[go: up one dir, main page]

Grames et al., 2018 - Google Patents

Milliampere beam studies using high polarization photocathodes at the cebaf photoinjector

Grames et al., 2018

View PDF
Document ID
14457165837992060817
Author
Grames J
Adderley P
Hansknecht J
Poelker M
Moser D
Stutzman M
Zhang S
Publication year
Publication venue
PoS PSTP2017

External Links

Snippet

GaAs photocathodes inside dc high voltage photo-guns are the primary means to produce spin polarized electron beams for nuclear and high energy physics experiments at particle accelerators. To be useful, such photocathodes must exhibit sufficiently long photocathode …
Continue reading at wiki.jlab.org (PDF) (other versions)

Classifications

    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/06Sources
    • H01J2237/08Ion sources
    • H01J2237/0802Field ionization sources
    • H01J2237/0807Gas field ion sources [GFIS]
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J41/00Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas; Discharge tubes for evacuation by diffusion of ions
    • H01J41/02Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas
    • H01J41/06Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas with ionisation by means of cold cathodes
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes, e.g. for surface treatment of objects such as coating, plating, etching, sterilising or bringing about chemical reactions
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • H01J35/14Arrangements for concentrating, focusing, or directing the cathode ray
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/02Details
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/153Correcting image defects, e.g. stigmators
    • H01J2237/1538Space charge (Boersch) effect compensation
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J41/00Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas; Discharge tubes for evacuation by diffusion of ions
    • H01J41/02Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas
    • H01J41/04Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas with ionisation by means of thermionic cathodes
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/24Tubes wherein the point of impact of the cathode ray on the anode or anti-cathode is movable relative to the surface thereof
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244Detection characterized by the detecting means

Similar Documents

Publication Publication Date Title
US9671302B2 (en) Cold cathode ionization vacuum gauge
Molvik et al. Gas desorption and electron emission from 1 MeV potassium ion bombardment of stainless steel
Belhaj et al. Analysis of two methods of measurement of surface potential of insulators in SEM: electron spectroscopy and X-ray spectroscopy methods
Suleiman et al. High current polarized electron source
Grames et al. Milliampere beam studies using high polarization photocathodes at the cebaf photoinjector
Pigache et al. Secondary‐emission electron gun for high pressure molecular lasers
Fränkle et al. Penning discharge in the KATRIN pre-spectrometer
Beck et al. Effect of a sweeping conductive wire on electrons stored in a Penning-like trap between the KATRIN spectrometers
Hau-Riege et al. Near-ultraviolet luminescence of N 2 irradiated by short X-ray pulses
Grames et al. Ion back-bombardment of gaas photocathodes inside dc high voltage electron guns
Golovin et al. Estimation of the current-voltage characteristic of an open discharge
Geng et al. Dynamical aspects of multipacting induced discharge in a rectangular waveguide
Oliver et al. Characterization of the rod-pinch diode X-ray source on Cygnus
Zhang et al. A Supersonic Gas Jet-Based Beam Profile Monitor Using Fluorescence for HL-LHC
Li et al. Characterization of an electron gun for hollow electron beam collimation
Yoskowitz et al. Charge lifetime improvement of the Continuous Electron Beam Accelerator Facility photogun with a biased anode
Kim Protection of accelerator hardware: RF systems
Sinclair et al. Dramatic reduction of DC field emission from large area electrodes by plasma-source ion implantation
RU2544830C1 (en) Method for recovery of powerful vacuum shf-device of gyrotron type
RU137653U1 (en) MASS SPECTROMETRIC ANALYZER OF GAS LEAK DETECTOR
US20170248485A1 (en) Spark Gap Device And Method Of Measurement Of X-Ray Tube Vacuum Pressure
Akishin Detection of ion beams by electron multipliers in mass spectrometry and nuclear physics
Katagiri et al. Design study of compact EBIS for light-ion production using low-energy hollow electron beams
Nishimori et al. Development of a Photoemission DC Gun at JAEA
Almen et al. Fast rise time, high sensitivity MCP ion detector for low-energy ion spectroscopy