Wankhede et al., 2025 - Google Patents
Automatic edge detection of screen printed elliptical grids captured by modified USB microscope for single point strain analysisWankhede et al., 2025
- Document ID
- 12488651301455122927
- Author
- Wankhede P
- Narayanaswamy N
- Suresh K
- Priyadarshini A
- Publication year
- Publication venue
- Journal of the Brazilian Society of Mechanical Sciences and Engineering
External Links
Snippet
This paper focuses on the development of required hardware and software for automatic single-point strain analysis in sheet metal forming through image processing. The software was developed in python with a user-friendly GUI. The handheld USB microscope has been …
- 238000004458 analytical method 0 title abstract description 17
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10024—Color image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
- G06K9/36—Image preprocessing, i.e. processing the image information without deciding about the identity of the image
- G06K9/46—Extraction of features or characteristics of the image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30004—Biomedical image processing
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20112—Image segmentation details
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10016—Video; Image sequence
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0012—Biomedical image inspection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20092—Interactive image processing based on input by user
- G06T2207/20104—Interactive definition of region of interest [ROI]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
- G06K9/62—Methods or arrangements for recognition using electronic means
- G06K9/6267—Classification techniques
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
- G06K9/62—Methods or arrangements for recognition using electronic means
- G06K9/6217—Design or setup of recognition systems and techniques; Extraction of features in feature space; Clustering techniques; Blind source separation
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K9/00—Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
- G06K9/00127—Acquiring and recognising microscopic objects, e.g. biological cells and cellular parts
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/60—Analysis of geometric attributes
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T5/00—Image enhancement or restoration, e.g. from bit-mapped to bit-mapped creating a similar image
- G06T5/007—Dynamic range modification
- G06T5/008—Local, e.g. shadow enhancement
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T11/00—2D [Two Dimensional] image generation
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
- G06K—RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K2209/00—Indexing scheme relating to methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
- G06K2209/19—Recognition of objects for industrial automation
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5546317B2 (en) | Visual inspection device, visual inspection discriminator generation device, visual inspection discriminator generation method, and visual inspection discriminator generation computer program | |
CN111083365B (en) | Method and device for rapidly detecting optimal focal plane position | |
US7580560B2 (en) | System and method for fast template matching by adaptive template decomposition | |
CN118644483B (en) | A method and system for detecting defects in a flexible circuit board | |
JP7622203B2 (en) | COMPUTER IMPLEMENTED METHOD FOR QUALITY CONTROL OF DIGITAL IMAGES OF SAMPLES - Patent application | |
CN118275449B (en) | Copper strip surface defect detection method, device and equipment | |
CN118837379B (en) | A high-precision defect detection method and system for smart glasses | |
CN117456195A (en) | Abnormal image identification method and system based on depth fusion | |
CN117392127B (en) | Method and device for detecting display panel frame and electronic equipment | |
CN119784741A (en) | A training method and system for 5G flexible circuit board defect detection model | |
CN118967695B (en) | Surface structure quality detection method and system for DFB laser chip | |
CN112381751A (en) | Online intelligent detection system and method based on image processing algorithm | |
Zhou et al. | An adaptive clustering method detecting the surface defects on linear guide rails | |
CN118570208B (en) | Lens component defect recognition method and system based on machine vision | |
Wankhede et al. | Automatic edge detection of screen printed elliptical grids captured by modified USB microscope for single point strain analysis | |
CN117474916A (en) | Image detection method, electronic equipment and storage medium | |
CN116934734A (en) | Image-based part defect multipath parallel detection method, device and related medium | |
Shen et al. | Design and implementation of PCB detection and classification system based on machine vision | |
Singh et al. | Surface area calculation of asymmetric/axisymmetric shapes utilising simple image processing and OpenCV | |
CN119672426B (en) | RFID chip image anomaly detection method and system based on intelligent learning | |
CN119919387B (en) | Method, system, product and medium for detecting surface flaws of optical film | |
Almobarak et al. | Classification of aesthetic photographic images using SVM and KNN classifiers | |
Peng et al. | A two-stage defect detection method for unevenly illuminated self-adhesive printed materials | |
YUN | IMAGE PROCESSING AND IMAGE ANALYSIS OF DEFECTS IN MICROLENS ARRAY USING SMARTPHONE CAMERA AND APPLICATION | |
CN119723101A (en) | A multi-scale chip defect size measurement method based on UNet++ |