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MX2017016137A - Metodo y aparato para analizar una superficie de un neumatico. - Google Patents

Metodo y aparato para analizar una superficie de un neumatico.

Info

Publication number
MX2017016137A
MX2017016137A MX2017016137A MX2017016137A MX2017016137A MX 2017016137 A MX2017016137 A MX 2017016137A MX 2017016137 A MX2017016137 A MX 2017016137A MX 2017016137 A MX2017016137 A MX 2017016137A MX 2017016137 A MX2017016137 A MX 2017016137A
Authority
MX
Mexico
Prior art keywords
scheme
subsection
region
large number
regions
Prior art date
Application number
MX2017016137A
Other languages
English (en)
Other versions
MX373372B (es
Inventor
Ballardini Valeriano
Regoli Fabio
Boffa Vincenzo
Ghidotti Piovan Alessandro
Di Stefano Luigi
Original Assignee
Pirelli
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pirelli filed Critical Pirelli
Publication of MX2017016137A publication Critical patent/MX2017016137A/es
Publication of MX373372B publication Critical patent/MX373372B/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M17/00—Testing of vehicles
    • G01M17/007—Wheeled or endless-tracked vehicles
    • G01M17/02—Tyres
    • G01M17/027—Tyres using light, e.g. infrared, ultraviolet or holographic techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95607—Inspecting patterns on the surface of objects using a comparative method
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10141—Special mode during image acquisition
    • G06T2207/10152—Varying illumination
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20036—Morphological image processing
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20212—Image combination
    • G06T2207/20216—Image averaging
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20212—Image combination
    • G06T2207/20224—Image subtraction

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Signal Processing (AREA)
  • Quality & Reliability (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)

Abstract

Método y aparato relacionado para analizar una superficie de una llanta, incluyendo: adquirir una o más imágenes digitales de una sección de superficie teniendo un patrón que consta de un esquema que es repetido sustancialmente igual en una gran cantidad de posiciones; identificar una gran cantidad de primeras regiones de una o más imágenes digitales, cada una correspondiendo a una respectiva subsección de esquema; identificar una respectiva gran cantidad de regiones homólogas a cada primera región, en donde la respectiva subsección de esquema es sustancialmente idéntica a la respectiva subsección de esquema de cada primera región; calcular un modelo de la respectiva subsección de esquema, donde cada pixel está asociado con un valor medio de los valores asociados con los pixeles de cada primera región y de las respectivas regiones homólogas que tienen las mismas coordenadas relativas de cada pixel; obtener un modelo de patrón usando los modelos calculados de la subsección de esquema.
MX2017016137A 2015-06-30 2016-06-21 Método y aparato para analizar una superficie de un neumático. MX373372B (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
ITUB20151774 2015-06-30
PCT/IB2016/053679 WO2017001969A1 (en) 2015-06-30 2016-06-21 Method and apparatus for analysing a surface of a tyre

Publications (2)

Publication Number Publication Date
MX2017016137A true MX2017016137A (es) 2018-06-18
MX373372B MX373372B (es) 2020-04-16

Family

ID=54199992

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2017016137A MX373372B (es) 2015-06-30 2016-06-21 Método y aparato para analizar una superficie de un neumático.

Country Status (6)

Country Link
US (1) US10845271B2 (es)
EP (1) EP3317855B1 (es)
CN (1) CN107771341B (es)
MX (1) MX373372B (es)
RU (1) RU2707723C2 (es)
WO (1) WO2017001969A1 (es)

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Also Published As

Publication number Publication date
CN107771341B (zh) 2022-01-11
MX373372B (es) 2020-04-16
CN107771341A (zh) 2018-03-06
RU2707723C2 (ru) 2019-11-28
US10845271B2 (en) 2020-11-24
RU2018101232A3 (es) 2019-09-30
US20180172557A1 (en) 2018-06-21
EP3317855A1 (en) 2018-05-09
RU2018101232A (ru) 2019-07-31
EP3317855B1 (en) 2020-08-05
WO2017001969A1 (en) 2017-01-05

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