Piombini et al., 2005 - Google Patents
Highlighting of local inhomogeneity in excimer conditioning of KDPPiombini et al., 2005
- Document ID
- 12151502752825336428
- Author
- Piombini H
- Damiani D
- Damamme G
- Natoli J
- Bertussi B
- Commandre M
- Publication year
- Publication venue
- Laser-induced damage in optical materials: 2004
External Links
Snippet
In order to increase the laser induced damage threshold of KDP crystal, a well-known solution consists in a laser conditioning process. In our case, the irradiation of the crystal is performed with an excimer laser XeF (λ= 351 nm, 16 ns). The improvements in laser …
- 230000003750 conditioning 0 title abstract description 54
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/636—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
- G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US20040102764A1 (en) | Laser ablation | |
| Lamaignère et al. | Parametric study of laser-induced surface damage density measurements: Toward reproducibility | |
| Zhang et al. | Coaxial monitoring of the fibre laser lap welding of Zn-coated steel sheets using an auxiliary illuminant | |
| CN106770311B (en) | A kind of crystal laser pretreatment and point-to-point damage test device and test method | |
| CN109444166B (en) | A method for rapid imaging of surface absorption defect distribution of large-aperture optical components | |
| Doualle et al. | CO2 laser microprocessing for laser damage growth mitigation of fused silica optics | |
| US9335156B2 (en) | Method and device for testing a composite material using laser ultrasonics | |
| Simonds et al. | Simultaneous high-speed x-ray transmission imaging and absolute dynamic absorptance measurements during high-power laser-metal processing | |
| CN111595783A (en) | Material laser absorption rate measuring system and method | |
| US20090154521A1 (en) | Non-contact method and apparatus for hardness case depth monitoring | |
| Vyacheslavov et al. | In-situ study of the processes of damage to the tungsten surface under transient heat loads possible in ITER | |
| Yang et al. | Multi-spot laser lock-in thermography for real-time imaging of cracks in semiconductor chips during a manufacturing process | |
| CN105195468A (en) | Method and device for online cleaning and detection of first lens of fusion device | |
| Lamaignère et al. | Laser damage resistance qualification of large optics for high power laser | |
| US20230129245A1 (en) | Method and system for laser welding of a semiconductor material | |
| Piombini et al. | Highlighting of local inhomogeneity in excimer conditioning of KDP | |
| US10908018B2 (en) | Rapid beam measuring in several planes | |
| Doualle et al. | Development of a laser damage growth mitigation process, based on CO2 laser micro processing, for the Laser MegaJoule fused silica optics | |
| Morgan | Expanded damage test facilities at LLNL | |
| US4755049A (en) | Method and apparatus for measuring the ion implant dosage in a semiconductor crystal | |
| CN112388156B (en) | A combined device for laser pretreatment and absorption defect imaging detection of large aperture optical components | |
| Lisitsyn et al. | Effect of the laser radiation wavelength on the energy threshold of initiation of heavy metal azides | |
| Courchinoux et al. | Laser-induced damage growth with small and large beams: comparison between laboratory experiments and large-scale laser data | |
| Zheng et al. | Microscopic characterization of bulk damage resistance of DKDP nonlinear crystals | |
| RU2656408C1 (en) | Method of optical tomography of transparent materials |