Passeri et al., 2003 - Google Patents
High-resolution CMOS particle detectors: design and test issuesPasseri et al., 2003
- Document ID
- 11971175585810943517
- Author
- Passeri D
- Placidi P
- Verducci L
- Ciampolini P
- Matrella G
- Marras A
- Bilei G
- Publication year
- Publication venue
- 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No. 03CH37515)
External Links
Snippet
In this paper, we discuss some issues related to the design, implementation and test of a CMOS active pixel sensor chip (RAPS01), developed in the framework of RAPS (Radiation Active Pixel Sensors) INFN project. Two different basic pixel schemes have been proposed …
- 239000002245 particle 0 title description 7
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
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