Park et al., 2007 - Google Patents
A wide dynamic-range CMOS image sensor using self-reset techniquePark et al., 2007
- Document ID
- 2620471507159920601
- Author
- Park D
- Rhee J
- Joo Y
- Publication year
- Publication venue
- IEEE Electron Device Letters
External Links
Snippet
A wide dynamic-range (DR) pixel-level CMOS image sensor with self-reset technique has been fabricated using a 0.18-mum six-metal CMOS technology and tested to verify simultaneous increase of both DR and peak signal-to-noise ratio (SNR). It provides a …
- 238000000034 method 0 title abstract description 9
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/335—Transforming light or analogous information into electric information using solid-state image sensors [SSIS]
- H04N5/369—SSIS architecture; Circuitry associated therewith
- H04N5/374—Addressed sensors, e.g. MOS or CMOS sensors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/335—Transforming light or analogous information into electric information using solid-state image sensors [SSIS]
- H04N5/369—SSIS architecture; Circuitry associated therewith
- H04N5/378—Readout circuits, e.g. correlated double sampling [CDS] circuits, output amplifiers or A/D converters
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/335—Transforming light or analogous information into electric information using solid-state image sensors [SSIS]
- H04N5/351—Control of the SSIS depending on the scene, e.g. brightness or motion in the scene
- H04N5/355—Control of the dynamic range
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/335—Transforming light or analogous information into electric information using solid-state image sensors [SSIS]
- H04N5/357—Noise processing, e.g. detecting, correcting, reducing or removing noise
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/14—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/36—Analogue value compared with reference values simultaneously only, i.e. parallel type
- H03M1/361—Analogue value compared with reference values simultaneously only, i.e. parallel type having a separate comparator and reference value for each quantisation level, i.e. full flash converter type
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N3/00—Scanning details of television systems
- H04N3/10—Scanning details of television systems by means not exclusively optical-mechanical
- H04N3/14—Scanning details of television systems by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
- H04N3/15—Scanning details of television systems by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
- H04N3/155—Control of the image-sensor operation, e.g. image processing within the image-sensor
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Park et al. | A wide dynamic-range CMOS image sensor using self-reset technique | |
| Stoppa et al. | Novel CMOS image sensor with a 132-dB dynamic range | |
| Yang et al. | A 640/spl times/512 CMOS image sensor with ultrawide dynamic range floating-point pixel-level ADC | |
| US6642503B2 (en) | Time domain sensing technique and system architecture for image sensor | |
| Wang et al. | A high dynamic range CMOS image sensor with inpixel light-to-frequency conversion | |
| US8653435B2 (en) | Time-delay integration imaging method and apparatus using a high-speed in-pixel analog photon counter | |
| KR100737916B1 (en) | Image sensor and test system and test method for it | |
| KR20090023549A (en) | Mixed Analog and Digital Pixels for High Dynamic Range Reading | |
| CN106412453A (en) | High-dynamic range image sensor based on two times of charge transfer and signal reading method | |
| Lou et al. | An over 140 dB dynamic range CMOS image sensor combined DCG and logarithmic response | |
| Guo et al. | A self-compensated approach for ramp kickback noise in CMOS image sensor column parallel single slope ADC | |
| Stoppa et al. | A 120-dB dynamic range CMOS image sensor with programmable power responsivity | |
| Spivak et al. | Very sensitive low-noise active-reset CMOS image sensor with in-pixel ADC | |
| Hassanli et al. | A highly sensitive, low-power, and wide dynamic range CMOS digital pixel sensor | |
| Matolin et al. | True correlated double sampling and comparator design for time-based image sensors | |
| Cho et al. | High fill factor low-voltage CMOS image sensor based on time-to-threshold PWM VLSI architecture | |
| Zhong et al. | A 6.25-M-pixel 270-fps floating gate image sensor using high-speed and low-power readout technology | |
| Yang et al. | Test structures for characterization and comparative analysis of CMOS image sensors | |
| CN103873791A (en) | Pixel unit read-out circuit and method, and pixel array read-out circuit and method | |
| Park et al. | Wide dynamic range and high SNR self-reset CMOS image sensor using a Schmitt trigger | |
| Wu et al. | Current mode image sensor with improved linearity and fixed-pattern noise | |
| Liu et al. | A dual-exposure wide dynamic range CMOS image sensor with 12 bit column-parallel incremental sigma-delta ADC | |
| Hassanli et al. | A compact, low-power, and fast pulse-width modulation based digital pixel sensor with no bias circuit | |
| Tsai et al. | A quad-sampling wide-dynamic-range pulse-frequency modulation pixel | |
| Chen et al. | A compact reconfigurable counter memory for spiking pixels |