MX2018001490A - Three-dimensional measurement device. - Google Patents
Three-dimensional measurement device.Info
- Publication number
- MX2018001490A MX2018001490A MX2018001490A MX2018001490A MX2018001490A MX 2018001490 A MX2018001490 A MX 2018001490A MX 2018001490 A MX2018001490 A MX 2018001490A MX 2018001490 A MX2018001490 A MX 2018001490A MX 2018001490 A MX2018001490 A MX 2018001490A
- Authority
- MX
- Mexico
- Prior art keywords
- stripe pattern
- pixel
- dimensional measurement
- printed substrate
- substrate
- Prior art date
Links
- 238000005259 measurement Methods 0.000 title abstract 4
- 239000000758 substrate Substances 0.000 abstract 5
- 238000007689 inspection Methods 0.000 abstract 2
- 238000005286 illumination Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 230000010363 phase shift Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2518—Projection by scanning of the object
- G01B11/2527—Projection by scanning of the object with phase change by in-plane movement of the patern
Landscapes
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Provided is a three-dimensional measurement device that makes it possible to dramatically increase measurement accuracy when making a three-dimensional measurement using the phase shift method. A substrate inspection device 1 is provided with the following: an illumination device 4 that projects a predetermined stripe pattern from the oblique upper direction onto the surface of a printed substrate 2; a camera 5 that captures images of the portion atop the printed substrate 2 where the stripe pattern is projected; and a control device 6 that performs various types of control, image processing, and arithmetic processing inside the substrate inspection device 1. Further, the stripe pattern projected onto the printed substrate 2 is moved, the moving stripe pattern is imaged multiple times, the brightness values of each pixel in a series of captured image data items are added together, for every pixel, and an average value for each pixel is calculated.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015231661A JP6062523B1 (en) | 2015-11-27 | 2015-11-27 | 3D measuring device |
| PCT/JP2016/070238 WO2017090268A1 (en) | 2015-11-27 | 2016-07-08 | Three-dimensional measurement device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| MX2018001490A true MX2018001490A (en) | 2018-08-01 |
| MX366402B MX366402B (en) | 2019-07-08 |
Family
ID=57800032
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| MX2018001490A MX366402B (en) | 2015-11-27 | 2016-07-08 | Three-dimensional measurement device. |
Country Status (6)
| Country | Link |
|---|---|
| JP (1) | JP6062523B1 (en) |
| CN (1) | CN107923736B (en) |
| DE (1) | DE112016005425T5 (en) |
| MX (1) | MX366402B (en) |
| TW (1) | TWI610061B (en) |
| WO (1) | WO2017090268A1 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7371443B2 (en) * | 2019-10-28 | 2023-10-31 | 株式会社デンソーウェーブ | 3D measuring device |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4701948B2 (en) * | 2005-09-21 | 2011-06-15 | オムロン株式会社 | Pattern light irradiation device, three-dimensional shape measurement device, and pattern light irradiation method |
| JP4688625B2 (en) * | 2005-10-18 | 2011-05-25 | 株式会社山武 | 3D measuring apparatus, 3D measuring method, and 3D measuring program |
| CN100561258C (en) * | 2008-02-01 | 2009-11-18 | 黑龙江科技学院 | A phase-shift grating in a three-dimensional measurement system |
| DE202010018585U1 (en) * | 2009-05-27 | 2017-11-28 | Koh Young Technology Inc. | Device for measuring a three-dimensional shape |
| JP2013124938A (en) * | 2011-12-15 | 2013-06-24 | Ckd Corp | Three-dimensional measuring device |
| JP5643241B2 (en) * | 2012-02-14 | 2014-12-17 | Ckd株式会社 | 3D measuring device |
| JP6346427B2 (en) * | 2013-10-30 | 2018-06-20 | キヤノン株式会社 | Image processing apparatus and image processing method |
-
2015
- 2015-11-27 JP JP2015231661A patent/JP6062523B1/en active Active
-
2016
- 2016-05-31 TW TW105116968A patent/TWI610061B/en active
- 2016-07-08 MX MX2018001490A patent/MX366402B/en active IP Right Grant
- 2016-07-08 CN CN201680046181.9A patent/CN107923736B/en active Active
- 2016-07-08 WO PCT/JP2016/070238 patent/WO2017090268A1/en not_active Ceased
- 2016-07-08 DE DE112016005425.4T patent/DE112016005425T5/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| TWI610061B (en) | 2018-01-01 |
| DE112016005425T5 (en) | 2018-08-16 |
| CN107923736B (en) | 2020-01-24 |
| WO2017090268A1 (en) | 2017-06-01 |
| TW201719112A (en) | 2017-06-01 |
| JP2017096866A (en) | 2017-06-01 |
| JP6062523B1 (en) | 2017-01-18 |
| CN107923736A (en) | 2018-04-17 |
| MX366402B (en) | 2019-07-08 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FG | Grant or registration |