[go: up one dir, main page]

Yang et al., 2003 - Google Patents

Current status and challenges of soc verification for embedded systems market

Yang et al., 2003

View PDF
Document ID
36716950161619269
Author
Yang W
Chung M
Kyung C
Publication year
Publication venue
IEEE International [Systems-on-Chip] SOC Conference, 2003. Proceedings.

External Links

Snippet

The SoC has become an indispensable solution in the embedded systems market. This tutorial introduces today's main issues of SoC design with a focus on the verification solutions proposed by EDA vendors and SoC developers. After the SoC platform based on …
Continue reading at www.researchgate.net (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5009—Computer-aided design using simulation
    • G06F17/5022—Logic simulation, e.g. for logic circuit operation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5009—Computer-aided design using simulation
    • G06F17/504—Formal methods
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5009—Computer-aided design using simulation
    • G06F17/5036—Computer-aided design using simulation for analog modelling, e.g. for circuits, spice programme, direct methods, relaxation methods
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/362—Software debugging
    • G06F11/3648—Software debugging using additional hardware
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5045—Circuit design
    • G06F17/5054—Circuit design for user-programmable logic devices, e.g. field programmable gate arrays [FPGA]
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/362—Software debugging
    • G06F11/3636—Software debugging by tracing the execution of the program
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequence
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequence by preliminary fault modelling, e.g. analysis, simulation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/34—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation; Recording or statistical evaluation of user activity, e.g. usability assessment
    • G06F11/3457—Performance evaluation by simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F2217/00—Indexing scheme relating to computer aided design [CAD]
    • G06F2217/86—Hardware-Software co-design
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F2217/00—Indexing scheme relating to computer aided design [CAD]
    • G06F2217/68—Processors
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F2217/00—Indexing scheme relating to computer aided design [CAD]
    • G06F2217/70—Fault tolerant, i.e. transient fault suppression
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F1/00—Details of data-processing equipment not covered by groups G06F3/00 - G06F13/00, e.g. cooling, packaging or power supply specially adapted for computer application
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F9/00—Arrangements for programme control, e.g. control unit
    • G06F9/06—Arrangements for programme control, e.g. control unit using stored programme, i.e. using internal store of processing equipment to receive and retain programme
    • G06F9/44—Arrangements for executing specific programmes
    • G06F9/455—Emulation; Software simulation, i.e. virtualisation or emulation of application or operating system execution engines

Similar Documents

Publication Publication Date Title
Chen et al. Challenges and trends in modern SoC design verification
US6530054B2 (en) Method and apparatus for test generation during circuit design
US6571373B1 (en) Simulator-independent system-on-chip verification methodology
Rashinkar et al. System-on-a-chip Verification: Methodology and Techniques
US7100133B1 (en) Computer system and method to dynamically generate system on a chip description files and verification information
US5933356A (en) Method and system for creating and verifying structural logic model of electronic design from behavioral description, including generation of logic and timing models
Ejlali et al. A hybrid fault injection approach based on simulation and emulation co-operation
Koczor et al. Verification approach based on emulation technology
Laeufer et al. Simulator independent coverage for rtl hardware languages
Liang et al. Python based testbench for coverage driven functional verification
Yang et al. Current status and challenges of soc verification for embedded systems market
US7584456B1 (en) Method and apparatus for debugging embedded systems having read only memory
US10740210B1 (en) Kernel tracing for a heterogeneous computing platform and data mining
Gao et al. Software and hardware co-verification technology based on virtual prototyping of RF SOC
US6868545B1 (en) Method for re-using system-on-chip verification software in an operating system
Bombieri et al. Hybrid, incremental assertion-based verification for TLM design flows
de Wit Comparison of Feature Verification and Directed Verification Coverage
Sjoholm et al. The need for Co-simulation in ASIC-verification
Akpan Model-based FPGA embedded-processor systems design methodologies: Modeling, syntheses, implementation and validation
Lahbib et al. An automatic ABV methodology enabling PSL assertions across SLD flow for SOCs modeled in SystemC
Lahbib et al. A new synchronization policy between PSL checkers and SystemC designs at transaction level
Ojala Automated uvm testbench generation
Wenwei et al. Study on a mixed verification strategy for IP-based soc design
Heikura High-Level verification methodology for UVMF-based C++ reference model testbench implementation
Díaz et al. Virtual Platform of FPGA based MPSoC for Power Electronics Applications: OS simulation