire & Security As | Sistema y método de verificación de la integridad operativa de un detector de humo |
| CN109918045A (zh) * | 2019-02-28 | 2019-06-21 | 徐文婷 | 一种改进的光量子随机数产生的实现方法 |
| CN109918046A (zh) * | 2019-02-28 | 2019-06-21 | 徐文婷 | 一种改进的基于光学的量子随机数产生的装置 |
| EP3726810B1 (en) * | 2019-04-16 | 2023-12-06 | ABB Schweiz AG | System and method for interoperable communication of automation system components |
| WO2021108774A1 (en) * | 2019-11-27 | 2021-06-03 | Hunt Perovskite Technologies, L.L.C. | Reusable interface for solar cell test and characterization |
| CN113205780B (zh) * | 2021-04-16 | 2022-08-30 | 广州朗国电子科技股份有限公司 | 一种一体机集成i2c光感模块的适配方法和系统 |
| IL309370B2 (en) | 2021-06-16 | 2025-07-01 | Conti Spe Llc | Mechanically stacked solar transmissive cells or modules |
| CN116466268B (zh) * | 2023-06-19 | 2024-06-07 | 力高(山东)新能源技术股份有限公司 | 一种光敏传感器的故障检测方法、系统及设备 |
| US12414402B1 (en) | 2025-01-03 | 2025-09-09 | Conti Innovation Center, Llc | Optimizing cadmium (CD) alloy solar cells with sputtered copper-dopped zinc telluride (ZNTE:CU) back contacts in the presence of hydrogen |
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| US5689340A (en) * | 1995-12-06 | 1997-11-18 | Eastman Kodak Company | Apparatus and method for measuring alignment in lenticular media |
| US6714296B2 (en) | 2001-10-25 | 2004-03-30 | Fuji Photo Film. Co., Ltd. | Method and apparatus for inspecting photosensitive material for surface defects |
| US6861686B2 (en) * | 2003-01-16 | 2005-03-01 | Samsung Electronics Co., Ltd. | Structure of a CMOS image sensor and method for fabricating the same |
| US7215361B2 (en) * | 2003-09-17 | 2007-05-08 | Micron Technology, Inc. | Method for automated testing of the modulation transfer function in image sensors |
| US20060234398A1 (en) * | 2005-04-15 | 2006-10-19 | International Business Machines Corporation | Single ic-chip design on wafer with an embedded sensor utilizing rf capabilities to enable real-time data transmission |
| US20090084436A1 (en) * | 2005-06-02 | 2009-04-02 | The Regents Of The University Of California | Effective organic solar cells based on triplet materials |
| JP5054326B2 (ja) * | 2006-05-01 | 2012-10-24 | 昭和シェル石油株式会社 | Cis系薄膜太陽電池モジュールの改良された耐久性試験方法 |
| CN101688893B (zh) * | 2007-04-19 | 2012-08-08 | 欧瑞康太阳能股份公司(特吕巴赫) | 用于薄膜太阳能电池模块的自动质量控制的测试设备 |
| JP2009043987A (ja) * | 2007-08-09 | 2009-02-26 | Toyota Motor Corp | 太陽電池モジュールの故障診断装置 |
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2016
- 2016-09-26 EP EP21180168.3A patent/EP3958461B8/en active Active
- 2016-09-26 ES ES21180168T patent/ES2955826T3/es active Active
- 2016-09-26 BR BR112018005784-3A patent/BR112018005784B1/pt active IP Right Grant
- 2016-09-26 EP EP16849881.4A patent/EP3353890B1/en active Active
- 2016-09-26 MY MYPI2018701149A patent/MY185260A/en unknown
- 2016-09-26 US US15/276,378 patent/US9831829B2/en active Active
- 2016-09-26 WO PCT/US2016/053806 patent/WO2017053984A1/en not_active Ceased
- 2016-09-26 KR KR1020217042702A patent/KR102456604B1/ko active Active
- 2016-09-26 CN CN201910950664.7A patent/CN110690856B/zh active Active
- 2016-09-26 ES ES16849881T patent/ES2895514T3/es active Active
- 2016-09-26 AU AU2016325716A patent/AU2016325716B2/en active Active
- 2016-09-26 CN CN201680065103.3A patent/CN108352809B/zh active Active
- 2016-09-26 EP EP23192024.0A patent/EP4290765A3/en active Pending
- 2016-09-26 PL PL16849881T patent/PL3353890T3/pl unknown
- 2016-09-26 KR KR1020197022257A patent/KR102345502B1/ko active Active
- 2016-09-26 KR KR1020227035896A patent/KR102567433B1/ko active Active
- 2016-09-26 JP JP2018515498A patent/JP6738051B2/ja active Active
- 2016-09-26 CA CA3022433A patent/CA3022433C/en active Active
- 2016-09-26 MX MX2018003586A patent/MX388217B/es unknown
- 2016-09-26 KR KR1020187011241A patent/KR20180049123A/ko not_active Ceased
- 2016-09-26 CA CA2999939A patent/CA2999939C/en active Active
- 2016-09-26 MX MX2021014474A patent/MX2021014474A/es unknown
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2017
- 2017-11-27 US US15/822,349 patent/US9985583B2/en active Active
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2018
- 2018-05-25 US US15/989,530 patent/US10797641B2/en active Active
- 2018-06-14 AU AU2018204249A patent/AU2018204249B2/en active Active
- 2018-10-17 AU AU2018250421A patent/AU2018250421B2/en active Active
- 2018-11-02 JP JP2018207151A patent/JP6905303B2/ja active Active
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2020
- 2020-09-18 JP JP2020157804A patent/JP7032498B2/ja active Active
- 2020-10-05 US US17/063,157 patent/US11387779B2/en active Active
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2022
- 2022-02-24 JP JP2022026521A patent/JP2022060487A/ja active Pending
- 2022-06-09 US US17/836,944 patent/US11863122B2/en active Active
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