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MX2009001912A - Sistema de inspeccion en linea para perfileria vertical de recipientes plasticos usando fuentes de luz de espectro discreto de longitud de onda multiple. - Google Patents

Sistema de inspeccion en linea para perfileria vertical de recipientes plasticos usando fuentes de luz de espectro discreto de longitud de onda multiple.

Info

Publication number
MX2009001912A
MX2009001912A MX2009001912A MX2009001912A MX2009001912A MX 2009001912 A MX2009001912 A MX 2009001912A MX 2009001912 A MX2009001912 A MX 2009001912A MX 2009001912 A MX2009001912 A MX 2009001912A MX 2009001912 A MX2009001912 A MX 2009001912A
Authority
MX
Mexico
Prior art keywords
photodetectors
container
inspection system
light sources
line inspection
Prior art date
Application number
MX2009001912A
Other languages
English (en)
Inventor
William E Schmidt
Georg V Wolfe
Original Assignee
American Glass Res
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Glass Res filed Critical American Glass Res
Publication of MX2009001912A publication Critical patent/MX2009001912A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
    • G01B11/0633—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection using one or more discrete wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9081—Inspection especially designed for plastic containers, e.g. preforms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G01N2021/3181—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths using LEDs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Blow-Moulding Or Thermoforming Of Plastics Or The Like (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

Se describen sistemas y métodos para la inspección en línea de recipientes de plástico moldeados por soplado. El sistema de inspección puede comprender una pluralidad de ensambles emisores configurados en un arreglo vertical. Cada ensamble emisor puede emitir cíclicamente energía de luz en al menos dos bandas de longitud de onda estrechada diferentes en un recipiente, cuando el recipiente pasa a través de un área de inspección. El sistema puede comprender también una pluralidad de fotodetectores de banda ancha configurados en un arreglo vertical, cada fotodetector de cara a al menos uno de los ensambles del emisor con un área de inspección entre ellos tal que los fotodetectores puedan detectar la energía de luz que pasa a través del recipiente cuando está en el área de inspección. El sistema puede comprender también un procesador en comunicación con los fotodetectores para determinar una característica del recipiente con base en las señales de los fotodetectores.
MX2009001912A 2006-09-01 2007-08-31 Sistema de inspeccion en linea para perfileria vertical de recipientes plasticos usando fuentes de luz de espectro discreto de longitud de onda multiple. MX2009001912A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US84195406P 2006-09-01 2006-09-01
PCT/US2007/019230 WO2008027569A2 (en) 2006-09-01 2007-08-31 In-line inspection system for vertically profiling plastic containers using multiple wavelength discrete spectral light sources

Publications (1)

Publication Number Publication Date
MX2009001912A true MX2009001912A (es) 2009-05-28

Family

ID=39136639

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2009001912A MX2009001912A (es) 2006-09-01 2007-08-31 Sistema de inspeccion en linea para perfileria vertical de recipientes plasticos usando fuentes de luz de espectro discreto de longitud de onda multiple.

Country Status (7)

Country Link
US (2) US7924421B2 (es)
EP (1) EP2067003B1 (es)
JP (1) JP5271908B2 (es)
KR (1) KR101389582B1 (es)
CN (1) CN101578495B (es)
MX (1) MX2009001912A (es)
WO (1) WO2008027569A2 (es)

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Also Published As

Publication number Publication date
US8208141B2 (en) 2012-06-26
US20120018925A1 (en) 2012-01-26
JP2010502952A (ja) 2010-01-28
JP5271908B2 (ja) 2013-08-21
CN101578495A (zh) 2009-11-11
CN101578495B (zh) 2011-11-09
KR20090043522A (ko) 2009-05-06
KR101389582B1 (ko) 2014-04-25
WO2008027569A3 (en) 2008-07-10
EP2067003A4 (en) 2015-12-30
EP2067003A2 (en) 2009-06-10
WO2008027569A2 (en) 2008-03-06
US20090278286A1 (en) 2009-11-12
US7924421B2 (en) 2011-04-12
EP2067003B1 (en) 2020-04-29

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