Lugo-Hernández et al., 2023 - Google Patents
Analysis of spurious peaks at series resonance in solidly mounted resonators by combined BVD-Mason modellingLugo-Hernández et al., 2023
View HTML- Document ID
- 3393093499984663964
- Author
- Lugo-Hernández E
- Mirea T
- Carmona J
- Clement M
- Olivares J
- Collado J
- Mateu J
- Publication year
- Publication venue
- Ultrasonics
External Links
Snippet
Abstract Solidly Mounted Resonators (SMRs) for high frequency RF filters and sensing applications often display spurious resonances that distort their frequency response. In this work, we try to identify the origin of spurious resonances accompanying the main series …
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/02—Analysing fluids
- G01N29/022—Fluid sensors based on micro-sensors, e.g. quartz crystal-microbalance [QCM], surface acoustic wave [SAW] devices, tuning forks, cantilevers, flexural plate wave [FPW] devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/02—Analysing fluids
- G01N29/036—Analysing fluids by measuring frequency or resonance of acoustic waves
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/15—Constructional features of resonators consisting of piezo-electric or electrostrictive material
- H03H9/17—Constructional features of resonators consisting of piezo-electric or electrostrictive material having a single resonator
- H03H9/171—Constructional features of resonators consisting of piezo-electric or electrostrictive material having a single resonator implemented with thin-film techniques, i.e. of the film bulk acoustic resonator [FBAR] type
- H03H9/172—Means for mounting on a substrate, i.e. means constituting the material interface confining the waves to a volume
- H03H9/174—Membranes
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02007—Details of bulk acoustic wave devices
- H03H9/02086—Means for compensation or elimination of undesirable effects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/025—Change of phase or condition
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/028—Material parameters
- G01N2291/02818—Density, viscosity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
- G01N2291/042—Wave modes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/028—Material parameters
- G01N2291/02827—Elastic parameters, strength or force
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/46—Filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/10—Number of transducers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
- G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Lugo-Hernández et al. | Analysis of spurious peaks at series resonance in solidly mounted resonators by combined BVD-Mason modelling | |
| Zhang et al. | Resonant spectrum method to characterize piezoelectric films in composite resonators | |
| Kuypers et al. | Intrinsic temperature compensation of aluminum nitride Lamb wave resonators for multiple-frequency references | |
| Zhang et al. | Micromachined acoustic resonant mass sensor | |
| Bjurström et al. | Temperature compensation of liquid FBAR sensors | |
| Colombo et al. | High-figure-of-merit X-cut lithium niobate MEMS resonators operating around 50 MHz for large passive voltage amplification in radio frequency applications | |
| US20060230833A1 (en) | Wireless oil filter sensor | |
| Villa-López et al. | Design and modelling of solidly mounted resonators for low-cost particle sensing | |
| Machado et al. | Generation and propagation of superhigh-frequency bulk acoustic waves in ga as | |
| Lozano et al. | Temperature characteristics of SAW resonators on Sc0. 26Al0. 74N/polycrystalline diamond heterostructures | |
| Munir et al. | Effects of compensating the temperature coefficient of frequency with the acoustic reflector layers on the overall performance of solidly mounted resonators | |
| Soluch et al. | Determination of mass density, dielectric, elastic, and piezoelectric constants of bulk GaN crystal | |
| Enlund et al. | Solidly mounted thin film electro-acoustic resonator utilizing a conductive Bragg reflector | |
| Pang et al. | Analytical and experimental study on the second harmonic mode response of a bulk acoustic wave resonator | |
| Mortada et al. | Analysis and optimization of acoustic wave micro-resonators integrating piezoelectric zinc oxide layers | |
| Hernandez et al. | Analysis of Spurious Peaks Due to Ohmic Losses in Solidly Mounted Resonators by Combined Bvd-Mason Modelling | |
| Zhang et al. | Parameter characterization of high-overtone bulk acoustic resonators by resonant spectrum method | |
| Lucklum et al. | Thin film shear modulus determination with quartz crystal resonators: a review | |
| Lugo-Hernández et al. | Modified Mason’s and BVD models for analysis of spurious modes due to ohmic losses in BAW resonators | |
| Patel et al. | FEM modeling of solidly mounted film bulk acoustic resonator and gas sensor using PIB-sensitive layer | |
| Pang et al. | Analytical and experimental study on second harmonic response of FBAR for oscillator applications above 2GHz | |
| US8076999B2 (en) | Electroacoustic resonator, filter, duplexer and method for determining parameters of a resonator | |
| Kvashnin et al. | Peculiarities of microwave Lamb wave excitation in composite SAW resonator based on diamond substrate | |
| Bahr et al. | Determination of the Electromechanical Coupling Coefficient of Thin‐Film Cadmium Sulphide | |
| RU2349925C1 (en) | Measurement method for electromechanical coupling constant of piezoelectric material |