MX2016011345A - Sonda de voltaje diferencial aislada para fuente de ruido emi. - Google Patents
Sonda de voltaje diferencial aislada para fuente de ruido emi.Info
- Publication number
- MX2016011345A MX2016011345A MX2016011345A MX2016011345A MX2016011345A MX 2016011345 A MX2016011345 A MX 2016011345A MX 2016011345 A MX2016011345 A MX 2016011345A MX 2016011345 A MX2016011345 A MX 2016011345A MX 2016011345 A MX2016011345 A MX 2016011345A
- Authority
- MX
- Mexico
- Prior art keywords
- differential voltage
- voltage probe
- noise source
- probe
- emi noise
- Prior art date
Links
- 239000000523 sample Substances 0.000 title abstract 5
- 238000005259 measurement Methods 0.000 abstract 2
- 238000002955 isolation Methods 0.000 abstract 1
- 238000004804 winding Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/18—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
- G01R15/183—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers using transformers with a magnetic core
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
- G01R17/02—Arrangements in which the value to be measured is automatically compared with a reference value
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0878—Sensors; antennas; probes; detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
Se divulga que una sonda de voltaje diferencial para proporcionar mediciones exactas de voltaje diferencial con componentes de frecuencia alta está configurada, además, para identificar con exactitud fuentes de ruido en aplicaciones de EMI/EMC. La sonda de voltaje diferencial está configurada para proporcionar los beneficios del ancho de banda de medición de voltaje diferencial adecuado, capacidad de aislamiento galvánico, CMRR alta, diseño flexible para adaptarse a diversas necesidades en cuanto al voltaje nominal, el efecto de carga y al rango de frecuencia de interés, y/o fácil implementación y bajo costo. La sonda de voltaje diferencial es capaz de lograr estas características optimizadas implementando diseños de arrollamientos únicos para transformadores usados en el diseño de circuitos de la sonda de voltaje diferencial.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US14/846,521 US10067165B2 (en) | 2015-09-04 | 2015-09-04 | Isolated differential voltage probe for EMI noise source |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| MX2016011345A true MX2016011345A (es) | 2017-05-04 |
Family
ID=57140089
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| MX2016011345A MX2016011345A (es) | 2015-09-04 | 2016-09-02 | Sonda de voltaje diferencial aislada para fuente de ruido emi. |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US10067165B2 (es) |
| CN (1) | CN106501562B (es) |
| DE (1) | DE102016115957A1 (es) |
| GB (1) | GB2542502A (es) |
| MX (1) | MX2016011345A (es) |
| RU (1) | RU2016135036A (es) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10302676B2 (en) * | 2016-03-18 | 2019-05-28 | Tektronix, Inc. | Flexible resistive tip cable assembly for differential probing |
| US11187723B2 (en) * | 2016-10-31 | 2021-11-30 | Rohde & Schwarz Gmbh & Co. Kg | Differential test probe |
| EP3404427B1 (en) | 2017-05-18 | 2024-11-13 | Rohde & Schwarz GmbH & Co. KG | Electrical test and measurement device, measurement extension device as well as test and measurement system |
| US11290291B2 (en) * | 2018-07-31 | 2022-03-29 | Analog Devices International Unlimited Company | Power over data lines system with combined dc coupling and common mode termination circuitry |
| CN109031166B (zh) * | 2018-08-09 | 2019-12-27 | 大连理工大学 | 一种磁探针装置 |
| US11418369B2 (en) * | 2019-08-01 | 2022-08-16 | Analog Devices International Unlimited Company | Minimizing DC bias voltage difference across AC-blocking capacitors in PoDL system |
| CN110910271B (zh) * | 2019-09-29 | 2021-07-06 | 浙江大学 | 一种基于功耗和emi的电力终端指纹构建方法 |
Family Cites Families (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3986116A (en) | 1975-01-27 | 1976-10-12 | The United States Of America As Represented By The Secretary Of The Navy | Transient source and direction of propagation detector |
| CH592879A5 (es) | 1976-03-15 | 1977-11-15 | Bbc Brown Boveri & Cie | |
| US4949030A (en) | 1987-08-05 | 1990-08-14 | Astec International Limited | Isolated analog voltage sense circuit |
| US4879507A (en) | 1988-12-23 | 1989-11-07 | American Telephone And Telegraph Company | Noise measurement probe |
| JP3649457B2 (ja) * | 1994-06-30 | 2005-05-18 | アジレント・テクノロジーズ・インク | 電磁誘導式プローブ、インピーダンス測定装置、校正方法、および、校正用治具 |
| US5517154A (en) * | 1995-01-13 | 1996-05-14 | Tektronix, Inc. | Split-path linear isolation circuit apparatus and method |
| US6028423A (en) | 1997-12-11 | 2000-02-22 | Sanchez; Jorge | Isolation instrument for electrical testing |
| JP2002208527A (ja) * | 2001-01-12 | 2002-07-26 | Toko Inc | 漏れ磁束型電力変換トランス |
| GB2406910A (en) | 2003-10-08 | 2005-04-13 | Weston Aerospace | Probe for detecting movement and speed or torque of magnetic objects |
| US6841986B1 (en) | 2003-12-08 | 2005-01-11 | Dell Products L.P. | Inductively coupled direct contact test probe |
| US7242176B2 (en) * | 2004-12-20 | 2007-07-10 | Dell Products, L.P. | Systems and methods for evaluating electromagnetic interference |
| US7309980B2 (en) | 2006-05-08 | 2007-12-18 | Tektronix, Inc. | Current sensing circuit for use in a current measurement probe |
| US7294995B1 (en) | 2006-05-08 | 2007-11-13 | Tektronix, Inc. | Current probing system |
| US7952375B2 (en) * | 2006-06-06 | 2011-05-31 | Formfactor, Inc. | AC coupled parameteric test probe |
| WO2009036989A1 (en) | 2007-09-21 | 2009-03-26 | Inphynix | Physical quantity measuring unit and sensor for non-contact electric or magnetic field measurements |
| US7898376B2 (en) * | 2008-05-20 | 2011-03-01 | Sercomm Corporation | Transformer apparatus with shielding architecture and shielding method thereof |
| US8089266B2 (en) | 2008-08-06 | 2012-01-03 | Robert Bosch Gmbh | Measuring induced currents on a CAN bus |
| CN101458284A (zh) | 2008-12-30 | 2009-06-17 | 南京师范大学 | 传导性电磁干扰噪声的共模噪声和差模噪声分离器 |
| WO2010098123A1 (ja) * | 2009-02-26 | 2010-09-02 | パナソニック株式会社 | 電動機およびそれを備えた電気機器 |
| WO2014083073A1 (de) * | 2012-11-27 | 2014-06-05 | Eaton Electrical Ip Gmbh & Co. Kg | Schaltgerät mit einer messeinrichtung |
| US8693528B1 (en) | 2012-11-30 | 2014-04-08 | Nxp B.V. | Common mode suppression circuit |
| CN103884887A (zh) * | 2012-12-20 | 2014-06-25 | 北京普源精电科技有限公司 | 一种具有霍尔元件的隔离电路及其示波器 |
| US9188606B2 (en) * | 2013-04-29 | 2015-11-17 | Keysight Technologies, Inc. | Oscilloscope current probe with interchangeable range and sensitivity setting modules |
| US9625495B2 (en) | 2013-08-22 | 2017-04-18 | Tektronix, Inc. | Isolated probe with digital multimeter or digital voltmeter |
| KR101522272B1 (ko) * | 2014-06-30 | 2015-05-21 | 엘에스산전 주식회사 | 회로 차단기의 중성 극 변류기 모듈 및 중성 극 전류 검출 장치 |
| US9722626B2 (en) * | 2015-01-05 | 2017-08-01 | General Electric Company | Method and system using computational sigma-delta modulators |
-
2015
- 2015-09-04 US US14/846,521 patent/US10067165B2/en active Active
-
2016
- 2016-08-26 DE DE102016115957.3A patent/DE102016115957A1/de not_active Withdrawn
- 2016-08-29 CN CN201610754397.2A patent/CN106501562B/zh active Active
- 2016-08-29 RU RU2016135036A patent/RU2016135036A/ru not_active Application Discontinuation
- 2016-09-01 GB GB1614875.1A patent/GB2542502A/en not_active Withdrawn
- 2016-09-02 MX MX2016011345A patent/MX2016011345A/es unknown
Also Published As
| Publication number | Publication date |
|---|---|
| US20170067940A1 (en) | 2017-03-09 |
| DE102016115957A1 (de) | 2017-03-09 |
| RU2016135036A (ru) | 2018-03-05 |
| GB2542502A (en) | 2017-03-22 |
| GB201614875D0 (en) | 2016-10-19 |
| CN106501562A (zh) | 2017-03-15 |
| CN106501562B (zh) | 2021-06-29 |
| US10067165B2 (en) | 2018-09-04 |
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