Agarwal et al., 2017 - Google Patents
A review on analyzers for mass spectrometryAgarwal et al., 2017
View PDF- Document ID
- 14769319070566450605
- Author
- Agarwal P
- Goyal A
- Publication year
- Publication venue
- Int. J. Pharma. Bio. Sci
External Links
Snippet
Mass spectrometry is a technique used for measuring the molecular weight and determining the molecular formula of an organic compound. The complete process involves the conversion of the sample into gaseous ions, with or without fragmentation, which are then …
- 238000004949 mass spectrometry 0 title abstract description 41
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- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/422—Two-dimensional RF ion traps
- H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles
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- H—ELECTRICITY
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- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
- H01J49/4215—Quadrupole mass filters
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- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
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- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/4255—Device types with particular constructional features
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- H01J49/426—Methods for controlling ions
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- H01J49/36—Radio frequency spectrometers, e.g. Bennett-type spectrometers, Redhead-type spectrometers
- H01J49/38—Omegatrons Using ion cyclotron resonance
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- H01J49/06—Electron- or ion-optical arrangements
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- H—ELECTRICITY
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- H01J49/00—Particle spectrometer or separator tubes
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- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
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- H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
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- H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
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- H01J49/0027—Methods for using particle spectrometers
- H01J49/0036—Step by step routines describing the handling of the data generated during a measurement
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- H01J49/0031—Step by step routines describing the use of the apparatus
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- H01J37/02—Details
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