[go: up one dir, main page]

Han et al., 1997 - Google Patents

Using neural network process models to perform PECVD silicon dioxide recipe synthesis via genetic algorithms

Han et al., 1997

Document ID
11623641573037872244
Author
Han S
May G
Publication year
Publication venue
IEEE transactions on semiconductor manufacturing

External Links

Snippet

Silicon oxide (SiO/sub 2/) films have extensive applications in integrated circuit fabrication technology, including passivation layers for integrated circuits, diffusion or photolithographic masks, and interlayer dielectrics for metal-insulator structures such as MOS transistors or …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06NCOMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00Computer systems based on biological models
    • G06N3/12Computer systems based on biological models using genetic models
    • G06N3/126Genetic algorithms, i.e. information processing using digital simulations of the genetic system
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B13/00Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion
    • G05B13/02Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric
    • G05B13/0265Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric the criterion being a learning criterion
    • G05B13/027Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric the criterion being a learning criterion using neural networks only
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06NCOMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00Computer systems based on biological models
    • G06N3/02Computer systems based on biological models using neural network models
    • G06N3/08Learning methods
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B13/00Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion
    • G05B13/02Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric
    • G05B13/04Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric involving the use of models or simulators
    • G05B13/042Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric involving the use of models or simulators in which a parameter or coefficient is automatically adjusted to optimise the performance

Similar Documents

Publication Publication Date Title
Han et al. Using neural network process models to perform PECVD silicon dioxide recipe synthesis via genetic algorithms
Man et al. Genetic algorithms for control and signal processing
Kim et al. An optimal neural network process model for plasma etching
Rietman et al. Use of neural networks in modeling semiconductor manufacturing processes: An example for plasma etch modeling
US6810291B2 (en) Scalable, hierarchical control for complex processes
Han et al. Modeling the properties of PECVD silicon dioxide films using optimized back-propagation neural networks
KR100915339B1 (en) Dual-phase virtual metrology method
Xie et al. Process optimization using a fuzzy logic response surface method
CN116053164A (en) Method and system for controlling critical dimension
Kim et al. Reactive ion etch modeling using neural networks and simulated annealing
CN116842439A (en) A model-based semiconductor quality prediction method
Han et al. Optimization of neural network structure and learning parameters using genetic algorithms
Han et al. Modeling the growth of PECVD silicon nitride films for solar cell applications using neural networks
Chan et al. Modelling and optimization of fluid dispensing for electronic packaging using neural fuzzy networks and genetic algorithms
Kim et al. Optimization of via formation in photosensitive dielectric layers using neural networks and genetic algorithms
Fernando et al. An elitist non-dominated sorting based genetic algorithm for simultaneous area and wirelength minimization in VLSI floorplanning
Kim et al. Intelligent control of via formation by photosensitive BCB for MCM-L/D applications
Tan et al. Efficient establishment of a fuzzy logic model for process modeling and control
Han et al. Recipe synthesis for PECVD SiO/sub 2/films using neural networks and genetic algorithms
Dai et al. Multi-objectives design optimization based on multi-objectives Gaussian processes for System-in-Package
Kim et al. Intelligent control of via formation process in MCM-L/D substrates using neural networks
Davis et al. Automatic synthesis of equipment recipes from specified wafer-state transitions
May Gary zyxwvutsrqponm
Bae et al. Optimization of silicon solar cell fabrication based on neural network and genetic programming modeling
Han Modeling and optimization of plasma-enhanced chemical vapor deposition using neural networks and genetic algorithms