Liu et al., 2023 - Google Patents
BP neural network for non-invasive IGBT junction temperature online detectionLiu et al., 2023
View HTML- Document ID
- 11907757202521492103
- Author
- Liu L
- Peng Q
- Jiang H
- Ran L
- Wang Y
- Du C
- Chen J
- Zhou H
- Chen Y
- Peng Z
- Publication year
- Publication venue
- Microelectronics Reliability
External Links
Snippet
A number of studies have focused on Insulated Gate Bipolar Transistor (IGBT) junction temperature prediction methods. Some methods introduce extra circuits or sensors for an invasive prediction. However, the most of current methods hardly consider the situation that …
- 230000001537 neural 0 title abstract description 73
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2642—Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests
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