[go: up one dir, main page]

Stoykova et al., 2008 - Google Patents

3D Scene Capture by Multi-Wavelength Pattern Projection at Divergent Illumination of A Sinusoidal Phase Grating

Stoykova et al., 2008

View PDF
Document ID
15015568722124919937
Author
Stoykova E
Sainov V
Minchev G
Publication year
Publication venue
2008 3DTV Conference: The True Vision-Capture, Transmission and Display of 3D Video

External Links

Snippet

The paper focuses on the performance of a phase-shifting profilometric system with a sinusoidal phase grating as a projection element under simultaneous multi-wavelength projection of four phase-shifted patterns at divergent illumination and simultaneous multi …
Continue reading at iomt.bas.bg (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical means
    • G01B11/24—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2545—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical means
    • G01B11/24—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical means
    • G01B11/24—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2536—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings with variable grating pitch, projected on the object with the same angle of incidence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical means
    • G01B11/24—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2531—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings, projected with variable angle of incidence on the object, and one detection device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Instruments as specified in the subgroups and characterised by the use of optical measuring means
    • G01B9/02—Interferometers for determining dimensional properties of, or relations between, measurement objects
    • G01B9/02001—Interferometers for determining dimensional properties of, or relations between, measurement objects characterised by manipulating or generating specific radiation properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical means
    • G01B11/24—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures
    • G01B11/2441—Measuring arrangements characterised by the use of optical means for measuring contours or curvatures using interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Instruments as specified in the subgroups and characterised by the use of optical measuring means
    • G01B9/02—Interferometers for determining dimensional properties of, or relations between, measurement objects
    • G01B9/02055—Interferometers for determining dimensional properties of, or relations between, measurement objects characterised by error reduction techniques
    • G01B9/02075—Interferometers for determining dimensional properties of, or relations between, measurement objects characterised by error reduction techniques of particular errors
    • G01B9/02078—Caused by ambiguity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical means
    • G01B11/14—Measuring arrangements characterised by the use of optical means for measuring distance or clearance between spaced objects or spaced apertures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G01S17/89—Lidar systems specially adapted for specific applications for mapping or imaging

Similar Documents

Publication Publication Date Title
US11680790B2 (en) Multiple channel locating
Yamaguchi et al. Surface contouring by phase-shifting digital holography
JP3568297B2 (en) Method and apparatus for measuring surface profile using diffractive optical element
US9310184B2 (en) Systems and methods for suppressing coherent structured illumination artifacts
CN101451826B (en) Object three-dimensional profile measuring device and measuring method
CA2805443C (en) Method and apparatus for imaging
JP7386185B2 (en) Apparatus, method, and system for generating dynamic projection patterns in a confocal camera
US8129703B2 (en) Intraoral imaging system and method based on conoscopic holography
JP2014522981A (en) Apparatus and method for determining three-dimensional coordinates of an object using a spatial light modulator
CN110199206B (en) Holographic light detection and ranging
JP7348858B2 (en) Hologram imaging device and image reconstruction system
EP2500687A2 (en) Structured light projector
CN109323669B (en) Laser stripe projection device
KR100484637B1 (en) Apparatus and method for shape measurment of three dimension using moire techniques of phase transition of multi-channel
Stoykova et al. 3D Scene Capture by Multi-Wavelength Pattern Projection at Divergent Illumination of A Sinusoidal Phase Grating
Stoykova et al. Pattern projection with a sinusoidal phase grating
US12435968B2 (en) Multiple channel locating
JP5258052B2 (en) Shape measuring method and shape measuring device by phase shift method, complex amplitude measuring method and complex amplitude measuring device
Stoykova et al. Using LED illumination in fringe projection profilometry with a sinusoidal phase grating
Stoykova et al. Research Article Pattern Projection with a Sinusoidal Phase Grating
Merta et al. Simple method of the 3-D shape measurement by system of fiber-optic fringe projection
JP2007071817A (en) Two-beam interferometer and method for measuring the shape of an object to be measured using the interferometer
Saĭnov et al. Technique for reconstructing a surface shape for measuring coordinates
Sainov et al. Real-time multicamera system for measurement of 3D coordinates by pattern projection
Xu et al. Grating Interferometer Using±1st Order Beams for Step-Profile Altitude Difference Measurement