[go: up one dir, main page]

Harinarayan et al., 2016 - Google Patents

Automated Full Chip SPICE simulations with self-checking assertions for last mile verification & first pass Silicon of mixed signal SoCs

Harinarayan et al., 2016

Document ID
14146045463049611263
Author
Harinarayan G
Rana M
Pant N
Bansal M
Sharma S
Kaundal N
Publication year
Publication venue
2016 29th IEEE International System-on-Chip Conference (SOCC)

External Links

Snippet

System-on-Chips designed for modern applications combine a large number of highly integrated Analog, Digital and Mixed-signal circuits. As we approach smaller technology nodes, semiconductor mask costs rise higher and higher. Thus the need to achieve first pass …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5009—Computer-aided design using simulation
    • G06F17/5022—Logic simulation, e.g. for logic circuit operation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5068—Physical circuit design, e.g. layout for integrated circuits or printed circuit boards
    • G06F17/5081—Layout analysis, e.g. layout verification, design rule check
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5009—Computer-aided design using simulation
    • G06F17/5036—Computer-aided design using simulation for analog modelling, e.g. for circuits, spice programme, direct methods, relaxation methods
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5045—Circuit design
    • G06F17/5054—Circuit design for user-programmable logic devices, e.g. field programmable gate arrays [FPGA]
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5045—Circuit design
    • G06F17/505—Logic synthesis, e.g. technology mapping, optimisation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F2217/00—Indexing scheme relating to computer aided design [CAD]
    • G06F2217/78—Power analysis and optimization
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F1/00—Details of data-processing equipment not covered by groups G06F3/00 - G06F13/00, e.g. cooling, packaging or power supply specially adapted for computer application
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/32—Means for saving power
    • G06F1/3203—Power Management, i.e. event-based initiation of power-saving mode
    • G06F1/3234—Action, measure or step performed to reduce power consumption
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F2217/00—Indexing scheme relating to computer aided design [CAD]
    • G06F2217/68—Processors
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F1/00—Details of data-processing equipment not covered by groups G06F3/00 - G06F13/00, e.g. cooling, packaging or power supply specially adapted for computer application
    • G06F1/04—Generating or distributing clock signals or signals derived directly therefrom
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F2217/00—Indexing scheme relating to computer aided design [CAD]
    • G06F2217/70—Fault tolerant, i.e. transient fault suppression
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F2217/00—Indexing scheme relating to computer aided design [CAD]
    • G06F2217/86—Hardware-Software co-design
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. varying supply voltage

Similar Documents

Publication Publication Date Title
US8176453B2 (en) Power-aware debugging
Keating et al. Low power methodology manual: for system-on-chip design
US8352235B1 (en) Emulation of power shutoff behavior for integrated circuits
JP2017516223A (en) Computer-implemented system and method for translation of electronic design verification commands
US8250504B2 (en) Designing method of semiconductor integrated circuit
Priya et al. Early register transfer level (rtl) power estimation in real-time system-on-chips (socs)
Harinarayan et al. Automated Full Chip SPICE simulations with self-checking assertions for last mile verification & first pass Silicon of mixed signal SoCs
Liang Mixed-signal verification methods for multi-power mixed-signal System-on-Chip (SoC) design
Gagarski et al. Power specification, simulation and verification of SystemC designs
Peterson et al. Fully-automated Synthesis of Power Management controllers from UPF
Chen et al. A multicore chip load model for PDN analysis considering voltage–Current-timing interdependency and operation mode transitions
Kamath et al. A comprehensive multi-voltage design platform for system-level validation of standard cell library
Kulkarni et al. Energy efficient implementation, power aware simulation and verification of 16-bit ALU using unified power format standards
US20230367938A1 (en) Method for comprehensive low power simulation coverage
Sharma et al. Real-time automated register abstraction active power-aware electronic system level verification framework
US11574099B2 (en) Simulation framework
Ahmed Dynamic voltage scaling for current and future fpgas
Peterson et al. StML: bridging the gap between FPGA design and HDL circuit description
Patel et al. Advanced UPF based voltage-aware verification for IOs
Kurimoto et al. Verification work reduction methodology in low-power chip implementation
Shankar et al. Low Power Mixed-Signal SoC Integration and Verification Challenges with Third Party IP Cores
Koshiya Low Power Veri cation of Data Manipulation IP using UPF Methodology
Anantharaman et al. Power Aware Verification Strategy for SoCs
CN114970407A (en) Simulation framework
Patel Modeling and Verification of Power Aware IO Models