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Pomeranz et al., 1995 - Google Patents

On synthesis-for-testability of combinational logic circuits

Pomeranz et al., 1995

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Document ID
14232227314258020572
Author
Pomeranz I
Reddy S
Publication year
Publication venue
Proceedings of the 32nd annual ACM/IEEE Design Automation Conference

External Links

Snippet

We propose a synthesis method that modifies a given circuit to reduce the number of gates and the number of paths in the circuit. The synthesis procedure is based on replacing subcircuits of the given circuit by structures called comparison units. Comparison units are …
Continue reading at dl.acm.org (PDF) (other versions)

Classifications

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    • G06F17/50—Computer-aided design
    • G06F17/5045—Circuit design
    • G06F17/505—Logic synthesis, e.g. technology mapping, optimisation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5009—Computer-aided design using simulation
    • G06F17/5022—Logic simulation, e.g. for logic circuit operation
    • G—PHYSICS
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    • G—PHYSICS
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    • G06F17/50—Computer-aided design
    • G06F17/5068—Physical circuit design, e.g. layout for integrated circuits or printed circuit boards
    • G06F17/5081—Layout analysis, e.g. layout verification, design rule check
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
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    • G06F17/5054—Circuit design for user-programmable logic devices, e.g. field programmable gate arrays [FPGA]
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    • G06F17/5072—Floorplanning, e.g. partitioning, placement
    • G—PHYSICS
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    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. varying supply voltage

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